JPS62219954A - 三次元icの製造方法 - Google Patents
三次元icの製造方法Info
- Publication number
- JPS62219954A JPS62219954A JP61062981A JP6298186A JPS62219954A JP S62219954 A JPS62219954 A JP S62219954A JP 61062981 A JP61062981 A JP 61062981A JP 6298186 A JP6298186 A JP 6298186A JP S62219954 A JPS62219954 A JP S62219954A
- Authority
- JP
- Japan
- Prior art keywords
- conductive material
- dimensional
- post
- chips
- posts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/021—Manufacture or treatment of interconnections within wafers or substrates
- H10W20/023—Manufacture or treatment of interconnections within wafers or substrates the interconnections being through-semiconductor vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/284—Configurations of stacked chips characterised by structural arrangements for measuring or testing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/297—Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61062981A JPS62219954A (ja) | 1986-03-20 | 1986-03-20 | 三次元icの製造方法 |
| KR1019870002514A KR900008647B1 (ko) | 1986-03-20 | 1987-03-19 | 3차원 집적회로와 그의 제조방법 |
| DE8787104091T DE3778944D1 (de) | 1986-03-20 | 1987-03-20 | Dreidimensionale integrierte schaltung und deren herstellungsverfahren. |
| EP87104091A EP0238089B1 (en) | 1986-03-20 | 1987-03-20 | Three-dimensional integrated circuit and manufacturing method therefor |
| US07/325,122 US4939568A (en) | 1986-03-20 | 1989-03-17 | Three-dimensional integrated circuit and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61062981A JPS62219954A (ja) | 1986-03-20 | 1986-03-20 | 三次元icの製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62219954A true JPS62219954A (ja) | 1987-09-28 |
| JPH0374508B2 JPH0374508B2 (https=) | 1991-11-27 |
Family
ID=13216045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61062981A Granted JPS62219954A (ja) | 1986-03-20 | 1986-03-20 | 三次元icの製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62219954A (https=) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01129441A (ja) * | 1987-11-16 | 1989-05-22 | Nissan Motor Co Ltd | 半導体装置 |
| JPH01189141A (ja) * | 1988-01-25 | 1989-07-28 | Nec Corp | 半導体装置 |
| WO1999044236A1 (fr) * | 1998-02-27 | 1999-09-02 | Seiko Epson Corporation | Procede servant a fabriquer un composant tridimensionnel |
| WO1999045593A1 (fr) * | 1998-03-02 | 1999-09-10 | Seiko Epson Corporation | Dispositif tridimensionnel |
| US6639303B2 (en) | 1996-10-29 | 2003-10-28 | Tru-Si Technolgies, Inc. | Integrated circuits and methods for their fabrication |
| JP2004014706A (ja) * | 2002-06-05 | 2004-01-15 | Tokyo Seimitsu Co Ltd | 基板加工方法および基板加工装置 |
| US6882030B2 (en) | 1996-10-29 | 2005-04-19 | Tru-Si Technologies, Inc. | Integrated circuit structures with a conductor formed in a through hole in a semiconductor substrate and protruding from a surface of the substrate |
| US6953748B2 (en) | 2003-07-31 | 2005-10-11 | Seiko Epson Corporation | Method of manufacturing semiconductor device |
| JP2006135305A (ja) * | 2004-10-05 | 2006-05-25 | Semiconductor Energy Lab Co Ltd | 半導体装置、半導体装置の作製方法、及び半導体装置の検査方法 |
| JP2010016392A (ja) * | 2001-10-01 | 2010-01-21 | Xsil Technology Ltd | 基板、特に半導体ウェハの加工 |
| JP2010506406A (ja) * | 2006-10-06 | 2010-02-25 | ブルーワー サイエンス アイ エヌ シー. | スライディング手法を用いるウェーハの仮接合のための、高温およびスピンオン接合用組成物 |
| JP2011523203A (ja) * | 2008-05-06 | 2011-08-04 | ガウサム ヴィスワナダム, | 相互接続を伴うウェハレベルインテグレーションモジュール |
| CN112470293A (zh) * | 2018-06-14 | 2021-03-09 | 艾利迪公司 | 光电设备 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS607149A (ja) * | 1983-06-24 | 1985-01-14 | Nec Corp | 半導体装置の製造方法 |
| JPS6098654A (ja) * | 1983-11-02 | 1985-06-01 | Nec Corp | 半導体装置の製造方法 |
| JPS60235446A (ja) * | 1984-05-09 | 1985-11-22 | Nec Corp | 半導体装置とその製造方法 |
-
1986
- 1986-03-20 JP JP61062981A patent/JPS62219954A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS607149A (ja) * | 1983-06-24 | 1985-01-14 | Nec Corp | 半導体装置の製造方法 |
| JPS6098654A (ja) * | 1983-11-02 | 1985-06-01 | Nec Corp | 半導体装置の製造方法 |
| JPS60235446A (ja) * | 1984-05-09 | 1985-11-22 | Nec Corp | 半導体装置とその製造方法 |
Cited By (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01129441A (ja) * | 1987-11-16 | 1989-05-22 | Nissan Motor Co Ltd | 半導体装置 |
| JPH01189141A (ja) * | 1988-01-25 | 1989-07-28 | Nec Corp | 半導体装置 |
| US6882030B2 (en) | 1996-10-29 | 2005-04-19 | Tru-Si Technologies, Inc. | Integrated circuit structures with a conductor formed in a through hole in a semiconductor substrate and protruding from a surface of the substrate |
| US6639303B2 (en) | 1996-10-29 | 2003-10-28 | Tru-Si Technolgies, Inc. | Integrated circuits and methods for their fabrication |
| EP0986104A4 (en) * | 1998-02-27 | 2003-07-30 | Seiko Epson Corp | MANUFACTURING METHOD FOR A THREE-DIMENSIONAL COMPONENT |
| WO1999044236A1 (fr) * | 1998-02-27 | 1999-09-02 | Seiko Epson Corporation | Procede servant a fabriquer un composant tridimensionnel |
| KR100484959B1 (ko) * | 1998-02-27 | 2005-04-25 | 세이코 엡슨 가부시키가이샤 | 3차원 디바이스의 제조 방법 |
| KR100529842B1 (ko) * | 1998-03-02 | 2005-11-22 | 세이코 엡슨 가부시키가이샤 | 3차원 디바이스 및 그 제조 방법 |
| US6846703B2 (en) | 1998-03-02 | 2005-01-25 | Seiko Epson Corporation | Three-dimensional device |
| WO1999045593A1 (fr) * | 1998-03-02 | 1999-09-10 | Seiko Epson Corporation | Dispositif tridimensionnel |
| JP2010016392A (ja) * | 2001-10-01 | 2010-01-21 | Xsil Technology Ltd | 基板、特に半導体ウェハの加工 |
| JP2004014706A (ja) * | 2002-06-05 | 2004-01-15 | Tokyo Seimitsu Co Ltd | 基板加工方法および基板加工装置 |
| US6953748B2 (en) | 2003-07-31 | 2005-10-11 | Seiko Epson Corporation | Method of manufacturing semiconductor device |
| JP2006135305A (ja) * | 2004-10-05 | 2006-05-25 | Semiconductor Energy Lab Co Ltd | 半導体装置、半導体装置の作製方法、及び半導体装置の検査方法 |
| JP2010506406A (ja) * | 2006-10-06 | 2010-02-25 | ブルーワー サイエンス アイ エヌ シー. | スライディング手法を用いるウェーハの仮接合のための、高温およびスピンオン接合用組成物 |
| JP2011523203A (ja) * | 2008-05-06 | 2011-08-04 | ガウサム ヴィスワナダム, | 相互接続を伴うウェハレベルインテグレーションモジュール |
| CN112470293A (zh) * | 2018-06-14 | 2021-03-09 | 艾利迪公司 | 光电设备 |
| CN112470293B (zh) * | 2018-06-14 | 2024-05-03 | 艾利迪公司 | 光电设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0374508B2 (https=) | 1991-11-27 |
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