KR101697216B1 - 판유리의 검사 유닛 및 제조 설비 - Google Patents

판유리의 검사 유닛 및 제조 설비 Download PDF

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Publication number
KR101697216B1
KR101697216B1 KR1020157005839A KR20157005839A KR101697216B1 KR 101697216 B1 KR101697216 B1 KR 101697216B1 KR 1020157005839 A KR1020157005839 A KR 1020157005839A KR 20157005839 A KR20157005839 A KR 20157005839A KR 101697216 B1 KR101697216 B1 KR 101697216B1
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plate glass
inspection apparatus
inspecting
inspection
orthogonal
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KR20150038608A (ko
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타카노리 키리토시
마코토 사토
케이지 츠지타
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카와사키 주코교 카부시키 카이샤
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

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  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020157005839A 2012-08-13 2012-08-13 판유리의 검사 유닛 및 제조 설비 Active KR101697216B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/005145 WO2014027375A1 (ja) 2012-08-13 2012-08-13 板ガラスの検査ユニット及び製造設備

Publications (2)

Publication Number Publication Date
KR20150038608A KR20150038608A (ko) 2015-04-08
KR101697216B1 true KR101697216B1 (ko) 2017-01-17

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KR1020157005839A Active KR101697216B1 (ko) 2012-08-13 2012-08-13 판유리의 검사 유닛 및 제조 설비

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JP (1) JP5923172B2 (enExample)
KR (1) KR101697216B1 (enExample)
CN (2) CN103591897B (enExample)
IN (1) IN2015KN00605A (enExample)
TW (1) TWI486578B (enExample)
WO (1) WO2014027375A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101697216B1 (ko) * 2012-08-13 2017-01-17 카와사키 주코교 카부시키 카이샤 판유리의 검사 유닛 및 제조 설비
JP2017032523A (ja) * 2015-08-06 2017-02-09 株式会社オハラ 光学ガラス母材欠陥検査装置及び光学ガラス母材欠陥検査方法
CN110431406B (zh) * 2017-02-28 2022-04-01 东洋玻璃株式会社 容器的检查装置和容器的检查方法
CN109746188A (zh) * 2017-11-01 2019-05-14 湖南海擎智能科技有限责任公司 流水线玻璃板厚度检测系统
CN108106996B (zh) * 2017-12-25 2024-05-28 通彩智能科技集团有限公司 一种玻璃检测盛放平台
CN108287167A (zh) * 2018-01-04 2018-07-17 芜湖东旭光电科技有限公司 液晶玻璃边缘检测方法和装置
CN108716935A (zh) * 2018-08-27 2018-10-30 陈富威 汽车挡风玻璃检测设备
CN109580659A (zh) * 2018-10-23 2019-04-05 彩虹(合肥)液晶玻璃有限公司 一种玻璃检测系统及玻璃生产系统
CN109406538B (zh) * 2018-12-27 2024-09-27 银河水滴科技(北京)有限公司 手机外观检测系统
CN112782197A (zh) * 2021-01-06 2021-05-11 蚌埠凯盛工程技术有限公司 退火窑炸板在线监测装置
JP7742039B2 (ja) * 2021-12-03 2025-09-19 日本電気硝子株式会社 ガラス物品の製造方法
KR20240116702A (ko) * 2021-12-03 2024-07-30 니폰 덴키 가라스 가부시키가이샤 투명체의 측정 방법 및 측정기 및 유리판의 제조 방법
CN117553701B (zh) * 2024-01-12 2024-03-22 山东晟昌新材料有限公司 一种木质板材翘曲的在线检测装置及方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300663A (ja) * 2005-04-19 2006-11-02 Asahi Glass Co Ltd 欠点検出システム
JP2008536127A (ja) * 2005-04-06 2008-09-04 コーニング インコーポレイテッド ガラス検査装置及びその使用方法

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JP2585594Y2 (ja) * 1993-03-10 1998-11-18 株式会社イナックス 表面凹凸検査システム
JP3746433B2 (ja) * 2001-03-02 2006-02-15 日本板硝子株式会社 ガラス製品の製造方法及び製造装置
JP2003098122A (ja) * 2001-09-21 2003-04-03 Toshiba Ceramics Co Ltd ガラス基板の外観検査装置
JP4626982B2 (ja) * 2005-02-10 2011-02-09 セントラル硝子株式会社 ガラス板の端面の欠陥検出装置および検出方法
JP4628964B2 (ja) * 2005-04-26 2011-02-09 大日本スクリーン製造株式会社 基板処理装置
DE102005050882B4 (de) * 2005-10-21 2008-04-30 Isra Vision Systems Ag System und Verfahren zur optischen Inspektion von Glasscheiben
JP2007205724A (ja) * 2006-01-30 2007-08-16 Central Glass Co Ltd ガラス基板の形状測定装置および測定方法
JP2008076171A (ja) * 2006-09-20 2008-04-03 Olympus Corp 基板検査装置
JP5169194B2 (ja) * 2006-12-14 2013-03-27 日本電気硝子株式会社 板ガラス欠陥検出装置、板ガラスの製造方法
JP4964176B2 (ja) * 2008-03-13 2012-06-27 AvanStrate株式会社 ガラス板の厚さ測定装置およびガラス板の厚さ測定方法
JP2010019834A (ja) * 2008-06-13 2010-01-28 Nippon Electric Glass Co Ltd 板ガラス欠陥検査装置及びフラットパネルディスプレイ用板ガラスの製造方法
JP5596925B2 (ja) 2009-01-20 2014-09-24 株式会社山梨技術工房 異物検査装置及び検査方法
JP2011227049A (ja) * 2010-03-31 2011-11-10 Asahi Glass Co Ltd 光透過性矩形板状物の端面検査方法及び端面検査装置
JP2012007993A (ja) 2010-06-24 2012-01-12 Asahi Glass Co Ltd 板状透明体の欠陥検査装置及びその方法
CN102445168A (zh) * 2010-09-30 2012-05-09 旭硝子株式会社 表面形状的检查方法及检查装置
KR101170928B1 (ko) * 2010-11-05 2012-08-03 (주)미래컴퍼니 기판 검사 장치 및 기판 검사 방법
KR101697216B1 (ko) * 2012-08-13 2017-01-17 카와사키 주코교 카부시키 카이샤 판유리의 검사 유닛 및 제조 설비

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008536127A (ja) * 2005-04-06 2008-09-04 コーニング インコーポレイテッド ガラス検査装置及びその使用方法
JP2006300663A (ja) * 2005-04-19 2006-11-02 Asahi Glass Co Ltd 欠点検出システム

Also Published As

Publication number Publication date
JP5923172B2 (ja) 2016-05-24
JPWO2014027375A1 (ja) 2016-07-25
TWI486578B (zh) 2015-06-01
CN103591897B (zh) 2016-06-29
IN2015KN00605A (enExample) 2015-07-17
CN103591897A (zh) 2014-02-19
CN203396363U (zh) 2014-01-15
KR20150038608A (ko) 2015-04-08
TW201407152A (zh) 2014-02-16
WO2014027375A1 (ja) 2014-02-20

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