JPH0429991B2 - - Google Patents
Info
- Publication number
- JPH0429991B2 JPH0429991B2 JP57140312A JP14031282A JPH0429991B2 JP H0429991 B2 JPH0429991 B2 JP H0429991B2 JP 57140312 A JP57140312 A JP 57140312A JP 14031282 A JP14031282 A JP 14031282A JP H0429991 B2 JPH0429991 B2 JP H0429991B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- tester
- memory
- input
- clock signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000015654 memory Effects 0.000 claims description 37
- 238000012360 testing method Methods 0.000 claims description 28
- 230000003111 delayed effect Effects 0.000 claims description 11
- 230000010355 oscillation Effects 0.000 claims description 6
- 230000006870 function Effects 0.000 description 4
- 238000010998 test method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57140312A JPS5930072A (ja) | 1982-08-12 | 1982-08-12 | Ｉｃメモリ試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57140312A JPS5930072A (ja) | 1982-08-12 | 1982-08-12 | Ｉｃメモリ試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5930072A JPS5930072A (ja) | 1984-02-17 |
| JPH0429991B2 true JPH0429991B2 (de) | 1992-05-20 |
Family
ID=15265863
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57140312A Granted JPS5930072A (ja) | 1982-08-12 | 1982-08-12 | Ｉｃメモリ試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5930072A (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62100274A (ja) * | 1985-10-29 | 1987-05-09 | Freunt Ind Co Ltd | 食品の保存法と食品保存用具 |
| JPS62155071A (ja) * | 1985-12-24 | 1987-07-10 | 陳 森義 | 食品用防腐剤及びこの防腐剤を使用した食品の保存方法 |
-
1982
- 1982-08-12 JP JP57140312A patent/JPS5930072A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5930072A (ja) | 1984-02-17 |
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