KR20070032960A - 마찰 저감용 롤러 글라이드를 포함한 리프트 핀 - Google Patents

마찰 저감용 롤러 글라이드를 포함한 리프트 핀 Download PDF

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Publication number
KR20070032960A
KR20070032960A KR1020067027409A KR20067027409A KR20070032960A KR 20070032960 A KR20070032960 A KR 20070032960A KR 1020067027409 A KR1020067027409 A KR 1020067027409A KR 20067027409 A KR20067027409 A KR 20067027409A KR 20070032960 A KR20070032960 A KR 20070032960A
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KR
South Korea
Prior art keywords
pin
pin assembly
ball
substrate
lift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020067027409A
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English (en)
Korean (ko)
Inventor
로렝 두보스트
실바인 헤르난데즈
한스 예거
카린 랜드리
베르트랑 바이넬
유진 자포디뉴
자끄 슈미트
레두앙 엘 부히키
Original Assignee
오씨 외를리콘 발처스 악티엔게젤샤프트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오씨 외를리콘 발처스 악티엔게젤샤프트 filed Critical 오씨 외를리콘 발처스 악티엔게젤샤프트
Publication of KR20070032960A publication Critical patent/KR20070032960A/ko
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582—Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Liquid Crystal (AREA)
  • Motorcycle And Bicycle Frame (AREA)
  • User Interface Of Digital Computer (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
KR1020067027409A 2004-05-28 2005-05-26 마찰 저감용 롤러 글라이드를 포함한 리프트 핀 Withdrawn KR20070032960A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US57515804P 2004-05-28 2004-05-28
US60/575,158 2004-05-28
PCT/CH2005/000299 WO2005117097A1 (en) 2004-05-28 2005-05-26 Lift pin with roller glide for reducing friction

Publications (1)

Publication Number Publication Date
KR20070032960A true KR20070032960A (ko) 2007-03-23

Family

ID=34968080

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067027409A Withdrawn KR20070032960A (ko) 2004-05-28 2005-05-26 마찰 저감용 롤러 글라이드를 포함한 리프트 핀

Country Status (9)

Country Link
US (1) US20060016398A1 (enExample)
EP (1) EP1754254B1 (enExample)
JP (1) JP4777345B2 (enExample)
KR (1) KR20070032960A (enExample)
AT (1) ATE397288T1 (enExample)
DE (1) DE602005007217D1 (enExample)
ES (1) ES2304174T3 (enExample)
TW (1) TWI393799B (enExample)
WO (1) WO2005117097A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100945178B1 (ko) * 2008-04-24 2010-03-03 이옥기 이송장치용 부싱
WO2010086796A3 (en) * 2009-01-29 2010-11-04 Lam Research Corporation Pin lifting system
KR101404009B1 (ko) * 2007-12-21 2014-06-13 주성엔지니어링(주) 리프트 핀 어셈블리
KR101432152B1 (ko) * 2012-11-13 2014-08-22 삼성디스플레이 주식회사 기판 지지 모듈

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* Cited by examiner, † Cited by third party
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US8033245B2 (en) * 2004-02-12 2011-10-11 Applied Materials, Inc. Substrate support bushing
JP2007207807A (ja) * 2006-01-31 2007-08-16 Hitachi Kokusai Electric Inc 試料位置決め装置
JP4855097B2 (ja) * 2006-02-14 2012-01-18 株式會社塩山製作所 半導体チップ分離装置
WO2011009007A2 (en) * 2009-07-15 2011-01-20 Applied Materials, Inc. Improved lift pin guides
JP5549441B2 (ja) * 2010-01-14 2014-07-16 東京エレクトロン株式会社 保持体機構、ロードロック装置、処理装置及び搬送機構
KR101053565B1 (ko) * 2010-10-11 2011-08-03 (주) 에스디시 승강 핀 가이드
US9371584B2 (en) * 2011-03-09 2016-06-21 Applied Materials, Inc. Processing chamber and method for centering a substrate therein
WO2012157638A1 (ja) * 2011-05-19 2012-11-22 シャープ株式会社 基板載置台および基板処理装置
KR101549854B1 (ko) * 2011-10-20 2015-09-03 어플라이드 머티어리얼스, 인코포레이티드 기판 지지 부싱
CN105039934A (zh) * 2015-09-15 2015-11-11 京东方科技集团股份有限公司 滚轮套筒
KR101764418B1 (ko) 2016-01-06 2017-08-02 (주)신산이엔지 기판 열처리용 내열 지지유닛
US10998219B2 (en) * 2016-06-13 2021-05-04 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer support device and method for removing lift pin therefrom
CN111971785B (zh) * 2018-03-27 2024-07-12 Vat控股公司 具有用于容纳和放开支撑销的联接装置的销提升装置
CN111029236A (zh) * 2018-10-09 2020-04-17 北京北方华创微电子装备有限公司 支撑装置及反应腔室
JP7147527B2 (ja) 2018-12-10 2022-10-05 トヨタ自動車株式会社 支援装置、支援方法およびプログラム
US20220406645A1 (en) * 2019-11-22 2022-12-22 Lam Research Corporation Coin-slot and ball-lock ceramic lift pin holders
CN113764328B (zh) 2020-06-02 2024-06-21 拓荆科技股份有限公司 用于加工晶圆的装置及方法
DE102020120732A1 (de) * 2020-08-06 2022-02-10 Vat Holding Ag Stifthubvorrichtung

