KR101788352B1 - 처리액 공급 장치의 운전 방법, 처리액 공급 장치 및 기억 매체 - Google Patents
처리액 공급 장치의 운전 방법, 처리액 공급 장치 및 기억 매체 Download PDFInfo
- Publication number
- KR101788352B1 KR101788352B1 KR1020130091329A KR20130091329A KR101788352B1 KR 101788352 B1 KR101788352 B1 KR 101788352B1 KR 1020130091329 A KR1020130091329 A KR 1020130091329A KR 20130091329 A KR20130091329 A KR 20130091329A KR 101788352 B1 KR101788352 B1 KR 101788352B1
- Authority
- KR
- South Korea
- Prior art keywords
- treatment liquid
- liquid
- filter unit
- filter
- liquid supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D19/00—Degasification of liquids
- B01D19/0031—Degasification of liquids by filtration
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D19/00—Degasification of liquids
- B01D19/0036—Flash degasification
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D36/00—Filter circuits or combinations of filters with other separating devices
- B01D36/001—Filters in combination with devices for the removal of gas, air purge systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Coating Apparatus (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012173299A JP5910401B2 (ja) | 2012-08-03 | 2012-08-03 | 処理液供給装置の運転方法、処理液供給装置及び記憶媒体 |
| JPJP-P-2012-173299 | 2012-08-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20140018130A KR20140018130A (ko) | 2014-02-12 |
| KR101788352B1 true KR101788352B1 (ko) | 2017-10-19 |
Family
ID=50024448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130091329A Active KR101788352B1 (ko) | 2012-08-03 | 2013-08-01 | 처리액 공급 장치의 운전 방법, 처리액 공급 장치 및 기억 매체 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9508574B2 (enExample) |
| JP (1) | JP5910401B2 (enExample) |
| KR (1) | KR101788352B1 (enExample) |
| CN (1) | CN103567110B (enExample) |
| TW (1) | TWI544971B (enExample) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6010457B2 (ja) * | 2012-12-28 | 2016-10-19 | 東京エレクトロン株式会社 | 液処理装置および薬液回収方法 |
| CN104979236B (zh) * | 2014-04-11 | 2017-09-26 | 沈阳芯源微电子设备有限公司 | 一种化学液供给装置及其供给方法 |
| PT3137768T (pt) * | 2014-04-30 | 2021-01-19 | Anthony George Hurter | Aparelho e processo de purificação com água supercrítica de óleo combustível usado |
| CN106463357B (zh) | 2014-05-15 | 2019-06-28 | 东京毅力科创株式会社 | 增加光致抗蚀剂分配系统中再循环和过滤的方法和设备 |
| KR102320180B1 (ko) * | 2014-05-30 | 2021-11-03 | 세메스 주식회사 | 필터 유닛 및 그것을 갖는 약액 공급 장치 |
| JP6330624B2 (ja) * | 2014-11-04 | 2018-05-30 | 東京エレクトロン株式会社 | 処理液供給装置及び処理液供給装置の洗浄方法 |
| JP6222118B2 (ja) * | 2015-01-09 | 2017-11-01 | 東京エレクトロン株式会社 | 処理液濾過装置、薬液供給装置及び処理液濾過方法並びに記憶媒体 |
| JP6319117B2 (ja) * | 2015-01-26 | 2018-05-09 | 東京エレクトロン株式会社 | 処理液供給装置、処理液供給方法及び記憶媒体 |
| JP6425669B2 (ja) * | 2015-03-31 | 2018-11-21 | 東京エレクトロン株式会社 | 処理液供給方法、読み取り可能なコンピュータ記憶媒体及び処理液供給装置 |
| US10121685B2 (en) * | 2015-03-31 | 2018-11-06 | Tokyo Electron Limited | Treatment solution supply method, non-transitory computer-readable storage medium, and treatment solution supply apparatus |
| JP5991403B2 (ja) * | 2015-04-21 | 2016-09-14 | 東京エレクトロン株式会社 | フィルタウエッティング方法、フィルタウエッティング装置及び記憶媒体 |
| KR20170010454A (ko) | 2015-06-30 | 2017-02-01 | 세메스 주식회사 | 기포 제거 유닛 및 이를 포함하는 기판 처리 장치 |
| JP6252926B1 (ja) * | 2016-07-29 | 2017-12-27 | パナソニックIpマネジメント株式会社 | 微細気泡洗浄装置及び微細気泡洗浄方法 |
| CN109564861B (zh) * | 2016-07-29 | 2019-12-13 | 松下知识产权经营株式会社 | 微气泡清洗装置和微气泡清洗方法 |
| JP6803701B2 (ja) * | 2016-08-23 | 2020-12-23 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び記録媒体 |
| JP6966260B2 (ja) * | 2017-08-30 | 2021-11-10 | 株式会社Screenホールディングス | ポンプ装置、処理液供給装置および基板処理装置 |
| US11273396B2 (en) * | 2018-08-31 | 2022-03-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Liquid supply system with improved bubble venting capacity |
