JPWO2016047784A1 - スルホニウム塩、光酸発生剤、及び感光性組成物 - Google Patents
スルホニウム塩、光酸発生剤、及び感光性組成物 Download PDFInfo
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- JPWO2016047784A1 JPWO2016047784A1 JP2016550417A JP2016550417A JPWO2016047784A1 JP WO2016047784 A1 JPWO2016047784 A1 JP WO2016047784A1 JP 2016550417 A JP2016550417 A JP 2016550417A JP 2016550417 A JP2016550417 A JP 2016550417A JP WO2016047784 A1 JPWO2016047784 A1 JP WO2016047784A1
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- halogen atom
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- ring
- ether
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- 239000000203 mixture Substances 0.000 title claims abstract description 44
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 63
- 125000005843 halogen group Chemical group 0.000 claims abstract description 48
- 229910052717 sulfur Inorganic materials 0.000 claims abstract description 24
- 150000001450 anions Chemical class 0.000 claims abstract description 23
- 125000004434 sulfur atom Chemical group 0.000 claims abstract description 13
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 claims abstract description 8
- -1 furanylcarbonyl group Chemical group 0.000 claims description 221
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 58
- 125000003118 aryl group Chemical group 0.000 claims description 31
- 125000001931 aliphatic group Chemical group 0.000 claims description 28
- 125000003277 amino group Chemical group 0.000 claims description 23
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims description 20
- 125000004448 alkyl carbonyl group Chemical group 0.000 claims description 19
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- 125000000623 heterocyclic group Chemical group 0.000 claims description 19
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- 125000003545 alkoxy group Chemical group 0.000 claims description 15
- 125000004093 cyano group Chemical group *C#N 0.000 claims description 15
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- 125000004390 alkyl sulfonyl group Chemical group 0.000 claims description 14
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- 125000005129 aryl carbonyl group Chemical group 0.000 claims description 12
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- 125000005110 aryl thio group Chemical group 0.000 claims description 12
- 125000004104 aryloxy group Chemical group 0.000 claims description 12
- 125000005161 aryl oxy carbonyl group Chemical group 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 7
