KR101487550B1 - 마스크 블랭크의 제조 방법 및 포토마스크의 제조 방법 - Google Patents
마스크 블랭크의 제조 방법 및 포토마스크의 제조 방법 Download PDFInfo
- Publication number
- KR101487550B1 KR101487550B1 KR20080054946A KR20080054946A KR101487550B1 KR 101487550 B1 KR101487550 B1 KR 101487550B1 KR 20080054946 A KR20080054946 A KR 20080054946A KR 20080054946 A KR20080054946 A KR 20080054946A KR 101487550 B1 KR101487550 B1 KR 101487550B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- contact
- resist solution
- application nozzle
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007155937A JP5073375B2 (ja) | 2007-06-13 | 2007-06-13 | マスクブランクの製造方法及びフォトマスクの製造方法 |
| JPJP-P-2007-00155937 | 2007-06-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080109650A KR20080109650A (ko) | 2008-12-17 |
| KR101487550B1 true KR101487550B1 (ko) | 2015-02-26 |
Family
ID=40238700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR20080054946A Active KR101487550B1 (ko) | 2007-06-13 | 2008-06-12 | 마스크 블랭크의 제조 방법 및 포토마스크의 제조 방법 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP5073375B2 (enExample) |
| KR (1) | KR101487550B1 (enExample) |
| CN (1) | CN101419398B (enExample) |
| MY (1) | MY150117A (enExample) |
| TW (1) | TWI439803B (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5086714B2 (ja) * | 2007-07-13 | 2012-11-28 | Hoya株式会社 | マスクブランクの製造方法及びフォトマスクの製造方法 |
| JP2011013321A (ja) * | 2009-06-30 | 2011-01-20 | Hoya Corp | フォトマスクブランクの製造方法、フォトマスクの製造方法及び塗布装置 |
| JP6659422B2 (ja) * | 2016-03-29 | 2020-03-04 | アルバック成膜株式会社 | 塗布装置、マスクブランクの製造方法 |
| CN114082602A (zh) * | 2021-11-30 | 2022-02-25 | Tcl华星光电技术有限公司 | 涂胶机构以及涂胶装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003112098A (ja) | 2001-10-01 | 2003-04-15 | Tokyo Electron Ltd | 処理装置 |
| KR20060044880A (ko) * | 2004-03-30 | 2006-05-16 | 호야 가부시키가이샤 | 레지스트막 부착 기판의 제조 방법 |
| KR20060050987A (ko) * | 2004-09-06 | 2006-05-19 | 동경 엘렉트론 주식회사 | 기판 처리 장치 및 기판 위치 결정 장치 |
| KR20070017228A (ko) * | 2003-07-17 | 2007-02-08 | 호야 가부시키가이샤 | 레지스트막 부착 기판의 제조방법 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4445985A1 (de) * | 1994-12-22 | 1996-06-27 | Steag Micro Tech Gmbh | Verfahren und Vorrichtung zur Belackung oder Beschichtung eines Substrats |
| JP2000343015A (ja) * | 1999-06-08 | 2000-12-12 | Dainippon Screen Mfg Co Ltd | 塗布装置 |
| JP3252325B2 (ja) * | 1999-10-29 | 2002-02-04 | 株式会社ヒラノテクシード | 塗工方法及び塗工装置 |
| JP2005051220A (ja) * | 2003-07-17 | 2005-02-24 | Hoya Corp | レジスト膜付基板の製造方法 |
| JP2005246274A (ja) * | 2004-03-05 | 2005-09-15 | Nidek Co Ltd | 塗工方法及び塗工装置 |
| JP4673157B2 (ja) * | 2004-10-01 | 2011-04-20 | 株式会社ヒラノテクシード | 塗工装置 |
| JP2006269599A (ja) * | 2005-03-23 | 2006-10-05 | Sony Corp | パターン形成方法、有機電界効果型トランジスタの製造方法、及び、フレキシブルプリント回路板の製造方法 |
-
2007
