JPS59119597A - 半導体記憶装置 - Google Patents
半導体記憶装置Info
- Publication number
- JPS59119597A JPS59119597A JP57228417A JP22841782A JPS59119597A JP S59119597 A JPS59119597 A JP S59119597A JP 57228417 A JP57228417 A JP 57228417A JP 22841782 A JP22841782 A JP 22841782A JP S59119597 A JPS59119597 A JP S59119597A
- Authority
- JP
- Japan
- Prior art keywords
- data
- memory cell
- read
- test mode
- detection circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0763—Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57228417A JPS59119597A (ja) | 1982-12-27 | 1982-12-27 | 半導体記憶装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57228417A JPS59119597A (ja) | 1982-12-27 | 1982-12-27 | 半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59119597A true JPS59119597A (ja) | 1984-07-10 |
| JPH047040B2 JPH047040B2 (enExample) | 1992-02-07 |
Family
ID=16876145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57228417A Granted JPS59119597A (ja) | 1982-12-27 | 1982-12-27 | 半導体記憶装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59119597A (enExample) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61158099A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS61158100A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS61220200A (ja) * | 1985-03-26 | 1986-09-30 | シーメンス、アクチエンゲゼルシヤフト | 半導体メモリの駆動方法および評価回路 |
| JPS621200A (ja) * | 1985-02-28 | 1987-01-07 | Nec Corp | 半導体メモリ |
| JPS6262500A (ja) * | 1985-09-11 | 1987-03-19 | シ−メンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS62170094A (ja) * | 1986-01-21 | 1987-07-27 | Mitsubishi Electric Corp | 半導体記憶回路 |
| JPS63102094A (ja) * | 1986-10-20 | 1988-05-06 | Nippon Telegr & Teleph Corp <Ntt> | 半導体メモリ |
| JPS63106997A (ja) * | 1986-10-08 | 1988-05-12 | シーメンス、アクチエンゲゼルシヤフト | メガビツト・メモリモジユールのテスト方法および装置 |
| JPS63211198A (ja) * | 1987-02-27 | 1988-09-02 | Hitachi Ltd | 半導体記憶装置 |
| JPH02180000A (ja) * | 1988-12-31 | 1990-07-12 | Samsung Electron Co Ltd | 高密度メモリのテスト用並列リード回路 |
| JPH0487925U (enExample) * | 1990-12-18 | 1992-07-30 | ||
| JPH0492924U (enExample) * | 1990-12-26 | 1992-08-12 | ||
| JPH0512520U (ja) * | 1991-07-30 | 1993-02-19 | 積水化学工業株式会社 | 折版屋根カバー材 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53120234A (en) * | 1977-03-30 | 1978-10-20 | Toshiba Corp | Semiconductor memory |
| JPS5578355A (en) * | 1978-12-08 | 1980-06-12 | Nec Corp | Semiconductor integrated circuit |
| JPS57189397A (en) * | 1981-05-14 | 1982-11-20 | Toshiba Corp | Semiconductor storage device |
| JPS57203298A (en) * | 1981-06-09 | 1982-12-13 | Matsushita Electric Ind Co Ltd | Semiconductor storage device |
-
1982
- 1982-12-27 JP JP57228417A patent/JPS59119597A/ja active Granted
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53120234A (en) * | 1977-03-30 | 1978-10-20 | Toshiba Corp | Semiconductor memory |
| JPS5578355A (en) * | 1978-12-08 | 1980-06-12 | Nec Corp | Semiconductor integrated circuit |
| JPS57189397A (en) * | 1981-05-14 | 1982-11-20 | Toshiba Corp | Semiconductor storage device |
| JPS57203298A (en) * | 1981-06-09 | 1982-12-13 | Matsushita Electric Ind Co Ltd | Semiconductor storage device |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61158100A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS61158099A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS621200A (ja) * | 1985-02-28 | 1987-01-07 | Nec Corp | 半導体メモリ |
| JPS61220200A (ja) * | 1985-03-26 | 1986-09-30 | シーメンス、アクチエンゲゼルシヤフト | 半導体メモリの駆動方法および評価回路 |
| JPS6262500A (ja) * | 1985-09-11 | 1987-03-19 | シ−メンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
| JPS62170094A (ja) * | 1986-01-21 | 1987-07-27 | Mitsubishi Electric Corp | 半導体記憶回路 |
| JPS63106997A (ja) * | 1986-10-08 | 1988-05-12 | シーメンス、アクチエンゲゼルシヤフト | メガビツト・メモリモジユールのテスト方法および装置 |
| JPS63102094A (ja) * | 1986-10-20 | 1988-05-06 | Nippon Telegr & Teleph Corp <Ntt> | 半導体メモリ |
| JPS63211198A (ja) * | 1987-02-27 | 1988-09-02 | Hitachi Ltd | 半導体記憶装置 |
| JPH02180000A (ja) * | 1988-12-31 | 1990-07-12 | Samsung Electron Co Ltd | 高密度メモリのテスト用並列リード回路 |
| JPH0487925U (enExample) * | 1990-12-18 | 1992-07-30 | ||
| JPH0492924U (enExample) * | 1990-12-26 | 1992-08-12 | ||
| JPH0512520U (ja) * | 1991-07-30 | 1993-02-19 | 積水化学工業株式会社 | 折版屋根カバー材 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH047040B2 (enExample) | 1992-02-07 |
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