JPS5578355A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS5578355A
JPS5578355A JP15254378A JP15254378A JPS5578355A JP S5578355 A JPS5578355 A JP S5578355A JP 15254378 A JP15254378 A JP 15254378A JP 15254378 A JP15254378 A JP 15254378A JP S5578355 A JPS5578355 A JP S5578355A
Authority
JP
Japan
Prior art keywords
circuit
terminal
gate
normal input
common terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15254378A
Other languages
Japanese (ja)
Other versions
JPS6120895B2 (en
Inventor
Tsutomu Iima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15254378A priority Critical patent/JPS5578355A/en
Publication of JPS5578355A publication Critical patent/JPS5578355A/en
Publication of JPS6120895B2 publication Critical patent/JPS6120895B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To use commonly a common terminal together with a normal input terminal without providing a private terminal in a test mode generation circuit by connecting the drain and the gate of the first FET to a power source voltage and the common terminal respectively and grounding the source and the gate of the second load FET.
CONSTITUTION: A common terminal is a terminal for normal input logic as well as test mode generation, and I2 is a normal input terminal, and normal input logic gates 11 and 12 are connected to these terminal respectively, and further, test mode generating circuit 13 is connected to the common terminal. Outputs of gate 11 and circuit 13 are inputted to NOR circuit 15, and outputs of gate 12 and circuit 13 are inputted to NOR circuit 16. In circuit 13, FETMT and load FETML are connected in series, and the drain of FETMT and the gate of FETMT are connected to power source voltage +VCC and the common terminal respectively, and the source and the gate of FETML are grounded. As a result, the common terminal can be used commonly together with the normal input terminal without providing a private terminal in circuit 13.
COPYRIGHT: (C)1980,JPO&Japio
JP15254378A 1978-12-08 1978-12-08 Semiconductor integrated circuit Granted JPS5578355A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15254378A JPS5578355A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15254378A JPS5578355A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS5578355A true JPS5578355A (en) 1980-06-12
JPS6120895B2 JPS6120895B2 (en) 1986-05-24

Family

ID=15542747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15254378A Granted JPS5578355A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5578355A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPS59119597A (en) * 1982-12-27 1984-07-10 Fujitsu Ltd Semiconductor storage device
JPS61292755A (en) * 1985-06-20 1986-12-23 Fujitsu Ltd Semiconductor integrated circuit
JPS6361495A (en) * 1986-08-29 1988-03-17 Mitsubishi Electric Corp Semiconductor memory device
JPH0560845A (en) * 1991-09-04 1993-03-12 Sharp Corp Digital integrated circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPH0132600B2 (en) * 1980-08-14 1989-07-06 Siemens Ag
JPS59119597A (en) * 1982-12-27 1984-07-10 Fujitsu Ltd Semiconductor storage device
JPH047040B2 (en) * 1982-12-27 1992-02-07 Fujitsu Ltd
JPS61292755A (en) * 1985-06-20 1986-12-23 Fujitsu Ltd Semiconductor integrated circuit
JPS6361495A (en) * 1986-08-29 1988-03-17 Mitsubishi Electric Corp Semiconductor memory device
JPH0560845A (en) * 1991-09-04 1993-03-12 Sharp Corp Digital integrated circuit

Also Published As

Publication number Publication date
JPS6120895B2 (en) 1986-05-24

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