KR100828981B1 - 표면 형상의 검사 방법 및 검사 장치 - Google Patents

표면 형상의 검사 방법 및 검사 장치 Download PDF

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Publication number
KR100828981B1
KR100828981B1 KR1020067017982A KR20067017982A KR100828981B1 KR 100828981 B1 KR100828981 B1 KR 100828981B1 KR 1020067017982 A KR1020067017982 A KR 1020067017982A KR 20067017982 A KR20067017982 A KR 20067017982A KR 100828981 B1 KR100828981 B1 KR 100828981B1
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South Korea
Prior art keywords
transparent plate
image
surface shape
shaped object
stripe pattern
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Expired - Lifetime
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English (en)
Korean (ko)
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KR20070019984A (ko
Inventor
요시유키 손다
기미아키 오토
무네히사 가토
아츠시 기야마
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아사히 가라스 가부시키가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/386—Glass
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Medicinal Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Food Science & Technology (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020067017982A 2004-06-04 2005-06-02 표면 형상의 검사 방법 및 검사 장치 Expired - Lifetime KR100828981B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2004-00167621 2004-06-04
JP2004167621A JP4645068B2 (ja) 2004-06-04 2004-06-04 表面形状の検査方法および検査装置

Publications (2)

Publication Number Publication Date
KR20070019984A KR20070019984A (ko) 2007-02-16
KR100828981B1 true KR100828981B1 (ko) 2008-05-14

Family

ID=35463002

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KR1020067017982A Expired - Lifetime KR100828981B1 (ko) 2004-06-04 2005-06-02 표면 형상의 검사 방법 및 검사 장치

Country Status (6)

Country Link
US (1) US7394536B2 (enExample)
EP (2) EP1750087B1 (enExample)
JP (1) JP4645068B2 (enExample)
KR (1) KR100828981B1 (enExample)
TW (1) TW200606399A (enExample)
WO (1) WO2005119172A1 (enExample)

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WO2007010875A1 (ja) 2005-07-15 2007-01-25 Asahi Glass Company, Limited 形状検査方法および装置
US7589844B2 (en) * 2005-07-15 2009-09-15 Asahi Glass Company, Limited Shape inspection method and apparatus
JP4907201B2 (ja) * 2006-03-20 2012-03-28 株式会社神戸製鋼所 形状測定装置
DE102006015792A1 (de) 2006-04-05 2007-10-18 Isra Surface Vision Gmbh Verfahren und System zur Formmessung einer reflektierenden Oberfläche
EP1882896B1 (de) * 2006-07-24 2014-12-17 3D-Shape GmbH Dreidimensionale Vermessung der Form und der lokalen Oberflächennormalen von spiegelnden Objekten
US7471383B2 (en) * 2006-12-19 2008-12-30 Pilkington North America, Inc. Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging
US8284392B2 (en) 2007-03-13 2012-10-09 3D-Shape Gmbh Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects
EP2183546B1 (en) 2007-08-17 2015-10-21 Renishaw PLC Non-contact probe
US7843557B2 (en) * 2007-09-28 2010-11-30 Cardinal Scientific, Inc. Method and system for detecting retroreflectors
JP5034891B2 (ja) * 2007-11-21 2012-09-26 旭硝子株式会社 透明板状体の形状測定装置及び板ガラスの製造方法
JP5158201B2 (ja) * 2008-07-30 2013-03-06 アイシン・エィ・ダブリュ株式会社 駆動装置および車両
US8441532B2 (en) * 2009-02-24 2013-05-14 Corning Incorporated Shape measurement of specular reflective surface
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
FR2951544A1 (fr) * 2009-10-21 2011-04-22 Saint Gobain Procede d'analyse de la qualite d'un vitrage
JP5817721B2 (ja) 2010-06-07 2015-11-18 旭硝子株式会社 形状測定装置、形状測定方法、およびガラス板の製造方法
CN102939513B (zh) 2010-06-15 2016-09-07 旭硝子株式会社 形状测定装置、形状测定方法及玻璃板的制造方法
KR101249758B1 (ko) * 2010-11-25 2013-04-02 (주)쎄미시스코 유리 기판의 불균일도 측정 시스템 및 방법
US8351051B2 (en) 2010-11-25 2013-01-08 Semisysco Co., Ltd. System and method of measuring irregularity of a glass substrate
US20120133761A1 (en) * 2010-11-30 2012-05-31 Angstrom, Inc. Uneven area inspection system
JP5529829B2 (ja) * 2011-11-01 2014-06-25 株式会社神戸製鋼所 高さ測定装置及び高さ測定方法
US9295532B2 (en) * 2011-11-10 2016-03-29 Carestream Health, Inc. 3D intraoral measurements using optical multiline method
US9349182B2 (en) * 2011-11-10 2016-05-24 Carestream Health, Inc. 3D intraoral measurements using optical multiline method
JP5749150B2 (ja) * 2011-12-22 2015-07-15 株式会社Sumco シリカガラスルツボの赤外吸収スペクトルの三次元分布の決定方法、シリコン単結晶の製造方法
EP2860490A4 (en) * 2012-06-12 2016-03-02 Shima Seiki Mfg THREE-DIMENSIONAL MEASURING APPARATUS AND THREE-DIMENSIONAL MEASURING METHOD
KR102263507B1 (ko) * 2013-12-27 2021-06-11 에이지씨 가부시키가이샤 형상 측정 장치, 형상 측정 방법 및 유리판의 제조 방법
CN103995000B (zh) * 2014-05-15 2017-01-11 京东方科技集团股份有限公司 一种显示基板的检查装置及检查系统
JP6694873B2 (ja) 2014-08-28 2020-05-20 ケアストリーム ヘルス インク 歯の表面に従ってセンサ画素配列を照射画素配列にマッピングするための装置の作動方法、及び、歯の表面輪郭画像を提供する装置の作動方法
JP5923644B2 (ja) * 2015-05-13 2016-05-24 株式会社Sumco シリカガラスルツボの赤外吸収スペクトルの三次元分布の決定方法、シリコン単結晶の製造方法
CN105091784A (zh) * 2015-06-30 2015-11-25 东莞市盟拓光电科技有限公司 用于表面为镜面或透明表面的被测物的三维成像系统
JP6642223B2 (ja) 2016-04-13 2020-02-05 Ａｇｃ株式会社 透明板表面検査装置、透明板表面検査方法、およびガラス板の製造方法
DE102016223671A1 (de) * 2016-11-29 2018-05-30 Continental Automotive Gmbh Leuchtsystem zur Ermittlung geometrischer Eigenschaften sowie Fahrerassistenzsystem und Verfahren dazu
MX2021000993A (es) 2018-07-24 2021-06-15 Glasstech Inc Sistema y metodo para medir una superficie en láminas de vidrio contorneado.
KR102199314B1 (ko) * 2019-03-07 2021-01-06 (주) 인텍플러스 디스플레이 패널 검사장치
JP7083856B2 (ja) * 2020-01-07 2022-06-13 日本電子株式会社 高さ測定装置、荷電粒子線装置、および高さ測定方法

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JP2001502800A (ja) * 1996-10-18 2001-02-27 インノメス・ゲゼルシャフト・フュア・メステクニク・エム・ベー・ハー 反射表面の経路を測定する方法及び装置
JP2004514882A (ja) 2000-11-22 2004-05-20 サン−ゴバン　グラス　フランス 基板表面の走査方法および装置

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JP3411829B2 (ja) * 1997-07-02 2003-06-03 旭硝子株式会社 表面形状の評価方法および評価装置
JP2004167621A (ja) 2002-11-19 2004-06-17 Toyo Advanced Technologies Co Ltd ホーニング加工装置の砥石径拡縮部材の作動方法およびホーニング加工装置

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JP2001502800A (ja) * 1996-10-18 2001-02-27 インノメス・ゲゼルシャフト・フュア・メステクニク・エム・ベー・ハー 反射表面の経路を測定する方法及び装置
JP2004514882A (ja) 2000-11-22 2004-05-20 サン−ゴバン　グラス　フランス 基板表面の走査方法および装置

Also Published As

Publication number Publication date
US20070091319A1 (en) 2007-04-26
TW200606399A (en) 2006-02-16
JP2005345383A (ja) 2005-12-15
EP1750087B1 (en) 2011-12-21
US7394536B2 (en) 2008-07-01
KR20070019984A (ko) 2007-02-16
EP2278270A3 (en) 2011-10-19
JP4645068B2 (ja) 2011-03-09
EP2278270A2 (en) 2011-01-26
TWI372235B (enExample) 2012-09-11
EP1750087A1 (en) 2007-02-07
WO2005119172A1 (ja) 2005-12-15
EP1750087A4 (en) 2008-03-26

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