KR100240538B1 - 반도체 기억 장치 - Google Patents

반도체 기억 장치 Download PDF

Info

Publication number
KR100240538B1
KR100240538B1 KR1019970000979A KR19970000979A KR100240538B1 KR 100240538 B1 KR100240538 B1 KR 100240538B1 KR 1019970000979 A KR1019970000979 A KR 1019970000979A KR 19970000979 A KR19970000979 A KR 19970000979A KR 100240538 B1 KR100240538 B1 KR 100240538B1
Authority
KR
South Korea
Prior art keywords
memory array
output signal
line
memory
local
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1019970000979A
Other languages
English (en)
Korean (ko)
Other versions
KR980011441A (ko
Inventor
가주타미 아리모토
Original Assignee
다니구찌 이찌로오, 기타오카 다카시
미쓰비시덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다니구찌 이찌로오, 기타오카 다카시, 미쓰비시덴키 가부시키가이샤 filed Critical 다니구찌 이찌로오, 기타오카 다카시
Publication of KR980011441A publication Critical patent/KR980011441A/ko
Application granted granted Critical
Publication of KR100240538B1 publication Critical patent/KR100240538B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/06Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
KR1019970000979A 1996-07-23 1997-01-15 반도체 기억 장치 Expired - Lifetime KR100240538B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8193757A JPH1040682A (ja) 1996-07-23 1996-07-23 半導体記憶装置
JP96-193757 1996-07-23

Publications (2)

Publication Number Publication Date
KR980011441A KR980011441A (ko) 1998-04-30
KR100240538B1 true KR100240538B1 (ko) 2000-01-15

Family

ID=16313313

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970000979A Expired - Lifetime KR100240538B1 (ko) 1996-07-23 1997-01-15 반도체 기억 장치

Country Status (4)

Country Link
US (2) US5781495A (enExample)
JP (1) JPH1040682A (enExample)
KR (1) KR100240538B1 (enExample)
TW (1) TW323366B (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100224667B1 (ko) * 1996-12-10 1999-10-15 윤종용 계층적 입출력라인 구조를 갖는 반도체 메모리장치 및 이의 배치방법
US6011710A (en) * 1997-10-30 2000-01-04 Hewlett-Packard Company Capacitance reducing memory system, device and method
KR100281125B1 (ko) * 1998-12-29 2001-03-02 김영환 비휘발성 강유전체 메모리장치
US5892725A (en) * 1998-05-13 1999-04-06 International Business Machines Corporation Memory in a data processing system having uneven cell grouping on bitlines and method therefor
JP2000030447A (ja) * 1998-07-14 2000-01-28 Mitsubishi Electric Corp 半導体記憶装置
US6333866B1 (en) * 1998-09-28 2001-12-25 Texas Instruments Incorporated Semiconductor device array having dense memory cell array and heirarchical bit line scheme
KR100287882B1 (ko) * 1998-11-03 2001-05-02 김영환 비휘발성 강유전체 메모리장치
JP2000150820A (ja) * 1998-11-09 2000-05-30 Mitsubishi Electric Corp 半導体記憶装置
KR100304962B1 (ko) 1998-11-24 2001-10-20 김영환 텅스텐비트라인형성방법
JP2001053243A (ja) * 1999-08-06 2001-02-23 Hitachi Ltd 半導体記憶装置とメモリモジュール
KR100310992B1 (ko) 1999-09-03 2001-10-18 윤종용 멀티 뱅크 메모리 장치 및 입출력 라인 배치방법
DE10004109C2 (de) * 2000-01-31 2001-11-29 Infineon Technologies Ag Speicherbaustein mit geringer Zugriffszeit
KR100326086B1 (ko) * 2000-02-03 2002-03-07 윤종용 반도체 메모리 장치 및 이 장치의 프리차지 방법
KR100364801B1 (ko) * 2000-08-30 2002-12-16 주식회사 하이닉스반도체 반도체 메모리 장치
KR100385956B1 (ko) * 2001-02-14 2003-06-02 삼성전자주식회사 효율적인 칼럼 리던던시 스킴을 갖는 반도체 메모리장치
KR100408421B1 (ko) * 2002-01-16 2003-12-03 삼성전자주식회사 서브-어레이의 개수에 관계없이 계층형 입출력 라인구조를 가지는 반도체 메모리 장치
DE10392539T5 (de) * 2002-04-10 2005-06-02 Hynix Semiconductor Inc., Ichon Speicherchiparchitektur mit nichtrechteckigen Speicherbänken und Verfahren zum Anordnen von Speicherbänken
KR100733406B1 (ko) 2004-05-10 2007-06-29 주식회사 하이닉스반도체 글로벌 데이터 버스를 구비한 반도체 메모리 소자
JP2006216693A (ja) * 2005-02-02 2006-08-17 Toshiba Corp 半導体記憶装置
KR100873623B1 (ko) * 2007-07-10 2008-12-12 주식회사 하이닉스반도체 반도체 메모리 장치
JP2010257552A (ja) * 2009-04-28 2010-11-11 Elpida Memory Inc 半導体記憶装置
KR101060899B1 (ko) * 2009-12-23 2011-08-30 주식회사 하이닉스반도체 반도체 메모리 장치 및 이의 동작 방법
JP5622715B2 (ja) * 2011-12-28 2014-11-12 株式会社東芝 半導体記憶装置
US9286423B2 (en) * 2012-03-30 2016-03-15 International Business Machines Corporation Cycle accurate and cycle reproducible memory for an FPGA based hardware accelerator
US9230046B2 (en) 2012-03-30 2016-01-05 International Business Machines Corporation Generating clock signals for a cycle accurate, cycle reproducible FPGA based hardware accelerator

