TW200619604A - Photodetection apparatus - Google Patents

Photodetection apparatus

Info

Publication number
TW200619604A
TW200619604A TW094128988A TW94128988A TW200619604A TW 200619604 A TW200619604 A TW 200619604A TW 094128988 A TW094128988 A TW 094128988A TW 94128988 A TW94128988 A TW 94128988A TW 200619604 A TW200619604 A TW 200619604A
Authority
TW
Taiwan
Prior art keywords
capacitance section
transistor
electric charge
photodiode
transistors
Prior art date
Application number
TW094128988A
Other languages
English (en)
Other versions
TWI372240B (zh
Inventor
Yukinobu Sugiyama
Seiichiro Mizuno
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Publication of TW200619604A publication Critical patent/TW200619604A/zh
Application granted granted Critical
Publication of TWI372240B publication Critical patent/TWI372240B/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155Control of the image-sensor operation, e.g. image processing within the image-sensor
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50Control of the SSIS exposure
    • H04N25/57Control of the dynamic range
    • H04N25/59Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/766Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
TW094128988A 2004-08-26 2005-08-24 Photodetection apparatus TW200619604A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004247183A JP4744828B2 (ja) 2004-08-26 2004-08-26 光検出装置

Publications (2)

Publication Number Publication Date
TW200619604A true TW200619604A (en) 2006-06-16
TWI372240B TWI372240B (zh) 2012-09-11

Family

ID=35967378

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094128988A TW200619604A (en) 2004-08-26 2005-08-24 Photodetection apparatus

Country Status (7)

Country Link
US (1) US7679663B2 (zh)
EP (1) EP1783467A1 (zh)
JP (1) JP4744828B2 (zh)
KR (1) KR20070046790A (zh)
CN (1) CN101023330B (zh)
TW (1) TW200619604A (zh)
WO (1) WO2006022163A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5076416B2 (ja) * 2006-09-14 2012-11-21 株式会社ニコン 撮像素子および撮像装置
KR100830583B1 (ko) * 2006-11-13 2008-05-22 삼성전자주식회사 듀얼 캡쳐가 가능한 씨모스 이미지 센서의 픽셀 회로 및그것의 구조
JP4719201B2 (ja) * 2007-09-25 2011-07-06 浜松ホトニクス株式会社 固体撮像装置
JP5058057B2 (ja) * 2008-04-24 2012-10-24 浜松ホトニクス株式会社 医療用x線撮像システム
JP6334908B2 (ja) * 2013-12-09 2018-05-30 キヤノン株式会社 撮像装置及びその制御方法、及び撮像素子
JP2016139660A (ja) * 2015-01-26 2016-08-04 株式会社東芝 固体撮像装置
KR102207002B1 (ko) 2019-04-19 2021-01-25 한화시스템 주식회사 광 검출 장치
KR102219713B1 (ko) 2019-04-19 2021-02-24 한화시스템 주식회사 레이저 탐색기

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6338256A (ja) * 1986-08-01 1988-02-18 Nikon Corp イメ−ジセンサ
JPS6353968A (ja) * 1986-08-22 1988-03-08 Nikon Corp イメ−ジセンサ
JP3146502B2 (ja) 1990-08-30 2001-03-19 富士電機株式会社 フォトセンサ回路
JPH08256293A (ja) * 1995-03-17 1996-10-01 Fujitsu Ltd 固体撮像素子及び固体撮像ユニット並びに撮像カメラ
US6246436B1 (en) * 1997-11-03 2001-06-12 Agilent Technologies, Inc Adjustable gain active pixel sensor
US6008486A (en) * 1997-12-31 1999-12-28 Gentex Corporation Wide dynamic range optical sensor
JPH11274454A (ja) 1998-03-19 1999-10-08 Canon Inc 固体撮像装置及びその形成方法
US6831691B1 (en) * 1998-04-15 2004-12-14 Minolta Co., Ltd. Solid-state image pickup device
US6078037A (en) * 1998-04-16 2000-06-20 Intel Corporation Active pixel CMOS sensor with multiple storage capacitors
JP2000023041A (ja) * 1998-06-30 2000-01-21 Toshiba Corp 撮像装置
JP2000092395A (ja) * 1998-09-11 2000-03-31 Nec Corp 固体撮像装置およびその駆動方法
JP3592106B2 (ja) * 1998-11-27 2004-11-24 キヤノン株式会社 固体撮像装置およびカメラ
US6697114B1 (en) * 1999-08-13 2004-02-24 Foveon, Inc. Triple slope pixel sensor and arry
US7116366B1 (en) * 1999-08-31 2006-10-03 Micron Technology, Inc. CMOS aps pixel sensor dynamic range increase
US6882367B1 (en) * 2000-02-29 2005-04-19 Foveon, Inc. High-sensitivity storage pixel sensor having auto-exposure detection
JP2001285717A (ja) * 2000-03-29 2001-10-12 Toshiba Corp 固体撮像装置
JP2002072963A (ja) * 2000-06-12 2002-03-12 Semiconductor Energy Lab Co Ltd 発光モジュールおよびその駆動方法並びに光センサ
US6809769B1 (en) * 2000-06-22 2004-10-26 Pixim, Inc. Designs of digital pixel sensors
AU2001276726A1 (en) * 2000-08-03 2002-02-18 Hamamatsu Photonics K.K. Optical sensor
JP3493405B2 (ja) * 2000-08-31 2004-02-03 ミノルタ株式会社 固体撮像装置
JP4628586B2 (ja) * 2001-05-14 2011-02-09 浜松ホトニクス株式会社 光検出装置
JP3931606B2 (ja) * 2001-09-20 2007-06-20 ソニー株式会社 撮像装置およびノイズ除去方法
US6927796B2 (en) * 2001-09-24 2005-08-09 The Board Of Trustees Of The Leland Stanford Junior University CMOS image sensor system with self-reset digital pixel architecture for improving SNR and dynamic range
JP2005034511A (ja) 2003-07-17 2005-02-10 Inax Corp 衣類乾燥装置
JP4268492B2 (ja) * 2003-10-02 2009-05-27 浜松ホトニクス株式会社 光検出装置

Also Published As

Publication number Publication date
TWI372240B (zh) 2012-09-11
WO2006022163A1 (ja) 2006-03-02
KR20070046790A (ko) 2007-05-03
US20060109361A1 (en) 2006-05-25
CN101023330A (zh) 2007-08-22
US7679663B2 (en) 2010-03-16
JP4744828B2 (ja) 2011-08-10
EP1783467A1 (en) 2007-05-09
JP2006064525A (ja) 2006-03-09
CN101023330B (zh) 2010-09-29

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees