JPS56124229A - Manufacture of thin film - Google Patents
Manufacture of thin filmInfo
- Publication number
- JPS56124229A JPS56124229A JP2833380A JP2833380A JPS56124229A JP S56124229 A JPS56124229 A JP S56124229A JP 2833380 A JP2833380 A JP 2833380A JP 2833380 A JP2833380 A JP 2833380A JP S56124229 A JPS56124229 A JP S56124229A
- Authority
- JP
- Japan
- Prior art keywords
- light
- coupling
- wavelength
- coupling type
- absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/517—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using a combination of discharges covered by two or more of groups C23C16/503 - C23C16/515
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Inorganic Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Photovoltaic Devices (AREA)
Abstract
PURPOSE:To improve the characteristics of an amorphous Si remarkably by a method wherein a certain specific coupling type absorption of an Si and an H is utilized and this is changed into a coupling type giving no inffuence to its characteristics with the aid of a direct method. CONSTITUTION:An SiH4 diluted by an Ar is induced in an evacuating device 2. A substrate 3 is heated up 4 and is discharged by giving a high frequency from an electrode 1. The substrate or a raw gas is irradiated by the light source 10 having the wavelength within the prescribed range. There exists an absorption peak in the coupling of the Si and H in the amorphous Si for the light having a specific wavelength. For example, in the case where the coupling type of an Si-H2 is desired to be removed, the light having the wavelength of 2,100cm<-1>, 900cm<-1> and 850cm<-1> can be used. Through said method, the uncoupling into the Si-H2, Si-H or H can be performed by irradiating the light having the necesary energy to obtain the desired H and by utilizing the absorption due to the resonance vibration generated by the coupling of the Si and H.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2833380A JPS56124229A (en) | 1980-03-05 | 1980-03-05 | Manufacture of thin film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2833380A JPS56124229A (en) | 1980-03-05 | 1980-03-05 | Manufacture of thin film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56124229A true JPS56124229A (en) | 1981-09-29 |
JPS637020B2 JPS637020B2 (en) | 1988-02-15 |
Family
ID=12245675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2833380A Granted JPS56124229A (en) | 1980-03-05 | 1980-03-05 | Manufacture of thin film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56124229A (en) |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5823434A (en) * | 1981-08-04 | 1983-02-12 | Kanegafuchi Chem Ind Co Ltd | Amorphous silicon semiconductor |
JPS5973045A (en) * | 1982-10-19 | 1984-04-25 | Inoue Japax Res Inc | Surface coating method |
JPS59127833A (en) * | 1983-01-12 | 1984-07-23 | Agency Of Ind Science & Technol | Thin film manufacturing device according to excited vapor phase deposition |
JPS59177919A (en) * | 1983-03-28 | 1984-10-08 | Nippon Telegr & Teleph Corp <Ntt> | Selective growth of thin film |
FR2548218A1 (en) * | 1983-06-29 | 1985-01-04 | Pauleau Yves | Process for deposition of thin layers by gas phase chemical reaction employing two different radiations |
JPS6027122A (en) * | 1983-07-22 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Method of photo plasma gas phase reaction |
JPS6027123A (en) * | 1983-07-25 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Method of photo plasma gas phase reaction |
JPS6027767A (en) * | 1983-07-27 | 1985-02-12 | Suzuki Motor Co Ltd | Fuel regulator for carburetor |
JPS6027121A (en) * | 1983-07-22 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Photo chemical vapor deposition device |
JPS60175411A (en) * | 1984-02-22 | 1985-09-09 | Hitachi Ltd | Manufacture of thin semiconductor film and apparatus thereof |
JPS60236219A (en) * | 1984-04-25 | 1985-11-25 | テキサス インスツルメンツ インコーポレイテツド | Depositing method and device using plasma produced source gas |
JPH05190473A (en) * | 1992-06-03 | 1993-07-30 | Semiconductor Energy Lab Co Ltd | Photo cvd apparatus |
CN102496663A (en) * | 2011-12-29 | 2012-06-13 | 普乐新能源(蚌埠)有限公司 | Method for reducing attenuation rate of amorphous silicon solar cell |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5244562A (en) * | 1975-10-07 | 1977-04-07 | Fujitsu Ltd | Epitaxial growth method |
JPS53103985A (en) * | 1977-02-22 | 1978-09-09 | Kokusai Electric Co Ltd | Growing film forming method |
-
1980
- 1980-03-05 JP JP2833380A patent/JPS56124229A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5244562A (en) * | 1975-10-07 | 1977-04-07 | Fujitsu Ltd | Epitaxial growth method |
JPS53103985A (en) * | 1977-02-22 | 1978-09-09 | Kokusai Electric Co Ltd | Growing film forming method |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5823434A (en) * | 1981-08-04 | 1983-02-12 | Kanegafuchi Chem Ind Co Ltd | Amorphous silicon semiconductor |
JPH0447453B2 (en) * | 1981-08-04 | 1992-08-04 | Kanegafuchi Chemical Ind | |
JPH0340107B2 (en) * | 1982-10-19 | 1991-06-17 | ||
JPS5973045A (en) * | 1982-10-19 | 1984-04-25 | Inoue Japax Res Inc | Surface coating method |
JPS59127833A (en) * | 1983-01-12 | 1984-07-23 | Agency Of Ind Science & Technol | Thin film manufacturing device according to excited vapor phase deposition |
JPH0419702B2 (en) * | 1983-01-12 | 1992-03-31 | Kogyo Gijutsuin | |
JPS59177919A (en) * | 1983-03-28 | 1984-10-08 | Nippon Telegr & Teleph Corp <Ntt> | Selective growth of thin film |
FR2548218A1 (en) * | 1983-06-29 | 1985-01-04 | Pauleau Yves | Process for deposition of thin layers by gas phase chemical reaction employing two different radiations |
JPS6027121A (en) * | 1983-07-22 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Photo chemical vapor deposition device |
JPS6027122A (en) * | 1983-07-22 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Method of photo plasma gas phase reaction |
JPH0463536B2 (en) * | 1983-07-22 | 1992-10-12 | Handotai Energy Kenkyusho | |
JPS6027123A (en) * | 1983-07-25 | 1985-02-12 | Semiconductor Energy Lab Co Ltd | Method of photo plasma gas phase reaction |
JPH0557732B2 (en) * | 1983-07-25 | 1993-08-24 | Handotai Energy Kenkyusho | |
JPS6027767A (en) * | 1983-07-27 | 1985-02-12 | Suzuki Motor Co Ltd | Fuel regulator for carburetor |
JPS60175411A (en) * | 1984-02-22 | 1985-09-09 | Hitachi Ltd | Manufacture of thin semiconductor film and apparatus thereof |
JPS60236219A (en) * | 1984-04-25 | 1985-11-25 | テキサス インスツルメンツ インコーポレイテツド | Depositing method and device using plasma produced source gas |
JPH0573050B2 (en) * | 1984-04-25 | 1993-10-13 | Texas Instruments Inc | |
JPH05190473A (en) * | 1992-06-03 | 1993-07-30 | Semiconductor Energy Lab Co Ltd | Photo cvd apparatus |
CN102496663A (en) * | 2011-12-29 | 2012-06-13 | 普乐新能源(蚌埠)有限公司 | Method for reducing attenuation rate of amorphous silicon solar cell |
Also Published As
Publication number | Publication date |
---|---|
JPS637020B2 (en) | 1988-02-15 |
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