KR101015749B1 - 비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 - Google Patents

비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 Download PDF

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Publication number
KR101015749B1
KR101015749B1 KR1020057012830A KR20057012830A KR101015749B1 KR 101015749 B1 KR101015749 B1 KR 101015749B1 KR 1020057012830 A KR1020057012830 A KR 1020057012830A KR 20057012830 A KR20057012830 A KR 20057012830A KR 101015749 B1 KR101015749 B1 KR 101015749B1
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South Korea
Prior art keywords
window frame
flange
semiconductor package
ceramic
gold
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Expired - Fee Related
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KR1020057012830A
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English (en)
Korean (ko)
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KR20050105168A (ko
Inventor
제프리 베네가스
폴 갈랜드
조슈아 롭싱어
린다 루
Original Assignee
교세라 아메리카 인코포레이티드
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Publication of KR20050105168A publication Critical patent/KR20050105168A/ko
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
    • H01L23/047—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads being parallel to the base
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/12—Mountings, e.g. non-detachable insulating substrates
    • H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/36—Mechanical coupling means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
    • H01L23/057—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads being parallel to the base
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367—Cooling facilitated by shape of device
    • H01L23/3675—Cooling facilitated by shape of device characterised by the shape of the housing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554—External layer
    • H01L2224/05599—Material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399—Material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01078—Platinum [Pt]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01079—Gold [Au]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097—Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701—Low temperature co-fired ceramic [LTCC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Optics & Photonics (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
KR1020057012830A 2003-01-10 2004-01-09 비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지 Expired - Fee Related KR101015749B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/339,834 US7298046B2 (en) 2003-01-10 2003-01-10 Semiconductor package having non-ceramic based window frame
US10/339,834 2003-01-10

Publications (2)

Publication Number Publication Date
KR20050105168A KR20050105168A (ko) 2005-11-03
KR101015749B1 true KR101015749B1 (ko) 2011-02-22

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Family Applications (1)

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KR1020057012830A Expired - Fee Related KR101015749B1 (ko) 2003-01-10 2004-01-09 비-세라믹 기반 윈도우 프레임을 갖는 반도체 패키지

Country Status (9)

Country Link
US (2) US7298046B2 (enExample)
EP (1) EP1584101B1 (enExample)
JP (1) JP4466645B2 (enExample)
KR (1) KR101015749B1 (enExample)
CN (1) CN101080800B (enExample)
AT (1) ATE515053T1 (enExample)
CA (1) CA2512845C (enExample)
IL (1) IL169543A (enExample)
WO (1) WO2004064120A2 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070175660A1 (en) * 2006-01-27 2007-08-02 Yeung Betty H Warpage-reducing packaging design
DE602006001393D1 (de) * 2006-03-06 2008-07-17 Umicore Ag & Co Kg Zusammensetzung zur Befestigung von Hochleistungshalbleiter
US20080016684A1 (en) * 2006-07-06 2008-01-24 General Electric Company Corrosion resistant wafer processing apparatus and method for making thereof
US20080006204A1 (en) * 2006-07-06 2008-01-10 General Electric Company Corrosion resistant wafer processing apparatus and method for making thereof
US7961470B2 (en) * 2006-07-19 2011-06-14 Infineon Technologies Ag Power amplifier
US7952188B2 (en) * 2007-01-08 2011-05-31 Infineon Technologies Ag Semiconductor module with a dielectric layer including a fluorocarbon compound on a chip
CN101399237B (zh) * 2008-10-24 2010-06-02 江阴市赛英电子有限公司 全压接快速散热型陶瓷外壳
US20100139885A1 (en) * 2008-12-09 2010-06-10 Renewable Thermodynamics, Llc Sintered diamond heat exchanger apparatus
WO2011119891A2 (en) * 2010-03-25 2011-09-29 Anwar Abdul Mohammed High performance low cost open air cavity ceramic power packages for high temperature die attach processes
US8907467B2 (en) 2012-03-28 2014-12-09 Infineon Technologies Ag PCB based RF-power package window frame
JP6296687B2 (ja) 2012-04-27 2018-03-20 キヤノン株式会社 電子部品、電子モジュールおよびこれらの製造方法。
JP5885690B2 (ja) 2012-04-27 2016-03-15 キヤノン株式会社 電子部品および電子機器
EP2757582A1 (en) * 2013-01-17 2014-07-23 Nxp B.V. Packaged electrical components
US9879722B2 (en) * 2013-03-11 2018-01-30 Bell Helicopter Textron Inc. Low shear modulus transition shim for elastomeric bearing bonding in torsional applications
JP6210339B2 (ja) * 2013-03-28 2017-10-11 パナソニックＩｐマネジメント株式会社 半導体パッケージおよび半導体デバイス
US10468399B2 (en) 2015-03-31 2019-11-05 Cree, Inc. Multi-cavity package having single metal flange
US9629246B2 (en) 2015-07-28 2017-04-18 Infineon Technologies Ag PCB based semiconductor package having integrated electrical functionality
US9997476B2 (en) 2015-10-30 2018-06-12 Infineon Technologies Ag Multi-die package having different types of semiconductor dies attached to the same thermally conductive flange
US10225922B2 (en) 2016-02-18 2019-03-05 Cree, Inc. PCB based semiconductor package with impedance matching network elements integrated therein
US10332847B2 (en) * 2017-06-01 2019-06-25 Infineon Technologies Ag Semiconductor package with integrated harmonic termination feature
CN109037161A (zh) * 2018-06-15 2018-12-18 华为技术有限公司 一种法兰和半导体功率器件
JP7083898B2 (ja) * 2018-06-28 2022-06-13 京セラ株式会社 基体および半導体装置
CN114582826A (zh) * 2020-11-30 2022-06-03 上海华为技术有限公司 一种封装结构、封装方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995015007A1 (en) * 1993-11-29 1995-06-01 Rogers Corporation Electronic chip carrier package and method of making thereof
US6332720B1 (en) * 1998-09-17 2001-12-25 Hitachi, Ltd. Semiconductor laser coupling device and method for assembling the same on circuit board
US6365961B1 (en) * 1997-02-27 2002-04-02 Kyocera Corporation High-frequency input/output feedthrough and package for housing high-frequency semiconductor element using same
US6462413B1 (en) * 1999-07-22 2002-10-08 Polese Company, Inc. LDMOS transistor heatsink package assembly and manufacturing method

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3767839A (en) * 1971-06-04 1973-10-23 Wells Plastics Of California I Plastic micro-electronic packages
US4385342A (en) * 1980-05-12 1983-05-24 Sprague Electric Company Flat electrolytic capacitor
US4784974A (en) * 1982-08-05 1988-11-15 Olin Corporation Method of making a hermetically sealed semiconductor casing
JPS59214243A (ja) * 1983-05-20 1984-12-04 Nec Corp 半導体装置
US4725347A (en) * 1986-05-02 1988-02-16 The Dow Chemical Company Reinforced bipolar electrolytic cell frame
JPS63109104A (ja) * 1986-10-28 1988-05-13 Nippon Steel Corp チタンの積層鋼板の製造方法
US4930857A (en) * 1989-05-19 1990-06-05 At&T Bell Laboratories Hybrid package arrangement
US5045972A (en) * 1990-08-27 1991-09-03 The Standard Oil Company High thermal conductivity metal matrix composite
US5650592A (en) * 1993-04-05 1997-07-22 Olin Corporation Graphite composites for electronic packaging
JPH0831480A (ja) * 1994-07-15 1996-02-02 Fuji Denka:Kk 気密端子
TW350194B (en) * 1994-11-30 1999-01-11 Mitsubishi Gas Chemical Co Metal-foil-clad composite ceramic board and process for the production thereof the invention relates to the metal-foil-clad composite ceramic board and process for the production
CA2189233A1 (en) * 1995-03-02 1996-09-06 Norman L. Greenman A low cost, high performance package for microwave circuits in the up to 90 ghz frequency range using bga i/o rf port format and ceramic substrate technology
WO1996037915A1 (en) * 1995-05-26 1996-11-28 Sheldahl, Inc. Adherent film with low thermal impedance and high electrical impedance used in an electronic assembly with a heat sink
US6056186A (en) * 1996-06-25 2000-05-02 Brush Wellman Inc. Method for bonding a ceramic to a metal with a copper-containing shim
US5792984A (en) * 1996-07-01 1998-08-11 Cts Corporation Molded aluminum nitride packages
AU4902897A (en) * 1996-11-08 1998-05-29 W.L. Gore & Associates, Inc. Method for improving reliability of thin circuit substrates by increasing the T of the substrate
JP3617232B2 (ja) * 1997-02-06 2005-02-02 住友電気工業株式会社 半導体用ヒートシンクおよびその製造方法ならびにそれを用いた半導体パッケージ
US5926372A (en) * 1997-12-23 1999-07-20 Ford Global Technologies, Inc. Power block assembly and method of making same
US6211463B1 (en) * 1998-01-26 2001-04-03 Saint-Gobain Industrial Ceramics, Inc. Electronic circuit package with diamond film heat conductor
JP2000077462A (ja) * 1998-08-28 2000-03-14 Nec Eng Ltd Ｔａｂテープ貼付装置
US6114048A (en) * 1998-09-04 2000-09-05 Brush Wellman, Inc. Functionally graded metal substrates and process for making same
JP3457901B2 (ja) * 1998-11-18 2003-10-20 京セラ株式会社 光半導体素子収納用パッケージ
US6683325B2 (en) * 1999-01-26 2004-01-27 Patent-Treuhand-Gesellschaft-für Elektrische Glühlampen mbH Thermal expansion compensated opto-electronic semiconductor element, particularly ultraviolet (UV) light emitting diode, and method of its manufacture
JP3792445B2 (ja) * 1999-03-30 2006-07-05 日本特殊陶業株式会社 コンデンサ付属配線基板
US6261868B1 (en) * 1999-04-02 2001-07-17 Motorola, Inc. Semiconductor component and method for manufacturing the semiconductor component
