KR20070046790A - 광검출 장치 - Google Patents
광검출 장치 Download PDFInfo
- Publication number
- KR20070046790A KR20070046790A KR1020067027155A KR20067027155A KR20070046790A KR 20070046790 A KR20070046790 A KR 20070046790A KR 1020067027155 A KR1020067027155 A KR 1020067027155A KR 20067027155 A KR20067027155 A KR 20067027155A KR 20070046790 A KR20070046790 A KR 20070046790A
- Authority
- KR
- South Korea
- Prior art keywords
- output
- voltage value
- capacitor
- charge
- signal processor
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 131
- 238000000034 method Methods 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 238000009825 accumulation Methods 0.000 claims 1
- 230000000875 corresponding effect Effects 0.000 description 28
- 238000010586 diagram Methods 0.000 description 16
- 230000035945 sensitivity Effects 0.000 description 10
- 238000009792 diffusion process Methods 0.000 description 7
- 229920006395 saturated elastomer Polymers 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 230000003321 amplification Effects 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000005513 bias potential Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/766—Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004247183A JP4744828B2 (ja) | 2004-08-26 | 2004-08-26 | 光検出装置 |
JPJP-P-2004-00247183 | 2004-08-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20070046790A true KR20070046790A (ko) | 2007-05-03 |
Family
ID=35967378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020067027155A KR20070046790A (ko) | 2004-08-26 | 2005-08-15 | 광검출 장치 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7679663B2 (ja) |
EP (1) | EP1783467A1 (ja) |
JP (1) | JP4744828B2 (ja) |
KR (1) | KR20070046790A (ja) |
CN (1) | CN101023330B (ja) |
TW (1) | TW200619604A (ja) |
WO (1) | WO2006022163A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200122880A (ko) | 2019-04-19 | 2020-10-28 | 한화시스템 주식회사 | 레이저 탐색기 |
KR20200122879A (ko) | 2019-04-19 | 2020-10-28 | 한화시스템 주식회사 | 광 검출 장치 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5076416B2 (ja) * | 2006-09-14 | 2012-11-21 | 株式会社ニコン | 撮像素子および撮像装置 |
KR100830583B1 (ko) * | 2006-11-13 | 2008-05-22 | 삼성전자주식회사 | 듀얼 캡쳐가 가능한 씨모스 이미지 센서의 픽셀 회로 및그것의 구조 |
JP4719201B2 (ja) * | 2007-09-25 | 2011-07-06 | 浜松ホトニクス株式会社 | 固体撮像装置 |
JP5058057B2 (ja) * | 2008-04-24 | 2012-10-24 | 浜松ホトニクス株式会社 | 医療用x線撮像システム |
JP6334908B2 (ja) * | 2013-12-09 | 2018-05-30 | キヤノン株式会社 | 撮像装置及びその制御方法、及び撮像素子 |
JP2016139660A (ja) * | 2015-01-26 | 2016-08-04 | 株式会社東芝 | 固体撮像装置 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6338256A (ja) * | 1986-08-01 | 1988-02-18 | Nikon Corp | イメ−ジセンサ |
JPS6353968A (ja) * | 1986-08-22 | 1988-03-08 | Nikon Corp | イメ−ジセンサ |
JP3146502B2 (ja) | 1990-08-30 | 2001-03-19 | 富士電機株式会社 | フォトセンサ回路 |
JPH08256293A (ja) * | 1995-03-17 | 1996-10-01 | Fujitsu Ltd | 固体撮像素子及び固体撮像ユニット並びに撮像カメラ |
US6246436B1 (en) * | 1997-11-03 | 2001-06-12 | Agilent Technologies, Inc | Adjustable gain active pixel sensor |
US6008486A (en) * | 1997-12-31 | 1999-12-28 | Gentex Corporation | Wide dynamic range optical sensor |