- 2007-06-13 JP JP2007155937A patent/JP5073375B2/ja active Active
-
2008
- 2008-06-12 KR KR20080054946A patent/KR101487550B1/ko active Active
- 2008-06-12 TW TW097121869A patent/TWI439803B/zh active
- 2008-06-12 MY MYPI20082068A patent/MY150117A/en unknown
- 2008-06-12 CN CN2008101778611A patent/CN101419398B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003112098A (ja) | 2001-10-01 | 2003-04-15 | Tokyo Electron Ltd | 処理装置 |
| KR20070017228A (ko) * | 2003-07-17 | 2007-02-08 | 호야 가부시키가이샤 | 레지스트막 부착 기판의 제조방법 |
| KR20060044880A (ko) * | 2004-03-30 | 2006-05-16 | 호야 가부시키가이샤 | 레지스트막 부착 기판의 제조 방법 |
| KR20060050987A (ko) * | 2004-09-06 | 2006-05-19 | 동경 엘렉트론 주식회사 | 기판 처리 장치 및 기판 위치 결정 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101419398B (zh) | 2012-06-20 |
| JP5073375B2 (ja) | 2012-11-14 |
| CN101419398A (zh) | 2009-04-29 |
| JP2008311327A (ja) | 2008-12-25 |
| TW200912518A (en) | 2009-03-16 |
| KR20080109650A (ko) | 2008-12-17 |
| TWI439803B (zh) | 2014-06-01 |
| MY150117A (en) | 2013-11-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5111015B2 (ja) | 感光性有機物及びその塗布方法並びにこれを用いた有機膜パターンの形成方法及びこの有機膜を有する表示装置 | |
| KR101097519B1 (ko) | 도포액 도포장치 및 이를 이용한 도포막의 형성방법 | |
| KR0128813B1 (ko) | 액도포 방법 및 도포장치 | |
| KR101487550B1 (ko) | 마스크 블랭크의 제조 방법 및 포토마스크의 제조 방법 | |
| WO2013071663A1 (zh) | Tft-lcd用液晶配向膜的涂布方法 | |
| US8647703B2 (en) | Apparatus and method for coating photoresist | |
| JP5329837B2 (ja) | 塗布装置および塗布方法 | |
| KR20080100776A (ko) | 마스크 블랭크의 제조 방법 및 포토마스크의 제조 방법 | |
| KR20110001945A (ko) | 포토마스크 블랭크의 제조 방법, 포토마스크의 제조 방법 및 도포 장치 | |
| KR101412912B1 (ko) | 마스크 블랭크의 제조 방법 및 포토 마스크의 제조 방법 | |
| JP2008283098A (ja) | マスクブランクの製造方法及びフォトマスクの製造方法 | |
| TWI276474B (en) | Manufacturing method for substrates with resist films | |
| TWI313194B (en) | Coating film forming method | |
| JP5086714B2 (ja) | マスクブランクの製造方法及びフォトマスクの製造方法 | |
| JP5338071B2 (ja) | 塗布方法および塗布装置並びに液晶ディスプレイ用部材の製造方法 | |
| KR101309037B1 (ko) | 슬릿코터 | |
| JP6659422B2 (ja) | 塗布装置、マスクブランクの製造方法 | |
| TWI787551B (zh) | 塗布裝置及塗布方法 | |
| JP4569357B2 (ja) | 予備吐出装置 | |
| JP2020202228A (ja) | マスクブランクの製造方法、塗布装置 | |
| JP4934892B2 (ja) | 塗布装置および塗布方法 | |
| CN114721187A (zh) | 配向膜的制作方法及液晶显示面板 | |
| KR20040069486A (ko) | 유리기판의 코팅방법 | |
| JPH08141463A (ja) | 基板への塗布液塗布装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| E14-X000 | Pre-grant third party observation filed |
St.27 status event code: A-2-3-E10-E14-opp-X000 |
|
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| FPAY | Annual fee payment |
Payment date: 20180104 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| FPAY | Annual fee payment |
Payment date: 20200107 Year of fee payment: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |