JPS6465834A - Manufacture of compound semiconductor device - Google Patents

Manufacture of compound semiconductor device

Info

Publication number
JPS6465834A
JPS6465834A JP22337487A JP22337487A JPS6465834A JP S6465834 A JPS6465834 A JP S6465834A JP 22337487 A JP22337487 A JP 22337487A JP 22337487 A JP22337487 A JP 22337487A JP S6465834 A JPS6465834 A JP S6465834A
Authority
JP
Japan
Prior art keywords
substrate
ion
epitaxial layer
compound semiconductor
regions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22337487A
Other languages
Japanese (ja)
Inventor
Goro Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP22337487A priority Critical patent/JPS6465834A/en
Publication of JPS6465834A publication Critical patent/JPS6465834A/en
Pending legal-status Critical Current

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  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To selectively form ion implanted regions and an epitaxial layer on a substrate in simple process by a method wherein the activation of ion implanted regions and the formation of an epitaxial layer are continuously performed in a single epitaxial growing device. CONSTITUTION:A GaInAs layer 2 is formed on the surface of an InP single crystal substrate 1 to form a compound semiconductor substrate 3. Next, p type impurity is ion-implanted in a photodetector forming region 4p while n type impurity is ion-implanted in the same region 4n. Later, these impurity ions are led in the substrate 3 epitaxial growing device to activate the ion implanted regions 4p, 4n by annealing process. Through these procedures, the regions 4p, 4n are changed into a p type active region 4p' and an n type active region 4n'. Successively, an epitaxial layer 5 is selectively formed on the substrate 3 to be a transistor forming region. Through these procedures, the compound semiconductor device selectively formed of the ion implanted regions 4p, 4n and the epitaxial layer 5 can be manufactured in simple process and excellent yield.
JP22337487A 1987-09-07 1987-09-07 Manufacture of compound semiconductor device Pending JPS6465834A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22337487A JPS6465834A (en) 1987-09-07 1987-09-07 Manufacture of compound semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22337487A JPS6465834A (en) 1987-09-07 1987-09-07 Manufacture of compound semiconductor device

Publications (1)

Publication Number Publication Date
JPS6465834A true JPS6465834A (en) 1989-03-13

Family

ID=16797143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22337487A Pending JPS6465834A (en) 1987-09-07 1987-09-07 Manufacture of compound semiconductor device

Country Status (1)

Country Link
JP (1) JPS6465834A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120258583A1 (en) * 2011-04-11 2012-10-11 Varian Semiconductor Equipment Associates, Inc. Method for epitaxial layer overgrowth

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120258583A1 (en) * 2011-04-11 2012-10-11 Varian Semiconductor Equipment Associates, Inc. Method for epitaxial layer overgrowth
US8969181B2 (en) * 2011-04-11 2015-03-03 Varian Semiconductor Equipment Associates, Inc. Method for epitaxial layer overgrowth

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