KR102475056B1 - 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트 - Google Patents

결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트 Download PDF

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KR102475056B1
KR102475056B1 KR1020180023836A KR20180023836A KR102475056B1 KR 102475056 B1 KR102475056 B1 KR 102475056B1 KR 1020180023836 A KR1020180023836 A KR 1020180023836A KR 20180023836 A KR20180023836 A KR 20180023836A KR 102475056 B1 KR102475056 B1 KR 102475056B1
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defect
printing
pattern
film
marking
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KR20180101210A (ko
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게이타 이무라
데츠시 고시노
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스미또모 가가꾸 가부시키가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8874—Taking dimensions of defect into account
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

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  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Making Paper Articles (AREA)
KR1020180023836A 2017-03-03 2018-02-27 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트 Active KR102475056B1 (ko)

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JP2017040931 2017-03-03
JPJP-P-2017-040931 2017-03-03

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KR20180101210A KR20180101210A (ko) 2018-09-12
KR102475056B1 true KR102475056B1 (ko) 2022-12-06

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JP (1) JP6978963B2 (enrdf_load_stackoverflow)
KR (1) KR102475056B1 (enrdf_load_stackoverflow)
CN (1) CN108535259B (enrdf_load_stackoverflow)
TW (1) TWI766952B (enrdf_load_stackoverflow)

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WO2021117273A1 (ja) * 2019-12-10 2021-06-17 日東電工株式会社 長尺光学積層体の検査方法及び検査システム
JPWO2022107756A1 (enrdf_load_stackoverflow) * 2020-11-18 2022-05-27
JP7330253B2 (ja) * 2020-12-08 2023-08-21 住友化学株式会社 マーク付き光学積層体、及び、マーク付き光学積層体の製造方法
JP7594917B2 (ja) * 2021-01-08 2024-12-05 日東電工株式会社 光学積層フィルムの検査方法及びフィルム製品の製造方法
CN114604678A (zh) * 2022-03-11 2022-06-10 凌云光技术股份有限公司 一种消除缺陷定位误差的方法

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JP2016176836A (ja) * 2015-03-20 2016-10-06 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法

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JP2006071560A (ja) * 2004-09-03 2006-03-16 Fuji Photo Film Co Ltd 光ファイバの欠陥検出装置
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JP2007192660A (ja) * 2006-01-19 2007-08-02 Fujifilm Corp フイルムの表面欠陥検出方法及び検出機
JP2014224763A (ja) * 2013-05-16 2014-12-04 住友化学株式会社 欠陥検査システム
JP2016176836A (ja) * 2015-03-20 2016-10-06 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法

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JP2018146580A (ja) 2018-09-20
CN108535259B (zh) 2022-05-06
TW201837456A (zh) 2018-10-16
CN108535259A (zh) 2018-09-14
JP6978963B2 (ja) 2021-12-08
KR20180101210A (ko) 2018-09-12
TWI766952B (zh) 2022-06-11

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