JPS6057159B2 - Mos半導体記憶器 - Google Patents

Mos半導体記憶器

Info

Publication number
JPS6057159B2
JPS6057159B2 JP52125635A JP12563577A JPS6057159B2 JP S6057159 B2 JPS6057159 B2 JP S6057159B2 JP 52125635 A JP52125635 A JP 52125635A JP 12563577 A JP12563577 A JP 12563577A JP S6057159 B2 JPS6057159 B2 JP S6057159B2
Authority
JP
Japan
Prior art keywords
evaluation circuit
bit line
memory
storage
bit lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52125635A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5350944A (en
Inventor
パウルウエルナ−・フオン・バツセ
リユデイガ−・ホフマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of JPS5350944A publication Critical patent/JPS5350944A/ja
Publication of JPS6057159B2 publication Critical patent/JPS6057159B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/025Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/403Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
    • G11C11/404Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4097Bit-line organisation, e.g. bit-line layout, folded bit lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP52125635A 1976-10-20 1977-10-19 Mos半導体記憶器 Expired JPS6057159B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2647394.9 1976-10-20
DE2647394A DE2647394C2 (de) 1976-10-20 1976-10-20 MOS-Halbleiterspeicherbaustein

Publications (2)

Publication Number Publication Date
JPS5350944A JPS5350944A (en) 1978-05-09
JPS6057159B2 true JPS6057159B2 (ja) 1985-12-13

Family

ID=5990933

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52125635A Expired JPS6057159B2 (ja) 1976-10-20 1977-10-19 Mos半導体記憶器

Country Status (5)

Country Link
US (1) US4122546A (Direct)
JP (1) JPS6057159B2 (Direct)
DE (1) DE2647394C2 (Direct)
FR (1) FR2368783A1 (Direct)
GB (1) GB1593866A (Direct)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3025103U (ja) * 1995-11-22 1996-06-11 株式会社マックエイト 電子部品の印刷配線板への取付構造

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54148340A (en) * 1978-05-12 1979-11-20 Nec Corp Memory circuit
JPS5817998B2 (ja) * 1978-10-26 1983-04-11 富士通株式会社 半導体メモリ
JPS5558890A (en) * 1978-10-27 1980-05-01 Hitachi Ltd Reference voltage generation circuit
DE2855118C2 (de) * 1978-12-20 1981-03-26 IBM Deutschland GmbH, 70569 Stuttgart Dynamischer FET-Speicher
DE2904994C2 (de) * 1979-02-09 1984-02-16 Siemens AG, 1000 Berlin und 8000 München MOS-Halbleiterspeicherbaustein mit sich kreuzenden Wort- und Bitleitungen
DE2926514A1 (de) * 1979-06-30 1981-01-15 Ibm Deutschland Elektrische speicheranordnung und verfahren zu ihrem betrieb
JPS5683891A (en) * 1979-12-13 1981-07-08 Fujitsu Ltd Semiconductor storage device
US4287576A (en) * 1980-03-26 1981-09-01 International Business Machines Corporation Sense amplifying system for memories with small cells
USRE32682E (en) * 1980-10-10 1988-05-31 Inmos Corporation Folded bit line-shared sense amplifiers
US4351034A (en) * 1980-10-10 1982-09-21 Inmos Corporation Folded bit line-shared sense amplifiers
DE3101802A1 (de) * 1981-01-21 1982-08-19 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierter halbleiterspeicher
JPS57198592A (en) * 1981-05-29 1982-12-06 Hitachi Ltd Semiconductor memory device
JPS58111183A (ja) * 1981-12-25 1983-07-02 Hitachi Ltd ダイナミツクram集積回路装置
JPS60234295A (ja) * 1984-05-04 1985-11-20 Fujitsu Ltd 半導体記憶装置
KR900005667B1 (ko) * 1984-11-20 1990-08-03 후지쓰 가부시끼가이샤 반도체 기억장치
JPS61178795A (ja) * 1985-02-01 1986-08-11 Toshiba Corp ダイナミツク型半導体記憶装置
JPS61296598A (ja) * 1985-06-21 1986-12-27 Mitsubishi Electric Corp Mosダイナミツクramのダミ−ワ−ド線駆動回路
JPS6282597A (ja) * 1985-10-08 1987-04-16 Fujitsu Ltd 半導体記憶装置
JPS62197992A (ja) * 1986-02-25 1987-09-01 Mitsubishi Electric Corp ダイナミツクram
JPS62200596A (ja) * 1986-02-26 1987-09-04 Mitsubishi Electric Corp 半導体メモリ
JPH07111823B2 (ja) * 1986-03-18 1995-11-29 三菱電機株式会社 半導体記憶装置
US4731747A (en) * 1986-04-14 1988-03-15 American Telephone And Telegraph Company, At&T Bell Laboratories Highly parallel computation network with normalized speed of response
JPH07107797B2 (ja) * 1987-02-10 1995-11-15 三菱電機株式会社 ダイナミツクランダムアクセスメモリ
JPS63146295A (ja) * 1987-11-18 1988-06-18 Toshiba Corp 半導体メモリ
JP2566517B2 (ja) * 1993-04-28 1996-12-25 三菱電機株式会社 ダイナミック型半導体記憶装置
TWI291699B (en) * 2005-05-26 2007-12-21 Macronix Int Co Ltd Method of reading the bits of nitride read-only memory cell
KR102160178B1 (ko) * 2016-08-31 2020-09-28 마이크론 테크놀로지, 인크 메모리 어레이

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3983545A (en) * 1975-06-30 1976-09-28 International Business Machines Corporation Random access memory employing single ended sense latch for one device cell

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3025103U (ja) * 1995-11-22 1996-06-11 株式会社マックエイト 電子部品の印刷配線板への取付構造

Also Published As

Publication number Publication date
DE2647394B1 (de) 1978-03-16
FR2368783A1 (fr) 1978-05-19
FR2368783B1 (Direct) 1984-05-04
DE2647394C2 (de) 1978-11-16
US4122546A (en) 1978-10-24
GB1593866A (en) 1981-07-22
JPS5350944A (en) 1978-05-09

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