KR20090004636A - 기판 외관 검사 장치 - Google Patents

기판 외관 검사 장치 Download PDF

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Publication number
KR20090004636A
KR20090004636A KR1020080063316A KR20080063316A KR20090004636A KR 20090004636 A KR20090004636 A KR 20090004636A KR 1020080063316 A KR1020080063316 A KR 1020080063316A KR 20080063316 A KR20080063316 A KR 20080063316A KR 20090004636 A KR20090004636 A KR 20090004636A
Authority
KR
South Korea
Prior art keywords
substrate
board
image
unit
inspection apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020080063316A
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English (en)
Korean (ko)
Inventor
히로유키 오카히라
Original Assignee
올림푸스 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 올림푸스 가부시키가이샤 filed Critical 올림푸스 가부시키가이샤
Publication of KR20090004636A publication Critical patent/KR20090004636A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
KR1020080063316A 2007-07-06 2008-07-01 기판 외관 검사 장치 Withdrawn KR20090004636A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00178772 2007-07-06
JP2007178772A JP2009014617A (ja) 2007-07-06 2007-07-06 基板外観検査装置

Publications (1)

Publication Number Publication Date
KR20090004636A true KR20090004636A (ko) 2009-01-12

Family

ID=40213265

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080063316A Withdrawn KR20090004636A (ko) 2007-07-06 2008-07-01 기판 외관 검사 장치

Country Status (4)

Country Link
JP (1) JP2009014617A (enrdf_load_stackoverflow)
KR (1) KR20090004636A (enrdf_load_stackoverflow)
CN (1) CN101339143A (enrdf_load_stackoverflow)
TW (1) TW200909798A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190051031A (ko) * 2016-09-30 2019-05-14 상하이 마이크로 일렉트로닉스 이큅먼트(그룹) 컴퍼니 리미티드 패널에서 파티클을 검출하는 방법

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101080216B1 (ko) * 2009-02-17 2011-11-09 (주)글로벌 텍 글라스 에지 검사장치 및 그를 이용한 글라스 에지 검사방법
JP5274389B2 (ja) * 2009-06-18 2013-08-28 株式会社アルバック メンテナンス装置及び吐出装置
TW201118027A (en) * 2009-11-30 2011-06-01 Schmid Yaya Technology Co Ltd Chip transporting machine table
US8432540B2 (en) * 2010-03-31 2013-04-30 Cooper S.K. Kuo Support mechanism for inspection systems
CN102680495B (zh) * 2011-03-15 2016-09-07 上海赫立电子科技有限公司 自动光学检测装置及方法
CN103534582A (zh) * 2011-05-10 2014-01-22 旭硝子株式会社 透光性板状体的微小缺陷的检查方法和透光性板状体的微小缺陷的检查装置
CN102621149B (zh) * 2012-03-21 2015-07-22 深圳市华星光电技术有限公司 基板的检测装置及方法
US20130248692A1 (en) * 2012-03-21 2013-09-26 Shenzhen China Star Optoelectronics Technology Co Ltd. Detecting apparatus and method for substrate
CN102636498B (zh) * 2012-03-22 2014-04-16 深圳市华星光电技术有限公司 玻璃基板的检测装置及检测方法
CN102866167A (zh) * 2012-10-19 2013-01-09 深圳市劲拓自动化设备股份有限公司 一种电路板离线检测系统和方法
CN104568973A (zh) * 2015-02-09 2015-04-29 京东方科技集团股份有限公司 一种基板检测装置及方法
CN105115979A (zh) * 2015-09-09 2015-12-02 苏州威盛视信息科技有限公司 基于图像拼接技术的pcb工作片aoi检测方法
JP6587211B2 (ja) * 2015-12-17 2019-10-09 日本電気硝子株式会社 ガラス板の製造方法
KR101751801B1 (ko) * 2016-05-18 2017-06-29 한국기계연구원 기판 결함 검사 장치 및 이를 이용한 검사 방법
CN106862097A (zh) * 2017-03-27 2017-06-20 江苏凯伦铝业有限公司 光伏组件铝边框全自动检测装置
FR3066821B1 (fr) * 2017-05-24 2019-07-12 Areva Np Dispositif de detection d'un defaut sur une surface par eclairage multidirectionnel
CN107843991A (zh) * 2017-09-05 2018-03-27 努比亚技术有限公司 屏幕漏光的检测方法、系统、终端及计算机可读存储介质
JP6795479B2 (ja) * 2017-09-25 2020-12-02 株式会社Ｓｃｒｅｅｎホールディングス 検査装置および検査方法
CN107526196A (zh) * 2017-09-27 2017-12-29 武汉华星光电技术有限公司 玻璃基板承载装置及检测设备
CN107907549A (zh) * 2017-11-13 2018-04-13 武汉华星光电半导体显示技术有限公司 基板检查设备及基板检查方法
JP2019158500A (ja) 2018-03-12 2019-09-19 オムロン株式会社 外観検査システム、画像処理装置、撮像装置および検査方法
KR102374037B1 (ko) * 2018-06-29 2022-03-11 캐논 톡키 가부시키가이샤 기판 검사 시스템, 전자 디바이스 제조 시스템, 기판 검사 방법, 및 전자 디바이스 제조 방법
CN110783223B (zh) * 2018-07-24 2024-04-16 泰克元有限公司 电子部件处理设备用拍摄装置
JP7246938B2 (ja) * 2019-01-18 2023-03-28 第一実業ビスウィル株式会社 検査装置
CN113945491A (zh) * 2021-09-01 2022-01-18 郑州旭飞光电科技有限公司 玻璃基板表面颗粒检测系统
CN114994062B (zh) * 2022-08-05 2023-03-14 深圳市倍捷锐生物医学科技有限公司 材料表面质量检测方法、系统及存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10300446A (ja) * 1997-04-30 1998-11-13 Nissan Motor Co Ltd 表面欠陥検査装置
JP2000039564A (ja) * 1998-07-24 2000-02-08 Sony Corp 拡大観察装置
JP4744665B2 (ja) * 2000-03-15 2011-08-10 オリンパス株式会社 基板検査装置及び基板検査システム
JP2003075294A (ja) * 2001-09-05 2003-03-12 Toray Ind Inc 基板の検査方法
CN100370243C (zh) * 2001-09-21 2008-02-20 奥林巴斯株式会社 缺陷检查装置
JP2003262593A (ja) * 2002-03-08 2003-09-19 Mitsubishi Rayon Co Ltd 欠陥検出装置及び欠陥検出方法
JP4243837B2 (ja) * 2003-03-14 2009-03-25 株式会社日立ハイテクノロジーズ 透明基板の表面検査方法及び検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190051031A (ko) * 2016-09-30 2019-05-14 상하이 마이크로 일렉트로닉스 이큅먼트(그룹) 컴퍼니 리미티드 패널에서 파티클을 검출하는 방법

Also Published As

Publication number Publication date
TW200909798A (en) 2009-03-01
CN101339143A (zh) 2009-01-07
JP2009014617A (ja) 2009-01-22

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PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20080701

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid