KR100219345B1 - 압접형 반도체 장치 - Google Patents
압접형 반도체 장치 Download PDFInfo
- Publication number
- KR100219345B1 KR100219345B1 KR1019950029953A KR19950029953A KR100219345B1 KR 100219345 B1 KR100219345 B1 KR 100219345B1 KR 1019950029953 A KR1019950029953 A KR 1019950029953A KR 19950029953 A KR19950029953 A KR 19950029953A KR 100219345 B1 KR100219345 B1 KR 100219345B1
- Authority
- KR
- South Korea
- Prior art keywords
- chip
- electrode
- semiconductor device
- plate
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/71—Means for bonding not being attached to, or not being formed on, the surface to be connected
- H01L24/72—Detachable connecting means consisting of mechanical auxiliary parts connecting the device, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
- H01L23/051—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body another lead being formed by a cover plate parallel to the base plate, e.g. sandwich type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
- H01L23/3185—Partial encapsulation or coating the coating covering also the sidewalls of the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00
- H01L25/0655—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01042—Molybdenum [Mo]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12035—Zener diode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1301—Thyristor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19043—Component type being a resistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
- H10D12/411—Insulated-gate bipolar transistors [IGBT]
- H10D12/441—Vertical IGBTs
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Die Bonding (AREA)
- Thyristors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24692794A JP3256636B2 (ja) | 1994-09-15 | 1994-09-15 | 圧接型半導体装置 |
| JP94-246927 | 1994-09-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR960012561A KR960012561A (ko) | 1996-04-20 |
| KR100219345B1 true KR100219345B1 (ko) | 1999-09-01 |
Family
ID=17155834
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950029953A Expired - Fee Related KR100219345B1 (ko) | 1994-09-15 | 1995-09-14 | 압접형 반도체 장치 |
Country Status (7)
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3258200B2 (ja) * | 1995-05-31 | 2002-02-18 | 株式会社東芝 | 圧接型半導体装置 |
| US5798287A (en) * | 1993-12-24 | 1998-08-25 | Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno | Method for forming a power MOS device chip |
| EP0660396B1 (en) * | 1993-12-24 | 1998-11-04 | Consorzio per la Ricerca sulla Microelettronica nel Mezzogiorno | Power MOS device chip and package assembly |
| US5726466A (en) * | 1995-09-11 | 1998-03-10 | Kabushiki Kaisha Toshiba | Press pack power semiconductor device incorporating a plurality of semiconductor elements |
| JP3018971B2 (ja) * | 1995-12-18 | 2000-03-13 | 富士電機株式会社 | 半導体装置 |
| JP3319569B2 (ja) * | 1996-05-31 | 2002-09-03 | 株式会社東芝 | 圧接型半導体装置 |
| US6125529A (en) * | 1996-06-17 | 2000-10-03 | Thermometrics, Inc. | Method of making wafer based sensors and wafer chip sensors |
| JP3426101B2 (ja) * | 1997-02-25 | 2003-07-14 | 三菱電機株式会社 | 整流装置 |
| WO1998043301A1 (fr) * | 1997-03-26 | 1998-10-01 | Hitachi, Ltd. | Dispositif plat a semi-conducteur et convertisseur de courant utilisant ce dernier |
| JP3480811B2 (ja) * | 1997-07-15 | 2003-12-22 | 株式会社東芝 | 電圧駆動型電力用半導体装置 |
| JP3533317B2 (ja) * | 1997-08-28 | 2004-05-31 | 株式会社東芝 | 圧接型半導体装置 |
| JP3344552B2 (ja) * | 1997-09-17 | 2002-11-11 | 株式会社東芝 | 圧接型半導体装置 |
| GB9725960D0 (en) * | 1997-12-08 | 1998-02-04 | Westinghouse Brake & Signal | Encapsulating semiconductor chips |
| CN1236982A (zh) | 1998-01-22 | 1999-12-01 | 株式会社日立制作所 | 压力接触型半导体器件及其转换器 |
| JP2930074B1 (ja) * | 1998-06-02 | 1999-08-03 | 富士電機株式会社 | 半導体装置 |
| DE19843309A1 (de) * | 1998-09-22 | 2000-03-23 | Asea Brown Boveri | Kurzschlussfestes IGBT Modul |
| JP3612226B2 (ja) * | 1998-12-21 | 2005-01-19 | 株式会社東芝 | 半導体装置及び半導体モジュール |
| JP2001036002A (ja) * | 1999-07-23 | 2001-02-09 | Fuji Electric Co Ltd | 半導体装置 |
| US20020145188A1 (en) * | 1999-09-07 | 2002-10-10 | Hironori Kodama | Flat semiconductor device and power converter employing the same |
| DE10048859B4 (de) * | 2000-10-02 | 2005-12-15 | Infineon Technologies Ag | Druckkontaktanordnung sowie deren Verwendung |
| JP3954314B2 (ja) * | 2001-01-23 | 2007-08-08 | 株式会社東芝 | 圧接型半導体装置 |
| JP4230681B2 (ja) | 2001-07-06 | 2009-02-25 | 株式会社東芝 | 高耐圧半導体装置 |
| US6803667B2 (en) * | 2001-08-09 | 2004-10-12 | Denso Corporation | Semiconductor device having a protective film |
| JP2004023083A (ja) * | 2002-06-20 | 2004-01-22 | Toshiba Corp | 圧接型半導体装置 |
| CN100414690C (zh) * | 2003-08-21 | 2008-08-27 | 株洲时代集团公司 | 一种大功率器件及其散热器件的压装方法 |
| JP4157001B2 (ja) * | 2003-08-28 | 2008-09-24 | 株式会社東芝 | マルチチップ圧接型半導体装置 |
| JP4764979B2 (ja) * | 2004-06-08 | 2011-09-07 | 富士電機株式会社 | 半導体装置 |
| WO2013008424A1 (ja) * | 2011-07-11 | 2013-01-17 | 三菱電機株式会社 | 電力用半導体モジュール |
| JP5662565B2 (ja) | 2012-01-11 | 2015-02-04 | パナソニックIpマネジメント株式会社 | 圧接型半導体装置及びその製造方法 |
| CN103390642B (zh) * | 2013-08-01 | 2016-06-22 | 株洲南车时代电气股份有限公司 | 一种igbt器件及整晶圆igbt芯片的封装方法 |
| US9177943B2 (en) | 2013-10-15 | 2015-11-03 | Ixys Corporation | Power device cassette with auxiliary emitter contact |
| CN104733518B (zh) * | 2013-12-24 | 2019-03-19 | 南京励盛半导体科技有限公司 | 一种半导体功率器件的结构 |
| DE102014102493A1 (de) * | 2014-02-26 | 2015-08-27 | Infineon Technologies Bipolar Gmbh & Co. Kg | Verbesserte Scheibenzelle für mehrere druckkontaktierte Halbleiterbauelemente |
| DE102014104718B3 (de) * | 2014-04-03 | 2015-08-20 | Infineon Technologies Ag | Halbleiterbaugruppe mit Chiparrays |
| EP2966681A1 (en) * | 2014-07-09 | 2016-01-13 | GE Energy Power Conversion Technology Ltd | Power semiconductor devices |
| WO2016179023A1 (en) * | 2015-05-01 | 2016-11-10 | Adarza Biosystems, Inc. | Methods and devices for the high-volume production of silicon chips with uniform anti-reflective coatings |
| EP3306649B1 (en) | 2015-05-26 | 2025-04-30 | Mitsubishi Electric Corporation | PRESSURE CONTACT SEMICONDUCTOR DEVICE |
| CN107305886B (zh) * | 2016-04-25 | 2024-04-05 | 华北电力大学 | 一种便于串联使用的大功率igbt模块 |
| US11302592B2 (en) | 2017-03-08 | 2022-04-12 | Mediatek Inc. | Semiconductor package having a stiffener ring |
| CN109801899B (zh) * | 2018-12-27 | 2021-04-23 | 全球能源互联网研究院有限公司 | 一种功率半导体模块 |
| US11488903B2 (en) * | 2020-01-28 | 2022-11-01 | Littelfuse, Inc. | Semiconductor chip package and method of assembly |
| US11764209B2 (en) | 2020-10-19 | 2023-09-19 | MW RF Semiconductors, LLC | Power semiconductor device with forced carrier extraction and method of manufacture |
| CN112687676B (zh) * | 2020-12-14 | 2023-06-27 | 株洲中车时代半导体有限公司 | 压接式igbt子模组及压接式igbt模块 |
| DE112021007808T5 (de) | 2021-06-11 | 2024-03-21 | Mitsubishi Electric Corporation | Halbleitereinrichtung vom druckkontakttyp |
| CN118763061B (zh) * | 2024-09-06 | 2025-01-24 | 淄博美林电子有限公司 | 一种igbt封装结构及封装方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0064383A3 (en) * | 1981-05-06 | 1984-06-27 | LUCAS INDUSTRIES public limited company | A semi-conductor package |
| US4647959A (en) * | 1985-05-20 | 1987-03-03 | Tektronix, Inc. | Integrated circuit package, and method of forming an integrated circuit package |