- 125000000475 sulfinyl group Chemical group [*:2]S([*:1])=O 0.000 claims description 5
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims description 4
- 125000005740 oxycarbonyl group Chemical group [*:1]OC([*:2])=O 0.000 claims description 4
- 125000002541 furyl group Chemical group 0.000 claims description 3
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- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 16
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 15
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- 239000003795 chemical substances by application Substances 0.000 description 15
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 15
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- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 12
- 238000000576 coating method Methods 0.000 description 12
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 12
- FNYWFRSQRHGKJT-UHFFFAOYSA-N 3-ethyl-3-[(3-ethyloxetan-3-yl)methoxymethyl]oxetane Chemical compound C1OCC1(CC)COCC1(CC)COC1 FNYWFRSQRHGKJT-UHFFFAOYSA-N 0.000 description 11
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- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 11
- 229940125904 compound 1 Drugs 0.000 description 11
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 11
- LVTHXRLARFLXNR-UHFFFAOYSA-M potassium;1,1,2,2,3,3,4,4,4-nonafluorobutane-1-sulfonate Chemical compound [K+].[O-]S(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F LVTHXRLARFLXNR-UHFFFAOYSA-M 0.000 description 11
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 10
- 125000001153 fluoro group Chemical group F* 0.000 description 10
- 125000004430 oxygen atom Chemical group O* 0.000 description 10
- 125000001424 substituent group Chemical group 0.000 description 10
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 9
- 230000002378 acidificating effect Effects 0.000 description 9
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- 238000006243 chemical reaction Methods 0.000 description 9
- 238000004132 cross linking Methods 0.000 description 9
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 9
- 238000011156 evaluation Methods 0.000 description 9
- 229910052731 fluorine Inorganic materials 0.000 description 9
- 125000002950 monocyclic group Chemical group 0.000 description 9
- 239000000049 pigment Substances 0.000 description 9
- 239000007870 radical polymerization initiator Substances 0.000 description 9
- 239000007787 solid Substances 0.000 description 9
- 238000005160 1H NMR spectroscopy Methods 0.000 description 8
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 230000000996 additive effect Effects 0.000 description 8
- 239000002518 antifoaming agent Substances 0.000 description 8
- 239000003963 antioxidant agent Substances 0.000 description 8
- 150000004945 aromatic hydrocarbons Chemical group 0.000 description 8
- 229910052799 carbon Inorganic materials 0.000 description 8
- 125000004356 hydroxy functional group Chemical group O* 0.000 description 8
- 239000003112 inhibitor Substances 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 8
- 150000002596 lactones Chemical class 0.000 description 8
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
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- 150000003839 salts Chemical class 0.000 description 7
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- JWAZRIHNYRIHIV-UHFFFAOYSA-N 2-naphthol Chemical compound C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 6
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 6
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
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- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 6
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- 125000001501 propionyl group Chemical group O=C([*])C([H])([H])C([H])([H])[H] 0.000 description 1
- ILVGAIQLOCKNQA-UHFFFAOYSA-N propyl 2-hydroxypropanoate Chemical compound CCCOC(=O)C(C)O ILVGAIQLOCKNQA-UHFFFAOYSA-N 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 125000004742 propyloxycarbonyl group Chemical group 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 125000004309 pyranyl group Chemical group O1C(C=CC=C1)* 0.000 description 1
- 125000003373 pyrazinyl group Chemical group 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- 125000000714 pyrimidinyl group Chemical group 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 125000000719 pyrrolidinyl group Chemical group 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 125000002294 quinazolinyl group Chemical group N1=C(N=CC2=CC=CC=C12)* 0.000 description 1
- 125000005493 quinolyl group Chemical group 0.000 description 1
- 125000001567 quinoxalinyl group Chemical group N1=C(C=NC2=CC=CC=C12)* 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- YGSDEFSMJLZEOE-UHFFFAOYSA-M salicylate Chemical compound OC1=CC=CC=C1C([O-])=O YGSDEFSMJLZEOE-UHFFFAOYSA-M 0.000 description 1
- 229960001860 salicylate Drugs 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- 125000005930 sec-butyloxycarbonyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(OC(*)=O)C([H])([H])[H] 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 238000010898 silica gel chromatography Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 125000004436 sodium atom Chemical group 0.000 description 1
- 229910052938 sodium sulfate Inorganic materials 0.000 description 1
- 235000011152 sodium sulphate Nutrition 0.000 description 1
- 239000000600 sorbitol Substances 0.000 description 1
- 239000003549 soybean oil Substances 0.000 description 1
- 235000012424 soybean oil Nutrition 0.000 description 1
- 125000003003 spiro group Chemical group 0.000 description 1
- 125000003696 stearoyl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 229920003048 styrene butadiene rubber Polymers 0.000 description 1
- FDDDEECHVMSUSB-UHFFFAOYSA-N sulfanilamide Chemical compound NC1=CC=C(S(N)(=O)=O)C=C1 FDDDEECHVMSUSB-UHFFFAOYSA-N 0.000 description 1
- 229940124530 sulfonamide Drugs 0.000 description 1
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 1
- 150000008053 sultones Chemical group 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- PFBLRDXPNUJYJM-UHFFFAOYSA-N tert-butyl 2-methylpropaneperoxoate Chemical compound CC(C)C(=O)OOC(C)(C)C PFBLRDXPNUJYJM-UHFFFAOYSA-N 0.000 description 1
- 150000005621 tetraalkylammonium salts Chemical class 0.000 description 1
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
- 125000003718 tetrahydrofuranyl group Chemical group 0.000 description 1
- BSYVTEYKTMYBMK-UHFFFAOYSA-N tetrahydrofurfuryl alcohol Chemical compound OCC1CCCO1 BSYVTEYKTMYBMK-UHFFFAOYSA-N 0.000 description 1
- 125000001412 tetrahydropyranyl group Chemical group 0.000 description 1
- 125000005958 tetrahydrothienyl group Chemical group 0.000 description 1
- 125000004632 tetrahydrothiopyranyl group Chemical group S1C(CCCC1)* 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- CVNKFOIOZXAFBO-UHFFFAOYSA-J tin(4+);tetrahydroxide Chemical compound [OH-].[OH-].[OH-].[OH-].[Sn+4] CVNKFOIOZXAFBO-UHFFFAOYSA-J 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- 125000002088 tosyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1C([H])([H])[H])S(*)(=O)=O 0.000 description 1
- 229910052723 transition metal Chemical class 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 125000005409 triarylsulfonium group Chemical group 0.000 description 1
- STCOOQWBFONSKY-UHFFFAOYSA-N tributyl phosphate Chemical compound CCCCOP(=O)(OCCCC)OCCCC STCOOQWBFONSKY-UHFFFAOYSA-N 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-N triflic acid Chemical compound OS(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-N 0.000 description 1
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- VRRIVXLVXXAHJA-UHFFFAOYSA-N tris(2,3,4-tribromophenyl) phosphate Chemical compound BrC1=C(Br)C(Br)=CC=C1OP(=O)(OC=1C(=C(Br)C(Br)=CC=1)Br)OC1=CC=C(Br)C(Br)=C1Br VRRIVXLVXXAHJA-UHFFFAOYSA-N 0.000 description 1
- BIKXLKXABVUSMH-UHFFFAOYSA-N trizinc;diborate Chemical compound [Zn+2].[Zn+2].[Zn+2].[O-]B([O-])[O-].[O-]B([O-])[O-] BIKXLKXABVUSMH-UHFFFAOYSA-N 0.000 description 1
- KOZCZZVUFDCZGG-UHFFFAOYSA-N vinyl benzoate Chemical compound C=COC(=O)C1=CC=CC=C1 KOZCZZVUFDCZGG-UHFFFAOYSA-N 0.000 description 1
- 125000001834 xanthenyl group Chemical group C1=CC=CC=2OC3=CC=CC=C3C(C12)* 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 description 1
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- C07C321/24—Thiols, sulfides, hydropolysulfides, or polysulfides having thio groups bound to carbon atoms of six-membered aromatic rings
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
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- C07C309/01—Sulfonic acids
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- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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Abstract
Description
本発明の第三の態様は、本発明の第一の態様に係るスルホニウム塩からなる光酸発生剤を含有する感光性組成物である。
本発明に係る感光性組成物は、本発明に係るスルホニウム塩を含有するため、カチオン重合性化合物を含有する場合、紫外線で硬化させることができる。また、本発明に係る感光性組成物は、貯蔵安定性が高く、増感剤を用いる必要がないことから、コスト及び作業性に優れる。
本発明に係る感光性組成物がカチオン重合性化合物を含有する場合、その硬化物は、増感剤を用いずに得ることができるため、増感剤の残存に起因する着色や劣化という問題がない。
本発明に係るスルホニウム塩は、上記一般式(a1)で表されるものであり、上記一般式(a1)中のベンゼン環において、A1が結合する炭素原子に対してオルト位の炭素原子にメチル基が結合していることを特徴とする。本発明に係るスルホニウム塩は、上記の位置にメチル基を有するため、従来のスルホニウム塩と比較して、活性エネルギー線に対する感度が高い。
上記一般式(a1)において、R1及びR2が相互に結合して式中の硫黄原子と共に環を形成する場合、形成される環は、硫黄原子を含めて3〜10員環であることが好ましく、5〜7員環であることがより好ましい。形成される環は多環でもよく、5〜7員環が縮合したものであることが好ましい。
上記一般式(a1)において、R3は上記一般式(a3)で表される基であることが好ましい。
上記一般式(a1)において、A1は、S又はOであることが好ましく、Sであることがより好ましい。
上記一般式(a2)において、m1は、環Z1の種類に応じて選択でき、例えば、0〜4の整数、好ましくは0〜3の整数、より好ましくは0〜2の整数であってもよい。
上記一般式(a3)において、R6は、アルキル基;ヒドロキシ基、置換されていてよいアミノ基、若しくはニトロ基で置換されたアルキル基;又は上記一般式(a6)で表される基であることが好ましく、上記一般式(a6)で表される基であることがより好ましい。
上記一般式(a3)において、A2はS又はOであることが好ましく、Sであることがより好ましい。
上記一般式(a3)において、n1は0であることが好ましい。
上記一般式(a4)において、R9及びR10のいずれもが上記一般式(a2)で表される基であることが好ましい。R9及びR10は互いに同一でも異なっていてもよい。
上記一般式(a4)において、R9及びR10が相互に結合して式中の硫黄原子と共に環を形成する場合、形成される環は、硫黄原子を含めて3〜10員環であることが好ましく、5〜7員環であることがより好ましい。形成される環は多環でもよく、5〜7員環が縮合したものであることが好ましい。
上記一般式(a4)において、A3は、S又はOであることが好ましく、Sであることがより好ましい。
上記一般式(a4)において、n2は0であることが好ましい。
上記一般式(a5)において、m2は、環Z2の種類に応じて選択でき、例えば、0〜4の整数、好ましくは0〜3の整数、より好ましくは0〜2の整数であってもよい。
上記一般式(a6)において、m3は、環Z3の種類に応じて選択でき、例えば、0〜4の整数、好ましくは0〜3の整数、より好ましくは0〜2の整数であってもよい。
Yはハロゲン原子(フッ素原子が好ましい。)を表す。
また、Rx2で表されるアルキル基、フルオロアルキル基又はアリール基における炭素鎖は、酸素原子、窒素原子、硫黄原子等のヘテロ原子を有していてもよい。特に、Rx2で表されるアルキル基又はフルオロアルキル基における炭素鎖は、2価の官能基(例えば、エーテル結合、カルボニル結合、エステル結合、アミノ結合、アミド結合、イミド結合、スルホニル結合、スルホニルアミド結合、スルホニルイミド結合、ウレタン結合等)を有していてもよい。
Rx2で表されるアルキル基、フルオロアルキル基又はアリール基が上記置換基、ヘテロ原子、又は官能基を有する場合、上記置換基、ヘテロ原子、又は官能基の個数は、1個であっても2個以上であってもよい。
aは4〜6の整数を表す。
bは、1〜5の整数が好ましく、更に好ましくは2〜4の整数、特に好ましくは2又は3である。
cは、1〜4の整数が好ましく、更に好ましくは4である。
本発明に係るスルホニウム塩は、光酸発生剤として好適である。
光酸発生剤とは、光照射によりその化学構造が分解し、酸を発生する化合物をいう。発生した酸は、エポキシドの硬化反応等の触媒として適用できる。本発明の光酸発生剤は、単独で使用してもよいし、他の光酸発生剤と共に使用してもよい。
本発明に係る感光性組成物は、本発明に係るスルホニウム塩からなる光酸発生剤を含有するものであり、例えば、本発明に係るスルホニウム塩からなる光酸発生剤とカチオン重合性化合物とを含有するものが挙げられる。本発明に係る感光性組成物において、上記光酸発生剤は、1種単独で使用しても2種以上を併用してもよく、また、上記カチオン重合性化合物は、1種単独で使用しても2種以上を併用してもよい。
(1)の酸の作用によりアルカリ現像液に可溶となる樹脂(以下、「樹脂(1)」という)は、保護基により保護された酸基を有する樹脂であれば特に限定されない。酸性基は、ブレンステッドの定義による酸性を示す基であれば特に限定されない。好適な酸性基としては、カルボキシル基、フェノール性水酸基が挙げられる。
なお、樹脂(1)の基本骨格は、これらの樹脂の基本骨格に限定されない。
樹脂(1)として好適に使用される、ノボラック樹脂、ヒドロキシスチレン樹脂、及びアクリル樹脂についてそれぞれ後述する。
不飽和カルボン酸としては、(メタ)アクリル酸、クロトン酸等のモノカルボン酸;マレイン酸、フマル酸、シトラコン酸、メサコン酸、イタコン酸等のジカルボン酸が挙げられる。これらの不飽和カルボン酸の中では、(メタ)アクリル酸が好ましい。
樹脂(1)が、アルコール性水酸基及び/又は環状エーテル基を更に有することで、化学増幅型レジスト材料の解像性が向上する。
−Rg12−OH・・・(g4)
環状エーテル基は、下式(g5)で表される基として樹脂(1)中に存在するのが好ましい。式(g5)中、Rg13は、単結合、又は直鎖状でも、分岐鎖状であってもよい炭素原子数1〜6のアルキレン基であり、Rg14は、5員環以上、好ましくは5〜8員環の環状エーテル基である。
−Rg13−Rg14・・・(g5)
また、当該フェノール性水酸基と、Hal−Rg13−Rg14(Halはハロゲン原子であり、Rg13及びRg14は式(g5)と同様である。)で表される末端にハロゲン原子を有する環状エーテル化合物とを常法に従って反応させてフェノール性水酸基をエーテル化することで、樹脂(1)に環状エーテル基を導入することができる。末端にハロゲン原子を有する環状エーテル化合物としては、テトラヒドロフルフリルクロライド等が挙げられる。
また、当該カルボキシル基と、HO−Rg13−Rg14(Rg13及びRg14は式(g5)と同様である。)で表される末端に水酸基を有する環状エーテル化合物とを常法に従って反応させてエステル化を行うことで、樹脂(1)に環状エーテル基を導入することができる。末端に水酸基を有する環状エーテル化合物としては、テトラヒドロフルフリルアルコール、テトラヒドロ−4H−ピラン−4−メタノール、及びテトラヒドロ−2H−ピラン−3−メタノール等が挙げられる。
不飽和二重結合と、アルコール性水酸基又は環状エーテル基とを有する単量体として使用できる化合物の好適な例としては、下式(h−1)〜(h−22)で表される化合物が挙げられる。式(h−1)〜(h−22)において、Rg15は、前述の式(g4)で表される基、又は式(g5)で表される基であり、Rg16は水素原子又はメチル基である。
また、−SO2−含有環式基は、特に、その環骨格中に−O−SO2−を含む環式基、すなわち−O−SO2−中の−O−S−が環骨格の一部を形成するスルトン(sultone)環を含有する環式基であることが好ましい。
極性基は、脂環骨格含有炭化水素基の2級又は3級炭素に結合していることが好ましい。また、脂環骨格含有炭化水素基に1〜3個の範囲で結合していることが好ましい。
ノボラック樹脂は、例えばフェノール性水酸基を有する芳香族化合物(以下、単に「フェノール類」という。)とアルデヒド類とを酸触媒下で付加縮合させることにより得られる。
上記アルデヒド類としては、例えば、ホルムアルデヒド、フルフラール、ベンズアルデヒド、ニトロベンズアルデヒド、アセトアルデヒド等が挙げられる。
付加縮合反応時の触媒は、特に限定されるものではないが、例えば酸触媒では、塩酸、硝酸、硫酸、蟻酸、シュウ酸、酢酸等が使用される。
ポリヒドロキシスチレン樹脂は、スチレン系化合物を含む単量体の重合体である。ポリヒドロキシスチレン樹脂を構成するヒドロキシスチレン系化合物としては、p−ヒドロキシスチレン、α−メチルヒドロキシスチレン、α−エチルヒドロキシスチレン等が挙げられる。
更に、ポリヒドロキシスチレン樹脂は、ヒドロキシスチレン系化合物とスチレン系化合物との共重合体であるのが好ましい。このようなスチレン樹脂を構成するスチレン系化合物としては、スチレン、クロロスチレン、クロロメチルスチレン、ビニルトルエン、α−メチルスチレン等が挙げられる。
アクリル樹脂としては、(メタ)アクリル酸と、他の不飽和結合を有する単量体とを共重合して得られる樹脂が好ましい。(メタ)アクリル酸と共重合可能な単量体の例としては、(メタ)アクリル酸以外の不飽和カルボン酸、(メタ)アクリル酸エステル類、(メタ)アクリルアミド類、アリル化合物、ビニルエーテル類、ビニルエステル類、及びスチレン類等が挙げられる。
エポキシ基を持たない(メタ)アクリル酸エステルの中では、脂環式骨格を有する基を有する(メタ)アクリル酸エステルが好ましい。
本発明のスルホニウム塩以外の光酸発生剤(以下「その他の光酸発生剤成分」という)は、特に限定されず、これまで化学増幅型レジスト用の酸発生剤として提案されているものを用いることができる。
その他の光酸発生剤成分としては、例えば、ヨードニウム塩やスルホニウム塩等のオニウム塩系酸発生剤、オキシムスルホネート系酸発生剤、ビスアルキル又はビスアリールスルホニルジアゾメタン類、ポリ(ビススルホニル)ジアゾメタン類等のジアゾメタン系酸発生剤、ニトロベンジルスルホネート系酸発生剤、イミノスルホネート系酸発生剤、ジスルホン系酸発生剤等が挙げられる。
その他の光酸発生剤成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
上記(1)〜(3)の化学増幅型レジスト材料に含まれる光酸発生剤が、本発明のスルホニウム塩と、その他の光酸発生剤成分を含む場合、本発明のスルホニウム塩の光酸発生剤全体に対する割合は、例えば、0.1〜99質量%であり、1〜90質量%が好ましく、10〜70質量%がより好ましい。
有機溶剤としては、ケトン系溶剤、エステル系溶剤、アルコール系溶剤、エーテル系溶剤、アミド系溶剤等の極性溶剤;炭化水素系溶剤等を含有するものが挙げられる。
アミド系溶剤としては、例えば、N−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、ヘキサメチルホスホリックトリアミド、1,3−ジメチル−2−イミダゾリジノン、N,N,N’,N’−テトラメチルウレア、N,N,2−トリメチルプロピオンアミド等が挙げられる。
[合成例1:化合物1Aの合成]
撹拌子を備えた100mLの丸底フラスコにエタノール(30mL)及び水酸化カリウム(2.1g,37mmol)を入れ、撹拌しながら0℃とした後、ベンゼンチオール(3.3g,30mmol)及び1−フルオロ−2−メチル−4−ニトロベンゼン(5.6g,36mmol)を添加し、室温下、一晩撹拌した。反応終了後、飽和の塩化アンモニウム水を添加し、有機層を分離し、水層をヘキサンで3回抽出した。得られた有機層及びヘキサン抽出液を合わせて、硫酸ナトリウム上で乾燥し、ろ過及び減圧濃縮することにより、粗製物を油状残渣として得た。当該粗製物を、シリカゲルカラムクロマトグラフィー(溶離液:ヘキサン)により精製したところ、(2−メチル−4−ニトロフェニル)フェニルスルフィドが、収率82%で得られた。
1H−NMR:d6−ジメチルスルホキシド;δ(ppm)7.7〜7.9(12H、m)、7.5〜7.6(4H、m)、7.5(1H、dd)、6.9〜7.0(1H、d)、2.4(3H、s)
パーフルオロブタンスルホン酸カリウム塩の代わりにヘキサフルオロリン酸カリウム(30mmol)を用いた以外は合成例1と同様にして、透明の4−(フェニルチオ)−3−メチルフェニルジフェニルスルホニウムヘキサフルオロリン酸塩(化合物1B)を収率90%で得た。
1H−NMR:d6−ジメチルスルホキシド;δ(ppm)7.7〜7.9(12H、m)、7.5〜7.6(4H、m)、7.5(1H、dd)、6.9〜7.0(1H、d)、2.4(3H、s)
4−(4−フェニルチオ)−3−メチルフェニルジフェニルスルホニウムブロマイド14g(30mmol)を含むジクロロメタン溶液50mLを、塩化アルミニウム2.8g、アセチルクロライド1.5g、及びジクロロメタン70mLを混合して得た懸濁液中に、撹拌及び冷却下、系内温度が10℃を超えないように滴下した。滴下終了後、室温で2時間反応させた後、撹拌下、反応液を冷水150mL中に投入し、よく混合した。引続きパーフルオロブタンスルホン酸カリウム塩9gを投入し、室温で1時間撹拌した後、静置した。水層を分液ロートで除去し、有機層を水150mLで5回水洗した後、ロータリーエバポレーターにて、減圧下、溶剤を除去することにより、黄色液状物を得た。引き続きトルエン/ヘキサン混合溶液で洗浄後、不純物を除去し、50℃で減圧下乾燥することにより黄色粘調物として4−(4−アセチルフェニルチオ)−3−メチルフェニルジフェニルスルホニウムパーフルオロブタンスルホネート(化合物1C)を収率90%で得た。
1H−NMR:d6−ジメチルスルホキシド;δ(ppm)8.0(2H、d)、7.7〜7.9(10H、m)、7.5〜7.6(4H、m)、7.5(1H、dd)、6.9〜7.0(1H、d)、2.6(3H、s)、2.4(3H、s)
実施例及び比較例では、下記の材料を用いた。
[酸発生剤]
・化合物1A(本発明に係るスルホニウム塩)
・化合物1B(本発明に係るスルホニウム塩)
・比較化合物1(下記式で表される従来のスルホニウム塩)
・溶剤1:プロピレングリコールモノメチルエーテルアセテート
[実施例1]
スピンコーターを用いてガラス基板上に化合物1Bの溶液(溶媒:プロピレングリコールモノメチルエーテルアセテート、濃度:10%)を塗布し、ホットプレートにより80℃で120秒間プリベークを行い、膜厚約500nmの塗膜を形成した。次いで、高圧水銀灯により500mJ/cm2の条件で塗膜に紫外線を照射した。分光光度計を用い、露光前後の塗膜の紫外線吸収を測定した。結果を図1に示す。
化合物1Bの代わりに比較化合物1を用いた以外は、実施例1と同様にして、露光前後の塗膜の紫外線吸収を測定した。結果を図2に示す。
