JPS57109374A - Buried channel type charge transfer device - Google Patents
Buried channel type charge transfer deviceInfo
- Publication number
- JPS57109374A JPS57109374A JP18650180A JP18650180A JPS57109374A JP S57109374 A JPS57109374 A JP S57109374A JP 18650180 A JP18650180 A JP 18650180A JP 18650180 A JP18650180 A JP 18650180A JP S57109374 A JPS57109374 A JP S57109374A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- charge transfer
- gate
- buried channel
- transfer device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000969 carrier Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/762—Charge transfer devices
- H01L29/765—Charge-coupled devices
- H01L29/768—Charge-coupled devices with field effect produced by an insulated gate
- H01L29/76833—Buried channel CCD
Abstract
PURPOSE:To make it possible to flow excess carriers into a charge transfer region by making a buried channel pinch off without creating an inversion layer on the surface of the charge transfer region at a required gate voltage. CONSTITUTION:The density and depth of a channel region 2 are selected to make it pinch off at the voltage prior to creating an inversion layer applied to gate electrodes by changing the voltage in the direction to create the inversion layer on the semiconductor surface of the channel region 2 on the gate 4 so as to make the properties of the minimum potential phimin. in the buried channel region 2 and the gate 4 voltage VG as shown in the figure. In this way, the minimum potential phimin. can be made 0 while the pinch off voltage is applied on the gate 14.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18650180A JPS57109374A (en) | 1980-12-26 | 1980-12-26 | Buried channel type charge transfer device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18650180A JPS57109374A (en) | 1980-12-26 | 1980-12-26 | Buried channel type charge transfer device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57109374A true JPS57109374A (en) | 1982-07-07 |
Family
ID=16189589
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18650180A Pending JPS57109374A (en) | 1980-12-26 | 1980-12-26 | Buried channel type charge transfer device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57109374A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01503187A (en) * | 1987-05-05 | 1989-10-26 | ヒューズ・エアクラフト・カンパニー | Charge-coupled device with focused ion beam configuration |
US8297589B2 (en) | 2006-04-12 | 2012-10-30 | Waters Technologies Corp | Active valve and methods of operation thereof |
-
1980
- 1980-12-26 JP JP18650180A patent/JPS57109374A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01503187A (en) * | 1987-05-05 | 1989-10-26 | ヒューズ・エアクラフト・カンパニー | Charge-coupled device with focused ion beam configuration |
US8297589B2 (en) | 2006-04-12 | 2012-10-30 | Waters Technologies Corp | Active valve and methods of operation thereof |
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