KR101015749B1 - 비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 - Google Patents
비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 Download PDFInfo
- Publication number
- KR101015749B1 KR101015749B1 KR1020057012830A KR20057012830A KR101015749B1 KR 101015749 B1 KR101015749 B1 KR 101015749B1 KR 1020057012830 A KR1020057012830 A KR 1020057012830A KR 20057012830 A KR20057012830 A KR 20057012830A KR 101015749 B1 KR101015749 B1 KR 101015749B1
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- Prior art keywords
- window frame
- flange
- semiconductor package
- ceramic based
- die
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
- H01L23/047—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads being parallel to the base
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/36—Mechanical coupling means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
- H01L23/057—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads being parallel to the base
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3675—Cooling facilitated by shape of device characterised by the shape of the housing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
Claims (15)
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 반도체 패키지로서,열 싱크 플랜지(a heat sink flange)와, 상기 열 싱크 플랜지 상에 장착된 비-세라믹 기반의 전기적 절연 물질의 윈도우 프레임, 및 상기 윈도우 프레임 상에 장착된 리드(lead)를 포함하되,상기 윈도우 프레임은 섬유로 충진되는 PTFE(polytetrafluoroethylene)의 매트릭스로 구성되고 금속으로 피복되며(clad),상기 금속 피복은 니켈 또는 금 또는 니켈 및 금으로 도금되고, 상기 윈도우 프레임은 납땜(braze) 또는 땜납(solder) 또는 접착 물질을 이용하여 상기 플랜지 및 상기 리드에 납땜되는반도체 패키지.
- 제 10 항에 있어서,상기 윈도우 프레임은 구리로 피복되며, 상기 플랜지와 상기 리드 중 적어도 하나는 상기 윈도우 프레임의 구리 피복의 일부를 포함하는반도체 패키지.
- 삭제
- 삭제
- 삭제
- 제 10 항에 있어서,상기 윈도우 프레임은 용융점을 갖는 금과 게르마늄의 땜납(gold/germanium solder)을 이용하여 상기 플랜지에 접합되며,상기 반도체 패키지는상기 금과 게르마늄의 땜납의 용융점보다 낮은 용융점을 갖는 금과 주석의 혼합물(gold/tin mixture)을 이용하여 상기 플랜지에 접합되는 다이를 더 포함하는반도체 패키지.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/339,834 US7298046B2 (en) | 2003-01-10 | 2003-01-10 | Semiconductor package having non-ceramic based window frame |
US10/339,834 | 2003-01-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050105168A KR20050105168A (ko) | 2005-11-03 |
KR101015749B1 true KR101015749B1 (ko) | 2011-02-22 |
Family
ID=32711185
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020057012830A KR101015749B1 (ko) | 2003-01-10 | 2004-01-09 | 비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 |
Country Status (10)
Country | Link |
---|---|
US (2) | US7298046B2 (ko) |
EP (1) | EP1584101B1 (ko) |
JP (1) | JP4466645B2 (ko) |
KR (1) | KR101015749B1 (ko) |
CN (1) | CN101080800B (ko) |
AT (1) | ATE515053T1 (ko) |
CA (1) | CA2512845C (ko) |
HK (1) | HK1082591A1 (ko) |
IL (1) | IL169543A (ko) |
WO (1) | WO2004064120A2 (ko) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070175660A1 (en) * | 2006-01-27 | 2007-08-02 | Yeung Betty H | Warpage-reducing packaging design |
DE602006001393D1 (de) * | 2006-03-06 | 2008-07-17 | Umicore Ag & Co Kg | Zusammensetzung zur Befestigung von Hochleistungshalbleiter |
US20080006204A1 (en) * | 2006-07-06 | 2008-01-10 | General Electric Company | Corrosion resistant wafer processing apparatus and method for making thereof |
US20080016684A1 (en) * | 2006-07-06 | 2008-01-24 | General Electric Company | Corrosion resistant wafer processing apparatus and method for making thereof |
US7961470B2 (en) * | 2006-07-19 | 2011-06-14 | Infineon Technologies Ag | Power amplifier |
US7952188B2 (en) * | 2007-01-08 | 2011-05-31 | Infineon Technologies Ag | Semiconductor module with a dielectric layer including a fluorocarbon compound on a chip |
