KR101894965B1 - 프로브 핀 및 ic 소켓 - Google Patents

프로브 핀 및 ic 소켓 Download PDF

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Publication number
KR101894965B1
KR101894965B1 KR1020167031384A KR20167031384A KR101894965B1 KR 101894965 B1 KR101894965 B1 KR 101894965B1 KR 1020167031384 A KR1020167031384 A KR 1020167031384A KR 20167031384 A KR20167031384 A KR 20167031384A KR 101894965 B1 KR101894965 B1 KR 101894965B1
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KR
South Korea
Prior art keywords
coil spring
movable member
slit
arm
auxiliary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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KR1020167031384A
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English (en)
Korean (ko)
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KR20170020314A (ko
Inventor
마사후미 오쿠마
Original Assignee
주식회사 오킨스전자
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 오킨스전자 filed Critical 주식회사 오킨스전자
Priority claimed from PCT/JP2015/061171 external-priority patent/WO2015163160A1/ja
Publication of KR20170020314A publication Critical patent/KR20170020314A/ko
Application granted granted Critical
Publication of KR101894965B1 publication Critical patent/KR101894965B1/ko
Active legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020167031384A 2014-04-21 2015-04-09 프로브 핀 및 ic 소켓 Active KR101894965B1 (ko)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP2014087081 2014-04-21
JPJP-P-2014-087081 2014-04-21
JPJP-P-2014-195895 2014-09-25
JP2014195895A JP2015215328A (ja) 2014-04-21 2014-09-25 プローブピンおよびｉｃソケット
JP2014195894A JP6442668B2 (ja) 2014-04-21 2014-09-25 プローブピンおよびｉｃソケット
JPJP-P-2014-195894 2014-09-25
PCT/JP2015/061171 WO2015163160A1 (ja) 2014-04-21 2015-04-09 プローブピンおよびｉｃソケット

Publications (2)

Publication Number Publication Date
KR20170020314A KR20170020314A (ko) 2017-02-22
KR101894965B1 true KR101894965B1 (ko) 2018-09-05

Family

ID=54752325

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167031384A Active KR101894965B1 (ko) 2014-04-21 2015-04-09 프로브 핀 및 ic 소켓

Country Status (2)

Country Link
JP (2) JP2015215328A (enrdf_load_stackoverflow)
KR (1) KR101894965B1 (enrdf_load_stackoverflow)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6837283B2 (ja) 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
KR101819191B1 (ko) * 2016-07-20 2018-01-16 주식회사 마이크로컨텍솔루션 컨택트 프로브
JP7021874B2 (ja) * 2017-06-28 2022-02-17 株式会社ヨコオ コンタクトプローブ及び検査治具
JP7024275B2 (ja) * 2017-09-19 2022-02-24 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP7141796B2 (ja) * 2018-09-26 2022-09-26 株式会社エンプラス コンタクトピン及びソケット
JP6837513B2 (ja) * 2019-05-07 2021-03-03 株式会社ヨコオ ソケット
JP7130247B2 (ja) * 2019-05-31 2022-09-05 共進電機株式会社 プローブ及び太陽電池セル用測定装置
KR102182784B1 (ko) * 2019-05-31 2020-11-25 주식회사 오킨스전자 Ｍｅｍｓ 켈빈 스프링 핀, 및 이를 이용한 켈빈 테스트 소켓
KR102162476B1 (ko) * 2019-07-18 2020-10-06 박상량 단일 몸체의 하우징으로 구성되는 고성능 반도체 테스트 소켓
KR102147699B1 (ko) * 2020-04-29 2020-08-26 (주)피티앤케이 프로브 핀 및 이의 제조 방법
KR102456449B1 (ko) * 2020-08-11 2022-10-20 리노공업주식회사 검사 프로브
KR102202827B1 (ko) * 2020-10-27 2021-01-14 (주) 네스텍코리아 프로브 핀 및 이를 적용한 동축 프로브 조립체

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003307542A (ja) 2002-02-18 2003-10-31 Tokyo Cosmos Electric Co Ltd Ｉｃソケット
JP4089976B2 (ja) 2004-05-17 2008-05-28 リーノ アイエヌディー．インコーポレイテッド 大電流用プローブ
JP5858781B2 (ja) 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
JP6011103B2 (ja) 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3326095B2 (ja) * 1996-12-27 2002-09-17 日本発条株式会社 導電性接触子
JP2007048576A (ja) * 2005-08-09 2007-02-22 Yamaichi Electronics Co Ltd アダプタソケット
JP5067790B2 (ja) * 2007-04-27 2012-11-07 センサータ テクノロジーズ マサチューセッツ インコーポレーテッド プローブピンおよびそれを用いたソケット
CN101669034A (zh) * 2007-04-27 2010-03-10 日本发条株式会社 导电性接触器
JP4900843B2 (ja) * 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
JP5624746B2 (ja) 2009-10-23 2014-11-12 株式会社ヨコオ コンタクトプローブ及びソケット
KR101154519B1 (ko) * 2010-05-27 2012-06-13 하이콘 주식회사 스프링 콘택트 구조
JP5503477B2 (ja) 2010-09-13 2014-05-28 シチズンセイミツ株式会社 コンタクトプローブ及びこれを用いた電子回路試験装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003307542A (ja) 2002-02-18 2003-10-31 Tokyo Cosmos Electric Co Ltd Ｉｃソケット
JP4089976B2 (ja) 2004-05-17 2008-05-28 リーノ アイエヌディー．インコーポレイテッド 大電流用プローブ
JP5858781B2 (ja) 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
JP6011103B2 (ja) 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット

Also Published As

Publication number Publication date
JP6442668B2 (ja) 2018-12-26
KR20170020314A (ko) 2017-02-22
JP2015215327A (ja) 2015-12-03
JP2015215328A (ja) 2015-12-03

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