JPS644042A - Prober - Google Patents

Prober

Info

Publication number
JPS644042A
JPS644042A JP63132517A JP13251788A JPS644042A JP S644042 A JPS644042 A JP S644042A JP 63132517 A JP63132517 A JP 63132517A JP 13251788 A JP13251788 A JP 13251788A JP S644042 A JPS644042 A JP S644042A
Authority
JP
Japan
Prior art keywords
thin film
contact piece
head
supporting member
main surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63132517A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0517705B2 (enExample
Inventor
Jiei Guruubu Hansu
Ii Garutsu Barudeisu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS644042A publication Critical patent/JPS644042A/ja
Publication of JPH0517705B2 publication Critical patent/JPH0517705B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP63132517A 1987-06-09 1988-05-30 Prober Granted JPS644042A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/059,903 US4912399A (en) 1987-06-09 1987-06-09 Multiple lead probe for integrated circuits in wafer form

Publications (2)

Publication Number Publication Date
JPS644042A true JPS644042A (en) 1989-01-09
JPH0517705B2 JPH0517705B2 (enExample) 1993-03-09

Family

ID=22026029

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63132517A Granted JPS644042A (en) 1987-06-09 1988-05-30 Prober

Country Status (4)

Country Link
US (1) US4912399A (enExample)
EP (1) EP0294939A3 (enExample)
JP (1) JPS644042A (enExample)
KR (1) KR890001174A (enExample)

Cited By (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01108738A (ja) * 1987-10-21 1989-04-26 Matsushita Electric Ind Co Ltd 測定装置
JPH02234067A (ja) * 1989-03-07 1990-09-17 Nec Corp フレキシブルプローブカード
JPH02237131A (ja) * 1989-03-10 1990-09-19 Matsushita Electric Ind Co Ltd 半導体ｉｃの試験装置及び試験方法
JPH03127845A (ja) * 1989-10-13 1991-05-30 Fuji Electric Co Ltd 集積回路装置試験用プローブ
JPH03122371U (enExample) * 1990-03-23 1991-12-13
JPH03293566A (ja) * 1990-04-10 1991-12-25 Nitto Denko Corp 検査装置
JPH0463134U (enExample) * 1990-10-03 1992-05-29
JPH05232142A (ja) * 1991-08-26 1993-09-07 Hughes Aircraft Co 隆起したコンタクト用の弾性ガスケット支持体を備えた電気回路
JPH05340964A (ja) * 1992-06-05 1993-12-24 Mitsubishi Electric Corp ウエハ及びチップの試験装置
JPH06118100A (ja) * 1991-02-08 1994-04-28 Nippon Denshi Zairyo Kk プローブカード
JPH0749356A (ja) * 1991-09-03 1995-02-21 At & T Corp ウェーハ検査装置
JP2007085801A (ja) * 2005-09-20 2007-04-05 Epson Toyocom Corp 高周波デバイスの測定治具
JP2016125876A (ja) * 2014-12-26 2016-07-11 株式会社ヨコオ 交換用コンタクトユニット及び検査治具
JP2016186484A (ja) * 2015-03-27 2016-10-27 株式会社ヨコオ コンタクトユニット及び検査治具
JP2017058201A (ja) * 2015-09-15 2017-03-23 株式会社ヨコオ コンタクトユニット及び検査治具
KR20190028492A (ko) 2016-07-19 2019-03-18 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028782A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028757A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028781A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190031278A (ko) 2016-07-19 2019-03-25 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20210010895A (ko) * 2018-05-16 2021-01-28 테크노프로브 에스.피.에이. 고주파에서 고성능의 프로브 카드
JP2021067666A (ja) * 2019-10-25 2021-04-30 巨擘科技股▲ふん▼有限公司Ｐｒｉｎｃｏ Ｃｏｒｐ． 金属プローブ構造及びその製造方法
JP2021081274A (ja) * 2019-11-18 2021-05-27 三菱電機株式会社 試験装置及び試験方法
CN114200278A (zh) * 2021-11-29 2022-03-18 强一半导体（苏州）有限公司 一种薄膜探针卡及其探针头
WO2023047962A1 (ja) * 2021-09-27 2023-03-30 株式会社ヨコオ コンタクトユニット及び検査治具

Families Citing this family (102)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0361779A1 (en) * 1988-09-26 1990-04-04 Hewlett-Packard Company Micro-strip architecture for membrane test probe
GB8901817D0 (en) * 1989-01-27 1989-03-15 Stag Electronic Designs Apparatus for testing an electrical device
JPH02237047A (ja) * 1989-03-09 1990-09-19 Mitsubishi Electric Corp 半導体試験装置
US5055778A (en) * 1989-10-02 1991-10-08 Nihon Denshizairyo Kabushiki Kaisha Probe card in which contact pressure and relative position of each probe end are correctly maintained
US5012187A (en) * 1989-11-03 1991-04-30 Motorola, Inc. Method for parallel testing of semiconductor devices
US4975638A (en) * 1989-12-18 1990-12-04 Wentworth Laboratories Test probe assembly for testing integrated circuit devices
US5055776A (en) * 1990-07-10 1991-10-08 The United States Of America As Represented By The Secretary Of The Army Flexible membrane circuit tester
US5072176A (en) * 1990-07-10 1991-12-10 The United States Of America As Represented By The Secretary Of The Army Flexible membrane circuit tester
US5079501A (en) * 1990-07-10 1992-01-07 The United States Of America As Represented By The Secretary Of The Army Flexible membrane circuit tester
US5128612A (en) * 1990-07-31 1992-07-07 Texas Instruments Incorporated Disposable high performance test head
US5090118A (en) * 1990-07-31 1992-02-25 Texas Instruments Incorporated High performance test head and method of making
US5059898A (en) * 1990-08-09 1991-10-22 Tektronix, Inc. Wafer probe with transparent loading member
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5589781A (en) * 1990-09-20 1996-12-31 Higgins; H. Dan Die carrier apparatus
US5521518A (en) * 1990-09-20 1996-05-28 Higgins; H. Dan Probe card apparatus
US5148103A (en) * 1990-10-31 1992-09-15 Hughes Aircraft Company Apparatus for testing integrated circuits
US6998860B1 (en) 1991-06-04 2006-02-14 Micron Technology, Inc. Method for burn-in testing semiconductor dice
US5302891A (en) * 1991-06-04 1994-04-12 Micron Technology, Inc. Discrete die burn-in for non-packaged die
KR940001809B1 (ko) * 1991-07-18 1994-03-09 금성일렉트론 주식회사 반도체 칩의 테스터
EP0532926B1 (en) * 1991-08-26 1997-01-22 Hughes Aircraft Company Electrical circuit with resilient gasket support for raised connection features
US5264787A (en) * 1991-08-30 1993-11-23 Hughes Aircraft Company Rigid-flex circuits with raised features as IC test probes
US5204615A (en) * 1991-10-24 1993-04-20 Interconnect Devices, Inc. Module attachment for printed circuit board test fixtures
US5334931A (en) * 1991-11-12 1994-08-02 International Business Machines Corporation Molded test probe assembly
US5180977A (en) * 1991-12-02 1993-01-19 Hoya Corporation Usa Membrane probe contact bump compliancy system
GB2263980B (en) * 1992-02-07 1996-04-10 Marconi Gec Ltd Apparatus and method for testing bare dies
US5336992A (en) * 1992-06-03 1994-08-09 Trw Inc. On-wafer integrated circuit electrical testing
US5479109A (en) * 1992-06-03 1995-12-26 Trw Inc. Testing device for integrated circuits on wafer
EP0629867B1 (en) * 1993-06-16 1999-01-27 Nitto Denko Corporation Probe structure
US5412866A (en) * 1993-07-01 1995-05-09 Hughes Aircraft Company Method of making a cast elastomer/membrane test probe assembly
US5786701A (en) * 1993-07-02 1998-07-28 Mitel Semiconductor Limited Bare die testing
GB2279805B (en) * 1993-07-02 1997-09-17 Plessey Semiconductors Ltd Bare die testing
DE4418679A1 (de) * 1994-05-28 1995-11-30 Telefunken Microelectron Vorrichtung zur Kontaktierung zweier Schaltungsteile
WO1996007924A1 (en) * 1994-09-09 1996-03-14 Micromodule Systems Membrane probing of circuits
JP2978720B2 (ja) * 1994-09-09 1999-11-15 東京エレクトロン株式会社 プローブ装置
EP0779987A4 (en) * 1994-09-09 1998-01-07 Micromodule Systems Inc EXPLORATION OF THE CIRCUIT MEMBRANE
EP0707214A3 (en) * 1994-10-14 1997-04-16 Hughes Aircraft Co Multiport membrane probe to test complete semiconductor plates
WO1996013967A1 (en) * 1994-10-28 1996-05-09 Micromodule Systems Programmable high density electronic testing device
US5557212A (en) * 1994-11-18 1996-09-17 Isaac; George L. Semiconductor test socket and contacts
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US5642054A (en) * 1995-08-08 1997-06-24 Hughes Aircraft Company Active circuit multi-port membrane probe for full wafer testing
US5886877A (en) * 1995-10-13 1999-03-23 Meiko Electronics Co., Ltd. Circuit board, manufacturing method therefor, and bump-type contact head and semiconductor component packaging module using the circuit board
US6046599A (en) * 1996-05-20 2000-04-04 Microconnect, Inc. Method and device for making connection
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US5926029A (en) * 1997-05-27 1999-07-20 International Business Machines Corporation Ultra fine probe contacts
US6137299A (en) * 1997-06-27 2000-10-24 International Business Machines Corporation Method and apparatus for testing integrated circuit chips
US5973405A (en) * 1997-07-22 1999-10-26 Dytak Corporation Composite electrical contact structure and method for manufacturing the same
JPH11160356A (ja) * 1997-11-25 1999-06-18 Matsushita Electric Ind Co Ltd ウェハ一括型測定検査用プローブカードおよびセラミック多層配線基板ならびにそれらの製造方法
US6426636B1 (en) * 1998-02-11 2002-07-30 International Business Machines Corporation Wafer probe interface arrangement with nonresilient probe elements and support structure
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6343369B1 (en) 1998-09-15 2002-01-29 Microconnect, Inc. Methods for making contact device for making connection to an electronic circuit device and methods of using the same
US6215320B1 (en) * 1998-10-23 2001-04-10 Teradyne, Inc. High density printed circuit board
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
JP2001056346A (ja) * 1999-08-19 2001-02-27 Fujitsu Ltd プローブカード及び複数の半導体装置が形成されたウエハの試験方法
TW460697B (en) * 2000-01-24 2001-10-21 Urex Prec Inc Probe card of thin film type
US6838890B2 (en) * 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6496026B1 (en) 2000-02-25 2002-12-17 Microconnect, Inc. Method of manufacturing and testing an electronic device using a contact device having fingers and a mechanical ground
US6426638B1 (en) * 2000-05-02 2002-07-30 Decision Track Llc Compliant probe apparatus
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US7355420B2 (en) * 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
EP1509776A4 (en) 2002-05-23 2010-08-18 Cascade Microtech Inc PROBE TO TEST ANY TESTING EQUIPMENT
US6759861B2 (en) * 2002-07-30 2004-07-06 Intel Corporation Thin film probe card contact drive system
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7173442B2 (en) * 2003-08-25 2007-02-06 Delaware Capital Formation, Inc. Integrated printed circuit board and test contactor for high speed semiconductor testing
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
US20050162177A1 (en) * 2004-01-28 2005-07-28 Chou Arlen L. Multi-signal single beam probe
JP4980903B2 (ja) * 2004-07-07 2012-07-18 カスケード マイクロテック インコーポレイテッド 膜懸垂プローブを具えるプローブヘッド
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
CN100348983C (zh) * 2005-02-07 2007-11-14 董玟昌 一种微机电探针电路薄膜及其制法
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
US20070075717A1 (en) * 2005-09-14 2007-04-05 Touchdown Technologies, Inc. Lateral interposer contact design and probe card assembly
TWI466205B (zh) * 2006-06-06 2014-12-21 Advanced Inquiry Systems Inc 用於雙形態晶圓測試之方法與設備
DE202007018733U1 (de) 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
WO2007146291A2 (en) * 2006-06-09 2007-12-21 Octavian Scientific, Inc. Method and apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
TWI445109B (zh) * 2006-07-07 2014-07-11 Advanced Inquiry Systems Inc 平面延伸電導體超越基材邊緣的方法和設備
US7489148B2 (en) * 2006-07-28 2009-02-10 Advanced Inquiry Systems, Inc. Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator
JP4842049B2 (ja) * 2006-08-22 2011-12-21 株式会社日本マイクロニクス プローブ組立体
US7764076B2 (en) * 2007-02-20 2010-07-27 Centipede Systems, Inc. Method and apparatus for aligning and/or leveling a test head
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
WO2010140814A2 (ko) * 2009-06-03 2010-12-09 주식회사 쎄믹스 척의 능동적 기울기 제어가 가능한 웨이퍼 프로브 스테이션 및 그 제어방법
KR101090333B1 (ko) 2009-06-03 2011-12-07 주식회사 쎄믹스 척의 능동적 기울기 제어가 가능한 웨이퍼 프로브 스테이션 및 그 제어방법
US9176186B2 (en) 2009-08-25 2015-11-03 Translarity, Inc. Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed
US8362797B2 (en) * 2009-08-25 2013-01-29 Advanced Inquiry Systems, Inc. Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween
CN103229066A (zh) 2010-09-28 2013-07-31 高级查询系统公司 晶片测试系统以及相关的使用和制造方法
US9435855B2 (en) 2013-11-19 2016-09-06 Teradyne, Inc. Interconnect for transmitting signals between a device and a tester
US9594114B2 (en) 2014-06-26 2017-03-14 Teradyne, Inc. Structure for transmitting signals in an application space between a device under test and test electronics
US9977052B2 (en) 2016-10-04 2018-05-22 Teradyne, Inc. Test fixture
US10677815B2 (en) 2018-06-08 2020-06-09 Teradyne, Inc. Test system having distributed resources
US11363746B2 (en) 2019-09-06 2022-06-14 Teradyne, Inc. EMI shielding for a signal trace
US11243230B2 (en) * 2019-12-30 2022-02-08 Juniper Networks, Inc. Compact opto-electric probe
US11862901B2 (en) 2020-12-15 2024-01-02 Teradyne, Inc. Interposer
TWI868842B (zh) * 2023-08-04 2025-01-01 漢民測試系統股份有限公司 可調式承載裝置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832632A (en) * 1971-11-22 1974-08-27 F Ardezzone Multi-point probe head assembly
JPS60260861A (ja) * 1984-06-08 1985-12-24 Hitachi Ltd プロ−ブ
US4636722A (en) * 1984-05-21 1987-01-13 Probe-Rite, Inc. High density probe-head with isolated and shielded transmission lines
JPS62182672A (ja) * 1986-01-07 1987-08-11 Yokogawa Hewlett Packard Ltd 試験用プロ−ブ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596228A (en) * 1969-05-29 1971-07-27 Ibm Fluid actuated contactor
US3866119A (en) * 1973-09-10 1975-02-11 Probe Rite Inc Probe head-probing machine coupling adaptor
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4523144A (en) * 1980-05-27 1985-06-11 Japan Electronic Materials Corp. Complex probe card for testing a semiconductor wafer
US4574235A (en) * 1981-06-05 1986-03-04 Micro Component Technology, Inc. Transmission line connector and contact set assembly for test site
US4590422A (en) * 1981-07-30 1986-05-20 Pacific Western Systems, Inc. Automatic wafer prober having a probe scrub routine
US4649339A (en) * 1984-04-25 1987-03-10 Honeywell Inc. Integrated circuit interface
JPS60231336A (ja) * 1984-04-27 1985-11-16 Sumitomo Electric Ind Ltd プロ−ブ・カ−ド
JPS6180067A (ja) * 1984-09-21 1986-04-23 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション テスト・プロ−ブ装置
FR2571861B1 (fr) * 1984-10-16 1987-04-17 Radiotechnique Compelec Tete de mesure pour tester sous pointes des circuits
KR870006645A (ko) * 1985-12-23 1987-07-13 로버트 에스 헐스 집적회로의 멀티플리드 프로브장치
US4733172A (en) * 1986-03-08 1988-03-22 Trw Inc. Apparatus for testing I.C. chip
US4891585A (en) * 1986-09-05 1990-01-02 Tektronix, Inc. Multiple lead probe for integrated circuits in wafer form

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832632A (en) * 1971-11-22 1974-08-27 F Ardezzone Multi-point probe head assembly
US4636722A (en) * 1984-05-21 1987-01-13 Probe-Rite, Inc. High density probe-head with isolated and shielded transmission lines
JPS60260861A (ja) * 1984-06-08 1985-12-24 Hitachi Ltd プロ−ブ
JPS62182672A (ja) * 1986-01-07 1987-08-11 Yokogawa Hewlett Packard Ltd 試験用プロ−ブ

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01108738A (ja) * 1987-10-21 1989-04-26 Matsushita Electric Ind Co Ltd 測定装置
JPH02234067A (ja) * 1989-03-07 1990-09-17 Nec Corp フレキシブルプローブカード
JPH02237131A (ja) * 1989-03-10 1990-09-19 Matsushita Electric Ind Co Ltd 半導体ｉｃの試験装置及び試験方法
JPH03127845A (ja) * 1989-10-13 1991-05-30 Fuji Electric Co Ltd 集積回路装置試験用プローブ
JPH03122371U (enExample) * 1990-03-23 1991-12-13
JPH03293566A (ja) * 1990-04-10 1991-12-25 Nitto Denko Corp 検査装置
JPH0463134U (enExample) * 1990-10-03 1992-05-29
JPH06118100A (ja) * 1991-02-08 1994-04-28 Nippon Denshi Zairyo Kk プローブカード
JPH05232142A (ja) * 1991-08-26 1993-09-07 Hughes Aircraft Co 隆起したコンタクト用の弾性ガスケット支持体を備えた電気回路
JPH0749356A (ja) * 1991-09-03 1995-02-21 At & T Corp ウェーハ検査装置
JPH05340964A (ja) * 1992-06-05 1993-12-24 Mitsubishi Electric Corp ウエハ及びチップの試験装置
JP2007085801A (ja) * 2005-09-20 2007-04-05 Epson Toyocom Corp 高周波デバイスの測定治具
JP2016125876A (ja) * 2014-12-26 2016-07-11 株式会社ヨコオ 交換用コンタクトユニット及び検査治具
US10393771B2 (en) 2014-12-26 2019-08-27 Yokowo Co., Ltd. Exchangeable contact unit and inspection jig
JP2016186484A (ja) * 2015-03-27 2016-10-27 株式会社ヨコオ コンタクトユニット及び検査治具
JP2017058201A (ja) * 2015-09-15 2017-03-23 株式会社ヨコオ コンタクトユニット及び検査治具
KR20190028782A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028757A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028781A (ko) 2016-07-19 2019-03-19 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190031278A (ko) 2016-07-19 2019-03-25 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
KR20190028492A (ko) 2016-07-19 2019-03-18 신닛테츠스미킨 카부시키카이샤 고주파 담금질용 강
US20190300992A1 (en) * 2016-07-19 2019-10-03 Nippon Steel & Sumitomo Metal Corporation Steel for Induction Hardening
KR20210010895A (ko) * 2018-05-16 2021-01-28 테크노프로브 에스.피.에이. 고주파에서 고성능의 프로브 카드
JP2021524029A (ja) * 2018-05-16 2021-09-09 テクノプローべ ソシエタ ペル アチオニ 高周波における高性能プローブカード
JP2021067666A (ja) * 2019-10-25 2021-04-30 巨擘科技股▲ふん▼有限公司Ｐｒｉｎｃｏ Ｃｏｒｐ． 金属プローブ構造及びその製造方法
US11474128B2 (en) 2019-10-25 2022-10-18 Princo Corp. Metal probe structure and method for fabricating the same
JP2021081274A (ja) * 2019-11-18 2021-05-27 三菱電機株式会社 試験装置及び試験方法
WO2023047962A1 (ja) * 2021-09-27 2023-03-30 株式会社ヨコオ コンタクトユニット及び検査治具
CN114200278A (zh) * 2021-11-29 2022-03-18 强一半导体（苏州）有限公司 一种薄膜探针卡及其探针头

Also Published As

Publication number Publication date
EP0294939A3 (en) 1990-05-09
US4912399A (en) 1990-03-27
JPH0517705B2 (enExample) 1993-03-09
KR890001174A (ko) 1989-03-18
EP0294939A2 (en) 1988-12-14

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