US6373717B1 (en) * 1999-07-02 2002-04-16 International Business Machines Corporation Electronic package with high density interconnect layer
US6414389B1 (en) * 2000-01-28 2002-07-02 Ericsson Inc. Alignment pedestals in an LDMOS power package
JP2002252299A (ja) * 2001-02-26 2002-09-06 Kyocera Corp 半導体素子収納用パッケージおよび半導体装置
JP2002368168A (ja) * 2001-06-13 2002-12-20 Hitachi Ltd 半導体装置用複合部材、それを用いた絶縁型半導体装置、又は非絶縁型半導体装置
US6500529B1 (en) * 2001-09-14 2002-12-31 Tonoga, Ltd. Low signal loss bonding ply for multilayer circuit boards
US20030131476A1 (en) * 2001-09-28 2003-07-17 Vlad Ocher Heat conduits and terminal radiator for microcircuit packaging and manufacturing process
AT5972U1 (de) * 2002-03-22 2003-02-25 Plansee Ag Package mit substrat hoher wärmeleitfähigkeit
US6671449B1 (en) * 2002-06-13 2003-12-30 Agilent Technologies, Inc. Optical packaging assembly including a hermetically sealed optical device housing and method of making the same
US20040046247A1 (en) * 2002-09-09 2004-03-11 Olin Corporation, A Corporation Of The Commonwealth Of Virginia Hermetic semiconductor package
US6727117B1 (en) * 2002-11-07 2004-04-27 Kyocera America, Inc. Semiconductor substrate having copper/diamond composite material and method of making same
US7105931B2 (en) * 2003-01-07 2006-09-12 Abbas Ismail Attarwala Electronic package and method
SG157957A1 (en) * 2003-01-29 2010-01-29 Interplex Qlp Inc Package for integrated circuit die
US7095053B2 (en) * 2003-05-05 2006-08-22 Lamina Ceramics, Inc. Light emitting diodes packaged for high temperature operation
US6982483B2 (en) * 2003-05-30 2006-01-03 Freescale Semiconductor, Inc. High impedance radio frequency power plastic package
US20040246682A1 (en) * 2003-06-09 2004-12-09 Sumitomo Metal (Smi) Eectronics Devices Inc. Apparatus and package for high frequency usages and their manufacturing method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995015007A1 (en) * 1993-11-29 1995-06-01 Rogers Corporation Electronic chip carrier package and method of making thereof
US6365961B1 (en) * 1997-02-27 2002-04-02 Kyocera Corporation High-frequency input/output feedthrough and package for housing high-frequency semiconductor element using same
US6332720B1 (en) * 1998-09-17 2001-12-25 Hitachi, Ltd. Semiconductor laser coupling device and method for assembling the same on circuit board
US6462413B1 (en) * 1999-07-22 2002-10-08 Polese Company, Inc. LDMOS transistor heatsink package assembly and manufacturing method

Also Published As

Publication number Publication date
HK1082591A1 (en) 2006-06-09
US7298046B2 (en) 2007-11-20
CA2512845A1 (en) 2004-07-29
JP2006516361A (ja) 2006-06-29
WO2004064120A3 (en) 2005-09-01
ATE515053T1 (de) 2011-07-15
CA2512845C (en) 2012-07-03
IL169543A0 (en) 2007-07-04
CN101080800B (zh) 2012-02-22
KR20050105168A (ko) 2005-11-03
EP1584101A4 (en) 2008-11-26
US20080142963A1 (en) 2008-06-19
EP1584101A2 (en) 2005-10-12
CN101080800A (zh) 2007-11-28
JP4466645B2 (ja) 2010-05-26
US7582964B2 (en) 2009-09-01
US20040195662A1 (en) 2004-10-07
WO2004064120A2 (en) 2004-07-29
IL169543A (en) 2016-06-30
EP1584101B1 (en) 2011-06-29

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