EP2359122A4 - An inspection system and method - Google Patents

An inspection system and method Download PDF

Info

Publication number
EP2359122A4
EP2359122A4 EP09794834.3A EP09794834A EP2359122A4 EP 2359122 A4 EP2359122 A4 EP 2359122A4 EP 09794834 A EP09794834 A EP 09794834A EP 2359122 A4 EP2359122 A4 EP 2359122A4
Authority
EP
European Patent Office
Prior art keywords
inspection system
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP09794834.3A
Other languages
German (de)
French (fr)
Other versions
EP2359122A2 (en
Inventor
Stanley P. Johnson
Lawrence J. ZAGORSKY
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quest Metrology LLC
Original Assignee
Quest Metrology LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/383,141 external-priority patent/US8035094B2/en
Application filed by Quest Metrology LLC filed Critical Quest Metrology LLC
Publication of EP2359122A2 publication Critical patent/EP2359122A2/en
Publication of EP2359122A4 publication Critical patent/EP2359122A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP09794834.3A 2008-07-10 2009-07-10 An inspection system and method Withdrawn EP2359122A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13448708P 2008-07-10 2008-07-10
US12/383,141 US8035094B2 (en) 2002-06-17 2009-03-20 Methods for measuring at least one physical characteristic of a component
PCT/US2009/004030 WO2010005591A2 (en) 2008-07-10 2009-07-10 An inspection system and method

Publications (2)

Publication Number Publication Date
EP2359122A2 EP2359122A2 (en) 2011-08-24
EP2359122A4 true EP2359122A4 (en) 2017-03-29

Family

ID=41507641

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09794834.3A Withdrawn EP2359122A4 (en) 2008-07-10 2009-07-10 An inspection system and method

Country Status (3)

Country Link
EP (1) EP2359122A4 (en)
JP (1) JP2012504223A (en)
WO (1) WO2010005591A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2392895B1 (en) * 2010-06-01 2013-03-06 Tenaris Connections Ltd. Method for measurement of geometrical parameters of coated threaded joints
ITRN20110031A1 (en) * 2011-05-03 2012-11-04 Vici & C S R L METHOD OF OPTO-ELECTRONIC DETERMINATION OF THREAD PARAMETERS
CN104459936B (en) * 2014-12-11 2017-01-18 北京空间机电研究所 Microstress assembling method for large-caliber reflector assembly
EP3324194B1 (en) * 2016-11-22 2019-06-26 Anton Paar GmbH Imaging a gap between sample and probe of a scanning probe microscope in substantially horizontal side view
CN110849287B (en) * 2019-11-27 2021-05-25 陕西理工大学 Machine vision thread form angle compensation method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153809A (en) * 2004-12-01 2006-06-15 Mitsubishi Nuclear Fuel Co Ltd Inside face inspection device, and inspection device for inside face of can
US20080043252A1 (en) * 2006-06-27 2008-02-21 Parlour Noel S Internal and external measuring device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3009253A (en) * 1959-08-14 1961-11-21 Bror W Swanson Thread comparator
JPS5811804A (en) * 1981-07-14 1983-01-22 Sumitomo Metal Ind Ltd Method and device for measuring screw shape
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
US5521707A (en) * 1991-08-21 1996-05-28 Apeiron, Inc. Laser scanning method and apparatus for rapid precision measurement of thread form
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US5646724A (en) * 1995-08-18 1997-07-08 Candid Logic, Inc. Threaded parts inspection device
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US6683995B2 (en) * 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
NL1014067C2 (en) * 2000-01-12 2001-07-16 Reginald Ir Galestien A method of measuring parameters of internal and external threads and similar grooves using wedge probes.
US7777209B2 (en) * 2002-06-17 2010-08-17 Johnson Stanley P Product inspection system and a method for implementing same
US7453583B2 (en) * 2004-02-20 2008-11-18 International Business Machines Corporation Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
US7684054B2 (en) * 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153809A (en) * 2004-12-01 2006-06-15 Mitsubishi Nuclear Fuel Co Ltd Inside face inspection device, and inspection device for inside face of can
US20080043252A1 (en) * 2006-06-27 2008-02-21 Parlour Noel S Internal and external measuring device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PFEIFER T ET AL: "BERUHRUNGSLOSE OPTISCHE INNENGEWINDEMESSUNG", TR TRANSFER: EUROPAEISCHE INDUSTRIE- UND HANDELSZEITUNG, HALLWAG AG, CH, vol. 81, no. 4, 27 January 1989 (1989-01-27), pages 52 - 55,57, XP000046253, ISSN: 1023-0823 *

Also Published As

Publication number Publication date
WO2010005591A3 (en) 2011-07-14
WO2010005591A2 (en) 2010-01-14
JP2012504223A (en) 2012-02-16
EP2359122A2 (en) 2011-08-24

Similar Documents

Publication Publication Date Title
WO2009121628A9 (en) Optical inspection system and method
EP2353108A4 (en) Method and system for analyzing text
IL208496A0 (en) Bioretention system and method
SI2163094T1 (en) Method and system for monitoring an environment
GB2464453B8 (en) An imaging system and method
EP2373558A4 (en) Method and system for providing dock-assist
EP2344872A4 (en) System and method for ultrasonic testing
EP2321795A4 (en) Image analysis method and system
EP2350952A4 (en) An advertising system and method
EP2395704A4 (en) Method and system for implementing measurement
GB0810413D0 (en) Method and system
EP2287636A4 (en) Method and system for inspecting special nuclear material
GB0812553D0 (en) Connection system and method
EP2351512A4 (en) Position detection system and position detection method
IL232271A0 (en) Yahreit system and method
EP2510472A4 (en) System and method for lacunarity analysis
EP2359122A4 (en) An inspection system and method
IL189007A0 (en) System and method for evaluating an area
AU2009901899A0 (en) An inspection method and system
AU2006900412A0 (en) Inspection system and method
AU2008906545A0 (en) Fixing system and method
AU2008905028A0 (en) An Advertising System and Method
AU2009904407A0 (en) Analysis method and system
AU2008903841A0 (en) Method and system for obtaining consent
AU2008906381A0 (en) Development monitoring system and method

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20110207

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: JOHNSON THREAD-VIEW SYSTEMS LLC

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: QUEST METROLOGY GROUP, LLC

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: QUEST METROLOGY, LLC

DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20170301

RIC1 Information provided on ipc code assigned before grant

Ipc: G01B 11/12 20060101ALI20170222BHEP

Ipc: G01N 21/954 20060101ALI20170222BHEP

Ipc: G01N 21/88 20060101ALI20170222BHEP

Ipc: G01B 11/24 20060101AFI20170222BHEP

Ipc: G01N 21/95 20060101ALI20170222BHEP

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20170911