JPH11274454A (ja) | 1998-03-19 | 1999-10-08 | Canon Inc | 固体撮像装置及びその形成方法 |
US6831691B1 (en) * | 1998-04-15 | 2004-12-14 | Minolta Co., Ltd. | Solid-state image pickup device |
US6078037A (en) * | 1998-04-16 | 2000-06-20 | Intel Corporation | Active pixel CMOS sensor with multiple storage capacitors |
JP2000023041A (ja) * | 1998-06-30 | 2000-01-21 | Toshiba Corp | 撮像装置 |
JP2000092395A (ja) * | 1998-09-11 | 2000-03-31 | Nec Corp | 固体撮像装置およびその駆動方法 |
JP3592106B2 (ja) * | 1998-11-27 | 2004-11-24 | キヤノン株式会社 | 固体撮像装置およびカメラ |
US6697114B1 (en) * | 1999-08-13 | 2004-02-24 | Foveon, Inc. | Triple slope pixel sensor and arry |
US7116366B1 (en) * | 1999-08-31 | 2006-10-03 | Micron Technology, Inc. | CMOS aps pixel sensor dynamic range increase |
US6882367B1 (en) * | 2000-02-29 | 2005-04-19 | Foveon, Inc. | High-sensitivity storage pixel sensor having auto-exposure detection |
JP2001285717A (ja) * | 2000-03-29 | 2001-10-12 | Toshiba Corp | 固体撮像装置 |
JP2002072963A (ja) * | 2000-06-12 | 2002-03-12 | Semiconductor Energy Lab Co Ltd | 発光モジュールおよびその駆動方法並びに光センサ |
US6809769B1 (en) * | 2000-06-22 | 2004-10-26 | Pixim, Inc. | Designs of digital pixel sensors |
AU2001276726A1 (en) * | 2000-08-03 | 2002-02-18 | Hamamatsu Photonics K.K. | Optical sensor |
JP3493405B2 (ja) * | 2000-08-31 | 2004-02-03 | ミノルタ株式会社 | 固体撮像装置 |
JP4628586B2 (ja) * | 2001-05-14 | 2011-02-09 | 浜松ホトニクス株式会社 | 光検出装置 |
JP3931606B2 (ja) * | 2001-09-20 | 2007-06-20 | ソニー株式会社 | 撮像装置およびノイズ除去方法 |
US6927796B2 (en) * | 2001-09-24 | 2005-08-09 | The Board Of Trustees Of The Leland Stanford Junior University | CMOS image sensor system with self-reset digital pixel architecture for improving SNR and dynamic range |
JP2005034511A (ja) | 2003-07-17 | 2005-02-10 | Inax Corp | 衣類乾燥装置 |
JP4268492B2 (ja) * | 2003-10-02 | 2009-05-27 | 浜松ホトニクス株式会社 | 光検出装置 |
-
2004
- 2004-08-26 JP JP2004247183A patent/JP4744828B2/ja not_active Expired - Fee Related
-
2005
- 2005-08-15 EP EP05780280A patent/EP1783467A1/en not_active Withdrawn
- 2005-08-15 KR KR1020067027155A patent/KR20070046790A/ko not_active Application Discontinuation
- 2005-08-15 WO PCT/JP2005/014910 patent/WO2006022163A1/ja active Application Filing
- 2005-08-15 CN CN2005800288022A patent/CN101023330B/zh not_active Expired - Fee Related
- 2005-08-24 TW TW094128988A patent/TW200619604A/zh not_active IP Right Cessation
- 2005-10-28 US US11/260,229 patent/US7679663B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200122880A (ko) | 2019-04-19 | 2020-10-28 | 한화시스템 주식회사 | 레이저 탐색기 |
KR20200122879A (ko) | 2019-04-19 | 2020-10-28 | 한화시스템 주식회사 | 광 검출 장치 |
Also Published As
Publication number | Publication date |
---|---|
TWI372240B (ja) | 2012-09-11 |
WO2006022163A1 (ja) | 2006-03-02 |
TW200619604A (en) | 2006-06-16 |
US20060109361A1 (en) | 2006-05-25 |
CN101023330A (zh) | 2007-08-22 |
US7679663B2 (en) | 2010-03-16 |
JP4744828B2 (ja) | 2011-08-10 |
EP1783467A1 (en) | 2007-05-09 |
JP2006064525A (ja) | 2006-03-09 |
CN101023330B (zh) | 2010-09-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E601 | Decision to refuse application |