CN100524538C - 测试装置与测试方法 - Google Patents

测试装置与测试方法 Download PDF

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Publication number
CN100524538C
CN100524538C CNB2005800091974A CN200580009197A CN100524538C CN 100524538 C CN100524538 C CN 100524538C CN B2005800091974 A CNB2005800091974 A CN B2005800091974A CN 200580009197 A CN200580009197 A CN 200580009197A CN 100524538 C CN100524538 C CN 100524538C
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CN
China
Prior art keywords
tested
bad
information
storeies
address
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Expired - Fee Related
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CNB2005800091974A
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English (en)
Chinese (zh)
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CN1934654A (zh
Inventor
山田益弘
佐藤和彦
大泽俊美
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Advantest Corp
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Advantest Corp
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Publication of CN1934654A publication Critical patent/CN1934654A/zh
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Publication of CN100524538C publication Critical patent/CN100524538C/zh
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606—Error catch memory

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CNB2005800091974A 2004-03-24 2005-03-22 测试装置与测试方法 Expired - Fee Related CN100524538C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP087924/2004 2004-03-24
JP2004087924A JP4130811B2 (ja) 2004-03-24 2004-03-24 試験装置及び試験方法

Publications (2)

Publication Number Publication Date
CN1934654A CN1934654A (zh) 2007-03-21
CN100524538C true CN100524538C (zh) 2009-08-05

Family

ID=34993950

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005800091974A Expired - Fee Related CN100524538C (zh) 2004-03-24 2005-03-22 测试装置与测试方法

Country Status (7)

Country Link
US (1) US7441166B2 (enExample)
JP (1) JP4130811B2 (enExample)
KR (1) KR100838864B1 (enExample)
CN (1) CN100524538C (enExample)
DE (1) DE112005000640T5 (enExample)
TW (1) TWI371594B (enExample)
WO (1) WO2005091305A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4401319B2 (ja) * 2005-04-07 2010-01-20 株式会社日立製作所 Ｄｒａｍ積層パッケージ並びにｄｒａｍ積層パッケージの試験および救済方法
JP2007322141A (ja) * 2006-05-30 2007-12-13 Yokogawa Electric Corp 半導体集積回路試験装置及び方法
JP5003941B2 (ja) * 2007-02-05 2012-08-22 横河電機株式会社 Ｉｃ試験装置およびｉｃ試験方法
JP5080501B2 (ja) * 2007-02-16 2012-11-21 株式会社アドバンテスト 試験装置および試験方法
US8368418B2 (en) * 2007-11-14 2013-02-05 Advantest Corporation Testing apparatus for multiple identical circuit components
TW200947450A (en) * 2008-05-09 2009-11-16 A Data Technology Co Ltd Storage system capable of data recovery and method thereof
JP5077265B2 (ja) * 2009-02-26 2012-11-21 横河電機株式会社 記憶装置及び半導体試験装置
US8706439B2 (en) * 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
JP2012174313A (ja) 2011-02-23 2012-09-10 Advantest Corp 試験装置
CN104090846A (zh) * 2013-04-01 2014-10-08 深圳芯力电子技术有限公司 一种电子信息产品数据存取方法及电子信息产品
US9251915B2 (en) * 2013-11-11 2016-02-02 Advantest Corporation Seamless fail analysis with memory efficient storage of fail lists
KR102825124B1 (ko) * 2022-12-29 2025-06-25 주식회사 와이씨 인터리브 방식을 이용한 메모리 스크램블 방법 및 장치
KR102835344B1 (ko) * 2022-12-29 2025-07-18 주식회사 와이씨 메모리 페일 카운트 방법 및 시스템

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004328A1 (fr) * 1995-07-19 1997-02-06 Advantest Corporation Analyseur de defauts de memoire pour dispositif de controle de memoire a semi-conducteurs
WO2003052767A1 (en) * 2001-11-15 2003-06-26 Advantest Corporation Semiconductor testing apparatus
US20030236648A1 (en) * 2000-10-19 2003-12-25 Takahiro Yasui Memory defect redress analysis treating method, and memory testing apparatus performing the method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100192064B1 (ko) * 1990-04-17 1999-06-15 가나이 쓰도무 저저항 배선구조를 갖는 반도체장치 및 그 제조방법
US5070297A (en) * 1990-06-04 1991-12-03 Texas Instruments Incorporated Full wafer integrated circuit testing device
US5610925A (en) * 1995-03-27 1997-03-11 Advantest Corporation Failure analyzer for semiconductor tester
US5790559A (en) * 1996-03-29 1998-08-04 Advantest Corporation Semiconductor memory testing apparatus
US6499121B1 (en) * 1999-03-01 2002-12-24 Formfactor, Inc. Distributed interface for parallel testing of multiple devices using a single tester channel
JP4097069B2 (ja) 2002-08-28 2008-06-04 Ｔｄｋ株式会社 プリント基板の製造方法
US7036053B2 (en) * 2002-12-19 2006-04-25 Intel Corporation Two dimensional data eye centering for source synchronous data transfers
JP4308637B2 (ja) * 2003-12-17 2009-08-05 株式会社日立製作所 半導体試験装置
US20070061669A1 (en) * 2005-08-30 2007-03-15 Major Karl L Method, device and system for detecting error correction defects

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004328A1 (fr) * 1995-07-19 1997-02-06 Advantest Corporation Analyseur de defauts de memoire pour dispositif de controle de memoire a semi-conducteurs
US20030236648A1 (en) * 2000-10-19 2003-12-25 Takahiro Yasui Memory defect redress analysis treating method, and memory testing apparatus performing the method
WO2003052767A1 (en) * 2001-11-15 2003-06-26 Advantest Corporation Semiconductor testing apparatus

Also Published As

Publication number Publication date
JP2005276317A (ja) 2005-10-06
US20070067685A1 (en) 2007-03-22
TWI371594B (en) 2012-09-01
KR100838864B1 (ko) 2008-06-16
DE112005000640T5 (de) 2008-07-03
US7441166B2 (en) 2008-10-21
CN1934654A (zh) 2007-03-21
JP4130811B2 (ja) 2008-08-06
WO2005091305A1 (ja) 2005-09-29
TW200533943A (en) 2005-10-16
KR20060135036A (ko) 2006-12-28

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090805

Termination date: 20110322