JP5080459B2 - 広帯域能動/受動差動信号プローブ - Google Patents
広帯域能動/受動差動信号プローブ Download PDFInfo
- Publication number
- JP5080459B2 JP5080459B2 JP2008516872A JP2008516872A JP5080459B2 JP 5080459 B2 JP5080459 B2 JP 5080459B2 JP 2008516872 A JP2008516872 A JP 2008516872A JP 2008516872 A JP2008516872 A JP 2008516872A JP 5080459 B2 JP5080459 B2 JP 5080459B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- differential
- frequency
- probe
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims description 82
- 238000005259 measurement Methods 0.000 claims description 16
- 230000005540 biological transmission Effects 0.000 description 13
- 239000004020 conductor Substances 0.000 description 13
- 230000000295 complement effect Effects 0.000 description 10
- 230000011664 signaling Effects 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 4
- 230000002238 attenuated effect Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 1
- 239000011358 absorbing material Substances 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/10—Measuring sum, difference or ratio
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Amplifiers (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
Claims (3)
- 高周波数コモンモード信号および高周波数差動モード信号を含む高周波数成分と、低周波数コモンモード信号および低周波数差動モード信号を含む低周波数成分と、のうち少なくとも1つを具える差動信号の測定用のハイブリッドプローブであって、
(a)前記差動信号の前記高周波数コモンモード信号を減衰させ、前記差動信号の前記高周波数差動モード信号および前記低周波数成分の少なくとも一つを含むチョーク出力を出力するチョークと、
(b)前記チョーク出力の前記高周波数差動モード信号を遮断し、前記チョーク出力の前記低周波数成分を通過させる第1フィルタと、
(c)前記第1フィルタによって通過された前記低周波数成分の前記低周波数コモンモード信号を減衰させ、前記低周波数差動モード信号を低周波数シングルエンド信号に変換する差動増幅器と、
(d)前記チョーク出力の前記低周波数成分を遮断し、前記高周波数差動モード信号に対応する高周波数シングルエンド信号を通過させる第2フィルタと、
(e)前記低周波数シングルエンド信号と前記高周波数シングルエンド信号とを加算する合成器と、
を具えることを特徴とするプローブ。 - 前記差動増幅器のループ利得が1未満である請求項1に記載のプローブ。
- 請求項1に記載のプローブであって、
(a)前記合成器と前記差動増幅器の入力とに導電接続されている第1減衰器と、
(b)前記合成器と前記差動増幅器の出力とに導電接続されている第2減衰器と、
をさらに具えることを特徴とするプローブ。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US69010905P | 2005-06-13 | 2005-06-13 | |
US60/690,109 | 2005-06-13 | ||
US73939705P | 2005-11-23 | 2005-11-23 | |
US60/739,397 | 2005-11-23 | ||
PCT/US2006/016238 WO2006137979A2 (en) | 2005-06-13 | 2006-04-28 | Wideband active-passive differential signal probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008544250A JP2008544250A (ja) | 2008-12-04 |
JP5080459B2 true JP5080459B2 (ja) | 2012-11-21 |
Family
ID=37570931
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008516872A Expired - Fee Related JP5080459B2 (ja) | 2005-06-13 | 2006-04-28 | 広帯域能動/受動差動信号プローブ |
Country Status (5)
Country | Link |
---|---|
US (1) | US7619419B2 (ja) |
EP (1) | EP1932003A2 (ja) |
JP (1) | JP5080459B2 (ja) |
TW (1) | TWI292043B (ja) |
WO (1) | WO2006137979A2 (ja) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8369959B2 (en) * | 2007-05-31 | 2013-02-05 | Cochlear Limited | Implantable medical device with integrated antenna system |
EP2068156B1 (de) * | 2007-12-04 | 2018-05-30 | Rohde & Schwarz GmbH & Co. KG | Tastkopf mit Wellenleiter mit konzentrierter Dämpfung |
CN102004173B (zh) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业(深圳)有限公司 | 探针 |
DE102010027567B4 (de) * | 2010-02-19 | 2019-05-02 | Rohde & Schwarz Gmbh & Co. Kg | Tastkopf-System mit verschiedenen Verstärkern für die hochfrequente und niederfrequente Komponente |
CN102193008A (zh) * | 2010-03-03 | 2011-09-21 | 鸿富锦精密工业(深圳)有限公司 | 探头 |
EP2572207B1 (en) | 2010-05-21 | 2020-07-15 | University Of Virginia Patent Foundation | Micromachined on-wafer probes and related method |
US9264154B1 (en) * | 2012-10-09 | 2016-02-16 | The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration | Dynamic range enhancement of high-speed electrical signal data via non-linear compression |
US9500675B2 (en) * | 2013-07-15 | 2016-11-22 | Mpi Corporation | Probe module supporting loopback test |
