JPS57186828A - Data acquisition system with self calibration function and method of calibracting same - Google Patents

Data acquisition system with self calibration function and method of calibracting same

Info

Publication number
JPS57186828A
JPS57186828A JP57073236A JP7323682A JPS57186828A JP S57186828 A JPS57186828 A JP S57186828A JP 57073236 A JP57073236 A JP 57073236A JP 7323682 A JP7323682 A JP 7323682A JP S57186828 A JPS57186828 A JP S57186828A
Authority
JP
Japan
Prior art keywords
calibracting
same
data acquisition
acquisition system
calibration function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57073236A
Other languages
English (en)
Other versions
JPH0348700B2 (ja
Inventor
Tan Kennsangu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of JPS57186828A publication Critical patent/JPS57186828A/ja
Publication of JPH0348700B2 publication Critical patent/JPH0348700B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1023—Offset correction
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
    • H03M1/181—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values
    • H03M1/183—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values the feedback signal controlling the gain of an amplifier or attenuator preceding the analogue/digital converter

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
JP57073236A 1981-05-04 1982-04-30 Data acquisition system with self calibration function and method of calibracting same Granted JPS57186828A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/260,435 US4399426A (en) 1981-05-04 1981-05-04 On board self-calibration of analog-to-digital and digital-to-analog converters

Publications (2)

Publication Number Publication Date
JPS57186828A true JPS57186828A (en) 1982-11-17
JPH0348700B2 JPH0348700B2 (ja) 1991-07-25

Family

ID=22989151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57073236A Granted JPS57186828A (en) 1981-05-04 1982-04-30 Data acquisition system with self calibration function and method of calibracting same

Country Status (4)

Country Link
US (1) US4399426A (ja)
EP (1) EP0064147B1 (ja)
JP (1) JPS57186828A (ja)
DE (1) DE3279433D1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62145854A (ja) * 1985-12-16 1987-06-29 クリスタル　セミコンダクタ−　コ−ポレ−シヨン モノリシック集積回路に於ける複数のキャパシタンスの調節方法及びアナログ―デジタル変換器のインターリーブ動作及び較正方法
JPH01194609A (ja) * 1987-12-14 1989-08-04 Siemens Ag 冗長性ａ‐ｄおよびｄ‐ａ変換器の較正方法
JPH03206728A (ja) * 1990-01-08 1991-09-10 Matsushita Electric Ind Co Ltd 自己校正方式ａｄコンバータおよびそのテスト方法
JP4890561B2 (ja) * 2005-12-08 2012-03-07 アナログ・デバイシズ・インコーポレーテッド 補正ｄａｃを含むデジタル補正ｓａｒ変換器
WO2012153372A1 (ja) * 2011-05-10 2012-11-15 パナソニック株式会社 逐次比較型ａｄ変換器

Families Citing this family (114)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5610810A (en) * 1981-09-06 1997-03-11 Canon Kabushiki Kaisha Apparatus for correcting errors in a digital-to-analog converter
US4568917A (en) * 1983-06-27 1986-02-04 Motorola, Inc. Capacitive digital to analog converter which can be trimmed up and down
US4616329A (en) * 1983-08-26 1986-10-07 Bio-Rad Laboratories, Inc. Self-calibrating adaptive ranging apparatus and method
US4599604A (en) * 1984-08-27 1986-07-08 Motorola, Inc. A/D Self-testing circuit
FR2574606B1 (fr) * 1984-12-11 1990-05-11 Efcis Convertisseur numerique analogique a redistribution de charges capacitives avec autocalibration
US4677581A (en) * 1985-05-30 1987-06-30 Allied Corporation Multichannel, self-calibrating, analog input/output apparatus for generating and measuring DC stimuli
SE452830B (sv) * 1985-12-02 1987-12-14 Ellemtel Utvecklings Ab Anordning for att omvandla en analog, balanserad signal (v?71i?71n?71+,v?71i?71n?71-) till en digital signal genom laddningsomfordelning i ett antal kapacitiva element
IT1186476B (it) * 1985-12-19 1987-11-26 Sgs Microelettronica Spa Apparecchio e metodo per la correzione della tensione di offset in un convertitore analogico-digitale
EP0258842B1 (de) * 1986-09-01 1994-11-30 Siemens Aktiengesellschaft Analog-Digital-Umsetzer mit Kapazitätsnetzwerk
US4742330A (en) * 1987-05-01 1988-05-03 The Regents Of The University Of California Flash A/D converter using capacitor arrays
US4851838A (en) * 1987-12-18 1989-07-25 Vtc Incorporated Single chip successive approximation analog-to-digital converter with trimmable and controllable digital-to-analog converter
DE3883762D1 (de) * 1988-09-30 1993-10-07 Siemens Ag Selbstkalibrierender A/D- und D/A-Wandler.
ATE131973T1 (de) * 1988-09-30 1996-01-15 Siemens Ag Verfahren zur bestimmung und verarbeitung von korrekturwerten für selbstkalibrierende a/d- und d/a-wandler und rechenwerk zur durchführung des verfahrens
EP0360914B1 (de) * 1988-09-30 1994-07-27 Siemens Aktiengesellschaft Selbstkalibrierender A/D- und D/A-Wandler
US5006854A (en) * 1989-02-13 1991-04-09 Silicon Systems, Inc. Method and apparatus for converting A/D nonlinearities to random noise
US4989002A (en) * 1990-02-12 1991-01-29 Texas Instruments Incorporated Common-mode error self-calibration circuit and method of operation
US5182558A (en) * 1991-10-25 1993-01-26 Halliburton Geophysical Services, Inc. System for generating correction signals for use in forming low distortion analog signals
US5353028A (en) * 1992-05-14 1994-10-04 Texas Instruments Incorporated Differential fuse circuit and method utilized in an analog to digital converter
US5235335A (en) * 1992-06-02 1993-08-10 Texas Instruments Incorporated Circuit and method for tuning capacitor arrays
US5276446A (en) * 1992-07-01 1994-01-04 Northern Telecom Limited Analog-to-digital converter with error signal compensation and method for its operation
US5305004A (en) * 1992-09-29 1994-04-19 Texas Instruments Incorporated Digital to analog converter for sigma delta modulator
DE4313745A1 (de) * 1993-04-27 1994-11-03 Bosch Gmbh Robert Verfahren zur Kompensation von Bauteiletoleranzen in Analog-Digital-Konvertern
WO1994027373A1 (en) * 1993-05-12 1994-11-24 Analog Devices, Incorporated Algorithmic a/d converter with digitally calibrated output
US5434569A (en) * 1993-09-01 1995-07-18 Texas Instruments Incorporated Methods for adjusting the coupling capacitor of a multi-stage weighted capacitor A/D converter
KR970005828B1 (ko) * 1993-12-31 1997-04-21 김정덕 파이프 라인 구조의 다단 아날로그/디지탈 변환기
US5600275A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS comparator with offset cancellation
EP0757861B1 (en) * 1994-04-29 1998-12-30 Analog Devices, Inc. Charge redistribution analog-to-digital converter with system calibration
US5600322A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS analog-to-digital converter
US5668551A (en) * 1995-01-18 1997-09-16 Analog Devices, Inc. Power-up calibration of charge redistribution analog-to-digital converter
US5621409A (en) * 1995-02-15 1997-04-15 Analog Devices, Inc. Analog-to-digital conversion with multiple charge balance conversions
DE19512495C1 (de) * 1995-04-04 1996-08-14 Siemens Ag Verfahren zur Selbstkalibrierung eines A/D- oder D/A-Wandlers
DE19513796C1 (de) * 1995-04-11 1996-08-08 Siemens Ag Analog-Digital-Umsetzer
US5684487A (en) * 1995-06-05 1997-11-04 Analog Devices, Incorporated A/D converter with charge-redistribution DAC and split summation of main and correcting DAC outputs
JP3361218B2 (ja) * 1995-09-18 2003-01-07 シャープ株式会社 Ａ／ｄ変換回路
US5745060A (en) * 1996-02-12 1998-04-28 Analog Devices, Inc. Gain calibration circuitry for an analog to digital converter
US6281831B1 (en) * 1997-05-15 2001-08-28 Yozan Inc. Analog to digital converter
US6268813B1 (en) 1997-08-29 2001-07-31 Texas Instruments Incorporated Self-test for charge redistribution analog-to-digital converter
US6191714B1 (en) * 1997-11-12 2001-02-20 Photobit Corporation A/D converter correction scheme
US5926123A (en) * 1997-12-08 1999-07-20 Raytheon Company Self calibration circuitry and algorithm for multipass analog to digital converter interstage gain correction
US6198423B1 (en) * 1997-12-23 2001-03-06 Texas Instruments Incorporated Analog-to-digital converter system having enhanced digital self-calibration
US6885396B1 (en) * 1998-03-09 2005-04-26 Micron Technology, Inc. Readout circuit with gain and analog-to-digital a conversion for image sensor
DE19936327C2 (de) 1999-08-02 2003-04-24 Infineon Technologies Ag Verfahren und Vorrichtung zur Durchführung von ratiometrischen Messungen unter Verwendung eines Analog/Digital- oder eines Digital/Analog-Umsetzers, Analog/Digital- oder Digital/Analog-Umsetzer, und Verfahren zum Betreiben eines Analog/Digital- oder Digital/Analog-Umsetzers
US6473011B1 (en) * 1999-08-19 2002-10-29 Jesper Steensgaard-Madsen Serial D/A converter compensating for capacitor mismatch errors
US6483448B2 (en) * 2000-06-28 2002-11-19 Texas Instruments Incorporated System and method for reducing timing mismatch in sample and hold circuits using an FFT and decimation
SE517457C2 (sv) * 2000-08-29 2002-06-11 Ericsson Telefon Ab L M Metod och anordning för bakgrundskalibrering av A/D- omvandlare
US6400302B1 (en) * 2001-02-26 2002-06-04 Analog Devices, Inc. Quasi-differential successive-approximation structures and methods for converting analog signals into corresponding digital signals
US6480137B2 (en) * 2001-02-28 2002-11-12 Texas Instruments Incorporated Method of generating matched capacitor arrays
US6563444B2 (en) * 2001-03-30 2003-05-13 Iowa State University Research Foundation, Inc. Apparatus for and method of performing a conversion operation
US6608582B2 (en) * 2001-06-29 2003-08-19 Intel Corporation A/D conversion using a variable offset comparator
US6617926B2 (en) * 2001-06-29 2003-09-09 Intel Corporation Tail current node equalization for a variable offset amplifier
JP3549499B2 (ja) * 2001-07-04 2004-08-04 松下電器産業株式会社 半導体集積回路装置ならびにｄ／ａ変換装置およびａ／ｄ変換装置
US6448911B1 (en) 2001-07-30 2002-09-10 Cirrus Logic, Inc. Circuits and methods for linearizing capacitor calibration and systems using the same
US6473021B1 (en) * 2001-07-30 2002-10-29 Cirrlus Logic, Inc. Analog to digital conversion circuits, systems and methods with gain scaling switched-capacitor array
US6509852B1 (en) 2001-08-03 2003-01-21 Texas Instruments Incorporated Apparatus and method for gain calibration technique for analog-to-digital converter
US6462684B1 (en) * 2001-09-07 2002-10-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Advanced self-calibrating, self-repairing data acquisition system
US6781531B2 (en) 2002-01-15 2004-08-24 Raytheon Company Statistically based cascaded analog-to-digital converter calibration technique
US6587066B1 (en) * 2002-01-18 2003-07-01 Cirrus Logic, Inc. Circuits and methods for sampling an input signal in a charge redistribution digital to analog converter
US6707403B1 (en) * 2002-11-12 2004-03-16 Analog Devices, Inc. Analog to digital converter with a calibration circuit for compensating for coupling capacitor errors, and a method for calibrating the analog to digital converter
DE10255354B3 (de) * 2002-11-27 2004-03-04 Infineon Technologies Ag A/D-Wandler mit minimiertem Umschaltfehler
JP3843942B2 (ja) * 2002-12-25 2006-11-08 株式会社デンソー Ｄ／ａ変換器およびａ／ｄ変換器
US6674381B1 (en) * 2003-02-28 2004-01-06 Texas Instruments Incorporated Methods and apparatus for tone reduction in sigma delta modulators
US7388247B1 (en) 2003-05-28 2008-06-17 The United States Of America As Represented By The Secretary Of The Navy High precision microelectromechanical capacitor with programmable voltage source
US6985101B2 (en) * 2003-06-03 2006-01-10 Silicon Labs Cp, Inc. High speed comparator with blocking switches for SAR convertor
US7188199B2 (en) * 2003-06-03 2007-03-06 Silicon Labs Cp, Inc. DMA controller that restricts ADC from memory without interrupting generation of digital words when CPU accesses memory
US6882298B2 (en) * 2003-06-03 2005-04-19 Silicon Labs Cp, Inc. SAR analog-to-digital converter with two single ended inputs
US6956520B2 (en) * 2003-06-03 2005-10-18 Silicon Labs Cp, Inc. SAR data converter with unequal clock pulses for MSBS to allow for settling
US6977607B2 (en) * 2003-06-03 2005-12-20 Silicon Labs Cp, Inc. SAR with partial capacitor sampling to reduce parasitic capacitance
US6950052B2 (en) * 2003-06-03 2005-09-27 Silicon Labs Cp, Inc. Noise cancellation in a single ended SAR converter
US6954170B2 (en) * 2003-06-03 2005-10-11 Silicon Labs Cp, Inc. Open loop common mode driver for switched capacitor input to SAR
US6954167B2 (en) * 2003-06-03 2005-10-11 Silicon Labs Cp. Inc. Common centroid layout for parallel resistors in an amplifier with matched AC performance
DE102004004031B4 (de) * 2004-01-27 2019-03-28 Disetronic Licensing Ag Abgleich von Sensoren oder Messsystemen
US6924760B1 (en) * 2004-02-27 2005-08-02 Standard Microsystems Corporation Highly accurate switched capacitor DAC
US7049986B1 (en) * 2004-11-15 2006-05-23 Texas Instruments Incorporated Fuse link trim algorithm for minimum residual
DE102005015807B3 (de) * 2005-04-06 2006-10-12 Infineon Technologies Ag Analog/Digital-Wandler mit Korrektur eines Umschaltfehlers und eines Verstärkungsfehlers seines digitalen Ausgangswertes
US7218259B2 (en) * 2005-08-12 2007-05-15 Analog Devices, Inc. Analog-to-digital converter with signal-to-noise ratio enhancement
TWI260126B (en) * 2005-11-10 2006-08-11 Prolific Technology Inc Self-calibration circuit for capacitance mismatch
JP4921255B2 (ja) * 2007-06-22 2012-04-25 ルネサスエレクトロニクス株式会社 逐次型ａｄ変換器
US7609184B2 (en) * 2007-11-08 2009-10-27 Advantest Corporation D-A convert apparatus and A-D convert apparatus
US8035622B2 (en) * 2008-03-27 2011-10-11 Apple Inc. SAR ADC with dynamic input scaling and offset adjustment
US7868796B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Self-calibrating data conversion circuitry and method therefor
US7876254B2 (en) * 2008-09-30 2011-01-25 Freescale Semiconductor, Inc. Data conversion circuitry having successive approximation circuitry and method therefor
US7733258B2 (en) 2008-09-30 2010-06-08 Freescale Semiconductor, Inc. Data conversion circuitry for converting analog signals to digital signals and vice-versa and method therefor
US7880650B2 (en) 2008-09-30 2011-02-01 Freescale Semiconductor, Inc. Method and apparatus for testing data converter
US7868795B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Data conversion circuitry with an extra successive approximation step and method therefor
KR101182402B1 (ko) * 2008-11-19 2012-09-13 한국전자통신연구원 순차 접근 아날로그-디지털 변환기
US8836359B2 (en) * 2009-01-12 2014-09-16 Zentrum Mikroelektronic Dresden Ag Capacitive input test method
US8188753B2 (en) * 2009-02-18 2012-05-29 Analog Devices, Inc. Analog computation
US8040270B2 (en) * 2009-02-26 2011-10-18 General Electric Company Low-noise data acquisition system for medical imaging
US8458114B2 (en) * 2009-03-02 2013-06-04 Analog Devices, Inc. Analog computation using numerical representations with uncertainty
DE102009051830B3 (de) * 2009-11-04 2011-06-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80686 Kapazitiver Spannungsteiler
US8159382B2 (en) * 2009-11-27 2012-04-17 Texas Instruments Incorporated Low power converter and shutdown SAR ADC architecture
US8258991B2 (en) * 2010-06-11 2012-09-04 Texas Instruments Incorporated Low power comparator for use in SAR ADCs
US8514112B2 (en) * 2010-07-15 2013-08-20 Analog Devices, Inc. Programmable linearity correction circuit for digital-to-analog converter
EP2532177B1 (en) 2010-08-18 2017-02-01 Analog Devices, Inc. Charge sharing analog computation circuitry and applications
CN102545900B (zh) * 2010-12-20 2015-05-20 意法半导体研发（上海）有限公司 用于模数(a/d)转换的系统和方法
US8477052B2 (en) 2011-04-05 2013-07-02 Freescale Semiconductor, Inc. Method and apparatus for self-test of successive approximation register (SAR) A/D converter
KR101684748B1 (ko) 2011-06-06 2016-12-08 아날로그 디바이시스, 인코포레이티드 전하 공유 시간 영역 필터
US8451151B2 (en) * 2011-08-15 2013-05-28 Himax Technologies Limited Successive approximation analog to digital converter with capacitor mismatch calibration and method thereof
US8638248B2 (en) 2011-10-07 2014-01-28 Nxp, B.V. Input-independent self-calibration method and apparatus for successive approximation analog-to-digital converter with charge-redistribution digital to analog converter
US8421658B1 (en) 2011-11-24 2013-04-16 Hong Kong Applied Science & Technology Research Institute Company, Ltd. Parallel pipelined calculation of two calibration values during the prior conversion cycle in a successive-approximation-register analog-to-digital converter (SAR-ADC)
TWI497918B (zh) * 2012-12-28 2015-08-21 Ind Tech Res Inst 類比數位轉換器及其數位類比轉換器的電容權重估算方法
US9203426B2 (en) * 2014-04-07 2015-12-01 Analog Devices Global Estimation of digital-to-analog converter static mismatch errors
US9425811B1 (en) * 2015-04-20 2016-08-23 Texas Instruments Incorporated Method and apparatus for compensating offset drift with temperature
TWI556585B (zh) * 2015-06-11 2016-11-01 矽創電子股份有限公司 類比至數位轉換裝置及相關的校正方法及校正模組
US9584150B2 (en) * 2015-07-07 2017-02-28 Infineon Technologies Ag Gain calibration for ADC with external reference
US9602119B1 (en) * 2016-02-09 2017-03-21 Applied Micro Circuits Corporation Gain calibration by applying a portion of an input voltage to voltage associated with a capacitor array
US9774345B1 (en) * 2016-09-20 2017-09-26 Kabushiki Kaisha Toshiba Successive approximation register analog-to-digital converter
US9973202B2 (en) 2016-09-20 2018-05-15 Kabushiki Kaisha Toshiba Successive approximation register analog-to-digital converter
TWI657666B (zh) * 2017-10-31 2019-04-21 聯陽半導體股份有限公司 類比至數位轉換器及其校正方法以及校正設備
TWI664826B (zh) * 2018-02-23 2019-07-01 立積電子股份有限公司 電容調整方法及電容調整裝置
TWI673956B (zh) * 2018-10-17 2019-10-01 創意電子股份有限公司 校準方法和校準系統
CN114223136A (zh) * 2019-08-29 2022-03-22 新唐科技日本株式会社 半导体电路
CN111487478B (zh) * 2020-03-27 2022-04-01 杭州电子科技大学 基于深度神经网络的角度依赖型复杂阵列误差校准方法
EP3905531A1 (en) 2020-04-29 2021-11-03 IMEC vzw Advanced successive approximation register analog-to-digital converter and corresponding method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54134546A (en) * 1978-04-10 1979-10-19 Nippon Telegr & Teleph Corp <Ntt> Digital-analogue converter
JPS55165027A (en) * 1979-06-11 1980-12-23 Nippon Telegr & Teleph Corp <Ntt> A/d converter circuit

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3469256A (en) * 1965-05-10 1969-09-23 Ronald G Runge Analog-to-digital converter
JPS5953727B2 (ja) * 1977-04-06 1984-12-26 株式会社日立製作所 補正回路付ｄａ変換器
US4129863A (en) * 1977-10-03 1978-12-12 Regents Of The University Of California Weighted capacitor analog/digital converting apparatus and method
US4222107A (en) * 1979-01-22 1980-09-09 Burr-Brown Research Corporation Method and apparatus for automatically calibrating a digital to analog converter
US4272760A (en) * 1979-04-10 1981-06-09 Burr-Brown Research Corporation Self-calibrating digital to analog conversion system and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54134546A (en) * 1978-04-10 1979-10-19 Nippon Telegr & Teleph Corp <Ntt> Digital-analogue converter
JPS55165027A (en) * 1979-06-11 1980-12-23 Nippon Telegr & Teleph Corp <Ntt> A/d converter circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62145854A (ja) * 1985-12-16 1987-06-29 クリスタル　セミコンダクタ−　コ−ポレ−シヨン モノリシック集積回路に於ける複数のキャパシタンスの調節方法及びアナログ―デジタル変換器のインターリーブ動作及び較正方法
JPH0350421B2 (ja) * 1985-12-16 1991-08-01 Kurisutaru Semikondakutaa Corp
JPH01194609A (ja) * 1987-12-14 1989-08-04 Siemens Ag 冗長性ａ‐ｄおよびｄ‐ａ変換器の較正方法
JPH03206728A (ja) * 1990-01-08 1991-09-10 Matsushita Electric Ind Co Ltd 自己校正方式ａｄコンバータおよびそのテスト方法
JP4890561B2 (ja) * 2005-12-08 2012-03-07 アナログ・デバイシズ・インコーポレーテッド 補正ｄａｃを含むデジタル補正ｓａｒ変換器
WO2012153372A1 (ja) * 2011-05-10 2012-11-15 パナソニック株式会社 逐次比較型ａｄ変換器

Also Published As

Publication number Publication date
DE3279433D1 (en) 1989-03-09
EP0064147A2 (en) 1982-11-10
EP0064147B1 (en) 1989-02-01
US4399426B1 (ja) 1987-07-14
EP0064147A3 (en) 1985-09-25
US4399426A (en) 1983-08-16
JPH0348700B2 (ja) 1991-07-25

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