図2に示す通り、比較化合物1の場合、紫外線の露光後は、紫外領域及びより長波長の領域で吸収が増加する傾向が見られた。一方、図1に示す通り、化合物1Bの場合、紫外線の露光後は、310nm付近の特徴的な吸収が消失したのに加え、紫外領域全体では吸収が減少するか、吸収が増加しても、増加幅は非常に小さく、また、より長波長の領域では、吸収が増加したものの、増加幅は非常に小さかった。
以上から、比較化合物1に紫外線を照射した場合、紫外領域に吸収を有する副生成物が発生し、この副生成物が紫外線を吸収して、比較化合物1に到達する紫外線が減少すると考えられる。その結果、比較化合物1では、紫外線に対する感度が向上しにくいと推測される。
一方、化合物1Bに紫外線を照射した場合、紫外領域に吸収を有する副生成物が発生しにくく、化合物1Bに到達する紫外線が減少しにくいと考えられる。その結果、化合物1Bでは、紫外線に対する感度が向上しやすいと推測される。
[実施例2]
実施例1で得られた塗膜について、露光前後で1H−NMR測定を行った。結果を図3に示す。
比較例1で得られた塗膜について、露光前後で1H−NMR測定を行った。結果を図4に示す。
図3に示す通り、化合物1Bの場合、ベンゼン環の水素に該当する約7.2〜約7.4ppmの領域に、露光前はピークが観察されなかったのに対し、露光後は多数のピークが観察された。このことから、化合物1Bでは、露光により結合の開裂が多く生じており、紫外線に対する感度が高いことが示唆される。
一方、図4に示す通り、比較化合物1の場合、露光前も露光後も、約7.2〜約7.4ppmの領域に、ピークはほとんど観察されなかった。このことから、比較化合物1では、露光による結合の開裂が化合物1Bほどは多く生じておらず、紫外線に対する感度が低いことが示唆される。
[実施例3]
樹脂1 70部、樹脂2 30部、化合物1B 0.4部、及び溶剤1を混合し、固形分濃度25%のポジ型感光性組成物を調製した。スピンコーターを用いてシリコン基板上にこの感光性組成物を塗布し、ホットプレートにより80℃で120秒間プリベークを行い、膜厚約11.8μmの樹脂膜を得た。次いで、高圧水銀灯により500mJ/cm2の条件で樹脂膜全面に紫外線を照射した後、2.38%テトラメチルアンモニウム水酸化物水溶液により60秒間現像を行った。その結果、樹脂膜は、完全に溶解した。
化合物1B 0.4部の代わりに比較化合物1 0.4部を用いた以外は、実施例3と同様にして、ポジ型感光性組成物の調製、樹脂膜の作製、紫外線照射、及び現像を行った。その結果、樹脂膜は残存していた。露光量を1000mJ/cm2に変更しても、樹脂膜は残存していた。
以上の通り、化合物1Bは、比較化合物1よりも、紫外線に対する感度が高かった。このように、本発明に係るスルホニウム塩は、従来のスルホニウム塩と比較して、活性エネルギー線に対する感度が向上していることが確認された。
[実施例4、比較例4〜5]
表1の各成分を溶剤となる、プロピレングリコールモノメチルエーテルアセテート(PGMEA)、プロピレングリコールモノメチルエーテル(PGME)、乳酸エチル(質量比50:25;25)の混合溶媒に溶解させ、固形分濃度6質量%となるように調整して、各例のレジスト組成物を得た。表1中、酸発生剤及び添加剤の[]内の数値は、樹脂3:100質量部に対する質量比であり、1A、2A’及び3A’はそれぞれ等モルである。
シリコンウェーハ上に、有機系反射防止膜組成物を塗布し、ホットプレート上で乾燥させることにより、膜厚約130nmの有機系反射防止膜を形成した。そして、該反射防止膜上に、上記レジスト組成物をそれぞれ回転塗布し、ホットプレート上で110℃、90秒間の条件でプレベーク(PAB)処理を行い、乾燥することにより、膜厚約280nmのレジスト膜を形成した。
そして、110℃90秒間、露光後加熱(PEB)処理を行い、更に23℃にて2.38質量%の水酸化テトラメチルアンモニウム(TMAH)水溶液NMD−3(商品名、東京応化工業株式会社製)で60秒間の条件でアルカリ現像し、ピッチの異なる3種のLSパターン((1)ライン幅120nm、ピッチ240nm;(2)トレンチ幅140nm、ピッチ560nm;(3)ライン幅150nmの孤立ラインパターン)を形成した。
[実施例5、比較例6]
表2の各成分を溶剤となる、プロピレングリコールモノメチルエーテルアセテート(PGMEA)、プロピレングリコールモノメチルエーテル(PGME)、シクロヘキサノン(質量比45:30;25)の混合溶媒に溶解させ、固形分濃度3質量%となるように調整して、各例のレジスト組成物を得た。表2中、酸発生剤及び添加剤の[]内の数値は、樹脂4:100質量部に対する質量比であり、1A、及び2A’はそれぞれ等モルである。
シリコンウェーハ上に、有機系反射防止膜組成物を塗布し、ホットプレート上で乾燥させることにより、膜厚130nmの有機系反射防止膜を形成した。
次いで、該膜上に、上記のレジスト組成物をスピンナーを用いて塗布し、ホットプレート上で、温度120℃で60秒間の条件でプレベーク(PAB)処理を行い、乾燥することにより、膜厚100nmのレジスト膜を形成した。
そして、85℃60秒間、露光後加熱(PEB)処理を行い、更に23℃にて2.38質量%の水酸化テトラメチルアンモニウム(TMAH)水溶液NMD−3(商品名、東京応化工業株式会社製)により10秒間の条件でアルカリ現像し、異なる2種の孤立パターン((1)ライン幅90nm、ピッチ2000nm;(2)ドット幅80nm、ピッチ2000nm)を形成した。
Claims (3)
- 下記一般式(a1)で表されるスルホニウム塩。
- 請求項1に記載のスルホニウム塩からなる光酸発生剤。
- 請求項1に記載のスルホニウム塩からなる光酸発生剤を含有する感光性組成物。
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CN113264856A (zh) | 2021-08-17 |
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