| JP3137375B2 (ja) * | 1990-09-20 | 2001-02-19 | 株式会社東芝 | 圧接型半導体装置 |
| JP3117215B2 (ja) * | 1990-09-28 | 2000-12-11 | 株式会社東芝 | 圧接型半導体装置 |
| DE69109468T2 (de) * | 1991-05-23 | 1995-12-14 | Ansaldo Trasporti Spa | Elektronische Leistungsanordnung realisiert durch eine Reihe elementarer Halbleiterbauelemente in Parallelverbindung und verwandtes Herstellungsverfahren. |
| US5267867A (en) * | 1992-09-11 | 1993-12-07 | Digital Equipment Corporation | Package for multiple removable integrated circuits |
| JP3180863B2 (ja) * | 1993-07-27 | 2001-06-25 | 富士電機株式会社 | 加圧接触形半導体装置およびその組立方法 |
-
1994
- 1994-09-15 JP JP24692794A patent/JP3256636B2/ja not_active Expired - Fee Related
-
1995
- 1995-09-09 MY MYPI95002683A patent/MY131127A/en unknown
- 1995-09-11 US US08/526,320 patent/US5610439A/en not_active Expired - Lifetime
- 1995-09-14 KR KR1019950029953A patent/KR100219345B1/ko not_active Expired - Fee Related
- 1995-09-15 DE DE69534968T patent/DE69534968T2/de not_active Expired - Lifetime
- 1995-09-15 EP EP95114541A patent/EP0702406B1/en not_active Expired - Lifetime
- 1995-10-30 TW TW084111491A patent/TW281796B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| DE69534968T2 (de) | 2007-02-08 |
| JPH0888240A (ja) | 1996-04-02 |
| MY131127A (en) | 2007-07-31 |
| TW281796B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1996-07-21 |
| EP0702406B1 (en) | 2006-05-03 |
| EP0702406A2 (en) | 1996-03-20 |
| EP0702406A3 (en) | 1996-07-31 |
| DE69534968D1 (de) | 2006-06-08 |
| JP3256636B2 (ja) | 2002-02-12 |
| US5610439A (en) | 1997-03-11 |
| KR960012561A (ko) | 1996-04-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100219345B1 (ko) | 압접형 반도체 장치 | |
| US6770964B2 (en) | Semiconductor device including intermediate wiring element | |
| JP3180863B2 (ja) | 加圧接触形半導体装置およびその組立方法 | |
| US8222651B2 (en) | Semiconductor device | |
| US10985110B2 (en) | Semiconductor package having an electromagnetic shielding structure and method for producing the same | |
| US6373129B1 (en) | Semiconductor apparatus with pressure contact semiconductor chips | |
| US20250046664A1 (en) | Semiconductor device | |
| US12113002B2 (en) | Plurality of transistors attached to a heat sink with a periphery notch | |
| US6281569B1 (en) | Pressure-contact semiconductor device | |
| US5874774A (en) | Flat package semiconductor device | |
| CN111681997B (zh) | 功率封装模块及电子装置 | |
| US20130256920A1 (en) | Semiconductor device | |
| US11189592B2 (en) | Multi-clip structure for die bonding | |
| JP3973832B2 (ja) | 圧接型半導体装置 | |
| KR100244826B1 (ko) | 반도체장치 및 그 제조방법 | |
| JP3264190B2 (ja) | 半導体装置 | |
| US20250218887A1 (en) | Semiconductor device and manufacturing method of semiconductor device | |
| US20250183131A1 (en) | Semiconductor device, electronic device, and method of manufacturing electronic device | |
| US20250259960A1 (en) | Electronic module | |
| KR20190099654A (ko) | 가압형 반도체 파워 소자 패키지 | |
| JP3180868B2 (ja) | 加圧接触形半導体装置の製造方法 | |
| JPH09275186A (ja) | 半導体装置 | |
| JPH08195410A (ja) | 加圧接触形半導体装置 | |
| JPH10284522A (ja) | 平型半導体装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| T13-X000 | Administrative time limit extension granted |
St.27 status event code: U-3-3-T10-T13-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| FPAY | Annual fee payment |
Payment date: 20030530 Year of fee payment: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20040616 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20040616 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |