MX2021000993A - Sistema y metodo para medir una superficie en láminas de vidrio contorneado. - Google Patents

Sistema y metodo para medir una superficie en láminas de vidrio contorneado.

Info

Publication number
MX2021000993A
MX2021000993A MX2021000993A MX2021000993A MX2021000993A MX 2021000993 A MX2021000993 A MX 2021000993A MX 2021000993 A MX2021000993 A MX 2021000993A MX 2021000993 A MX2021000993 A MX 2021000993A MX 2021000993 A MX2021000993 A MX 2021000993A
Authority
MX
Mexico
Prior art keywords
inspection system
glass sheet
optical inspection
visible wavelength
sheet
Prior art date
Application number
MX2021000993A
Other languages
English (en)
Inventor
Jason C Addington
Michael J Vild
Benjamin L Moran
Original Assignee
Glasstech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glasstech Inc filed Critical Glasstech Inc
Publication of MX2021000993A publication Critical patent/MX2021000993A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/593—Depth or shape recovery from multiple images from stereo images
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
    • H04N13/106—Processing image signals
    • H04N13/111—Transformation of image signals corresponding to virtual viewpoints, e.g. spatial image interpolation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
    • H04N13/106—Processing image signals
    • H04N13/128—Adjusting depth or disparity
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/243—Image signal generators using stereoscopic image cameras using three or more 2D image sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/254—Image signal generators using stereoscopic image cameras in combination with electromagnetic radiation sources for illuminating objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10064—Fluorescence image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Abstract

Se proporciona un sistema de inspección óptica para un láser ultravioleta y una óptica asociada que forman una lámina láser plana dirigida a una lámina de vidrio. La lámina láser plana se interseca con una superficie de la lámina de vidrio, lo que provoca de ese modo que la superficie de la lámina de vidrio emita fluorescencia y forme una línea de longitud de onda visible en la superficie. Una cámara tiene un sensor de imagen para detectar la línea de longitud de onda visible. Se lo configura un sistema de control para recibir datos de imagen indicativos de la línea de longitud de onda visible, analizar y triangular los datos para determinar una serie de coordenadas asociadas con la línea y crear un mapa tridimensional de la superficie de la lámina de vidrio en función de las series de coordenadas. También se proporcionan métodos para utilizar un sistema de inspección óptica, para calibrar una superficie utilizando un sistema de inspección óptica y para proporcionar información de la reflectancia óptica de una superficie utilizando un sistema de inspección óptica.
MX2021000993A 2018-07-24 2019-07-24 Sistema y metodo para medir una superficie en láminas de vidrio contorneado. MX2021000993A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862702617P 2018-07-24 2018-07-24
PCT/US2019/043180 WO2020023599A1 (en) 2018-07-24 2019-07-24 System and method for measuring a surface in contoured glass sheets

Publications (1)

Publication Number Publication Date
MX2021000993A true MX2021000993A (es) 2021-06-15

Family

ID=69181147

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2021000993A MX2021000993A (es) 2018-07-24 2019-07-24 Sistema y metodo para medir una superficie en láminas de vidrio contorneado.

Country Status (11)

Country Link
US (1) US20210304396A1 (es)
EP (1) EP3827246B1 (es)
JP (1) JP2021530712A (es)
KR (1) KR20210033030A (es)
CN (1) CN112534240A (es)
AU (1) AU2019310451A1 (es)
BR (1) BR112021001219A2 (es)
CA (1) CA3107458A1 (es)
IL (1) IL280324A (es)
MX (1) MX2021000993A (es)
WO (1) WO2020023599A1 (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020060772A1 (en) * 2018-09-19 2020-03-26 Corning Incorporated Methods of measuring a size of edge defects of glass sheets using an edge defect gauge and corresponding edge defect gauge
EP3869793B1 (en) * 2020-02-19 2022-10-12 Sick IVP AB Method for reducing effects of laser speckles
CN113790674A (zh) * 2021-08-06 2021-12-14 河北光兴半导体技术有限公司 用于玻璃制品的测量方法、处理器和测量装置
CN113970300A (zh) * 2021-12-23 2022-01-25 湖南特玻智造科技有限公司 一种玻璃退火状态在线监测装置及方法
US20230222766A1 (en) * 2022-01-12 2023-07-13 Standard Stone, Inc. System and method for capturing consistent standardized photographs and using photographs for categorizing products
CN115015206B (zh) * 2022-07-15 2022-11-11 合肥工业大学 基于紫外荧光法的玻璃表面洁净度检测装置及检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI98757C (fi) * 1995-05-31 1997-08-11 Tamglass Eng Oy Menetelmä taivutetun lasilevyn taipumisasteen mittaamiseksi
DE102004027411A1 (de) * 2004-06-04 2005-12-29 Boraglas Gmbh Verfahren und Vorrichtung zur Identifizierung von Zinn- und Feuerseite bei Floatgläsern
US20120098959A1 (en) * 2010-10-20 2012-04-26 Glasstech, Inc. Method and apparatus for measuring transmitted optical distortion in glass sheets
US20150085080A1 (en) * 2012-04-18 2015-03-26 3Shape A/S 3d scanner using merged partial images
EP2865988B1 (de) * 2013-10-22 2018-09-19 Baumer Electric Ag Lichtschnittsensor
US10012496B2 (en) * 2015-10-29 2018-07-03 Canon Kabushiki Kaisha Multispectral binary coded projection using multiple projectors
CN108053367B (zh) * 2017-12-08 2021-04-20 北京信息科技大学 一种基于rgb-d特征匹配的3d点云拼接与融合方法
JP7187830B2 (ja) * 2018-06-13 2022-12-13 富士通株式会社 画像処理プログラム、画像処理装置、及び画像処理方法

Also Published As

Publication number Publication date
US20210304396A1 (en) 2021-09-30
EP3827246A1 (en) 2021-06-02
EP3827246B1 (en) 2024-04-17
BR112021001219A2 (pt) 2021-04-27
AU2019310451A1 (en) 2021-02-18
KR20210033030A (ko) 2021-03-25
CN112534240A (zh) 2021-03-19
CA3107458A1 (en) 2020-01-30
JP2021530712A (ja) 2021-11-11
IL280324A (en) 2021-03-25
EP3827246A4 (en) 2022-03-30
WO2020023599A1 (en) 2020-01-30

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