WO2010005591A3 - An inspection system and method - Google Patents

An inspection system and method Download PDF

Info

Publication number
WO2010005591A3
WO2010005591A3 PCT/US2009/004030 US2009004030W WO2010005591A3 WO 2010005591 A3 WO2010005591 A3 WO 2010005591A3 US 2009004030 W US2009004030 W US 2009004030W WO 2010005591 A3 WO2010005591 A3 WO 2010005591A3
Authority
WO
WIPO (PCT)
Prior art keywords
component
light beam
collimated light
algorithm
silhouette
Prior art date
Application number
PCT/US2009/004030
Other languages
French (fr)
Other versions
WO2010005591A2 (en
Inventor
Stanley P. Johnson
Lawrence J. ZAGORSKY
Original Assignee
Johnson Thread-View Systems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/383,141 external-priority patent/US8035094B2/en
Application filed by Johnson Thread-View Systems filed Critical Johnson Thread-View Systems
Priority to JP2011517427A priority Critical patent/JP2012504223A/en
Priority to EP09794834.3A priority patent/EP2359122A4/en
Publication of WO2010005591A2 publication Critical patent/WO2010005591A2/en
Publication of WO2010005591A3 publication Critical patent/WO2010005591A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A system and method for measuring the physical characteristics of a component where the system includes a light source, a sensing device, a reflecting device, and a retention mount. The method includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.
PCT/US2009/004030 2008-07-10 2009-07-10 An inspection system and method WO2010005591A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011517427A JP2012504223A (en) 2008-07-10 2009-07-10 Inspection system and method
EP09794834.3A EP2359122A4 (en) 2008-07-10 2009-07-10 An inspection system and method

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US13448708P 2008-07-10 2008-07-10
US61/134,487 2008-07-10
US12/383,141 2009-03-20
US12/383,141 US8035094B2 (en) 2002-06-17 2009-03-20 Methods for measuring at least one physical characteristic of a component

Publications (2)

Publication Number Publication Date
WO2010005591A2 WO2010005591A2 (en) 2010-01-14
WO2010005591A3 true WO2010005591A3 (en) 2011-07-14

Family

ID=41507641

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2009/004030 WO2010005591A2 (en) 2008-07-10 2009-07-10 An inspection system and method

Country Status (3)

Country Link
EP (1) EP2359122A4 (en)
JP (1) JP2012504223A (en)
WO (1) WO2010005591A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104459936A (en) * 2014-12-11 2015-03-25 北京空间机电研究所 Microstress assembling method for large-caliber reflector assembly

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2392895B1 (en) * 2010-06-01 2013-03-06 Tenaris Connections Ltd. Method for measurement of geometrical parameters of coated threaded joints
ITRN20110031A1 (en) * 2011-05-03 2012-11-04 Vici & C S R L METHOD OF OPTO-ELECTRONIC DETERMINATION OF THREAD PARAMETERS
EP3324194B1 (en) * 2016-11-22 2019-06-26 Anton Paar GmbH Imaging a gap between sample and probe of a scanning probe microscope in substantially horizontal side view
CN110849287B (en) * 2019-11-27 2021-05-25 陕西理工大学 Machine vision thread form angle compensation method

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3009253A (en) * 1959-08-14 1961-11-21 Bror W Swanson Thread comparator
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
US5646724A (en) * 1995-08-18 1997-07-08 Candid Logic, Inc. Threaded parts inspection device
US5712706A (en) * 1991-08-21 1998-01-27 M&M Precision Systems Corporation Laser scanning method and apparatus for rapid precision measurement of thread form
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US20030101602A1 (en) * 2000-01-12 2003-06-05 Reginald Galestien Measurement of geometric parameters of internal and external screw thread and similar grooves
US6683995B2 (en) * 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
US20060273269A1 (en) * 2002-06-17 2006-12-07 Johnson Stanley P Inspection system and method
US20080049235A1 (en) * 2006-08-25 2008-02-28 David Crowther Profile inspection system for threaded and axial components
US20080151268A1 (en) * 2004-02-20 2008-06-26 Archie Charles N Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5811804A (en) * 1981-07-14 1983-01-22 Sumitomo Metal Ind Ltd Method and device for measuring screw shape
JP2006153809A (en) * 2004-12-01 2006-06-15 Mitsubishi Nuclear Fuel Co Ltd Inside face inspection device, and inspection device for inside face of can
US7440120B2 (en) * 2006-06-27 2008-10-21 Barbara E. Parlour Internal and external measuring device

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3009253A (en) * 1959-08-14 1961-11-21 Bror W Swanson Thread comparator
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
US5712706A (en) * 1991-08-21 1998-01-27 M&M Precision Systems Corporation Laser scanning method and apparatus for rapid precision measurement of thread form
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US5646724A (en) * 1995-08-18 1997-07-08 Candid Logic, Inc. Threaded parts inspection device
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US6683995B2 (en) * 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
US20030101602A1 (en) * 2000-01-12 2003-06-05 Reginald Galestien Measurement of geometric parameters of internal and external screw thread and similar grooves
US20060273269A1 (en) * 2002-06-17 2006-12-07 Johnson Stanley P Inspection system and method
US20080151268A1 (en) * 2004-02-20 2008-06-26 Archie Charles N Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
US20080049235A1 (en) * 2006-08-25 2008-02-28 David Crowther Profile inspection system for threaded and axial components

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
GABRIEL: "Least Squares Approximation of Matrices by Additive and Multiplicative Models", JOURNAL OF ROYAL STATISTICAL SOCIETY, SERIES B (METHODOLOGICAL), vol. 40, no. 2, December 1978 (1978-12-01), XP055107409, Retrieved from the Internet <URL:http://venus.unive.it/romanazldatamiNarticoli/gabriel.pdf> [retrieved on 20110305] *
MUTAN: "COMPARISON OF REGRESSION TECHNIQUES VIA MONTE CARLO SIMULATION.", June 2004 (2004-06-01), pages 33, XP055107404, Retrieved from the Internet <URL:http://etd.lib.metu.edu.tr/upload/3/12605175/index.pdf> [retrieved on 20110305] *
See also references of EP2359122A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104459936A (en) * 2014-12-11 2015-03-25 北京空间机电研究所 Microstress assembling method for large-caliber reflector assembly

Also Published As

Publication number Publication date
JP2012504223A (en) 2012-02-16
EP2359122A2 (en) 2011-08-24
EP2359122A4 (en) 2017-03-29
WO2010005591A2 (en) 2010-01-14

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