KR20090073223A - Tcp 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법 - Google Patents
Tcp 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법 Download PDFInfo
- Publication number
- KR20090073223A KR20090073223A KR1020097009678A KR20097009678A KR20090073223A KR 20090073223 A KR20090073223 A KR 20090073223A KR 1020097009678 A KR1020097009678 A KR 1020097009678A KR 20097009678 A KR20097009678 A KR 20097009678A KR 20090073223 A KR20090073223 A KR 20090073223A
- Authority
- KR
- South Korea
- Prior art keywords
- tcp
- coordinate data
- contact surface
- connection terminal
- measuring unit
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2006/322396 WO2008056418A1 (en) | 2006-11-09 | 2006-11-09 | Tcp handling device, and method for positional alignment of connecting terminals in the device |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090073223A true KR20090073223A (ko) | 2009-07-02 |
Family
ID=39364247
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020097009678A KR20090073223A (ko) | 2006-11-09 | 2006-11-09 | Tcp 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5047188B2 (ja) |
KR (1) | KR20090073223A (ja) |
CN (1) | CN101583840A (ja) |
TW (1) | TW200836280A (ja) |
WO (1) | WO2008056418A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20160025291A (ko) * | 2014-08-27 | 2016-03-08 | 에스케이하이닉스 주식회사 | 보정용 프로브 카드, 프로브 테스트 장치, 보정용 프로브 카드의 설정 방법 및 보정용 프로브 카드를 이용한 프로브 테스트 장치의 얼라인 방법 |
KR20180084337A (ko) | 2017-01-16 | 2018-07-25 | 주식회사 에이티테크놀러지 | Tab용 핸들링 장치 |
KR200489368Y1 (ko) * | 2018-12-13 | 2019-06-07 | 주식회사 케이비엔텍 | 다양한 규격의 테스터기 장착이 가능한 칩 검사장치 |
US10710877B2 (en) | 2014-07-18 | 2020-07-14 | Korea Institute Of Science And Technology | Method and apparatus for generating hydrogen from formic acid |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10985328B2 (en) | 2016-05-25 | 2021-04-20 | Universal Display Corporation | Organic electroluminescent materials and devices |
US10324126B2 (en) * | 2016-06-10 | 2019-06-18 | Asm Technology Singapore Pte Ltd. | Method and apparatus for aligning probe pins with respect to positions of electronic devices |
CN107478152A (zh) * | 2017-08-11 | 2017-12-15 | 哈尔滨工业大学 | Tr芯片定位方法及检测方法 |
CN107560588B (zh) * | 2017-10-24 | 2023-10-27 | 江阴鑫宝利金属制品有限公司 | 涡轮焊接腔表面平整度检测工装 |
TWI701441B (zh) * | 2018-10-23 | 2020-08-11 | 鋒華科技股份有限公司 | 具有預先調整溫度的捲帶式覆晶薄膜測試裝置 |
CN111562413A (zh) * | 2019-02-14 | 2020-08-21 | 均豪精密工业股份有限公司 | 检测方法及检测系统 |
CN110690135B (zh) * | 2019-09-30 | 2022-02-01 | 武汉东飞凌科技有限公司 | 一种二次元坐标系旋转补偿测量方法及装置 |
CN110940918B (zh) * | 2019-12-13 | 2021-04-09 | 吴江市金澜机械制造有限公司 | 一种发电机定子电性能自动检测装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08327658A (ja) * | 1995-03-31 | 1996-12-13 | Tokyo Electron Ltd | 基板検査装置 |
JP2000161913A (ja) * | 1998-12-01 | 2000-06-16 | Philips Japan Ltd | 複数の物体を相互に位置合わせする方法及び装置 |
JP2001061913A (ja) * | 1999-08-26 | 2001-03-13 | Ishimoku:Kk | 歩行補助具、歩行補助具の製法 |
JP2001181888A (ja) * | 1999-12-17 | 2001-07-03 | Nippon Mining & Metals Co Ltd | コネクタ用めっき材料 |
JP2002181888A (ja) * | 2000-12-13 | 2002-06-26 | Ando Electric Co Ltd | プローブカードとtabの位置決め装置 |
JP2004146776A (ja) * | 2002-08-29 | 2004-05-20 | Shinko Electric Ind Co Ltd | フリップチップ実装装置及びフリップチップ実装方法 |
WO2004068154A1 (ja) * | 2003-01-31 | 2004-08-12 | Japan Engineering Co.,Ltd. | Tcpハンドリング装置および当該装置における位置ずれ補正方法 |
-
2006
- 2006-11-09 JP JP2008542972A patent/JP5047188B2/ja not_active Expired - Fee Related
- 2006-11-09 KR KR1020097009678A patent/KR20090073223A/ko not_active Application Discontinuation
- 2006-11-09 CN CNA2006800563147A patent/CN101583840A/zh active Pending
- 2006-11-09 WO PCT/JP2006/322396 patent/WO2008056418A1/ja active Application Filing
-
2007
- 2007-10-25 TW TW096140019A patent/TW200836280A/zh unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10710877B2 (en) | 2014-07-18 | 2020-07-14 | Korea Institute Of Science And Technology | Method and apparatus for generating hydrogen from formic acid |
KR20160025291A (ko) * | 2014-08-27 | 2016-03-08 | 에스케이하이닉스 주식회사 | 보정용 프로브 카드, 프로브 테스트 장치, 보정용 프로브 카드의 설정 방법 및 보정용 프로브 카드를 이용한 프로브 테스트 장치의 얼라인 방법 |
KR20180084337A (ko) | 2017-01-16 | 2018-07-25 | 주식회사 에이티테크놀러지 | Tab용 핸들링 장치 |
KR200489368Y1 (ko) * | 2018-12-13 | 2019-06-07 | 주식회사 케이비엔텍 | 다양한 규격의 테스터기 장착이 가능한 칩 검사장치 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2008056418A1 (ja) | 2010-02-25 |
WO2008056418A1 (en) | 2008-05-15 |
TW200836280A (en) | 2008-09-01 |
JP5047188B2 (ja) | 2012-10-10 |
CN101583840A (zh) | 2009-11-18 |
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