KR100766512B1 - 반도체 칩의 박리 방법 및 장치 - Google Patents
반도체 칩의 박리 방법 및 장치 Download PDFInfo
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- KR100766512B1 KR100766512B1 KR1020020014454A KR20020014454A KR100766512B1 KR 100766512 B1 KR100766512 B1 KR 100766512B1 KR 1020020014454 A KR1020020014454 A KR 1020020014454A KR 20020014454 A KR20020014454 A KR 20020014454A KR 100766512 B1 KR100766512 B1 KR 100766512B1
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- Prior art keywords
- contact member
- peeling
- annular contact
- tape
- semiconductor chip
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68318—Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
- H01L2221/68322—Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/934—Apparatus having delaminating means adapted for delaminating a specified article
- Y10S156/941—Means for delaminating semiconductive product
- Y10S156/943—Means for delaminating semiconductive product with poking delaminating means, e.g. jabbing means
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/976—Temporary protective layer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1168—Gripping and pulling work apart during delaminating
- Y10T156/1179—Gripping and pulling work apart during delaminating with poking during delaminating [e.g., jabbing, etc.]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1978—Delaminating bending means
- Y10T156/1983—Poking delaminating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49815—Disassembling
- Y10T29/49822—Disassembling by applying force
- Y10T29/49824—Disassembling by applying force to elastically deform work part or connector
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Dicing (AREA)
Abstract
Description
Claims (10)
- 삭제
- 삭제
- 삭제
- 삭제
- 내주면에 내측 견부(肩部)를 갖는 환상(環狀)의 제1접촉부재와, 상기 제1접촉부재의 내측에 배치되는 제2접촉부재로서 외주면에 상기 내측 견부에 의해 지지되는 외측 견부를 갖는 제2접촉부재를 구비한 박리 헤드에 의해서, 테이프에 붙여진 반도체 칩을 상기 테이프로부터 박리시키는 반도체 칩의 박리 방법으로서,상기 제1접촉부재를 캠에 의해 가압(押壓)하여, 상기 제1접촉부재와 상기 제2접촉부재를 제1위치로 상승시켜, 상기 반도체 칩을 밀어올리는 공정과,상기 제1접촉부재와 상기 제2접촉부재를 제1위치로 상승시킨 후, 상기 제1접촉부재를 상기 캠에 의해 상기 제1위치로 유지하면서, 상기 제2접촉부재를 상기 캠에 의해 더 가압하여 상기 제2접촉부재를 상기 제1위치보다 높은 제2위치로 상승시켜, 상기 반도체 칩을 더 밀어 올리는 공정을 포함하는 것을 특징으로 하는 반도체 칩의 박리 방법.
- 제 5 항에 있어서,상기 제1접촉부재는 상기 박리 헤드의 가장 외측에 배치되는 것을 특징으로 하는 반도체 칩의 박리 방법.
- 제 5 항에 있어서,상기 외측 견부가 상기 내측 견부에 접촉하고 있는 상태에서, 상기 제1접촉부재의 상면과 상기 제2접촉부재의 상면이 공통의 평면 내에 정렬하는 것을 특징으로 하는 반도체 칩의 박리 방법.
- 테이프에 붙여진 반도체 칩을 상기 테이프로부터 박리시키기 위한 박리 장치로서,내주면에 내측 견부(肩部)를 갖는 환상(環狀)의 제1접촉부재와, 상기 제1접촉부재의 내측에 배치되는 제2접촉부재로서 외주면에 상기 내측 견부에 의해 지지되는 외측 견부를 갖는 제2접촉부재를 구비한 박리 헤드와,상기 제1접촉부재를 가압(押壓)하여 상기 제1접촉부재와 상기 제2접촉부재를 제1위치로 상승시킨 후, 상기 제1접촉부재를 상기 제1위치로 유지하면서 상기 제2접촉부재를 더 가압하여, 상기 제2접촉부재를 상기 제1접촉부재보다 높은 제2위치로 상승시키는 것에 의해, 상기 테이프로부터 상기 반도체 칩을 외주부로부터 중심부를 향해 단계적으로 박리하는 캠을 포함하는 것을 특징으로 하는 반도체 칩의 박리 장치.
- 제 8 항에 있어서,상기 제1접촉부재는 상기 박리 헤드의 가장 외측에 배치되는 것을 특징으로 하는 반도체 칩의 박리 장치.