| KR20200126552A (ko) * | 2019-04-30 | 2020-11-09 | 삼성전자주식회사 | 다중 필터들을 가진 레지스트 필터링 시스템 및 레지스트 코팅 설비 |
| CN112999701B (zh) * | 2019-12-20 | 2023-08-11 | 台湾积体电路制造股份有限公司 | 用于从粘性流体去除气泡的设备 |
| TW202135914A (zh) * | 2020-02-05 | 2021-10-01 | 日商東京威力科創股份有限公司 | 過濾器洗淨系統及過濾器洗淨方法 |
| US20210245077A1 (en) | 2020-02-12 | 2021-08-12 | Tokyo Electron Limited | Vacuum Assisted Filtration |
| KR102548294B1 (ko) * | 2020-04-24 | 2023-06-28 | 세메스 주식회사 | 액 공급 유닛, 기판 처리 장치 및 액 처리 방법 |
| US11446585B2 (en) * | 2020-06-08 | 2022-09-20 | Hamilton Sundstrand Corporation | Grooved porous media gas trap for terrestrial and microgravity environment |
| US12194394B2 (en) | 2020-10-23 | 2025-01-14 | Lg Energy Solution, Ltd. | Electrode insulation liquid supply apparatus and electrode insulation liquid supply method |
| KR102798399B1 (ko) * | 2020-10-23 | 2025-04-23 | 주식회사 엘지에너지솔루션 | 전극 절연액 공급장치 및 전극 절연액 공급방법 |
| JP7510334B2 (ja) * | 2020-10-30 | 2024-07-03 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP7628450B2 (ja) * | 2021-03-24 | 2025-02-10 | 株式会社Screenホールディングス | 基板処理装置および配管着脱パーツ洗浄方法 |
| CN118391236A (zh) * | 2024-06-28 | 2024-07-26 | 宁波润华全芯微电子设备有限公司 | 一种光刻胶恒压泵 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000120530A (ja) * | 1998-10-13 | 2000-04-25 | Koganei Corp | 薬液供給方法および薬液供給装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0237228B2 (ja) * | 1982-08-06 | 1990-08-23 | Mitsubishi Electric Corp | Goseijushinoganshinhoho |
| JPH04196517A (ja) | 1990-11-28 | 1992-07-16 | Tokyo Electron Ltd | 液体処理方法 |
| JP3301213B2 (ja) * | 1994-04-13 | 2002-07-15 | ミツミ電機株式会社 | 薬液交換時期判定方法 |
| US6418942B1 (en) * | 2000-03-10 | 2002-07-16 | Donald Gray | Solvent and aqueous decompression processing system |
| JP3706294B2 (ja) * | 2000-03-27 | 2005-10-12 | 東京エレクトロン株式会社 | 処理液供給装置及び処理液供給方法 |
| JP4205318B2 (ja) * | 2001-05-23 | 2009-01-07 | 富士フイルム株式会社 | 送液流路における濾材処理方法 |
| JP3947398B2 (ja) * | 2001-12-28 | 2007-07-18 | 株式会社コガネイ | 薬液供給装置および薬液供給方法 |
| EP1874446A1 (en) * | 2005-04-25 | 2008-01-09 | Entegris, Inc. | Method and apparatus for treating fluids to reduce microbubbles |
| KR100772844B1 (ko) * | 2005-11-30 | 2007-11-02 | 삼성전자주식회사 | 반도체 제조설비의 감광액 공급장치 |
| US7967978B2 (en) * | 2006-12-11 | 2011-06-28 | International Business Machines Corporation | Method and apparatus for filter conditioning |
| JP4683008B2 (ja) * | 2007-04-04 | 2011-05-11 | 株式会社デンソー | 燃料噴射ノズルの噴孔内への皮膜形成方法 |
| JP4879253B2 (ja) * | 2008-12-04 | 2012-02-22 | 東京エレクトロン株式会社 | 処理液供給装置 |
| JP2011230367A (ja) | 2010-04-27 | 2011-11-17 | Canon Inc | 液体供給構造および該構造を用いる液体吐出ヘッド |
-
2012
- 2012-08-03 JP JP2012173299A patent/JP5910401B2/ja active Active
-
2013
- 2013-07-31 TW TW102127452A patent/TWI544971B/zh active
- 2013-08-01 KR KR1020130091329A patent/KR101788352B1/ko active Active
- 2013-08-01 US US13/956,507 patent/US9508574B2/en active Active
- 2013-08-02 CN CN201310334130.4A patent/CN103567110B/zh active Active
-
2016
- 2016-10-28 US US15/336,856 patent/US9576829B1/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000120530A (ja) * | 1998-10-13 | 2000-04-25 | Koganei Corp | 薬液供給方法および薬液供給装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US9508574B2 (en) | 2016-11-29 |
| KR20140018130A (ko) | 2014-02-12 |
| JP5910401B2 (ja) | 2016-04-27 |
| CN103567110B (zh) | 2017-08-11 |
| US9576829B1 (en) | 2017-02-21 |
| JP2014033111A (ja) | 2014-02-20 |
| CN103567110A (zh) | 2014-02-12 |
| TW201420209A (zh) | 2014-06-01 |
| TWI544971B (zh) | 2016-08-11 |
| US20170043287A1 (en) | 2017-02-16 |
| US20140034584A1 (en) | 2014-02-06 |
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