KR20130140782A - 집적 회로 장치에서 내부 전원을 공유하기 위한 방법 및 장치 - Google Patents

집적 회로 장치에서 내부 전원을 공유하기 위한 방법 및 장치 Download PDF

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Publication number
KR20130140782A
KR20130140782A KR1020137015142A KR20137015142A KR20130140782A KR 20130140782 A KR20130140782 A KR 20130140782A KR 1020137015142 A KR1020137015142 A KR 1020137015142A KR 20137015142 A KR20137015142 A KR 20137015142A KR 20130140782 A KR20130140782 A KR 20130140782A
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KR
South Korea
Prior art keywords
supply voltage
regulator
voltage generator
memory device
internal
Prior art date
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Withdrawn
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KR1020137015142A
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English (en)
Korean (ko)
Inventor
피터 길링험
Original Assignee
모사이드 테크놀로지스 인코퍼레이티드
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Publication of KR20130140782A publication Critical patent/KR20130140782A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/221—Structures or relative sizes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/29—Bond pads specially adapted therefor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/50—Bond wires
    • H10W72/59—Bond pads specially adapted therefor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/20—Configurations of stacked chips
    • H10W90/297—Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020137015142A 2010-11-23 2011-05-03 집적 회로 장치에서 내부 전원을 공유하기 위한 방법 및 장치 Withdrawn KR20130140782A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US41643710P 2010-11-23 2010-11-23
US61/416,437 2010-11-23
PCT/CA2011/000528 WO2012068664A1 (en) 2010-11-23 2011-05-03 Method and apparatus for sharing internal power supplies in integrated circuit devices

Publications (1)

Publication Number Publication Date
KR20130140782A true KR20130140782A (ko) 2013-12-24

Family

ID=46064267

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020137015142A Withdrawn KR20130140782A (ko) 2010-11-23 2011-05-03 집적 회로 장치에서 내부 전원을 공유하기 위한 방법 및 장치

Country Status (6)

Country Link
US (2) US8625352B2 (https=)
EP (1) EP2643835A1 (https=)
JP (1) JP5623653B2 (https=)
KR (1) KR20130140782A (https=)
CN (1) CN103229240B (https=)
WO (1) WO2012068664A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8913443B2 (en) * 2011-09-19 2014-12-16 Conversant Intellectual Property Management Inc. Voltage regulation for 3D packages and method of manufacturing same
US9318186B1 (en) * 2014-12-31 2016-04-19 Nanya Technology Corporation DRAM wordline control circuit, DRAM module and method of controlling DRAM wordline voltage
TWI560718B (en) * 2015-03-27 2016-12-01 Silicon Motion Inc Data storage device and encoding method thereof
JP7685349B2 (ja) * 2021-03-18 2025-05-29 キオクシア株式会社 半導体記憶装置
US11816357B2 (en) * 2021-08-12 2023-11-14 Micron Technology, Inc. Voltage regulation distribution for stacked memory

Family Cites Families (23)

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US5197029A (en) * 1991-02-07 1993-03-23 Texas Instruments Incorporated Common-line connection for integrated memory array
JPH1070243A (ja) * 1996-05-30 1998-03-10 Toshiba Corp 半導体集積回路装置およびその検査方法およびその検査装置
US6750527B1 (en) * 1996-05-30 2004-06-15 Kabushiki Kaisha Toshiba Semiconductor integrated circuit device having a plurality of wells, test method of testing the semiconductor integrated circuit device, and test device which executes the test method
US6031760A (en) * 1997-07-29 2000-02-29 Kabushiki Kaisha Toshiba Semiconductor memory device and method of programming the same
KR100399773B1 (ko) * 2001-02-08 2003-09-26 삼성전자주식회사 메모리슬롯별 서로 다른 기준전압을 갖는 반도체 메모리장치
JP2003036673A (ja) * 2001-07-24 2003-02-07 Mitsubishi Electric Corp 半導体記憶装置
JP2003132679A (ja) * 2001-10-23 2003-05-09 Hitachi Ltd 半導体装置
US7466160B2 (en) * 2002-11-27 2008-12-16 Inapac Technology, Inc. Shared memory bus architecture for system with processor and memory units
JP4419049B2 (ja) * 2003-04-21 2010-02-24 エルピーダメモリ株式会社 メモリモジュール及びメモリシステム
JP4068616B2 (ja) * 2003-12-26 2008-03-26 エルピーダメモリ株式会社 半導体装置
KR100626385B1 (ko) * 2004-09-13 2006-09-20 삼성전자주식회사 반도체 메모리 장치 및 그것을 포함하는 멀티칩 패키지
KR100688514B1 (ko) 2005-01-05 2007-03-02 삼성전자주식회사 다른 종류의 ｍｃｐ를 탑재한 메모리 모듈
JP2006286048A (ja) * 2005-03-31 2006-10-19 Toshiba Corp 半導体記憶装置
US20070170979A1 (en) * 2005-11-25 2007-07-26 Giovanni Campardo Charge pump systems and methods
JP2007180087A (ja) * 2005-12-27 2007-07-12 Seiko Epson Corp 集積回路装置
KR100798797B1 (ko) * 2006-06-30 2008-01-29 주식회사 하이닉스반도체 내부전압 발생장치를 구비하는 반도체메모리소자 및 그의구동방법
US7639540B2 (en) * 2007-02-16 2009-12-29 Mosaid Technologies Incorporated Non-volatile semiconductor memory having multiple external power supplies
CN101290896A (zh) * 2007-04-19 2008-10-22 矽品精密工业股份有限公司 可供堆叠的半导体装置及其制法
JP2008300469A (ja) * 2007-05-30 2008-12-11 Sharp Corp 不揮発性半導体記憶装置
CN101919145B (zh) 2007-12-21 2013-07-17 桑迪士克科技股份有限公司 可自配置的多调压器专用集成电路核电力输送
KR101542353B1 (ko) 2007-12-21 2015-08-06 샌디스크 테크놀로지스, 인코포레이티드 Ａｓｉｃ 코어를 위한 다중 레귤레이터 전력 전달 시스템
US7894230B2 (en) 2009-02-24 2011-02-22 Mosaid Technologies Incorporated Stacked semiconductor devices including a master device
US8400781B2 (en) * 2009-09-02 2013-03-19 Mosaid Technologies Incorporated Using interrupted through-silicon-vias in integrated circuits adapted for stacking

Also Published As

Publication number Publication date
CN103229240B (zh) 2015-05-20
CN103229240A (zh) 2013-07-31
US8625352B2 (en) 2014-01-07
US20140119136A1 (en) 2014-05-01
HK1186569A1 (en) 2014-03-14
JP2014501016A (ja) 2014-01-16
US9236095B2 (en) 2016-01-12
WO2012068664A1 (en) 2012-05-31
JP5623653B2 (ja) 2014-11-12
EP2643835A1 (en) 2013-10-02
US20120127798A1 (en) 2012-05-24

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