JPS55138835A - Method of forming photoresist pattern - Google Patents
Method of forming photoresist patternInfo
- Publication number
- JPS55138835A JPS55138835A JP4644379A JP4644379A JPS55138835A JP S55138835 A JPS55138835 A JP S55138835A JP 4644379 A JP4644379 A JP 4644379A JP 4644379 A JP4644379 A JP 4644379A JP S55138835 A JPS55138835 A JP S55138835A
- Authority
- JP
- Japan
- Prior art keywords
- film
- photoresist pattern
- coated
- photoresist
- exposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0035—Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To remarkably improve the accuracy of forming a fine photoresist pattern by employing two types of different resists having different properties to form a resist pattern having both excellent adherence and resolution. CONSTITUTION:The first photoresist film 11 having desired adherence is coated on a semiconductor substrate 10, exposed with light, developed, and the first photoresist film 11 is coated on the substrate 10. Then, the second photoresist film 12 having slower ashing speed than the film 11 with desired resolution is coated on the film 11, and patterned as desired. Thereafter, with the second photoresist pattern as a mask the exposed film 11 is ashed and removed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4644379A JPS55138835A (en) | 1979-04-16 | 1979-04-16 | Method of forming photoresist pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4644379A JPS55138835A (en) | 1979-04-16 | 1979-04-16 | Method of forming photoresist pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55138835A true JPS55138835A (en) | 1980-10-30 |
Family
ID=12747303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4644379A Pending JPS55138835A (en) | 1979-04-16 | 1979-04-16 | Method of forming photoresist pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55138835A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4507331A (en) * | 1983-12-12 | 1985-03-26 | International Business Machines Corporation | Dry process for forming positive tone micro patterns |
JPH01309054A (en) * | 1988-06-07 | 1989-12-13 | Mitsubishi Electric Corp | Formation of fine pattern |
-
1979
- 1979-04-16 JP JP4644379A patent/JPS55138835A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4507331A (en) * | 1983-12-12 | 1985-03-26 | International Business Machines Corporation | Dry process for forming positive tone micro patterns |
JPH01309054A (en) * | 1988-06-07 | 1989-12-13 | Mitsubishi Electric Corp | Formation of fine pattern |
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