JPS5930072A - Ｉｃメモリ試験装置 - Google Patents

Ｉｃメモリ試験装置

Info

Publication number
JPS5930072A
JPS5930072A JP57140312A JP14031282A JPS5930072A JP S5930072 A JPS5930072 A JP S5930072A JP 57140312 A JP57140312 A JP 57140312A JP 14031282 A JP14031282 A JP 14031282A JP S5930072 A JPS5930072 A JP S5930072A
Authority
JP
Japan
Prior art keywords
generating means
delay signal
signal generating
tester
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57140312A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429991B2 (de
Inventor
Giichi Oe
大江　義一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57140312A priority Critical patent/JPS5930072A/ja
Publication of JPS5930072A publication Critical patent/JPS5930072A/ja
Publication of JPH0429991B2 publication Critical patent/JPH0429991B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP57140312A 1982-08-12 1982-08-12 Ｉｃメモリ試験装置 Granted JPS5930072A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57140312A JPS5930072A (ja) 1982-08-12 1982-08-12 Ｉｃメモリ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57140312A JPS5930072A (ja) 1982-08-12 1982-08-12 Ｉｃメモリ試験装置

Publications (2)

Publication Number Publication Date
JPS5930072A true JPS5930072A (ja) 1984-02-17
JPH0429991B2 JPH0429991B2 (de) 1992-05-20

Family

ID=15265863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57140312A Granted JPS5930072A (ja) 1982-08-12 1982-08-12 Ｉｃメモリ試験装置

Country Status (1)

Country Link
JP (1) JPS5930072A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62100274A (ja) * 1985-10-29 1987-05-09 Freunt Ind Co Ltd 食品の保存法と食品保存用具
JPS62155071A (ja) * 1985-12-24 1987-07-10 陳　森義 食品用防腐剤及びこの防腐剤を使用した食品の保存方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62100274A (ja) * 1985-10-29 1987-05-09 Freunt Ind Co Ltd 食品の保存法と食品保存用具
JPS62155071A (ja) * 1985-12-24 1987-07-10 陳　森義 食品用防腐剤及びこの防腐剤を使用した食品の保存方法

Also Published As

Publication number Publication date
JPH0429991B2 (de) 1992-05-20

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