CN101399237B (zh) * | 2008-10-24 | 2010-06-02 | 江阴市赛英电子有限公司 | 全压接快速散热型陶瓷外壳 |
US20100139885A1 (en) * | 2008-12-09 | 2010-06-10 | Renewable Thermodynamics, Llc | Sintered diamond heat exchanger apparatus |
WO2011119891A2 (en) * | 2010-03-25 | 2011-09-29 | Anwar Abdul Mohammed | High performance low cost open air cavity ceramic power packages for high temperature die attach processes |
US8907467B2 (en) | 2012-03-28 | 2014-12-09 | Infineon Technologies Ag | PCB based RF-power package window frame |
JP5885690B2 (ja) | 2012-04-27 | 2016-03-15 | キヤノン株式会社 | 電子部品および電子機器 |
JP6296687B2 (ja) | 2012-04-27 | 2018-03-20 | キヤノン株式会社 | 電子部品、電子モジュールおよびこれらの製造方法。 |
EP2757582A1 (en) * | 2013-01-17 | 2014-07-23 | Nxp B.V. | Packaged electrical components |
US9879722B2 (en) * | 2013-03-11 | 2018-01-30 | Bell Helicopter Textron Inc. | Low shear modulus transition shim for elastomeric bearing bonding in torsional applications |
US20160071777A1 (en) * | 2013-03-28 | 2016-03-10 | Panasonic Intellectual Property Management Co., Ltd. | Semiconductor package and semiconductor device |
US10468399B2 (en) | 2015-03-31 | 2019-11-05 | Cree, Inc. | Multi-cavity package having single metal flange |
US9629246B2 (en) | 2015-07-28 | 2017-04-18 | Infineon Technologies Ag | PCB based semiconductor package having integrated electrical functionality |
US9997476B2 (en) | 2015-10-30 | 2018-06-12 | Infineon Technologies Ag | Multi-die package having different types of semiconductor dies attached to the same thermally conductive flange |
US10225922B2 (en) | 2016-02-18 | 2019-03-05 | Cree, Inc. | PCB based semiconductor package with impedance matching network elements integrated therein |
US10332847B2 (en) * | 2017-06-01 | 2019-06-25 | Infineon Technologies Ag | Semiconductor package with integrated harmonic termination feature |
CN109037161A (zh) * | 2018-06-15 | 2018-12-18 | 华为技术有限公司 | 一种法兰和半导体功率器件 |
JP7083898B2 (ja) * | 2018-06-28 | 2022-06-13 | 京セラ株式会社 | 基体および半導体装置 |
CN114582826A (zh) * | 2020-11-30 | 2022-06-03 | 上海华为技术有限公司 | 一种封装结构、封装方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995015007A1 (en) * | 1993-11-29 | 1995-06-01 | Rogers Corporation | Electronic chip carrier package and method of making thereof |
US6332720B1 (en) * | 1998-09-17 | 2001-12-25 | Hitachi, Ltd. | Semiconductor laser coupling device and method for assembling the same on circuit board |
US6365961B1 (en) * | 1997-02-27 | 2002-04-02 | Kyocera Corporation | High-frequency input/output feedthrough and package for housing high-frequency semiconductor element using same |
US6462413B1 (en) * | 1999-07-22 | 2002-10-08 | Polese Company, Inc. | LDMOS transistor heatsink package assembly and manufacturing method |
Family Cites Families (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3767839A (en) * | 1971-06-04 | 1973-10-23 | Wells Plastics Of California I | Plastic micro-electronic packages |
US4385342A (en) * | 1980-05-12 | 1983-05-24 | Sprague Electric Company | Flat electrolytic capacitor |
US4784974A (en) * | 1982-08-05 | 1988-11-15 | Olin Corporation | Method of making a hermetically sealed semiconductor casing |
JPS59214243A (ja) * | 1983-05-20 | 1984-12-04 | Nec Corp | 半導体装置 |
US4725347A (en) * | 1986-05-02 | 1988-02-16 | The Dow Chemical Company | Reinforced bipolar electrolytic cell frame |
JPS63109104A (ja) * | 1986-10-28 | 1988-05-13 | Nippon Steel Corp | チタンの積層鋼板の製造方法 |
US4930857A (en) * | 1989-05-19 | 1990-06-05 | At&T Bell Laboratories | Hybrid package arrangement |