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US3887247A (en) * 1974-02-25 1975-06-03 Us Energy Bearing mounting for telescoping tubes
JP3249765B2 (ja) * 1997-05-07 2002-01-21 東京エレクトロン株式会社 基板処理装置
JP3028462B2 (ja) * 1995-05-12 2000-04-04 東京エレクトロン株式会社 熱処理装置
JP3354367B2 (ja) * 1995-12-19 2002-12-09 大日本スクリーン製造株式会社 基板洗浄装置
JP3940190B2 (ja) * 1996-09-30 2007-07-04 松下電器産業株式会社 真空処理装置
US5672010A (en) * 1996-11-18 1997-09-30 Macnicol; Allan E. Linear slide bearing apparatus
US5848670A (en) * 1996-12-04 1998-12-15 Applied Materials, Inc. Lift pin guidance apparatus
JP3456890B2 (ja) * 1998-01-16 2003-10-14 東京エレクトロン株式会社 基板処理装置
JPH11351250A (ja) * 1998-06-12 1999-12-24 Sony Corp ベアリング装置
JP3398936B2 (ja) * 1999-04-09 2003-04-21 日本エー・エス・エム株式会社 半導体処理装置
JP4402763B2 (ja) * 1999-05-13 2010-01-20 Ｓｕｍｃｏ Ｔｅｃｈｘｉｖ株式会社 エピタキシャルウェーハ製造装置
JP2001093960A (ja) * 1999-09-22 2001-04-06 Hitachi Techno Eng Co Ltd 処理装置用ウエファ位置決め装置
US6958098B2 (en) * 2000-02-28 2005-10-25 Applied Materials, Inc. Semiconductor wafer support lift-pin assembly
US20030072639A1 (en) * 2001-10-17 2003-04-17 Applied Materials, Inc. Substrate support
JP4111703B2 (ja) * 2001-10-19 2008-07-02 アプライド マテリアルズ インコーポレイテッド ウエハリフト機構
JP2003197719A (ja) * 2001-12-21 2003-07-11 Komatsu Electronic Metals Co Ltd 半導体製造装置および基板支持構造
JP2004026365A (ja) * 2002-06-24 2004-01-29 Dainippon Printing Co Ltd 作業台
DE10232478A1 (de) * 2002-07-17 2004-02-12 Infineon Technologies Ag Waferhubvorrichtung
US6887317B2 (en) * 2002-09-10 2005-05-03 Applied Materials, Inc. Reduced friction lift pin
JP4175988B2 (ja) * 2002-10-25 2008-11-05 東京エレクトロン株式会社 基板アライメント装置及び基板処理装置及び基板搬送装置
US8033245B2 (en) * 2004-02-12 2011-10-11 Applied Materials, Inc. Substrate support bushing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101404009B1 (ko) * 2007-12-21 2014-06-13 주성엔지니어링(주) 리프트 핀 어셈블리
KR100945178B1 (ko) * 2008-04-24 2010-03-03 이옥기 이송장치용 부싱
WO2010086796A3 (en) * 2009-01-29 2010-11-04 Lam Research Corporation Pin lifting system
KR101432152B1 (ko) * 2012-11-13 2014-08-22 삼성디스플레이 주식회사 기판 지지 모듈

Also Published As

Publication number Publication date
US20060016398A1 (en) 2006-01-26
JP2008500709A (ja) 2008-01-10
ES2304174T3 (es) 2008-09-16
WO2005117097A1 (en) 2005-12-08
DE602005007217D1 (de) 2008-07-10
JP4777345B2 (ja) 2011-09-21
TWI393799B (zh) 2013-04-21
EP1754254B1 (en) 2008-05-28
ATE397288T1 (de) 2008-06-15
TW200624587A (en) 2006-07-16
EP1754254A1 (en) 2007-02-21

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20061227

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid