US491783A - Bolster-plate - Google Patents

Bolster-plate Download PDF

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Publication number
US491783A
US491783A US491783DA US491783A US 491783 A US491783 A US 491783A US 491783D A US491783D A US 491783DA US 491783 A US491783 A US 491783A
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plates
axle
king
rivet
bolt
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B60VEHICLES IN GENERAL
    • B60GVEHICLE SUSPENSION ARRANGEMENTS
    • B60G9/00Resilient suspensions of a rigid axle or axle housing for two or more wheels
    • B60G9/02Resilient suspensions of a rigid axle or axle housing for two or more wheels the axle or housing being pivotally mounted on the vehicle, e.g. the pivotal axis being parallel to the longitudinal axis of the vehicle

Description

(No Model.)

H. A. MOYER.-

BOLS TER PLATE.

No. 491,783. Patented Feb. 14, 1893.

INVENTOR. 544M2 4 WITNESSES:

A; ATTORNEYS.

UNITED STATES PATENT OFFICE.

HARVEY A. MOYER, OF SYRACUSE, NEW YORK.

BOLSTER-PLATE.

SPECIFICATION forming part of Letters Patent No. 491,783, dated February 14, 1893.

Application filed December 15, 1890- Seriel No. 374,733. (No model.)

To all whom it may concern:

Be it known that I, HARVEY A. MOYER, of Syracuse, in the county of Onondaga, in the State of NewYork, have invented newand useful Improvements in Bolster or Fifth-VVhecl Plates, of which the following, taken in connection with the accompanying drawings, is a full, clear, and exact description.

This invention relates to the pivotal connection of the head-block and front axle of a vehicle. And the object of the invention is to relieve the kingbolt from shearing strain at the junction of the head-block and axle. And to that end the invention consists in the novel construction and combination of parts hereinafter fully described and set forth in the claim.

Referring to the annexed drawings, Figure 1 is a front View of the central portion of the front axle with the head block or bolster mounted thereon, Fig. 2 is an enlarged detached plan view of the axle-bed plate and bolster plate pivoted thereto by my improved device for protecting the king-bolt as aforesaid, and Fig. 3 is a vertical transverse section through the center of the pivotal connection of the aforesaid plates.

Similar letters of reference indicate corresponding parts.

A represents the front axle of the vehicle,B-- the usual wooden bed-piece mounted on said axle, and C-- the head-block pivoted to said bed-piece and axle. Between the head-block and bed-piece are usually interposed two metal wear-plates -P- and -P one of which is fastened to the top of the bedpiece -B by means of clips -c-c as shown in Fig. 1 of the drawings, and the other plate is fastened to the underside of the headblock usually by means of bolts or screws as indicated by dotted lines. The pivoting of the head block or bolster is usually effected by the king-bolt -dpassing down through the parts -C-B- and -A- and through perforations in the intervening plates P P. Experience has proven the fact that said construction and combination of parts subjects the king-bolt to both a lateral and shearing strain at the point where it passes through the plates -P-P-, and in consequence thereof the king-bolt has been broken. All of these defects are obviated by my present invention which consists in reaming out the king-bolt-holes in the two plates so as to bevel said holes throughout their depths gradually contracting the same to the adjacent faces of the plates, and inserting therein a rivet and upsetting or heading the ends of the rivet so as to closely'fit to the bevels of the holes. In this manner the rivet receives the shape of two f rusta of cones joined at their small ends, and thus forms a most effective tie of the two plates. Vertically through the center of said rivet I drill a hole for the reception of the king-bolt -dwhich passes through the head-block or bolster C-, plates PP, bed-piece -B and axle A.

The rivet -Z2 is to be fitted sufficiently loose in one or both plates to allow the same to turn on said rivet.

It will be observed that by tying the plates P-P- to each other in the form shown and described the king-bolt is entirely relieved from lateral as well as shearing strains.

Having described my invention, what I claim as new and desire to secure by Letters Patent, is:

The combination, with the front axle and head-block, of the plates P-P provided with eyes a-abeveled throughout their depths with the narrower ends at the adjacent faces of the plates, the rivet bof the form of two frusta of cones joined at their small ends and perforated at the center, and the king-bolt passing through said rivet, substantially as set forth.

In testimony whereof I havehereunto signed my name this 11th day of December, 1890.

HARVEY A. MOYER. [L. s.]

Witnesses:

MARK W. DEWEY, H. M. SEAMANs.

US491783A Bolster-plate Expired - Lifetime US491783A (en)

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Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020075019A1 (en) * 2000-12-04 2002-06-20 Leonard Hayden Wafer probe
US20050140386A1 (en) * 2003-12-24 2005-06-30 Eric Strid Active wafer probe
US20060043962A1 (en) * 2004-09-13 2006-03-02 Terry Burcham Double sided probing structures
US20060092505A1 (en) * 2004-11-02 2006-05-04 Umech Technologies, Co. Optically enhanced digital imaging system
US20060170441A1 (en) * 2005-01-31 2006-08-03 Cascade Microtech, Inc. Interface for testing semiconductors
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US20070194803A1 (en) * 1997-05-28 2007-08-23 Cascade Microtech, Inc. Probe holder for testing of a test device
US7271603B2 (en) 2003-05-23 2007-09-18 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US20070285111A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Test structure and probe for differential signals
US20070285112A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. On-wafer test structures
US20070285085A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Differential signal probing system
US20070285107A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US20090189623A1 (en) * 2007-08-08 2009-07-30 Campbell Richard L Differential waveguide probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors

Cited By (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070194803A1 (en) * 1997-05-28 2007-08-23 Cascade Microtech, Inc. Probe holder for testing of a test device
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7761983B2 (en) 2000-12-04 2010-07-27 Cascade Microtech, Inc. Method of assembling a wafer probe
US20020075019A1 (en) * 2000-12-04 2002-06-20 Leonard Hayden Wafer probe
US7688097B2 (en) 2000-12-04 2010-03-30 Cascade Microtech, Inc. Wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US20070200580A1 (en) * 2000-12-04 2007-08-30 Cascade Microtech, Inc. Wafer probe
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US20070075716A1 (en) * 2002-05-23 2007-04-05 Cascade Microtech, Inc. Probe for testing a device under test
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US20080024149A1 (en) * 2002-05-23 2008-01-31 Cascade Microtech, Inc. Probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US20080042673A1 (en) * 2002-11-13 2008-02-21 Cascade Microtech, Inc. Probe for combined signals
US20080074129A1 (en) * 2002-11-13 2008-03-27 Cascade Microtech, Inc. Probe for combined signals
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US20080042671A1 (en) * 2003-05-23 2008-02-21 Cascade Microtech, Inc. Probe for testing a device under test
US7271603B2 (en) 2003-05-23 2007-09-18 Cascade Microtech, Inc. Shielded probe for testing a device under test
US20090267625A1 (en) * 2003-05-23 2009-10-29 Cascade Microtech, Inc. Probe for testing a device under test
US7898273B2 (en) 2003-05-23 2011-03-01 Cascade Microtech, Inc. Probe for testing a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7759953B2 (en) 2003-12-24 2010-07-20 Cascade Microtech, Inc. Active wafer probe
US20080309358A1 (en) * 2003-12-24 2008-12-18 Cascade Microtech, Inc. Active wafer probe
US20050140386A1 (en) * 2003-12-24 2005-06-30 Eric Strid Active wafer probe
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US20080265925A1 (en) * 2004-09-13 2008-10-30 Cascade Microtech, Inc. Double sided probing structures
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US20060043962A1 (en) * 2004-09-13 2006-03-02 Terry Burcham Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US20060092505A1 (en) * 2004-11-02 2006-05-04 Umech Technologies, Co. Optically enhanced digital imaging system
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7940069B2 (en) 2005-01-31 2011-05-10 Cascade Microtech, Inc. System for testing semiconductors
US20060170441A1 (en) * 2005-01-31 2006-08-03 Cascade Microtech, Inc. Interface for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US20090134896A1 (en) * 2005-01-31 2009-05-28 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US20100097467A1 (en) * 2005-01-31 2010-04-22 Cascade Microtech, Inc. System for testing semiconductors
US20090079451A1 (en) * 2005-06-08 2009-03-26 Cascade Microtech, Inc. High frequency probe
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US20070285111A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Test structure and probe for differential signals
US20070285112A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. On-wafer test structures
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7750652B2 (en) 2006-06-12 2010-07-06 Cascade Microtech, Inc. Test structure and probe for differential signals
US20070285085A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Differential signal probing system
US20070285107A1 (en) * 2006-06-12 2007-12-13 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US20090021273A1 (en) * 2006-06-12 2009-01-22 Cascade Microtech, Inc. On-wafer test structures
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US20090189623A1 (en) * 2007-08-08 2009-07-30 Campbell Richard L Differential waveguide probe

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