KR102335853B1 - 수지 몰드 금형 및 수지 몰드 방법 - Google Patents
수지 몰드 금형 및 수지 몰드 방법 Download PDFInfo
- Publication number
- KR102335853B1 KR102335853B1 KR1020167019898A KR20167019898A KR102335853B1 KR 102335853 B1 KR102335853 B1 KR 102335853B1 KR 1020167019898 A KR1020167019898 A KR 1020167019898A KR 20167019898 A KR20167019898 A KR 20167019898A KR 102335853 B1 KR102335853 B1 KR 102335853B1
- Authority
- KR
- South Korea
- Prior art keywords
- elastic body
- resin
- cavity
- mounting component
- mold
- Prior art date
Links
- 229920005989 resin Polymers 0.000 title claims abstract description 182
- 239000011347 resin Substances 0.000 title claims abstract description 182
- 238000000034 method Methods 0.000 title claims description 23
- 238000000465 moulding Methods 0.000 title claims description 19
- 239000002184 metal Substances 0.000 claims abstract description 43
- 229910052751 metal Inorganic materials 0.000 claims abstract description 43
- 238000003825 pressing Methods 0.000 claims abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 20
- 239000010408 film Substances 0.000 description 29
- 239000000758 substrate Substances 0.000 description 24
- 239000004020 conductor Substances 0.000 description 23
- 239000004065 semiconductor Substances 0.000 description 20
- 239000000463 material Substances 0.000 description 9
- 230000007246 mechanism Effects 0.000 description 7
- 239000004696 Poly ether ether ketone Substances 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 229920002530 polyetherether ketone Polymers 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000007493 shaping process Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920006351 engineering plastic Polymers 0.000 description 2
- 229920001973 fluoroelastomer Polymers 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 229920001328 Polyvinylidene chloride Polymers 0.000 description 1
- 235000002597 Solanum melongena Nutrition 0.000 description 1
- 244000061458 Solanum melongena Species 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000007610 electrostatic coating method Methods 0.000 description 1
- 229920000840 ethylene tetrafluoroethylene copolymer Polymers 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229920009441 perflouroethylene propylene Polymers 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- -1 polypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000005033 polyvinylidene chloride Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14065—Positioning or centering articles in the mould
- B29C2045/14098—Positioning or centering articles in the mould fixing or clamping inserts having variable dimensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
- H01L23/3128—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014004448 | 2014-01-14 | ||
JPJP-P-2014-004448 | 2014-01-14 | ||
PCT/JP2014/079747 WO2015107758A1 (ja) | 2014-01-14 | 2014-11-10 | 樹脂モールド金型および樹脂モールド方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160106614A KR20160106614A (ko) | 2016-09-12 |
KR102335853B1 true KR102335853B1 (ko) | 2021-12-07 |
Family
ID=53542662
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020167019898A KR102335853B1 (ko) | 2014-01-14 | 2014-11-10 | 수지 몰드 금형 및 수지 몰드 방법 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6422447B2 (zh) |
KR (1) | KR102335853B1 (zh) |
CN (1) | CN105917451B (zh) |
TW (1) | TWI645952B (zh) |
WO (1) | WO2015107758A1 (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9911700B2 (en) * | 2016-01-26 | 2018-03-06 | Zhuhai Advanced Chip Carriers & Electronic Substrate Solutions Technologies Co. Ltd. | Embedded packages |
TWI585904B (zh) * | 2016-04-22 | 2017-06-01 | 矽品精密工業股份有限公司 | 電子封裝件及基板結構 |
JP6423399B2 (ja) * | 2016-09-27 | 2018-11-14 | アピックヤマダ株式会社 | 樹脂成形方法、フィルム搬送装置および樹脂成形装置 |
JP2019083276A (ja) * | 2017-10-31 | 2019-05-30 | エムテックスマツムラ株式会社 | 半導体素子パッケージの製造方法 |
US11227810B2 (en) * | 2017-11-10 | 2022-01-18 | Shindengen Electric Manufacturing Co., Ltd. | Electronic module with a groove and press hole on the surface of a conductor |
DE102017131110A1 (de) * | 2017-12-22 | 2019-06-27 | Osram Opto Semiconductors Gmbh | Verfahren zum einbetten von optoelektronischen bauelementen in eine schicht |
CN108761876A (zh) * | 2018-05-21 | 2018-11-06 | 武汉华星光电半导体显示技术有限公司 | 显示组件制造装置及方法、显示组件 |
US10950818B2 (en) | 2018-05-21 | 2021-03-16 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Apparatus and method for manufacturing display assembly |
NL2021145B1 (en) * | 2018-06-18 | 2020-01-06 | Besi Netherlands Bv | Mould for encapsulating electronic components, insert for such a mould, method for producing an insert and method for encapsulating electronic components |
CN108831839B (zh) * | 2018-06-22 | 2020-03-24 | 苏州震坤科技有限公司 | 一种去除半导体塑封制程中所产生毛边的方法 |
CN111952205B (zh) * | 2020-03-26 | 2022-04-19 | 神盾股份有限公司 | 模块化模具及使用其制作指纹感测模块的方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004128303A (ja) | 2002-10-04 | 2004-04-22 | Towa Corp | アンダーフィル樹脂モールド基板及び個片とアンダーフィル樹脂モールド方法及び金型 |
JP2006027082A (ja) * | 2004-07-16 | 2006-02-02 | Towa Corp | 半導体素子の樹脂封止成形方法 |
JP2007505491A (ja) * | 2003-09-09 | 2007-03-08 | フィーコ ビー.ブイ. | 可撓性圧力素子を用いて電子部品をカプセル封入する方法および装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4268389B2 (ja) * | 2002-09-06 | 2009-05-27 | Towa株式会社 | 電子部品の樹脂封止成形方法及び装置 |
JP5084829B2 (ja) * | 2007-06-28 | 2012-11-28 | パナソニック株式会社 | 半導体素子の実装構造体の製造方法、半導体素子の実装方法、及び加圧ツール |
JP2009124012A (ja) * | 2007-11-16 | 2009-06-04 | Towa Corp | 電子部品の圧縮成形方法及び金型 |
JP5185069B2 (ja) | 2008-10-31 | 2013-04-17 | アピックヤマダ株式会社 | トランスファモールド金型およびトランスファモールド装置とこれを用いた樹脂成形方法 |
JP5906528B2 (ja) * | 2011-07-29 | 2016-04-20 | アピックヤマダ株式会社 | モールド金型及びこれを用いた樹脂モールド装置 |
-
2014
- 2014-11-10 JP JP2015557719A patent/JP6422447B2/ja active Active
- 2014-11-10 CN CN201480073241.7A patent/CN105917451B/zh active Active
- 2014-11-10 WO PCT/JP2014/079747 patent/WO2015107758A1/ja active Application Filing
- 2014-11-10 KR KR1020167019898A patent/KR102335853B1/ko active IP Right Grant
- 2014-11-28 TW TW103141309A patent/TWI645952B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004128303A (ja) | 2002-10-04 | 2004-04-22 | Towa Corp | アンダーフィル樹脂モールド基板及び個片とアンダーフィル樹脂モールド方法及び金型 |
JP2007505491A (ja) * | 2003-09-09 | 2007-03-08 | フィーコ ビー.ブイ. | 可撓性圧力素子を用いて電子部品をカプセル封入する方法および装置 |
JP2006027082A (ja) * | 2004-07-16 | 2006-02-02 | Towa Corp | 半導体素子の樹脂封止成形方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20160106614A (ko) | 2016-09-12 |
CN105917451A (zh) | 2016-08-31 |
CN105917451B (zh) | 2018-07-06 |
TWI645952B (zh) | 2019-01-01 |
WO2015107758A1 (ja) | 2015-07-23 |
JP6422447B2 (ja) | 2018-11-14 |
JPWO2015107758A1 (ja) | 2017-03-23 |
TW201532774A (zh) | 2015-09-01 |
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