KR101756904B1 - 광학 필름 첩부 위치 측정 장치 - Google Patents

광학 필름 첩부 위치 측정 장치 Download PDF

Info

Publication number
KR101756904B1
KR101756904B1 KR1020150034962A KR20150034962A KR101756904B1 KR 101756904 B1 KR101756904 B1 KR 101756904B1 KR 1020150034962 A KR1020150034962 A KR 1020150034962A KR 20150034962 A KR20150034962 A KR 20150034962A KR 101756904 B1 KR101756904 B1 KR 101756904B1
Authority
KR
South Korea
Prior art keywords
optical film
optical
display device
position measuring
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020150034962A
Other languages
English (en)
Korean (ko)
Other versions
KR20160018328A (ko
Inventor
토모카즈 유라
사토루 고시오
Original Assignee
닛토덴코 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 닛토덴코 가부시키가이샤 filed Critical 닛토덴코 가부시키가이샤
Publication of KR20160018328A publication Critical patent/KR20160018328A/ko
Application granted granted Critical
Publication of KR101756904B1 publication Critical patent/KR101756904B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mathematical Physics (AREA)
KR1020150034962A 2014-08-07 2015-03-13 광학 필름 첩부 위치 측정 장치 Active KR101756904B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201420442537.9 2014-08-07
CN201420442537.9U CN204128496U (zh) 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线

Publications (2)

Publication Number Publication Date
KR20160018328A KR20160018328A (ko) 2016-02-17
KR101756904B1 true KR101756904B1 (ko) 2017-07-11

Family

ID=52384845

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020150034962A Active KR101756904B1 (ko) 2014-08-07 2015-03-13 광학 필름 첩부 위치 측정 장치

Country Status (5)

Country Link
JP (1) JP5924511B2 (enrdf_load_stackoverflow)
KR (1) KR101756904B1 (enrdf_load_stackoverflow)
CN (1) CN204128496U (enrdf_load_stackoverflow)
TW (1) TWI592715B (enrdf_load_stackoverflow)
WO (1) WO2016021463A1 (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
WO2018003578A1 (ja) * 2016-06-30 2018-01-04 日本電産サンキョー株式会社 アライメント装置
TWI745129B (zh) * 2020-10-20 2021-11-01 住華科技股份有限公司 光學膜偵測系統及應用其之光學膜偵測方法
JP2022090281A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
JP2022090247A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
CN112596286B (zh) * 2020-12-15 2022-11-04 滁州惠科光电科技有限公司 一种偏光片检测方法、装置及偏光片贴附机
CN114111607B (zh) * 2021-09-30 2024-01-23 杭州徐睿机械有限公司 一种跳转接头压装组件间隙的检测装置及检测方法
CN114505813B (zh) * 2022-01-19 2023-05-05 业成科技（成都）有限公司 贴合装置及贴合方法
CN116176100A (zh) * 2022-12-22 2023-05-30 成都瑞波科材料科技有限公司 一种用于贴合光学膜片的贴膜设备及贴膜方法
TWI880689B (zh) * 2023-03-29 2025-04-11 日商芝浦機械電子裝置股份有限公司 黏附裝置及檢查方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005165097A (ja) 2003-12-04 2005-06-23 Yamatake Corp 偏光板貼り付け位置検査装置
JP2006126483A (ja) 2004-10-28 2006-05-18 Sharp Corp 液晶表示パネルの製造方法および液晶表示パネルの製造装置
JP2007212939A (ja) 2006-02-13 2007-08-23 Hitachi High-Technologies Corp 位置ずれ検査方法、プログラム及び位置ずれ検査装置
WO2013174112A1 (zh) 2012-05-22 2013-11-28 北京京东方光电科技有限公司 偏光板贴附精度检测装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3948522B2 (ja) 2003-01-30 2007-07-25 株式会社タカトリ 液晶パネルの偏光板貼付け精度検査方法
KR100955486B1 (ko) * 2004-01-30 2010-04-30 삼성전자주식회사 디스플레이 패널의 검사장치 및 검사방법
JP4774123B1 (ja) 2010-03-18 2011-09-14 住友化学株式会社 偏光板の貼合精度検査方法および貼合精度検査装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005165097A (ja) 2003-12-04 2005-06-23 Yamatake Corp 偏光板貼り付け位置検査装置
JP2006126483A (ja) 2004-10-28 2006-05-18 Sharp Corp 液晶表示パネルの製造方法および液晶表示パネルの製造装置
JP2007212939A (ja) 2006-02-13 2007-08-23 Hitachi High-Technologies Corp 位置ずれ検査方法、プログラム及び位置ずれ検査装置
WO2013174112A1 (zh) 2012-05-22 2013-11-28 北京京东方光电科技有限公司 偏光板贴附精度检测装置及方法