US5045972A (en) * | 1990-08-27 | 1991-09-03 | The Standard Oil Company | High thermal conductivity metal matrix composite |
US5650592A (en) * | 1993-04-05 | 1997-07-22 | Olin Corporation | Graphite composites for electronic packaging |
JPH0831480A (ja) * | 1994-07-15 | 1996-02-02 | Fuji Denka:Kk | 気密端子 |
US5686172A (en) * | 1994-11-30 | 1997-11-11 | Mitsubishi Gas Chemical Company, Inc. | Metal-foil-clad composite ceramic board and process for the production thereof |
EP0764393B1 (en) * | 1995-03-02 | 2001-07-04 | Circuit Components, Incorporated | A low cost, high performance package for microwave circuits in the up to 90 ghz frequency range using bga i/o rf port format and ceramic substrate technology |
WO1996037915A1 (en) * | 1995-05-26 | 1996-11-28 | Sheldahl, Inc. | Adherent film with low thermal impedance and high electrical impedance used in an electronic assembly with a heat sink |
US6056186A (en) * | 1996-06-25 | 2000-05-02 | Brush Wellman Inc. | Method for bonding a ceramic to a metal with a copper-containing shim |
US5792984A (en) * | 1996-07-01 | 1998-08-11 | Cts Corporation | Molded aluminum nitride packages |
AU4902897A (en) * | 1996-11-08 | 1998-05-29 | W.L. Gore & Associates, Inc. | Method for improving reliability of thin circuit substrates by increasing the T of the substrate |
JP3617232B2 (ja) * | 1997-02-06 | 2005-02-02 | 住友電気工業株式会社 | 半導体用ヒートシンクおよびその製造方法ならびにそれを用いた半導体パッケージ |
US5926372A (en) * | 1997-12-23 | 1999-07-20 | Ford Global Technologies, Inc. | Power block assembly and method of making same |
US6211463B1 (en) * | 1998-01-26 | 2001-04-03 | Saint-Gobain Industrial Ceramics, Inc. | Electronic circuit package with diamond film heat conductor |
JP2000077462A (ja) * | 1998-08-28 | 2000-03-14 | Nec Eng Ltd | Tabテープ貼付装置 |
US6114048A (en) * | 1998-09-04 | 2000-09-05 | Brush Wellman, Inc. | Functionally graded metal substrates and process for making same |
JP3457901B2 (ja) * | 1998-11-18 | 2003-10-20 | 京セラ株式会社 | 光半導体素子収納用パッケージ |
US6683325B2 (en) * | 1999-01-26 | 2004-01-27 | Patent-Treuhand-Gesellschaft-für Elektrische Glühlampen mbH | Thermal expansion compensated opto-electronic semiconductor element, particularly ultraviolet (UV) light emitting diode, and method of its manufacture |
JP3792445B2 (ja) * | 1999-03-30 | 2006-07-05 | 日本特殊陶業株式会社 | コンデンサ付属配線基板 |
US6261868B1 (en) * | 1999-04-02 | 2001-07-17 | Motorola, Inc. | Semiconductor component and method for manufacturing the semiconductor component |
US6373717B1 (en) * | 1999-07-02 | 2002-04-16 | International Business Machines Corporation | Electronic package with high density interconnect layer |
US6414389B1 (en) * | 2000-01-28 | 2002-07-02 | Ericsson Inc. | Alignment pedestals in an LDMOS power package |
JP2002252299A (ja) * | 2001-02-26 | 2002-09-06 | Kyocera Corp | 半導体素子収納用パッケージおよび半導体装置 |
JP2002368168A (ja) * | 2001-06-13 | 2002-12-20 | Hitachi Ltd | 半導体装置用複合部材、それを用いた絶縁型半導体装置、又は非絶縁型半導体装置 |
US6500529B1 (en) * | 2001-09-14 | 2002-12-31 | Tonoga, Ltd. | Low signal loss bonding ply for multilayer circuit boards |
US20030131476A1 (en) * | 2001-09-28 | 2003-07-17 | Vlad Ocher | Heat conduits and terminal radiator for microcircuit packaging and manufacturing process |
AT5972U1 (de) * | 2002-03-22 | 2003-02-25 | Plansee Ag | Package mit substrat hoher wärmeleitfähigkeit |
US6671449B1 (en) * | 2002-06-13 | 2003-12-30 | Agilent Technologies, Inc. | Optical packaging assembly including a hermetically sealed optical device housing and method of making the same |
