JPH09503308A - 高速蛍光スキャナ - Google Patents
高速蛍光スキャナInfo
- Publication number
- JPH09503308A JPH09503308A JP8505027A JP50502796A JPH09503308A JP H09503308 A JPH09503308 A JP H09503308A JP 8505027 A JP8505027 A JP 8505027A JP 50502796 A JP50502796 A JP 50502796A JP H09503308 A JPH09503308 A JP H09503308A
- Authority
- JP
- Japan
- Prior art keywords
- scanner
- sample
- excitation beam
- scan
- fluorescence emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/447—Systems using electrophoresis
- G01N27/44704—Details; Accessories
- G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
- G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/101—Scanning measuring head
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. 像面におけるサンプル上の複数の位置において等しい角度でビームを方向 づけるための高速光学式スキャナであって、 第1のスペクトル特性を有する光の視準された励起ビームを生成するための手 段と、 走査ヘッドとを含み、これは、 (i) 励起ビームを一定の角度で受け、励起ビームを偏向させるように配置 されたリフレクタと、 (ii) リフレクタによって偏向された励起ビームを遮り、像面におけるサン プル上の位置に励起ビームを焦点合わせして、第2のスペクトル特性を有する蛍 光発光をサンプルから生じ、蛍光発光をサンプルから集めるように配置されたレ ンズとを有し、蛍光発光はリフレクタへと逆向きに方向づけられ、このスキャナ はさらに、 走査ヘッドを線形方向に往復運動させるためのアクチュエータ手段を含み、こ れによって、励起ビームは走査線において像面内のサンプルに衝突し、さらに、 蛍光発光のスペクトル特性と励起のスペクトル特性とを分離するためのスペク トル分散装置を含む、スキャナ。 2. リフレクタは、走査ヘッドを往復運動させるための手段の運動の方向に平 行な方向から励起ビームを受ける、請求項1に記載のスキャナ。 3. リフレクタは像面に対して約45°の角度で配向さ れ、 レンズはその軸が像面に直交した状態で位置決めされ、 これによって、励起ビームは走査線におけるあらゆる点で、直交する方向から 像面内のサンプルに衝突する、請求項2に記載のスキャナ。 4. アクチュエータ手段は秒速約100インチまでの走査速度を特徴とする、 請求項1に記載のスキャナ。 5. アクチュエータ手段は走査ヘッドに機械的に結合されたシャフトを含み、 シャフトはモータによって軸方向に駆動される、請求項1に記載のスキャナ。 6. 走査線の方向に直交する方向へ、像面においてサンプルを並進運動させ、 励起ビームの連続的な走査が像面の2次元を順次覆うようにするための手段をさ らに含む、請求項1に記載のスキャナ。 7. 走査線に直交する方向にサンプルを移動するための電気泳動手段をさらに 含む、請求項1に記載のスキャナ。 8. 走査ヘッドを往復運動させるための手段は、開ループ機構で動作するリニ アアクチュエータを含む、請求項1に記載のスキャナ。 9. 走査ヘッドを往復運動させるための手段は、閉ループ機構で動作するリニ アアクチュエータを含む、請求項1に記載のスキャナ。 10. 視準された励起ビームを生成するための手段は、 励起ビームを放射するレーザと、 励起ビームの経路に位置決めされた視準レンズとを含む、請求項1に記載のス キャナ。 11. スペクトル分散装置に近接して位置決めされて、スペクトル分散装置に よって励起ビームから分離されている蛍光発光を焦点合わせする第2のレンズと 、 蛍光発光に応答する光検出器とをさらに含む、請求項1に記載のスキャナ。 12. 第2のレンズおよび光検出器の間に位置決めされ、ピンホール開口を有 する空間フィルタをさらに含み、ピンホール開口は、蛍光発光を遮り、かつその 一部を入れるように配置される、請求項11に記載のスキャナ。 13. 像面におけるサンプル上の複数の位置において等しい角度でビームを方 向づけるための高速光学式スキャナであって、 走査ヘッドを含み、これは、 (i) 第1のスペクトル特性を有する光の励起ビームを生成するための手段 と、 (ii) 励起ビームを遮り、像面におけるサンプル上の位置に励起ビームを焦 点合わせして、第2のスペクトル特性を有する蛍光発光をサンプルから生じ、サ ンプルからの蛍光発光を集めるように配置されたレンズと、 (iii) 走査ヘッドから外へ蛍光発光を方向づけるための手段と、 (iv) 蛍光発光のスペクトル特性と励起のスペクトル 特性とを分離するためのスペクトル分散装置とを有し、このスキャナはさらに、 走査ヘッドを線形方向に往復運動させるためのアクチュエータ手段を含み、こ れによって、励起ビームは走査線において像面内のサンプルに衝突する、スキャ ナ。 14. 走査ヘッドおよびスペクトル分散装置から外へ蛍光発光を方向づけるた めの手段は、単一のダイクロイックビームスプリッタであり、ダイクロイックビ ームスプリッタは、レンズと励起ビームを生成するための手段との間に位置決め される、請求項13に記載のスキャナ。 15. 励起ビームを生成するための手段は、レーザダイオード、LED、ハロ ゲンランプおよびキセノンランプからなるグループから選択された光源である、 請求項13に記載のスキャナ。 16. アクチュエータ手段は秒速約100インチまでの走査速度を特徴とする 、請求項13に記載のスキャナ。 17. アクチュエータ手段は走査ヘッドに機械的に結合されたシャフトを含み 、シャフトはモータによって軸方向に駆動される、請求項13に記載のスキャナ 。 18. 走査線の方向に直交する方向へ、像面においてサンプルを並進運動させ 、励起ビームの連続的な走査が像面の2次元を順次覆うようにするための手段を さらに含む、請求項13に記載のスキャナ。 19. 走査線に直交する方向にサンプルを移動するため の電気泳動手段をさらに含む、請求項13に記載のスキャナ。 20. 走査ヘッドを往復運動させるための手段は、開ループ機構で動作するリ ニアアクチュエータを含む、請求項13に記載のスキャナ。 21. 走査ヘッドを往復運動させるための手段は、閉ループ機構で動作するリ ニアアクチュエータを含む、請求項13に記載のスキャナ。 22. 蛍光発光に応答する光検出器をさらに含み、光検出器は走査ヘッドから 離れる蛍光発光の経路に位置決めされ、さらに、 走査ヘッドおよび光検出器の間の蛍光発光の経路に位置決めされて、光検出器 へと蛍光発光を焦点合わせする第2のレンズを含む、請求項13に記載のスキャ ナ。 23. 第2のレンズおよび光検出器の間に位置決めされ、ピンホール開口を有 する空間フィルタをさらに含み、ピンホール開口は、蛍光発光を遮り、かつその 一部を入れるように配置される、請求項22に記載のスキャナ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US277,900 | 1994-07-19 | ||