TWI512300B (zh) * | 2013-07-15 | 2015-12-11 | Mpi Corp | Cantilever high frequency probe card |
CN104345185B (zh) * | 2013-07-26 | 2018-09-25 | 苏州普源精电科技有限公司 | 一种有源单端探头及一种测试测量仪器 |
US9435855B2 (en) | 2013-11-19 | 2016-09-06 | Teradyne, Inc. | Interconnect for transmitting signals between a device and a tester |
US9594114B2 (en) | 2014-06-26 | 2017-03-14 | Teradyne, Inc. | Structure for transmitting signals in an application space between a device under test and test electronics |
TWI583961B (zh) * | 2015-06-05 | 2017-05-21 | Mpi Corp | 具回授測試功能之探針模組(一) |
TWI583960B (zh) * | 2015-06-05 | 2017-05-21 | Mpi Corp | Probe module with feedback test function (3) |
US10302676B2 (en) * | 2016-03-18 | 2019-05-28 | Tektronix, Inc. | Flexible resistive tip cable assembly for differential probing |
US9977052B2 (en) | 2016-10-04 | 2018-05-22 | Teradyne, Inc. | Test fixture |
TWI636260B (zh) * | 2017-01-06 | 2018-09-21 | 新特系統股份有限公司 | 探針卡模組 |
US10782348B2 (en) * | 2017-03-10 | 2020-09-22 | Keithley Instruments, Llc | Automatic device detection and connection verification |
WO2019014622A1 (en) | 2017-07-14 | 2019-01-17 | Tektronix, Inc. | SYSTEMS, DEVICES AND METHODS FOR MEASURING CONTINUOUS / LOW FREQUENCY CURRENT SIGNAL COMPONENTS |
US11002761B2 (en) * | 2017-07-25 | 2021-05-11 | Keithley Instruments, Llc | Probe card system for testing an integrated circuit |
DE102017128726A1 (de) * | 2017-12-04 | 2019-06-06 | Karlsruher Institut für Technologie | Vorrichtung zum Erfassen von Frequenzbereichen |
US10541655B2 (en) | 2018-01-31 | 2020-01-21 | Keysight Technologies, Inc. | Wideband amplifier and methods of use |
US10677815B2 (en) | 2018-06-08 | 2020-06-09 | Teradyne, Inc. | Test system having distributed resources |
KR102174427B1 (ko) | 2019-04-22 | 2020-11-05 | 리노공업주식회사 | 검사장치 |
US10944599B2 (en) | 2019-06-28 | 2021-03-09 | Adtran, Inc. | Systems and methods for communicating high speed signals in a communication device |
US11363746B2 (en) | 2019-09-06 | 2022-06-14 | Teradyne, Inc. | EMI shielding for a signal trace |
US11862901B2 (en) | 2020-12-15 | 2024-01-02 | Teradyne, Inc. | Interposer |
CN114598303B (zh) * | 2022-03-17 | 2023-07-21 | 中国工程物理研究院流体物理研究所 | 脉冲高电压或大电流探测器及其无源差分电路和工作方法 |
CN117630647B (zh) * | 2024-01-05 | 2024-04-19 | 上海捷策创电子科技有限公司 | 一种基于嵌入式pcb子卡的测试装置 |
Family Cites Families (182)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US491783A (en) | 1893-02-14 | Bolster-plate | ||
US1337866A (en) | 1917-09-27 | 1920-04-20 | Griffiths Ethel Grace | System for protecting electric cables |
US2142625A (en) | 1932-07-06 | 1939-01-03 | Hollandsche Draad En Kabelfab | High tension cable |
US2376101A (en) | 1942-04-01 | 1945-05-15 | Ferris Instr Corp | Electrical energy transmission |
US2389668A (en) | 1943-03-04 | 1945-11-27 | Barnes Drill Co | Indexing mechanism for machine tables |
US2545258A (en) | 1945-03-22 | 1951-03-13 | Marcel L Cailloux | Device for telecontrol of spatial movement |
US2762234A (en) | 1952-09-08 | 1956-09-11 | Dodd Roy Frank | Search-track radar control |
US2901696A (en) | 1953-11-25 | 1959-08-25 | Ingeniors N Magnetic Ab Fa | Arrangement for automatic and continuous measuring of the noise factor of an electric device |
US2921276A (en) | 1955-08-30 | 1960-01-12 | Cutler Hammer Inc | Microwave circuits |
US2947939A (en) | 1956-09-24 | 1960-08-02 | Libbey Owens Ford Glass Co | Testing electrically conductive articles |
US3193712A (en) | 1962-03-21 | 1965-07-06 | Clarence A Harris | High voltage cable |
US3230299A (en) | 1962-07-18 | 1966-01-18 | Gen Cable Corp | Electrical cable with chemically bonded rubber layers |
US3176091A (en) | 1962-11-07 | 1965-03-30 | Helmer C Hanson | Controlled multiple switching unit |
US3262593A (en) | 1963-07-10 | 1966-07-26 | Gen Mills Inc | Wall-mounted support structure |
GB1031068A (en) | 1963-09-23 | 1966-05-25 | George Vincent Grispo | Improvements in or relating to motion reduction mechanisms |
US3218584A (en) | 1964-01-02 | 1965-11-16 | Sanders Associates Inc | Strip line connection |
US3429040A (en) | 1965-06-18 | 1969-02-25 | Ibm | Method of joining a component to a substrate |
US3401126A (en) | 1965-06-18 | 1968-09-10 | Ibm | Method of rendering noble metal conductive composition non-wettable by solder |
US3445770A (en) | 1965-12-27 | 1969-05-20 | Philco Ford Corp | Microelectronic test probe with defect marker access |
US3484679A (en) | 1966-10-03 | 1969-12-16 | North American Rockwell | Electrical apparatus for changing the effective capacitance of a cable |
US3573617A (en) | 1967-10-27 | 1971-04-06 | Aai Corp | Method and apparatus for testing packaged integrated circuits |
GB1240866A (en) | 1968-08-22 | 1971-07-28 | Amf Inc | Control device |
US3609539A (en) | 1968-09-28 | 1971-09-28 | Ibm | Self-aligning kelvin probe |
US3541222A (en) | 1969-01-13 | 1970-11-17 | Bunker Ramo | Connector screen for interconnecting adjacent surfaces of laminar circuits and method of making |
JPS497756B1 (ja) | 1969-01-24 | 1974-02-22 | ||
NL7003475A (ja) | 1969-03-28 | 1970-09-30 | ||
US3648169A (en) | 1969-05-26 | 1972-03-07 | Teledyne Inc | Probe and head assembly |
US3596228A (en) | 1969-05-29 | 1971-07-27 | Ibm | Fluid actuated contactor |
US3611199A (en) | 1969-09-30 | 1971-10-05 | Emerson Electric Co | Digital electromagnetic wave phase shifter comprising switchable reflectively terminated power-dividing means |
US3686624A (en) | 1969-12-15 | 1972-08-22 | Rca Corp | Coax line to strip line end launcher |
US3654585A (en) | 1970-03-11 | 1972-04-04 | Brooks Research And Mfg Inc | Coordinate conversion for the testing of printed circuit boards |
US3622915A (en) | 1970-03-16 | 1971-11-23 | Meca Electronics Inc | Electrical coupler |
US3740900A (en) | 1970-07-01 | 1973-06-26 | Signetics Corp | Vacuum chuck assembly for semiconductor manufacture |
US3700998A (en) | 1970-08-20 | 1972-10-24 | Computer Test Corp | Sample and hold circuit with switching isolation |
US3714572A (en) | 1970-08-21 | 1973-01-30 | Rca Corp | Alignment and test fixture apparatus |
US4009456A (en) | 1970-10-07 | 1977-02-22 | General Microwave Corporation | Variable microwave attenuator |
US3680037A (en) | 1970-11-05 | 1972-07-25 | Tech Wire Prod Inc | Electrical interconnector |
US3662318A (en) | 1970-12-23 | 1972-05-09 | Comp Generale Electricite | Transition device between coaxial and microstrip lines |
US3710251A (en) | 1971-04-07 | 1973-01-09 | Collins Radio Co | Microelectric heat exchanger pedestal |
US3705379A (en) | 1971-05-14 | 1972-12-05 | Amp Inc | Connector for interconnection of symmetrical and asymmetrical transmission lines |
US3766470A (en) | 1971-05-24 | 1973-10-16 | Unit Process Assemblies | Apparatus for testing the integrity of a thru-hole plating in circuit board workpieces or the like by measuring the effective thickness thereof |
US3725829A (en) | 1971-07-14 | 1973-04-03 | Itek Corp | Electrical connector |
GB1387587A (en) | 1971-07-22 | 1975-03-19 | Plessey Co Ltd | Electrical interconnectors and connector assemblies |
US3810016A (en) | 1971-12-17 | 1974-05-07 | Western Electric Co | Test probe for semiconductor devices |
US3882597A (en) | 1971-12-17 | 1975-05-13 | Western Electric Co | Method for making a test probe for semiconductor devices |
US3829076A (en) | 1972-06-08 | 1974-08-13 | H Sofy | Dial index machine |
US3858212A (en) | 1972-08-29 | 1974-12-31 | L Tompkins | Multi-purpose information gathering and distribution system |
US3952156A (en) | 1972-09-07 | 1976-04-20 | Xerox Corporation | Signal processing system |
CA970849A (en) | 1972-09-18 | 1975-07-08 | Malcolm P. Macmartin | Low leakage isolating transformer for electromedical apparatus |
US3806801A (en) | 1972-12-26 | 1974-04-23 | Ibm | Probe contactor having buckling beam probes |
US3839672A (en) | 1973-02-05 | 1974-10-01 | Belden Corp | Method and apparatus for measuring the effectiveness of the shield in a coaxial cable |
US3867698A (en) | 1973-03-01 | 1975-02-18 | Western Electric Co | Test probe for integrated circuit chips |
US3803709A (en) | 1973-03-01 | 1974-04-16 | Western Electric Co | Test probe for integrated circuit chips |
US3833852A (en) | 1973-08-16 | 1974-09-03 | Owens Illinois Inc | Inspection head mounting apparatus |
US3930809A (en) | 1973-08-21 | 1976-01-06 | Wentworth Laboratories, Inc. | Assembly fixture for fixed point probe card |
US3849728A (en) | 1973-08-21 | 1974-11-19 | Wentworth Labor Inc | Fixed point probe card and an assembly and repair fixture therefor |
US4001685A (en) | 1974-03-04 | 1977-01-04 | Electroglas, Inc. | Micro-circuit test probe |
US3936743A (en) | 1974-03-05 | 1976-02-03 | Electroglas, Inc. | High speed precision chuck assembly |
US3971610A (en) | 1974-05-10 | 1976-07-27 | Technical Wire Products, Inc. | Conductive elastomeric contacts and connectors |
US3976959A (en) | 1974-07-22 | 1976-08-24 | Gaspari Russell A | Planar balun |
US3970934A (en) | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
US4038599A (en) | 1974-12-30 | 1977-07-26 | International Business Machines Corporation | High density wafer contacting and test system |
US4123706A (en) | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
US4038894A (en) | 1975-07-18 | 1977-08-02 | Springfield Tool And Die, Inc. | Piercing apparatus |
SE407115B (sv) | 1975-10-06 | 1979-03-12 | Kabi Ab | Forfarande och metelektroder for studium av enzymatiska och andra biokemiska reaktioner |
US4035723A (en) | 1975-10-16 | 1977-07-12 | Xynetics, Inc. | Probe arm |
US3992073A (en) | 1975-11-24 | 1976-11-16 | Technical Wire Products, Inc. | Multi-conductor probe |
US4116523A (en) | 1976-01-23 | 1978-09-26 | James M. Foster | High frequency probe |
US4049252A (en) | 1976-02-04 | 1977-09-20 | Bell Theodore F | Index table |
US4008900A (en) | 1976-03-15 | 1977-02-22 | John Freedom | Indexing chuck |
US4063195A (en) | 1976-03-26 | 1977-12-13 | Hughes Aircraft Company | Parametric frequency converter |
US4099120A (en) | 1976-04-19 | 1978-07-04 | Akin Aksu | Probe head for testing printed circuit boards |
US4027935A (en) | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | Contact for an electrical contactor assembly |
US4074201A (en) | 1976-07-26 | 1978-02-14 | Gte Sylvania Incorporated | Signal analyzer with noise estimation and signal to noise readout |
US4115735A (en) | 1976-10-14 | 1978-09-19 | Faultfinders, Inc. | Test fixture employing plural platens for advancing some or all of the probes of the test fixture |
US4093988A (en) | 1976-11-08 | 1978-06-06 | General Electric Company | High speed frequency response measurement |
US4124787A (en) | 1977-03-11 | 1978-11-07 | Atari, Inc. | Joystick controller mechanism operating one or plural switches sequentially or simultaneously |
US4151465A (en) | 1977-05-16 | 1979-04-24 | Lenz Seymour S | Variable flexure test probe for microelectronic circuits |
US4161692A (en) | 1977-07-18 | 1979-07-17 | Cerprobe Corporation | Probe device for integrated circuit wafers |
US4312117A (en) | 1977-09-01 | 1982-01-26 | Raytheon Company | Integrated test and assembly device |
US4184729A (en) | 1977-10-13 | 1980-01-22 | Bunker Ramo Corporation | Flexible connector cable |
US4135131A (en) | 1977-10-14 | 1979-01-16 | The United States Of America As Represented By The Secretary Of The Army | Microwave time delay spectroscopic methods and apparatus for remote interrogation of biological targets |
US4184133A (en) | 1977-11-28 | 1980-01-15 | Rockwell International Corporation | Assembly of microwave integrated circuits having a structurally continuous ground plane |
US4216467A (en) | 1977-12-22 | 1980-08-05 | Westinghouse Electric Corp. | Hand controller |
US4232398A (en) | 1978-02-09 | 1980-11-04 | Motorola, Inc. | Radio receiver alignment indicator |
US4177421A (en) | 1978-02-27 | 1979-12-04 | Xerox Corporation | Capacitive transducer |
US4302146A (en) | 1978-08-23 | 1981-11-24 | Westinghouse Electric Corp. | Probe positioner |
US4225819A (en) | 1978-10-12 | 1980-09-30 | Bell Telephone Laboratories, Incorporated | Circuit board contact contamination probe |
US4306235A (en) | 1978-11-02 | 1981-12-15 | Cbc Corporation | Multiple frequency microwave antenna |
DE2849119A1 (de) | 1978-11-13 | 1980-05-14 | Siemens Ag | Verfahren und schaltungsanordnung zur daempfungsmessung, insbesondere zur ermittlung der daempfungs- und/oder gruppenlaufzeitverzerrung eines messobjektes |
US4251772A (en) | 1978-12-26 | 1981-02-17 | Pacific Western Systems Inc. | Probe head for an automatic semiconductive wafer prober |
US4280112A (en) | 1979-02-21 | 1981-07-21 | Eisenhart Robert L | Electrical coupler |
US4287473A (en) | 1979-05-25 | 1981-09-01 | The United States Of America As Represented By The United States Department Of Energy | Nondestructive method for detecting defects in photodetector and solar cell devices |
FI58719C (fi) * | 1979-06-01 | 1981-04-10 | Instrumentarium Oy | Diagnostiseringsanordning foer broestkancer |
US4277741A (en) | 1979-06-25 | 1981-07-07 | General Motors Corporation | Microwave acoustic spectrometer |
US4327180A (en) | 1979-09-14 | 1982-04-27 | Board Of Governors, Wayne State Univ. | Method and apparatus for electromagnetic radiation of biological material |
US4284033A (en) | 1979-10-31 | 1981-08-18 | Rca Corporation | Means to orbit and rotate target wafers supported on planet member |
US4330783A (en) | 1979-11-23 | 1982-05-18 | Toia Michael J | Coaxially fed dipole antenna |
US4284682A (en) | 1980-04-30 | 1981-08-18 | Nasa | Heat sealable, flame and abrasion resistant coated fabric |
US4425395A (en) * | 1981-04-30 | 1984-01-10 | Fujikura Rubber Works, Ltd. | Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production |
JPS60136006U (ja) * | 1984-02-20 | 1985-09-10 | 株式会社 潤工社 | フラツトケ−ブル |
US4646005A (en) * | 1984-03-16 | 1987-02-24 | Motorola, Inc. | Signal probe |
US4722846A (en) * | 1984-04-18 | 1988-02-02 | Kikkoman Corporation | Novel variant and process for producing light colored soy sauce using such variant |
DE3428087A1 (de) * | 1984-07-30 | 1986-01-30 | Kraftwerk Union AG, 4330 Mülheim | Konzentrisches dreileiterkabel |
DE3531893A1 (de) * | 1985-09-06 | 1987-03-19 | Siemens Ag | Verfahren zur bestimmung der verteilung der dielektrizitaetskonstanten in einem untersuchungskoerper sowie messanordnung zur durchfuehrung des verfahrens |
JPH0326643Y2 (ja) * | 1985-09-30 | 1991-06-10 | ||
US5917707A (en) * | 1993-11-16 | 1999-06-29 | Formfactor, Inc. | Flexible contact structure with an electrically conductive shell |
US4727319A (en) * | 1985-12-24 | 1988-02-23 | Hughes Aircraft Company | Apparatus for on-wafer testing of electrical circuits |
DE3752143T2 (de) * | 1986-01-24 | 1998-03-12 | Fuji Photo Film Co Ltd | Vorrichtung zum Beladen von Blattfilmen |
JP2609232B2 (ja) * | 1986-09-04 | 1997-05-14 | 日本ヒューレット・パッカード株式会社 | フローテイング駆動回路 |
US5180976A (en) * | 1987-04-17 | 1993-01-19 | Everett/Charles Contact Products, Inc. | Integrated circuit carrier having built-in circuit verification |
US5082627A (en) * | 1987-05-01 | 1992-01-21 | Biotronic Systems Corporation | Three dimensional binding site array for interfering with an electrical field |
US4894612A (en) * | 1987-08-13 | 1990-01-16 | Hypres, Incorporated | Soft probe for providing high speed on-wafer connections to a circuit |
US5084671A (en) * | 1987-09-02 | 1992-01-28 | Tokyo Electron Limited | Electric probing-test machine having a cooling system |
US4891584A (en) * | 1988-03-21 | 1990-01-02 | Semitest, Inc. | Apparatus for making surface photovoltage measurements of a semiconductor |
US4893914A (en) * | 1988-10-12 | 1990-01-16 | The Micromanipulator Company, Inc. | Test station |
US4904935A (en) * | 1988-11-14 | 1990-02-27 | Eaton Corporation | Electrical circuit board text fixture having movable platens |
US5129006A (en) * | 1989-01-06 | 1992-07-07 | Hill Amel L | Electronic audio signal amplifier and loudspeaker system |
US5089774A (en) * | 1989-12-26 | 1992-02-18 | Sharp Kabushiki Kaisha | Apparatus and a method for checking a semiconductor |
JPH03209737A (ja) * | 1990-01-11 | 1991-09-12 | Tokyo Electron Ltd | プローブ装置 |
JPH043607A (ja) * | 1990-04-20 | 1992-01-08 | Iwatsu Electric Co Ltd | 広帯域増幅器 |
US5187443A (en) * | 1990-07-24 | 1993-02-16 | Bereskin Alexander B | Microwave test fixtures for determining the dielectric properties of a material |
US5091732A (en) * | 1990-09-07 | 1992-02-25 | The United States Of America As Represented By The Secretary Of The Navy | Lightweight deployable antenna system |
US5280156A (en) * | 1990-12-25 | 1994-01-18 | Ngk Insulators, Ltd. | Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means |
US5177438A (en) * | 1991-08-02 | 1993-01-05 | Motorola, Inc. | Low resistance probe for semiconductor |
US5180977A (en) * | 1991-12-02 | 1993-01-19 | Hoya Corporation Usa | Membrane probe contact bump compliancy system |
TW212252B (ja) * | 1992-05-01 | 1993-09-01 | Martin Marietta Corp | |
USRE37130E1 (en) * | 1992-05-08 | 2001-04-10 | David Fiori, Jr. | Signal conditioning apparatus |
US5281364A (en) * | 1992-05-22 | 1994-01-25 | Finch Limited | Liquid metal electrical contact compositions |
US5684669A (en) * | 1995-06-07 | 1997-11-04 | Applied Materials, Inc. | Method for dechucking a workpiece from an electrostatic chuck |
JPH06302656A (ja) * | 1993-04-19 | 1994-10-28 | Toshiba Corp | 半導体素子特性評価装置及び該装置を用いる半導体素子特性評価方法 |
JP3165561B2 (ja) * | 1993-06-22 | 2001-05-14 | 日本電信電話株式会社 | 高周波重畳微小信号検出用差動プローブ |
JPH0714898A (ja) * | 1993-06-23 | 1995-01-17 | Mitsubishi Electric Corp | 半導体ウエハの試験解析装置および解析方法 |
US6728113B1 (en) * | 1993-06-24 | 2004-04-27 | Polychip, Inc. | Method and apparatus for non-conductively interconnecting integrated circuits |
US5412866A (en) * | 1993-07-01 | 1995-05-09 | Hughes Aircraft Company | Method of making a cast elastomer/membrane test probe assembly |
JP3442822B2 (ja) * | 1993-07-28 | 2003-09-02 | アジレント・テクノロジー株式会社 | 測定用ケーブル及び測定システム |
US6184053B1 (en) * | 1993-11-16 | 2001-02-06 | Formfactor, Inc. | Method of making microelectronic spring contact elements |
US6023103A (en) * | 1994-11-15 | 2000-02-08 | Formfactor, Inc. | Chip-scale carrier for semiconductor devices including mounted spring contacts |
US6525555B1 (en) * | 1993-11-16 | 2003-02-25 | Formfactor, Inc. | Wafer-level burn-in and test |
US20020011859A1 (en) * | 1993-12-23 | 2002-01-31 | Kenneth R. Smith | Method for forming conductive bumps for the purpose of contrructing a fine pitch test device |
US5715819A (en) * | 1994-05-26 | 1998-02-10 | The Carolinas Heart Institute | Microwave tomographic spectroscopy system and method |
US5704355A (en) * | 1994-07-01 | 1998-01-06 | Bridges; Jack E. | Non-invasive system for breast cancer detection |
GB9417450D0 (en) * | 1994-08-25 | 1994-10-19 | Symmetricom Inc | An antenna |
US5488954A (en) * | 1994-09-09 | 1996-02-06 | Georgia Tech Research Corp. | Ultrasonic transducer and method for using same |
US5481196A (en) * | 1994-11-08 | 1996-01-02 | Nebraska Electronics, Inc. | Process and apparatus for microwave diagnostics and therapy |
US6002109A (en) * | 1995-07-10 | 1999-12-14 | Mattson Technology, Inc. | System and method for thermal processing of a semiconductor substrate |
JP3838381B2 (ja) * | 1995-11-22 | 2006-10-25 | 株式会社アドバンテスト | プローブカード |
JP2900877B2 (ja) * | 1996-03-22 | 1999-06-02 | 日本電気株式会社 | 半導体デバイスの配線電流観測方法、配線系欠陥検査方法およびその装置 |
US6181149B1 (en) * | 1996-09-26 | 2001-01-30 | Delaware Capital Formation, Inc. | Grid array package test contactor |
US6184845B1 (en) * | 1996-11-27 | 2001-02-06 | Symmetricom, Inc. | Dielectric-loaded antenna |
US6019612A (en) * | 1997-02-10 | 2000-02-01 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus for electrically connecting a device to be tested |
JPH10335395A (ja) * | 1997-05-28 | 1998-12-18 | Advantest Corp | プローブカードの接触位置検出方法 |
WO1999004273A1 (en) * | 1997-07-15 | 1999-01-28 | Wentworth Laboratories, Inc. | Probe station with multiple adjustable probe supports |
US6013586A (en) * | 1997-10-09 | 2000-01-11 | Dimension Polyant Sailcloth, Inc. | Tent material product and method of making tent material product |
US6287776B1 (en) * | 1998-02-02 | 2001-09-11 | Signature Bioscience, Inc. | Method for detecting and classifying nucleic acid hybridization |
US7083985B2 (en) * | 1998-02-02 | 2006-08-01 | Hefti John J | Coplanar waveguide biosensor for detecting molecular or cellular events |
US6181144B1 (en) * | 1998-02-25 | 2001-01-30 | Micron Technology, Inc. | Semiconductor probe card having resistance measuring circuitry and method fabrication |
US6181416B1 (en) * | 1998-04-14 | 2001-01-30 | Optometrix, Inc. | Schlieren method for imaging semiconductor device properties |
TW440699B (en) * | 1998-06-09 | 2001-06-16 | Advantest Corp | Test apparatus for electronic parts |
US6194720B1 (en) * | 1998-06-24 | 2001-02-27 | Micron Technology, Inc. | Preparation of transmission electron microscope samples |
GB2342148B (en) * | 1998-10-01 | 2000-12-20 | Nippon Kokan Kk | Method and apparatus for preventing snow from melting and for packing snow in artificial ski facility |
US6175228B1 (en) * | 1998-10-30 | 2001-01-16 | Agilent Technologies | Electronic probe for measuring high impedance tri-state logic circuits |
US6169410B1 (en) * | 1998-11-09 | 2001-01-02 | Anritsu Company | Wafer probe with built in RF frequency conversion module |
AU5586000A (en) * | 1999-02-22 | 2000-09-14 | Paul Bryant | Programmable active microwave ultrafine resonance spectrometer (pamurs) method and systems |
US6400166B2 (en) * | 1999-04-15 | 2002-06-04 | International Business Machines Corporation | Micro probe and method of fabricating same |
US6340895B1 (en) * | 1999-07-14 | 2002-01-22 | Aehr Test Systems, Inc. | Wafer-level burn-in and test cartridge |
JP2001183396A (ja) * | 1999-12-28 | 2001-07-06 | Hioki Ee Corp | 差動プローブ |
US6459739B1 (en) * | 1999-12-30 | 2002-10-01 | Tioga Technologies Inc. | Method and apparatus for RF common-mode noise rejection in a DSL receiver |
US6379130B1 (en) * | 2000-06-09 | 2002-04-30 | Tecumseh Products Company | Motor cover retention |
JP2002022775A (ja) * | 2000-07-05 | 2002-01-23 | Ando Electric Co Ltd | 電気光学プローブおよび磁気光学プローブ |
JP2002039091A (ja) * | 2000-07-21 | 2002-02-06 | Minebea Co Ltd | 送風機 |
US6512482B1 (en) * | 2001-03-20 | 2003-01-28 | Xilinx, Inc. | Method and apparatus using a semiconductor die integrated antenna structure |
EP1394847A1 (en) * | 2001-06-06 | 2004-03-03 | Ibiden Co., Ltd. | Wafer prober |
CA2353024C (en) * | 2001-07-12 | 2005-12-06 | Ibm Canada Limited-Ibm Canada Limitee | Anti-vibration and anti-tilt microscope stand |
IL144806A (en) * | 2001-08-08 | 2005-11-20 | Nova Measuring Instr Ltd | Method and apparatus for process control in semiconductor manufacturing |
US20030032000A1 (en) * | 2001-08-13 | 2003-02-13 | Signature Bioscience Inc. | Method for analyzing cellular events |
US6794934B2 (en) * | 2001-12-14 | 2004-09-21 | Iterra Communications, Llc | High gain wideband driver amplifier |
WO2003100445A2 (en) * | 2002-05-23 | 2003-12-04 | Cascade Microtech, Inc. | Probe for testing a device under test |
US7343185B2 (en) * | 2002-06-21 | 2008-03-11 | Nir Diagnostics Inc. | Measurement of body compounds |
US6741129B1 (en) * | 2002-12-19 | 2004-05-25 | Texas Instruments Incorporated | Differential amplifier slew rate boosting scheme |
US6987483B2 (en) * | 2003-02-21 | 2006-01-17 | Kyocera Wireless Corp. | Effectively balanced dipole microstrip antenna |
US6838885B2 (en) * | 2003-03-05 | 2005-01-04 | Murata Manufacturing Co., Ltd. | Method of correcting measurement error and electronic component characteristic measurement apparatus |
-
2006
- 2006-04-28 WO PCT/US2006/016238 patent/WO2006137979A2/en active Application Filing
- 2006-04-28 JP JP2008516872A patent/JP5080459B2/ja not_active Expired - Fee Related
- 2006-04-28 US US11/413,738 patent/US7619419B2/en not_active Expired - Fee Related
- 2006-04-28 EP EP06751763A patent/EP1932003A2/en not_active Withdrawn
- 2006-05-12 TW TW095116803A patent/TWI292043B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI292043B (en) | 2008-01-01 |
US20060290357A1 (en) | 2006-12-28 |
EP1932003A2 (en) | 2008-06-18 |
WO2006137979A3 (en) | 2007-05-31 |
US7619419B2 (en) | 2009-11-17 |
WO2006137979A2 (en) | 2006-12-28 |
JP2008544250A (ja) | 2008-12-04 |
TW200700731A (en) | 2007-01-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5080459B2 (ja) | 広帯域能動/受動差動信号プローブ | |
US7378832B2 (en) | Probing high-frequency signals | |
US20080309349A1 (en) | Flexible interposer system | |
US7453276B2 (en) | Probe for combined signals | |
US7659790B2 (en) | High speed signal transmission line having reduced thickness regions | |
US6822463B1 (en) | Active differential test probe with a transmission line input structure | |
JP4866995B2 (ja) | プロービング方法及び装置 | |
CN107918062B (zh) | 一种宽频域的瞬态空间电场测量系统及方法 | |
US10041986B2 (en) | Balanced bridge | |
US8076989B2 (en) | Differential waveguide system connected to front and rear network elements | |
US6864761B2 (en) | Distributed capacitive/resistive electronic device | |
US9823284B2 (en) | Ultra-wide band measurement bridge | |
US6177804B1 (en) | Common-mode voltage probe for predicting EMI from unshielded differential-pair cables | |
US10591530B1 (en) | Coplanar load pull test fixture for wave measurements | |
JP2010097748A (ja) | 同軸ケーブルおよびこれを用いた伝送回路 | |
US11705611B2 (en) | High-frequency coaxial attenuator | |
JPH0835987A (ja) | プローブ | |
McKay et al. | Switch branch in trap-rich RFSOI with 84 dBm off-state IP3 | |
JPH05218780A (ja) | プローブ減衰器 | |
JP5470820B2 (ja) | 高周波測定方法及び装置 | |
Armstong et al. | Cable Media Performance Testing | |
JP2001074792A (ja) | 二端子トリオ測定装置 | |
Mittal | Quantification of channel performance and development and characterization of small magnetic field probes |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20101005 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20101222 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110906 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111206 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120814 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120830 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150907 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5080459 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |