JPS5613749A - Preparation of semiconductor device - Google Patents
Preparation of semiconductor deviceInfo
- Publication number
- JPS5613749A JPS5613749A JP8952379A JP8952379A JPS5613749A JP S5613749 A JPS5613749 A JP S5613749A JP 8952379 A JP8952379 A JP 8952379A JP 8952379 A JP8952379 A JP 8952379A JP S5613749 A JPS5613749 A JP S5613749A
- Authority
- JP
- Japan
- Prior art keywords
- film
- resist
- flowage
- deformation
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Abstract
PURPOSE:To prevent the resist film from deformation and flowage due to heat by irradiating plasma to the positive-resist film formed before a wiring metal film is provided. CONSTITUTION:SiO2 films 14 and 15 are provided on the surface of a semiconductor substrate 13. A portion of the film 15 is selectively removed to provide a step 15'. Then the surfaces of the films 14 and 15 are coated with the positive resist 16 to form a reverse pattern of a wiring pattern. After gas plasma is applied to this, the whole substrate 13 is heated to above 200 deg.C in a vacuum. At this time, the plasma irradiation restrict the deformation and flowage of the film 16 due to a high temperature to be smaller. Being thus heated, the whole surface of the substrate 13 is provided with a wiring metal film 17, and then the film 17 is coated with negative resist 18 to form a wiring pattern. The film 17 is selectively removed by using the resist pattern 18 as a mask. Then the films 16 and 18 are removed. Thus, the deformation and flowage of the resist due to heat can be prevented, so that a micro wiring pattern can be formed, and moreover the step portion can be excellently coated with the wiring metal film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8952379A JPS5613749A (en) | 1979-07-13 | 1979-07-13 | Preparation of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8952379A JPS5613749A (en) | 1979-07-13 | 1979-07-13 | Preparation of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5613749A true JPS5613749A (en) | 1981-02-10 |
Family
ID=13973157
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8952379A Pending JPS5613749A (en) | 1979-07-13 | 1979-07-13 | Preparation of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5613749A (en) |
-
1979
- 1979-07-13 JP JP8952379A patent/JPS5613749A/en active Pending
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