TWI592715B - 光學膜黏貼位置測定裝置 - Google Patents
光學膜黏貼位置測定裝置 Download PDFInfo
- Publication number
- TWI592715B TWI592715B TW104105056A TW104105056A TWI592715B TW I592715 B TWI592715 B TW I592715B TW 104105056 A TW104105056 A TW 104105056A TW 104105056 A TW104105056 A TW 104105056A TW I592715 B TWI592715 B TW I592715B
- Authority
- TW
- Taiwan
- Prior art keywords
- optical film
- optical
- display device
- position measuring
- measuring device
- Prior art date
Links
- 239000012788 optical film Substances 0.000 title claims description 197
- 230000003287 optical effect Effects 0.000 claims description 85
- 239000010408 film Substances 0.000 claims description 33
- 238000004519 manufacturing process Methods 0.000 claims description 32
- 239000011159 matrix material Substances 0.000 claims description 16
- 238000003384 imaging method Methods 0.000 claims description 8
- 238000009792 diffusion process Methods 0.000 claims description 5
- 239000000853 adhesive Substances 0.000 claims description 2
- 230000001070 adhesive effect Effects 0.000 claims description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 99
- 210000002858 crystal cell Anatomy 0.000 description 24
- 238000005259 measurement Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000005286 illumination Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Mathematical Physics (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420442537.9U CN204128496U (zh) | 2014-08-07 | 2014-08-07 | 光学膜贴合位置测定装置及光学显示装置生产线 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201606382A TW201606382A (zh) | 2016-02-16 |
| TWI592715B true TWI592715B (zh) | 2017-07-21 |
Family
ID=52384845
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104105056A TWI592715B (zh) | 2014-08-07 | 2015-02-13 | 光學膜黏貼位置測定裝置 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP5924511B2 (enrdf_load_stackoverflow) |
| KR (1) | KR101756904B1 (enrdf_load_stackoverflow) |
| CN (1) | CN204128496U (enrdf_load_stackoverflow) |
| TW (1) | TWI592715B (enrdf_load_stackoverflow) |
| WO (1) | WO2016021463A1 (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI880689B (zh) * | 2023-03-29 | 2025-04-11 | 日商芝浦機械電子裝置股份有限公司 | 黏附裝置及檢查方法 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101955757B1 (ko) * | 2016-06-08 | 2019-03-07 | 삼성에스디아이 주식회사 | 필름 처리장치 및 처리방법 |
| WO2018003578A1 (ja) * | 2016-06-30 | 2018-01-04 | 日本電産サンキョー株式会社 | アライメント装置 |
| TWI745129B (zh) * | 2020-10-20 | 2021-11-01 | 住華科技股份有限公司 | 光學膜偵測系統及應用其之光學膜偵測方法 |
| JP2022090281A (ja) * | 2020-12-07 | 2022-06-17 | 日東電工株式会社 | 光学フィルムの縁部検出方法 |
| JP2022090247A (ja) * | 2020-12-07 | 2022-06-17 | 日東電工株式会社 | 光学フィルムの縁部検出方法 |
| CN112596286B (zh) * | 2020-12-15 | 2022-11-04 | 滁州惠科光电科技有限公司 | 一种偏光片检测方法、装置及偏光片贴附机 |
| CN114111607B (zh) * | 2021-09-30 | 2024-01-23 | 杭州徐睿机械有限公司 | 一种跳转接头压装组件间隙的检测装置及检测方法 |
| CN114505813B (zh) * | 2022-01-19 | 2023-05-05 | 业成科技（成都）有限公司 | 贴合装置及贴合方法 |
| CN116176100A (zh) * | 2022-12-22 | 2023-05-30 | 成都瑞波科材料科技有限公司 | 一种用于贴合光学膜片的贴膜设备及贴膜方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3948522B2 (ja) | 2003-01-30 | 2007-07-25 | 株式会社タカトリ | 液晶パネルの偏光板貼付け精度検査方法 |
| JP4197488B2 (ja) * | 2003-12-04 | 2008-12-17 | 株式会社山武 | 偏光板貼り付け位置検査装置 |
| KR100955486B1 (ko) * | 2004-01-30 | 2010-04-30 | 삼성전자주식회사 | 디스플레이 패널의 검사장치 및 검사방법 |
| JP2006126483A (ja) | 2004-10-28 | 2006-05-18 | Sharp Corp | 液晶表示パネルの製造方法および液晶表示パネルの製造装置 |
| JP2007212939A (ja) * | 2006-02-13 | 2007-08-23 | Hitachi High-Technologies Corp | 位置ずれ検査方法、プログラム及び位置ずれ検査装置 |
| JP4774123B1 (ja) | 2010-03-18 | 2011-09-14 | 住友化学株式会社 | 偏光板の貼合精度検査方法および貼合精度検査装置 |
| CN102736280A (zh) * | 2012-05-22 | 2012-10-17 | 北京京东方光电科技有限公司 | 偏光板贴附精度检测装置及方法 |
-
2014
- 2014-08-07 CN CN201420442537.9U patent/CN204128496U/zh not_active Expired - Lifetime
-
2015
- 2015-01-13 JP JP2015004179A patent/JP5924511B2/ja active Active
- 2015-02-13 TW TW104105056A patent/TWI592715B/zh active
- 2015-03-13 KR KR1020150034962A patent/KR101756904B1/ko active Active
- 2015-07-29 WO PCT/JP2015/071515 patent/WO2016021463A1/ja active Application Filing
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI880689B (zh) * | 2023-03-29 | 2025-04-11 | 日商芝浦機械電子裝置股份有限公司 | 黏附裝置及檢查方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016038565A (ja) | 2016-03-22 |
| TW201606382A (zh) | 2016-02-16 |
| KR101756904B1 (ko) | 2017-07-11 |
| WO2016021463A1 (ja) | 2016-02-11 |
| KR20160018328A (ko) | 2016-02-17 |
| JP5924511B2 (ja) | 2016-05-25 |
| CN204128496U (zh) | 2015-01-28 |
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