Also Published As

Publication number Publication date
JP2016038565A (ja) 2016-03-22
TW201606382A (zh) 2016-02-16
WO2016021463A1 (ja) 2016-02-11
TWI592715B (zh) 2017-07-21
KR20160018328A (ko) 2016-02-17
JP5924511B2 (ja) 2016-05-25
CN204128496U (zh) 2015-01-28

Similar Documents

Publication Publication Date Title
KR101756904B1 (ko) 광학 필름 첩부 위치 측정 장치
CN101051619B (zh) 基板检查装置及使用其的基板检查方法
TWI542867B (zh) 用於檢測基板之邊緣部之設備
WO2017173757A1 (zh) 一种矫正摄像头平行度和距离的定位装置及其方法
KR101775458B1 (ko) 곡면 모델 디스플레이 정렬 상태 검사 시스템 및 곡면 모델 디스플레이 정렬 상태 검사 방법
CN102749334A (zh) 基板检查装置、基板检查方法及基板检查装置的调整方法
JP2016038565A5 (enrdf_load_stackoverflow)
CN110398198B (zh) 柔性显示板检查用夹具及利用其的检查装置
CN105450912B (zh) 扫描法面阵ccd探测器实时视场拼接方法
KR20110078958A (ko) 엘시디 패널 외관 검사장치
TW201333445A (zh) 檢查裝置及光學部材貼合體之製造裝置
CN104136969B (zh) 三维液晶显示装置的制造装置以及制造方法
CN104696900A (zh) 光源装置及对位标记照相识别系统
CN107677219A (zh) 一种平面平行度测量装置及测量方法
TW201509679A (zh) 薄膜貼合裝置、光學顯示設備之生產系統及光學顯示設備之生產方法
TWI528018B (zh) 貼片機檢測裝置
JP2014095617A (ja) パターン測定装置およびパターン測定方法
TWI637165B (zh) 視覺檢測模組及包含該模組的元件檢測系統
CN110018582A (zh) 光学显示面板连续检查方法和装置、连续制造方法和系统
TWM477571U (zh) 一種用以擷取一物件影像的擷取裝置以及影像檢測裝置
JP2013083884A (ja) 露光装置
KR20140087585A (ko) 편광 필름 검사 장치
KR101995289B1 (ko) 이물질 검출 방법
TW201732276A (zh) 視覺檢查模組、視覺檢查模組的焦距修正模組以及具有該模組的元件檢查系統
WO2014199776A1 (ja) 光制御フィルムの検査装置および光制御フィルムの製造装置

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20150313

PG1501 Laying open of application
A201 Request for examination
A302 Request for accelerated examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20161220

Comment text: Request for Examination of Application

Patent event code: PA02011R01I

Patent event date: 20150313

Comment text: Patent Application

PA0302 Request for accelerated examination

Patent event date: 20161220

Patent event code: PA03022R01D

Comment text: Request for Accelerated Examination

Patent event date: 20150313

Patent event code: PA03021R01I

Comment text: Patent Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20161230

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20170530

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20170705

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20170706

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20210621

Start annual number: 5

End annual number: 5

PR1001 Payment of annual fee

Payment date: 20220620

Start annual number: 6

End annual number: 6

PR1001 Payment of annual fee

Payment date: 20230619

Start annual number: 7

End annual number: 7

PR1001 Payment of annual fee

Payment date: 20240605

Start annual number: 8

End annual number: 8