- 제 8 항에 있어서,상기 외측 견부가 상기 내측 견부에 접촉하고 있는 상태에서, 상기 제1접촉부재의 상면과 상기 제2접촉부재의 상면이 공통의 평면 내에 정렬하는 것을 특징으로 하는 반도체 칩의 박리 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2001-00325113 | 2001-10-23 | ||
JP2001325113A JP3976541B2 (ja) | 2001-10-23 | 2001-10-23 | 半導体チップの剥離方法及び装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030035763A KR20030035763A (ko) | 2003-05-09 |
KR100766512B1 true KR100766512B1 (ko) | 2007-10-15 |
Family
ID=19141732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020014454A KR100766512B1 (ko) | 2001-10-23 | 2002-03-18 | 반도체 칩의 박리 방법 및 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6824643B2 (ko) |
JP (1) | JP3976541B2 (ko) |
KR (1) | KR100766512B1 (ko) |
CN (1) | CN1210760C (ko) |
TW (1) | TW540089B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200141675A (ko) * | 2019-06-11 | 2020-12-21 | 세메스 주식회사 | 다이 이젝팅 장치 |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100480628B1 (ko) * | 2002-11-11 | 2005-03-31 | 삼성전자주식회사 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
JP4574251B2 (ja) * | 2003-09-17 | 2010-11-04 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US20060137828A1 (en) * | 2004-05-31 | 2006-06-29 | Kabushiki Kaisha Shinkawa | Die pickup apparatus |
CH697213A5 (de) * | 2004-05-19 | 2008-06-25 | Alphasem Ag | Verfahren und Vorrichtung zum Ablösen eines auf eine flexible Folie geklebten Bauteils. |
US20050274457A1 (en) * | 2004-05-28 | 2005-12-15 | Asm Assembly Automation Ltd. | Peeling device for chip detachment |
KR100582056B1 (ko) * | 2004-07-05 | 2006-05-23 | 삼성전자주식회사 | 박형 칩 분리 장치 및 그를 이용한 박형 칩 분리 방법 |
JP4624813B2 (ja) * | 2005-01-21 | 2011-02-02 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法および半導体製造装置 |
US7238258B2 (en) * | 2005-04-22 | 2007-07-03 | Stats Chippac Ltd. | System for peeling semiconductor chips from tape |
US7534722B2 (en) | 2005-06-14 | 2009-05-19 | John Trezza | Back-to-front via process |
US7969015B2 (en) | 2005-06-14 | 2011-06-28 | Cufer Asset Ltd. L.L.C. | Inverse chip connector |
WO2006138493A2 (en) * | 2005-06-14 | 2006-12-28 | Cubic Wafer, Inc. | Chip tooling |
US7786592B2 (en) | 2005-06-14 | 2010-08-31 | John Trezza | Chip capacitive coupling |
US7781886B2 (en) | 2005-06-14 | 2010-08-24 | John Trezza | Electronic chip contact structure |
US7851348B2 (en) | 2005-06-14 | 2010-12-14 | Abhay Misra | Routingless chip architecture |
US8456015B2 (en) | 2005-06-14 | 2013-06-04 | Cufer Asset Ltd. L.L.C. | Triaxial through-chip connection |
US7560813B2 (en) | 2005-06-14 | 2009-07-14 | John Trezza | Chip-based thermo-stack |
US7687400B2 (en) | 2005-06-14 | 2010-03-30 | John Trezza | Side stacking apparatus and method |
US7521806B2 (en) | 2005-06-14 | 2009-04-21 | John Trezza | Chip spanning connection |
US7215032B2 (en) | 2005-06-14 | 2007-05-08 | Cubic Wafer, Inc. | Triaxial through-chip connection |
US7838997B2 (en) | 2005-06-14 | 2010-11-23 | John Trezza | Remote chip attachment |
JP4616748B2 (ja) * | 2005-10-11 | 2011-01-19 | 株式会社新川 | ダイピックアップ装置 |
