JPS6012737A - 窒化シリコン膜の製造方法 - Google Patents
窒化シリコン膜の製造方法Info
- Publication number
- JPS6012737A JPS6012737A JP58118079A JP11807983A JPS6012737A JP S6012737 A JPS6012737 A JP S6012737A JP 58118079 A JP58118079 A JP 58118079A JP 11807983 A JP11807983 A JP 11807983A JP S6012737 A JPS6012737 A JP S6012737A
- Authority
- JP
- Japan
- Prior art keywords
- film
- sin
- density
- internal stress
- irradiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P14/69433—
Landscapes
- Formation Of Insulating Films (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58118079A JPS6012737A (ja) | 1983-07-01 | 1983-07-01 | 窒化シリコン膜の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58118079A JPS6012737A (ja) | 1983-07-01 | 1983-07-01 | 窒化シリコン膜の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6012737A true JPS6012737A (ja) | 1985-01-23 |
| JPH0456453B2 JPH0456453B2 (enExample) | 1992-09-08 |
Family
ID=14727472
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58118079A Granted JPS6012737A (ja) | 1983-07-01 | 1983-07-01 | 窒化シリコン膜の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6012737A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS634624A (ja) * | 1986-06-25 | 1988-01-09 | Sony Corp | 半導体装置の製造方法 |
| US4948482A (en) * | 1987-12-29 | 1990-08-14 | Hoya Corporation | Method for forming silicon nitride film |
| US5264724A (en) * | 1989-02-13 | 1993-11-23 | The University Of Arkansas | Silicon nitride for application as the gate dielectric in MOS devices |
| JPH06333922A (ja) * | 1993-05-19 | 1994-12-02 | Nippondenso Co Ltd | 装置保護膜および装置保護膜の製造方法 |
| WO2002047170A1 (en) * | 2000-12-08 | 2002-06-13 | Hitachi, Ltd. | Semiconductor device |
| JP2021147678A (ja) * | 2020-03-23 | 2021-09-27 | 株式会社アルバック | 誘電体膜の形成方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4830789A (enExample) * | 1971-08-23 | 1973-04-23 |
-
1983
- 1983-07-01 JP JP58118079A patent/JPS6012737A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4830789A (enExample) * | 1971-08-23 | 1973-04-23 |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS634624A (ja) * | 1986-06-25 | 1988-01-09 | Sony Corp | 半導体装置の製造方法 |
| US4948482A (en) * | 1987-12-29 | 1990-08-14 | Hoya Corporation | Method for forming silicon nitride film |
| US5264724A (en) * | 1989-02-13 | 1993-11-23 | The University Of Arkansas | Silicon nitride for application as the gate dielectric in MOS devices |
| JPH06333922A (ja) * | 1993-05-19 | 1994-12-02 | Nippondenso Co Ltd | 装置保護膜および装置保護膜の製造方法 |
| WO2002047170A1 (en) * | 2000-12-08 | 2002-06-13 | Hitachi, Ltd. | Semiconductor device |
| JP2021147678A (ja) * | 2020-03-23 | 2021-09-27 | 株式会社アルバック | 誘電体膜の形成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0456453B2 (enExample) | 1992-09-08 |
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