US08/277,900 US5459325A (en) | 1994-07-19 | 1994-07-19 | High-speed fluorescence scanner |
PCT/US1995/007834 WO1996002824A1 (en) | 1994-07-19 | 1995-06-20 | High-speed fluorescence scanner |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005106422A Division JP3715307B2 (ja) | 1994-07-19 | 2005-04-01 | 像面におけるサンプルを走査する方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09503308A true JPH09503308A (ja) | 1997-03-31 |
JP4022255B2 JP4022255B2 (ja) | 2007-12-12 |
Family
ID=23062860
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50502796A Expired - Fee Related JP4022255B2 (ja) | 1994-07-19 | 1995-06-20 | 高速蛍光スキャナ |
JP2005106422A Expired - Fee Related JP3715307B2 (ja) | 1994-07-19 | 2005-04-01 | 像面におけるサンプルを走査する方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005106422A Expired - Fee Related JP3715307B2 (ja) | 1994-07-19 | 2005-04-01 | 像面におけるサンプルを走査する方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5459325A (ja) |
EP (1) | EP0724719B1 (ja) |
JP (2) | JP4022255B2 (ja) |
DE (1) | DE69535229T2 (ja) |
WO (1) | WO1996002824A1 (ja) |
Cited By (4)
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JP2000121559A (ja) * | 1998-10-14 | 2000-04-28 | Hitachi Denshi Ltd | 微小点光量読取装置 |
JP2001074656A (ja) * | 1999-09-03 | 2001-03-23 | Fuji Photo Film Co Ltd | 画像情報読取装置 |
JP2001091463A (ja) * | 1999-09-22 | 2001-04-06 | Tosoh Corp | 小型励起光源を使用したスキャナー型蛍光検出装置 |
US8175809B2 (en) | 2006-05-31 | 2012-05-08 | Hitachi High-Technologies Corporation | Fluorescence analyzing method, fluorescence analyzing apparatus and image detecting method |
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- 1995-06-20 WO PCT/US1995/007834 patent/WO1996002824A1/en active IP Right Grant
- 1995-06-20 JP JP50502796A patent/JP4022255B2/ja not_active Expired - Fee Related
- 1995-06-20 EP EP95924012A patent/EP0724719B1/en not_active Expired - Lifetime
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2005
- 2005-04-01 JP JP2005106422A patent/JP3715307B2/ja not_active Expired - Fee Related
Cited By (4)
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JP2000121559A (ja) * | 1998-10-14 | 2000-04-28 | Hitachi Denshi Ltd | 微小点光量読取装置 |
JP2001074656A (ja) * | 1999-09-03 | 2001-03-23 | Fuji Photo Film Co Ltd | 画像情報読取装置 |
JP2001091463A (ja) * | 1999-09-22 | 2001-04-06 | Tosoh Corp | 小型励起光源を使用したスキャナー型蛍光検出装置 |
US8175809B2 (en) | 2006-05-31 | 2012-05-08 | Hitachi High-Technologies Corporation | Fluorescence analyzing method, fluorescence analyzing apparatus and image detecting method |
Also Published As
Publication number | Publication date |
---|---|
EP0724719A4 (en) | 1998-12-09 |
EP0724719A1 (en) | 1996-08-07 |
JP4022255B2 (ja) | 2007-12-12 |
DE69535229T2 (de) | 2007-09-06 |
WO1996002824A1 (en) | 1996-02-01 |
EP0724719B1 (en) | 2006-09-20 |
US5459325A (en) | 1995-10-17 |
JP3715307B2 (ja) | 2005-11-09 |
JP2005201911A (ja) | 2005-07-28 |
DE69535229D1 (de) | 2006-11-02 |
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