US20040046247A1 (en) * | 2002-09-09 | 2004-03-11 | Olin Corporation, A Corporation Of The Commonwealth Of Virginia | Hermetic semiconductor package |
US6727117B1 (en) * | 2002-11-07 | 2004-04-27 | Kyocera America, Inc. | Semiconductor substrate having copper/diamond composite material and method of making same |
US7105931B2 (en) * | 2003-01-07 | 2006-09-12 | Abbas Ismail Attarwala | Electronic package and method |
SG157957A1 (en) * | 2003-01-29 | 2010-01-29 | Interplex Qlp Inc | Package for integrated circuit die |
US7095053B2 (en) * | 2003-05-05 | 2006-08-22 | Lamina Ceramics, Inc. | Light emitting diodes packaged for high temperature operation |
US6982483B2 (en) * | 2003-05-30 | 2006-01-03 | Freescale Semiconductor, Inc. | High impedance radio frequency power plastic package |
US20040246682A1 (en) * | 2003-06-09 | 2004-12-09 | Sumitomo Metal (Smi) Eectronics Devices Inc. | Apparatus and package for high frequency usages and their manufacturing method |
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2003
- 2003-01-10 US US10/339,834 patent/US7298046B2/en not_active Expired - Lifetime
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2004
- 2004-01-09 JP JP2006500897A patent/JP4466645B2/ja not_active Expired - Fee Related
- 2004-01-09 KR KR1020057012830A patent/KR101015749B1/ko active IP Right Grant
- 2004-01-09 EP EP04701262A patent/EP1584101B1/en not_active Expired - Lifetime
- 2004-01-09 AT AT04701262T patent/ATE515053T1/de not_active IP Right Cessation
- 2004-01-09 CN CN2004800035768A patent/CN101080800B/zh not_active Expired - Fee Related
- 2004-01-09 WO PCT/US2004/000621 patent/WO2004064120A2/en active Search and Examination
- 2004-01-09 CA CA2512845A patent/CA2512845C/en not_active Expired - Fee Related
-
2005
- 2005-07-05 IL IL169543A patent/IL169543A/en active IP Right Grant
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2006
- 2006-04-03 HK HK06104050.3A patent/HK1082591A1/xx not_active IP Right Cessation
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2007
- 2007-11-19 US US11/942,675 patent/US7582964B2/en not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995015007A1 (en) * | 1993-11-29 | 1995-06-01 | Rogers Corporation | Electronic chip carrier package and method of making thereof |
US6365961B1 (en) * | 1997-02-27 | 2002-04-02 | Kyocera Corporation | High-frequency input/output feedthrough and package for housing high-frequency semiconductor element using same |
US6332720B1 (en) * | 1998-09-17 | 2001-12-25 | Hitachi, Ltd. | Semiconductor laser coupling device and method for assembling the same on circuit board |
US6462413B1 (en) * | 1999-07-22 | 2002-10-08 | Polese Company, Inc. | LDMOS transistor heatsink package assembly and manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
HK1082591A1 (en) | 2006-06-09 |
WO2004064120A3 (en) | 2005-09-01 |
CN101080800A (zh) | 2007-11-28 |
ATE515053T1 (de) | 2011-07-15 |
US20080142963A1 (en) | 2008-06-19 |
IL169543A0 (en) | 2007-07-04 |
EP1584101B1 (en) | 2011-06-29 |
KR20050105168A (ko) | 2005-11-03 |
EP1584101A4 (en) | 2008-11-26 |
US7582964B2 (en) | 2009-09-01 |
CA2512845A1 (en) | 2004-07-29 |
IL169543A (en) | 2016-06-30 |
US20040195662A1 (en) | 2004-10-07 |
CA2512845C (en) | 2012-07-03 |
US7298046B2 (en) | 2007-11-20 |
EP1584101A2 (en) | 2005-10-12 |
JP2006516361A (ja) | 2006-06-29 |
WO2004064120A2 (en) | 2004-07-29 |
JP4466645B2 (ja) | 2010-05-26 |
CN101080800B (zh) | 2012-02-22 |
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