KR100838864B1 - 시험 장치 및 시험 방법 - Google Patents

시험 장치 및 시험 방법 Download PDF

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Publication number
KR100838864B1
KR100838864B1 KR1020067021895A KR20067021895A KR100838864B1 KR 100838864 B1 KR100838864 B1 KR 100838864B1 KR 1020067021895 A KR1020067021895 A KR 1020067021895A KR 20067021895 A KR20067021895 A KR 20067021895A KR 100838864 B1 KR100838864 B1 KR 100838864B1
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KR
South Korea
Prior art keywords
memory
fail
address
under test
information
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Expired - Fee Related
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KR1020067021895A
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English (en)
Korean (ko)
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KR20060135036A (ko
Inventor
마스히로 야마다
카즈히코 사토
토시미 오사와
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주식회사 아도반테스토
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Publication of KR20060135036A publication Critical patent/KR20060135036A/ko
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606—Error catch memory

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  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
KR1020067021895A 2004-03-24 2005-03-22 시험 장치 및 시험 방법 Expired - Fee Related KR100838864B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004087924A JP4130811B2 (ja) 2004-03-24 2004-03-24 試験装置及び試験方法
JPJP-P-2004-00087924 2004-03-24

Publications (2)

Publication Number Publication Date
KR20060135036A KR20060135036A (ko) 2006-12-28
KR100838864B1 true KR100838864B1 (ko) 2008-06-16

Family

ID=34993950

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067021895A Expired - Fee Related KR100838864B1 (ko) 2004-03-24 2005-03-22 시험 장치 및 시험 방법

Country Status (7)

Country Link
US (1) US7441166B2 (enExample)
JP (1) JP4130811B2 (enExample)
KR (1) KR100838864B1 (enExample)
CN (1) CN100524538C (enExample)
DE (1) DE112005000640T5 (enExample)
TW (1) TWI371594B (enExample)
WO (1) WO2005091305A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4401319B2 (ja) * 2005-04-07 2010-01-20 株式会社日立製作所 Ｄｒａｍ積層パッケージ並びにｄｒａｍ積層パッケージの試験および救済方法
JP2007322141A (ja) * 2006-05-30 2007-12-13 Yokogawa Electric Corp 半導体集積回路試験装置及び方法
JP5003941B2 (ja) * 2007-02-05 2012-08-22 横河電機株式会社 Ｉｃ試験装置およびｉｃ試験方法
JP5080501B2 (ja) * 2007-02-16 2012-11-21 株式会社アドバンテスト 試験装置および試験方法
US8368418B2 (en) * 2007-11-14 2013-02-05 Advantest Corporation Testing apparatus for multiple identical circuit components
TW200947450A (en) * 2008-05-09 2009-11-16 A Data Technology Co Ltd Storage system capable of data recovery and method thereof
JP5077265B2 (ja) * 2009-02-26 2012-11-21 横河電機株式会社 記憶装置及び半導体試験装置
US8706439B2 (en) * 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
JP2012174313A (ja) 2011-02-23 2012-09-10 Advantest Corp 試験装置
CN104090846A (zh) * 2013-04-01 2014-10-08 深圳芯力电子技术有限公司 一种电子信息产品数据存取方法及电子信息产品
US9251915B2 (en) * 2013-11-11 2016-02-02 Advantest Corporation Seamless fail analysis with memory efficient storage of fail lists
KR102825124B1 (ko) * 2022-12-29 2025-06-25 주식회사 와이씨 인터리브 방식을 이용한 메모리 스크램블 방법 및 장치
KR102835344B1 (ko) * 2022-12-29 2025-07-18 주식회사 와이씨 메모리 페일 카운트 방법 및 시스템

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970005033A (ko) * 1990-04-17 1997-01-29 미다 가쓰시게 저저항 배선구조를 갖는 반도체장치 및 그 제조방법
KR20010104719A (ko) * 1999-03-01 2001-11-26 이고르 와이. 칸드로스 단일 테스터 채널을 이용하여 다수의 디바이스의 테스트를병행하기 위한 분산형 인터페이스
KR20030036884A (ko) * 2000-10-19 2003-05-09 가부시키가이샤 아드반테스트 메모리의 불량구제해석 처리방법 및 이 방법을 실시하는메모리 시험장치
KR20030074652A (ko) * 2001-11-15 2003-09-19 가부시키가이샤 아드반테스트 반도체 시험장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5070297A (en) * 1990-06-04 1991-12-03 Texas Instruments Incorporated Full wafer integrated circuit testing device
US5610925A (en) * 1995-03-27 1997-03-11 Advantest Corporation Failure analyzer for semiconductor tester
JPH0933615A (ja) * 1995-07-19 1997-02-07 Advantest Corp 半導体メモリ試験装置のメモリ不良解析装置
US5790559A (en) * 1996-03-29 1998-08-04 Advantest Corporation Semiconductor memory testing apparatus
JP4097069B2 (ja) 2002-08-28 2008-06-04 Ｔｄｋ株式会社 プリント基板の製造方法
US7036053B2 (en) * 2002-12-19 2006-04-25 Intel Corporation Two dimensional data eye centering for source synchronous data transfers
JP4308637B2 (ja) * 2003-12-17 2009-08-05 株式会社日立製作所 半導体試験装置
US20070061669A1 (en) * 2005-08-30 2007-03-15 Major Karl L Method, device and system for detecting error correction defects

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970005033A (ko) * 1990-04-17 1997-01-29 미다 가쓰시게 저저항 배선구조를 갖는 반도체장치 및 그 제조방법
KR20010104719A (ko) * 1999-03-01 2001-11-26 이고르 와이. 칸드로스 단일 테스터 채널을 이용하여 다수의 디바이스의 테스트를병행하기 위한 분산형 인터페이스
KR20030036884A (ko) * 2000-10-19 2003-05-09 가부시키가이샤 아드반테스트 메모리의 불량구제해석 처리방법 및 이 방법을 실시하는메모리 시험장치
KR20030074652A (ko) * 2001-11-15 2003-09-19 가부시키가이샤 아드반테스트 반도체 시험장치

Also Published As

Publication number Publication date
JP2005276317A (ja) 2005-10-06
US20070067685A1 (en) 2007-03-22
TWI371594B (en) 2012-09-01
DE112005000640T5 (de) 2008-07-03
US7441166B2 (en) 2008-10-21
CN1934654A (zh) 2007-03-21
JP4130811B2 (ja) 2008-08-06
WO2005091305A1 (ja) 2005-09-29
TW200533943A (en) 2005-10-16
KR20060135036A (ko) 2006-12-28
CN100524538C (zh) 2009-08-05

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