JP4765536B2 (ja) * | 2005-10-14 | 2011-09-07 | パナソニック株式会社 | チップピックアップ装置およびチップピックアップ方法ならびにチップ剥離装置およびチップ剥離方法 |
TW200719394A (en) * | 2005-11-04 | 2007-05-16 | Tokyo Seimitsu Co Ltd | Method and device for peeling off film |
US7637639B2 (en) * | 2005-12-21 | 2009-12-29 | 3M Innovative Properties Company | LED emitter with radial prismatic light diverter |
US7687397B2 (en) | 2006-06-06 | 2010-03-30 | John Trezza | Front-end processed wafer having through-chip connections |
KR20070120319A (ko) * | 2006-06-19 | 2007-12-24 | 삼성전자주식회사 | 한 쌍의 이젝터들을 구비하는 반도체 칩의 탈착 장치 및이를 이용한 반도체 칩의 탈착 방법 |
JP2008103493A (ja) * | 2006-10-18 | 2008-05-01 | Lintec Corp | チップのピックアップ方法及びピックアップ装置 |
JP4825637B2 (ja) * | 2006-10-31 | 2011-11-30 | 芝浦メカトロニクス株式会社 | 半導体チップのピックアップ装置 |
US8221583B2 (en) * | 2007-01-20 | 2012-07-17 | Stats Chippac Ltd. | System for peeling semiconductor chips from tape |
US7670874B2 (en) | 2007-02-16 | 2010-03-02 | John Trezza | Plated pillar package formation |
JP4985513B2 (ja) * | 2008-03-26 | 2012-07-25 | 富士通セミコンダクター株式会社 | 電子部品の剥離方法及び剥離装置 |
JP5075013B2 (ja) * | 2008-05-27 | 2012-11-14 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置の製造方法 |
US8141612B2 (en) * | 2009-04-02 | 2012-03-27 | Asm Assembly Automation Ltd | Device for thin die detachment and pick-up |
TWI395281B (zh) * | 2009-07-23 | 2013-05-01 | Epistar Corp | 晶粒分類裝置 |
US8092645B2 (en) * | 2010-02-05 | 2012-01-10 | Asm Assembly Automation Ltd | Control and monitoring system for thin die detachment and pick-up |
US8801352B2 (en) * | 2011-08-11 | 2014-08-12 | International Business Machines Corporation | Pick and place tape release for thin semiconductor dies |
JP5687647B2 (ja) * | 2012-03-14 | 2015-03-18 | 株式会社東芝 | 半導体装置の製造方法、半導体製造装置 |
CH706280B1 (de) * | 2012-03-30 | 2016-03-15 | Esec Ag | Verfahren zum Ablösen eines Halbleiterchips von einer Folie. |
KR101397750B1 (ko) * | 2012-07-25 | 2014-05-21 | 삼성전기주식회사 | 칩 이젝터 및 이를 이용한 칩 탈착 방법 |
KR20140107982A (ko) * | 2013-02-28 | 2014-09-05 | 삼성전자주식회사 | 다이 이젝터 및 다이 분리 방법 |
JP2015008191A (ja) * | 2013-06-25 | 2015-01-15 | 富士電機株式会社 | 半導体装置の製造方法 |
JP2015065367A (ja) * | 2013-09-26 | 2015-04-09 | 株式会社テセック | 剥離装置およびピックアップシステム |
JP5717910B1 (ja) * | 2014-02-26 | 2015-05-13 | 株式会社新川 | 半導体ダイのピックアップ装置及びピックアップ方法 |
SG10201403372SA (en) * | 2014-06-18 | 2016-01-28 | Mfg Integration Technology Ltd | System and method for peeling a semiconductor chip from a tape using a multistage ejector |
KR102336572B1 (ko) * | 2015-01-23 | 2021-12-08 | 삼성디스플레이 주식회사 | 기판 탈착 장치 및 이를 이용한 표시장치의 제조 방법 |
US9553010B2 (en) * | 2015-06-25 | 2017-01-24 | Coreflow Ltd. | Wafer gripper with non-contact support platform |
CN105514301B (zh) * | 2016-01-21 | 2017-10-24 | 武汉华星光电技术有限公司 | 蒸镀装置及蒸镀方法 |
TWI641070B (zh) * | 2018-01-09 | 2018-11-11 | 力成科技股份有限公司 | 晶片頂針裝置 |
JP2019169516A (ja) * | 2018-03-22 | 2019-10-03 | 東芝メモリ株式会社 | 半導体装置の突き上げ装置及び突き上げ方法 |
US11062923B2 (en) * | 2018-09-28 | 2021-07-13 | Rohinni, LLC | Apparatus to control transfer parameters during transfer of semiconductor devices |
JP7274902B2 (ja) * | 2019-03-25 | 2023-05-17 | ファスフォードテクノロジ株式会社 | 半導体製造装置および半導体装置の製造方法 |
KR102178047B1 (ko) * | 2019-05-08 | 2020-11-12 | 세메스 주식회사 | 다이 이젝팅 장치 |
JP7326861B2 (ja) * | 2019-05-17 | 2023-08-16 | 三菱電機株式会社 | 半導体製造装置及び半導体装置の製造方法 |
JP7486264B2 (ja) | 2019-11-06 | 2024-05-17 | 株式会社ディスコ | ピックアップ方法、及び、ピックアップ装置 |
US11764098B2 (en) * | 2021-04-16 | 2023-09-19 | Asmpt Singapore Pte. Ltd. | Detaching a die from an adhesive tape by air ejection |
JP2023064405A (ja) * | 2021-10-26 | 2023-05-11 | 三菱電機株式会社 | 半導体製造装置および半導体装置の製造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01321650A (ja) * | 1988-06-22 | 1989-12-27 | Kawasaki Steel Corp | 半導体チツプのピツクアツプ装置 |
JPH02113547A (ja) * | 1988-10-21 | 1990-04-25 | Mitsubishi Electric Corp | 突出し装置 |
JPH11297793A (ja) * | 1998-04-06 | 1999-10-29 | Mitsubishi Electric Corp | チップ突き上げ装置及びそれを用いたダイボンディング装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3785507A (en) * | 1968-12-19 | 1974-01-15 | Teledyne Inc | Die sorting system |
JPS62166536A (ja) * | 1986-01-20 | 1987-07-23 | Sanyo Electric Co Ltd | 電子部品の突き上げ装置 |
US4850780A (en) * | 1987-09-28 | 1989-07-25 | Kulicke And Soffa Industries Inc. | Pre-peel die ejector apparatus |
JPH0266957A (ja) * | 1988-08-31 | 1990-03-07 | Nec Corp | 半導体素子のピックアップ装置 |
JP3117326B2 (ja) | 1993-05-28 | 2000-12-11 | 株式会社東芝 | 半導体チップ取出装置 |
JPH10189690A (ja) | 1996-12-26 | 1998-07-21 | Hitachi Ltd | 半導体チップのピックアップ方法及びピックアップ装置 |
JP2000353710A (ja) * | 1999-06-14 | 2000-12-19 | Toshiba Corp | ペレットピックアップ装置および半導体装置の製造方法 |
JP3209736B2 (ja) | 1999-11-09 | 2001-09-17 | エヌイーシーマシナリー株式会社 | ペレットピックアップ装置 |
JP3892703B2 (ja) * | 2001-10-19 | 2007-03-14 | 富士通株式会社 | 半導体基板用治具及びこれを用いた半導体装置の製造方法 |
-
2001
- 2001-10-23 JP JP2001325113A patent/JP3976541B2/ja not_active Expired - Fee Related
-
2002
- 2002-03-04 US US10/086,729 patent/US6824643B2/en not_active Expired - Lifetime
- 2002-03-05 TW TW091104019A patent/TW540089B/zh not_active IP Right Cessation
- 2002-03-18 KR KR1020020014454A patent/KR100766512B1/ko not_active IP Right Cessation
- 2002-03-26 CN CNB021080585A patent/CN1210760C/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01321650A (ja) * | 1988-06-22 | 1989-12-27 | Kawasaki Steel Corp | 半導体チツプのピツクアツプ装置 |
JPH02113547A (ja) * | 1988-10-21 | 1990-04-25 | Mitsubishi Electric Corp | 突出し装置 |
JPH11297793A (ja) * | 1998-04-06 | 1999-10-29 | Mitsubishi Electric Corp | チップ突き上げ装置及びそれを用いたダイボンディング装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200141675A (ko) * | 2019-06-11 | 2020-12-21 | 세메스 주식회사 | 다이 이젝팅 장치 |
KR102220340B1 (ko) * | 2019-06-11 | 2021-02-25 | 세메스 주식회사 | 다이 이젝팅 장치 |
Also Published As
Publication number | Publication date |
---|---|
JP2003133391A (ja) | 2003-05-09 |
JP3976541B2 (ja) | 2007-09-19 |
CN1414602A (zh) | 2003-04-30 |
US20030075271A1 (en) | 2003-04-24 |
US6824643B2 (en) | 2004-11-30 |
KR20030035763A (ko) | 2003-05-09 |
CN1210760C (zh) | 2005-07-13 |
TW540089B (en) | 2003-07-01 |
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