JPH09172229A - 半導体ウェーハ・ボンディングによって製造された透明基板垂直共振型面発光レーザ - Google Patents
半導体ウェーハ・ボンディングによって製造された透明基板垂直共振型面発光レーザInfo
- Publication number
- JPH09172229A JPH09172229A JP31584496A JP31584496A JPH09172229A JP H09172229 A JPH09172229 A JP H09172229A JP 31584496 A JP31584496 A JP 31584496A JP 31584496 A JP31584496 A JP 31584496A JP H09172229 A JPH09172229 A JP H09172229A
- Authority
- JP
- Japan
- Prior art keywords
- vcsel
- active layer
- bragg reflector
- distributed bragg
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
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- 239000004065 semiconductor Substances 0.000 title abstract description 21
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- 238000000034 method Methods 0.000 abstract description 46
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- 235000012431 wafers Nutrition 0.000 description 63
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- 230000003287 optical effect Effects 0.000 description 12
- 230000005693 optoelectronics Effects 0.000 description 11
- 230000000903 blocking effect Effects 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 7
- 230000008569 process Effects 0.000 description 6
- 239000007787 solid Substances 0.000 description 6
- 230000007547 defect Effects 0.000 description 4
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- 238000005530 etching Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
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- 230000007423 decrease Effects 0.000 description 2
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- 238000005516 engineering process Methods 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 230000007480 spreading Effects 0.000 description 2
- 238000003892 spreading Methods 0.000 description 2
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
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- 239000013308 plastic optical fiber Substances 0.000 description 1
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- 230000007261 regionalization Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0217—Removal of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0215—Bonding to the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0233—Mounting configuration of laser chips
- H01S5/0234—Up-side down mountings, e.g. Flip-chip, epi-side down mountings or junction down mountings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
- H01S5/0262—Photo-diodes, e.g. transceiver devices, bidirectional devices
- H01S5/0264—Photo-diodes, e.g. transceiver devices, bidirectional devices for monitoring the laser-output
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18305—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] with emission through the substrate, i.e. bottom emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
- H01S5/1838—Reflector bonded by wafer fusion or by an intermediate compound
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18386—Details of the emission surface for influencing the near- or far-field, e.g. a grating on the surface
- H01S5/18388—Lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US565,537 | 1995-11-30 | ||
| US08/565,537 US5724376A (en) | 1995-11-30 | 1995-11-30 | Transparent substrate vertical cavity surface emitting lasers fabricated by semiconductor wafer bonding |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09172229A true JPH09172229A (ja) | 1997-06-30 |
| JPH09172229A5 JPH09172229A5 (enExample) | 2004-11-18 |
Family
ID=24259060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31584496A Ceased JPH09172229A (ja) | 1995-11-30 | 1996-11-27 | 半導体ウェーハ・ボンディングによって製造された透明基板垂直共振型面発光レーザ |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US5724376A (enExample) |
| JP (1) | JPH09172229A (enExample) |
| DE (1) | DE19646015A1 (enExample) |
| GB (1) | GB2307791B (enExample) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002176200A (ja) * | 2000-09-12 | 2002-06-21 | Lumileds Lighting Us Llc | 改良された光抽出効率を有する発光ダイオード |
| JP2006003817A (ja) * | 2004-06-21 | 2006-01-05 | Ricoh Co Ltd | 面型光スイッチ及びそれを用いた光通信システム |
| JP2006313900A (ja) * | 2005-05-07 | 2006-11-16 | Samsung Electronics Co Ltd | 外部共振器型の面発光レーザ |
| JPWO2007029538A1 (ja) * | 2005-09-02 | 2009-03-19 | 国立大学法人京都大学 | 2次元フォトニック結晶面発光レーザ光源 |
| KR100952401B1 (ko) * | 2000-11-06 | 2010-04-14 | 필립스 루미리즈 라이팅 캄파니 엘엘씨 | 발광 반도체 장치 및 그 형성 방법 |
| CN102569031A (zh) * | 2011-07-07 | 2012-07-11 | 杨继远 | 一种用铟(In)进行外延片/硅片键合的方法 |
| JP2012209345A (ja) * | 2011-03-29 | 2012-10-25 | Sony Corp | 発光素子・受光素子組立体及びその製造方法 |
| JP2012253271A (ja) * | 2011-06-06 | 2012-12-20 | Denso Corp | 面発光レーザ素子 |
| US8628985B2 (en) | 2000-09-12 | 2014-01-14 | Philips Lumileds Lighting Company Llc | Light emitting devices with improved light extraction efficiency |
Families Citing this family (115)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09167877A (ja) * | 1995-12-15 | 1997-06-24 | Furukawa Electric Co Ltd:The | 半導体レーザ装置及びその製造方法 |
| US5977604A (en) * | 1996-03-08 | 1999-11-02 | The Regents Of The University Of California | Buried layer in a semiconductor formed by bonding |
| FR2753577B1 (fr) * | 1996-09-13 | 1999-01-08 | Alsthom Cge Alcatel | Procede de fabrication d'un composant optoelectronique a semiconducteur et composant et matrice de composants fabriques selon ce procede |
| US5835517A (en) * | 1996-10-04 | 1998-11-10 | W. L. Gore & Associates, Inc. | WDM multiplexer-demultiplexer using Fabry-Perot filter array |
| US5838707A (en) * | 1996-12-27 | 1998-11-17 | Motorola, Inc. | Ultraviolet/visible light emitting vertical cavity surface emitting laser and method of fabrication |
| US5914973A (en) * | 1997-02-10 | 1999-06-22 | Motorola, Inc. | Vertical cavity surface emitting laser for high power operation and method of fabrication |
| US5835521A (en) * | 1997-02-10 | 1998-11-10 | Motorola, Inc. | Long wavelength light emitting vertical cavity surface emitting laser and method of fabrication |
| US6243407B1 (en) * | 1997-03-21 | 2001-06-05 | Novalux, Inc. | High power laser devices |
| WO1998048492A1 (en) * | 1997-04-23 | 1998-10-29 | Honeywell Inc. | Electronic devices formed from pre-patterned structures that are bonded |
| CA2298491C (en) | 1997-07-25 | 2009-10-06 | Nichia Chemical Industries, Ltd. | Nitride semiconductor device |
| US6022760A (en) * | 1997-07-30 | 2000-02-08 | Motorola, Inc. | Integrated electro-optical package and method of fabrication |
| JPH11154774A (ja) * | 1997-08-05 | 1999-06-08 | Canon Inc | 面発光半導体デバイスの製造方法、この方法によって製造された面発光半導体デバイス及びこのデバイスを用いた表示装置 |
| US6021146A (en) * | 1997-09-15 | 2000-02-01 | Motorola, Inc. | Vertical cavity surface emitting laser for high power single mode operation and method of fabrication |
| EP2169733B1 (de) * | 1997-09-29 | 2017-07-19 | OSRAM Opto Semiconductors GmbH | Halbleiterlichtquelle |
| US6633120B2 (en) * | 1998-11-19 | 2003-10-14 | Unisplay S.A. | LED lamps |
| US6071795A (en) * | 1998-01-23 | 2000-06-06 | The Regents Of The University Of California | Separation of thin films from transparent substrates by selective optical processing |
| DE19807782A1 (de) * | 1998-02-18 | 1999-09-02 | Siemens Ag | Bauelement mit einem Lichtsender und einem Lichtempfänger |
| US6301281B1 (en) | 1998-08-31 | 2001-10-09 | Agilent Technologies, Inc. | Semiconductor laser having co-doped distributed bragg reflectors |
| US6195485B1 (en) * | 1998-10-26 | 2001-02-27 | The Regents Of The University Of California | Direct-coupled multimode WDM optical data links with monolithically-integrated multiple-channel VCSEL and photodetector |
| US6816528B1 (en) * | 1998-12-30 | 2004-11-09 | Xerox Corporation | Method and structure for nitride based laser diode arrays on a conducting substrate |
| US6204189B1 (en) | 1999-01-29 | 2001-03-20 | The Regents Of The University Of California | Fabrication of precision high quality facets on molecular beam epitaxy material |
| GB2346258A (en) * | 1999-01-30 | 2000-08-02 | Mitel Semiconductor Ab | Monitoring the light output of surface emitting lasers |
| US20010042866A1 (en) | 1999-02-05 | 2001-11-22 | Carrie Carter Coman | Inxalygazn optical emitters fabricated via substrate removal |
| US6320206B1 (en) * | 1999-02-05 | 2001-11-20 | Lumileds Lighting, U.S., Llc | Light emitting devices having wafer bonded aluminum gallium indium nitride structures and mirror stacks |
| US6280523B1 (en) | 1999-02-05 | 2001-08-28 | Lumileds Lighting, U.S., Llc | Thickness tailoring of wafer bonded AlxGayInzN structures by laser melting |
| JP3770014B2 (ja) | 1999-02-09 | 2006-04-26 | 日亜化学工業株式会社 | 窒化物半導体素子 |
| ATE452445T1 (de) | 1999-03-04 | 2010-01-15 | Nichia Corp | Nitridhalbleiterlaserelement |
| US6368890B1 (en) * | 1999-05-05 | 2002-04-09 | Mitel Semiconductor Ab | Top contact VCSEL with monitor |
| GB2349740A (en) * | 1999-05-05 | 2000-11-08 | Mitel Semiconductor Ab | Vertical cavity surface emitting laser with monitoring diode |
| EP1226612A4 (en) * | 1999-05-06 | 2007-01-24 | Univ Boston | REFLECTIVE LAYER BURIED IN SILICON AND METHOD FOR MANUFACTURING SAME |
| JP3728147B2 (ja) * | 1999-07-16 | 2005-12-21 | キヤノン株式会社 | 光電気混載配線基板 |
| JP2001141924A (ja) * | 1999-11-16 | 2001-05-25 | Matsushita Electric Ind Co Ltd | 分波素子及び分波受光素子 |
| DE19959182A1 (de) * | 1999-12-08 | 2001-06-28 | Max Planck Gesellschaft | Verfahren zum Herstellen eines optoelektronischen Bauelements |
| US6778582B1 (en) * | 2000-03-06 | 2004-08-17 | Novalux, Inc. | Coupled cavity high power semiconductor laser |
| US20060029120A1 (en) * | 2000-03-06 | 2006-02-09 | Novalux Inc. | Coupled cavity high power semiconductor laser |
| US6335263B1 (en) * | 2000-03-22 | 2002-01-01 | The Regents Of The University Of California | Method of forming a low temperature metal bond for use in the transfer of bulk and thin film materials |
| DE10017337C2 (de) * | 2000-04-07 | 2002-04-04 | Vishay Semiconductor Gmbh | Verfahren zum Herstellen lichtaussendender Halbleiterbauelemente |
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| JP3538602B2 (ja) * | 2000-06-28 | 2004-06-14 | シャープ株式会社 | 半導体レーザー装置の製造方法および半導体レーザー装置の製造装置 |
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| US6674948B2 (en) | 2001-08-13 | 2004-01-06 | Optoic Technology, Inc. | Optoelectronic IC module |
| US6656756B2 (en) * | 2001-08-24 | 2003-12-02 | Telecommunication Laboratories, Chunghwa Telecom Co., Ltd. | Technique for a surface-emitting laser diode with a metal reflector |
| US7501303B2 (en) * | 2001-11-05 | 2009-03-10 | The Trustees Of Boston University | Reflective layer buried in silicon and method of fabrication |
| US6656761B2 (en) * | 2001-11-21 | 2003-12-02 | Motorola, Inc. | Method for forming a semiconductor device for detecting light |
| DE10201102A1 (de) * | 2002-01-09 | 2003-07-24 | Infineon Technologies Ag | Laservorrichtung |
| US6773532B2 (en) * | 2002-02-27 | 2004-08-10 | Jds Uniphase Corporation | Method for improving heat dissipation in optical transmitter |
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| JP2006003817A (ja) * | 2004-06-21 | 2006-01-05 | Ricoh Co Ltd | 面型光スイッチ及びそれを用いた光通信システム |
| JP2006313900A (ja) * | 2005-05-07 | 2006-11-16 | Samsung Electronics Co Ltd | 外部共振器型の面発光レーザ |
| JPWO2007029538A1 (ja) * | 2005-09-02 | 2009-03-19 | 国立大学法人京都大学 | 2次元フォトニック結晶面発光レーザ光源 |
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| JP2012253271A (ja) * | 2011-06-06 | 2012-12-20 | Denso Corp | 面発光レーザ素子 |
| CN102569031A (zh) * | 2011-07-07 | 2012-07-11 | 杨继远 | 一种用铟(In)进行外延片/硅片键合的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB2307791B (en) | 2000-11-15 |
| US5837561A (en) | 1998-11-17 |
| DE19646015A1 (de) | 1997-06-05 |
| GB2307791A (en) | 1997-06-04 |
| GB9624926D0 (en) | 1997-01-15 |
| US5724376A (en) | 1998-03-03 |
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