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0492776B1 (en) * 1990-12-25 1998-05-13 Mitsubishi Denki Kabushiki Kaisha A semiconductor memory device with a large storage capacity memory and a fast speed memory
JP3283547B2 (ja) * 1991-08-29 2002-05-20 株式会社日立製作所 半導体メモリ装置
JP3244340B2 (ja) * 1993-05-24 2002-01-07 三菱電機株式会社 同期型半導体記憶装置
US5734620A (en) * 1995-04-05 1998-03-31 Micron Technology, Inc. Hierarchical memory array structure with redundant components having electrically isolated bit lines

Also Published As

Publication number Publication date
US6249474B1 (en) 2001-06-19
US5781495A (en) 1998-07-14
KR980011441A (ko) 1998-04-30
TW323366B (en) 1997-12-21
JPH1040682A (ja) 1998-02-13

Similar Documents

Publication Publication Date Title
KR100240538B1 (ko) 반도체 기억 장치
JPH1040682A5 (enExample)
US4992986A (en) Semiconductor memory
KR100252053B1 (ko) 칼럼 방향의 데이터 입출력선을 가지는 반도체메모리장치와불량셀 구제회로 및 방법
US5097440A (en) Semiconductor memory device comprising a plurality of memory arrays with improved peripheral circuit location and interconnection arrangement
KR100315977B1 (ko) 반도체기억장치
US20010052599A1 (en) Semiconductor memory device including plurality of global data lines in parallel arrangement with low parasitic capacitance, and fabrication method thereof
JP2003151280A5 (enExample)
JP3252895B2 (ja) 半導体記憶装置及びその駆動方法
US6788600B2 (en) Non-volatile semiconductor memory
US5586076A (en) Semiconductor memory device permitting high speed data transfer and high density integration
US6956780B2 (en) Semiconductor memory device having direct sense amplifier implemented in hierarchical input/output line architecture
US8355270B2 (en) Semiconductor device having open bit line architecture
US5862072A (en) Memory array architecture and method for dynamic cell plate sensing
US6781917B2 (en) Semiconductor memory device with dual port memory cells
US6278647B1 (en) Semiconductor memory device having multi-bank and global data bus
US6987698B2 (en) Semiconductor memory having dummy regions in memory cell array
JP4570356B2 (ja) オープンディジットアレイ用のセンスアンプおよびアーキテクチャ
JP3732111B2 (ja) 半導体装置
JP3469074B2 (ja) 半導体メモリ装置
US6226219B1 (en) Semiconductor memory with a plurality of memory banks
US6654271B2 (en) Method for reading and storing binary memory cells signals and circuit arrangement
JP3016373B2 (ja) 半導体記憶装置
KR100403344B1 (ko) 반도체 메모리 장치
KR100357182B1 (ko) 반도체 메모리 장치의 리던던시 회로

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19970115

PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 19970115

Comment text: Request for Examination of Application

PG1501 Laying open of application
E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 19990824

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 19991028

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 19991029

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20021025

Start annual number: 4

End annual number: 4

PR1001 Payment of annual fee

Payment date: 20031023

Start annual number: 5

End annual number: 5

PR1001 Payment of annual fee

Payment date: 20041025

Start annual number: 6

End annual number: 6

PR1001 Payment of annual fee

Payment date: 20051025

Start annual number: 7

End annual number: 7

PR1001 Payment of annual fee

Payment date: 20061026

Start annual number: 8

End annual number: 8

PR1001 Payment of annual fee

Payment date: 20071026

Start annual number: 9

End annual number: 9

PR1001 Payment of annual fee

Payment date: 20081024

Start annual number: 10

End annual number: 10

PR1001 Payment of annual fee

Payment date: 20091022

Start annual number: 11

End annual number: 11

PR1001 Payment of annual fee

Payment date: 20101027

Start annual number: 12

End annual number: 12

PR1001 Payment of annual fee

Payment date: 20110920

Start annual number: 13

End annual number: 13

FPAY Annual fee payment

Payment date: 20121002

Year of fee payment: 14

PR1001 Payment of annual fee

Payment date: 20121002

Start annual number: 14

End annual number: 14

FPAY Annual fee payment

Payment date: 20131001

Year of fee payment: 15

PR1001 Payment of annual fee

Payment date: 20131001

Start annual number: 15

End annual number: 15

FPAY Annual fee payment

Payment date: 20141007

Year of fee payment: 16

PR1001 Payment of annual fee

Payment date: 20141007

Start annual number: 16

End annual number: 16

FPAY Annual fee payment

Payment date: 20151001

Year of fee payment: 17

PR1001 Payment of annual fee

Payment date: 20151001

Start annual number: 17

End annual number: 17

PR1001 Payment of annual fee

Payment date: 20160930

Start annual number: 18

End annual number: 18

PC1801 Expiration of term