JPH0376592B2 - - Google Patents

Info

Publication number
JPH0376592B2
JPH0376592B2 JP58006912A JP691283A JPH0376592B2 JP H0376592 B2 JPH0376592 B2 JP H0376592B2 JP 58006912 A JP58006912 A JP 58006912A JP 691283 A JP691283 A JP 691283A JP H0376592 B2 JPH0376592 B2 JP H0376592B2
Authority
JP
Japan
Prior art keywords
type
conductivity type
region
type semiconductor
concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58006912A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59132671A (ja
Inventor
Shigeo Hoshino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissan Motor Co Ltd filed Critical Nissan Motor Co Ltd
Priority to JP58006912A priority Critical patent/JPS59132671A/ja
Publication of JPS59132671A publication Critical patent/JPS59132671A/ja
Publication of JPH0376592B2 publication Critical patent/JPH0376592B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/64Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66Vertical DMOS [VDMOS] FETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/13Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
    • H10D62/149Source or drain regions of field-effect devices
    • H10D62/151Source or drain regions of field-effect devices of IGFETs 
    • H10D62/156Drain regions of DMOS transistors
    • H10D62/157Impurity concentrations or distributions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/64Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66Vertical DMOS [VDMOS] FETs
    • H10D30/662Vertical DMOS [VDMOS] FETs having a drift region having a doping concentration that is higher between adjacent body regions relative to other parts of the drift region
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/13Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
    • H10D62/149Source or drain regions of field-effect devices
    • H10D62/151Source or drain regions of field-effect devices of IGFETs 
JP58006912A 1983-01-19 1983-01-19 縦型mosトランジスタ Granted JPS59132671A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58006912A JPS59132671A (ja) 1983-01-19 1983-01-19 縦型mosトランジスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58006912A JPS59132671A (ja) 1983-01-19 1983-01-19 縦型mosトランジスタ

Publications (2)

Publication Number Publication Date
JPS59132671A JPS59132671A (ja) 1984-07-30
JPH0376592B2 true JPH0376592B2 (en, 2012) 1991-12-05

Family

ID=11651445

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58006912A Granted JPS59132671A (ja) 1983-01-19 1983-01-19 縦型mosトランジスタ

Country Status (1)

Country Link
JP (1) JPS59132671A (en, 2012)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2645100B2 (ja) * 1988-09-07 1997-08-25 株式会社東芝 電界効果型半導体装置
JPH04276663A (ja) * 1991-03-05 1992-10-01 Nec Yamagata Ltd 半導体装置
US5674766A (en) * 1994-12-30 1997-10-07 Siliconix Incorporated Method of making a trench MOSFET with multi-resistivity drain to provide low on-resistance by varying dopant concentration in epitaxial layer
JPH08288503A (ja) * 1995-04-11 1996-11-01 Rohm Co Ltd プレーナ型高耐圧縦型素子を有する半導体装置およびその製造方法
SE9601178D0 (sv) * 1996-03-27 1996-03-27 Abb Research Ltd A field controlled semiconductor device of SiC and a method for production thereof
JP4164962B2 (ja) 1999-10-08 2008-10-15 株式会社デンソー 絶縁ゲート型バイポーラトランジスタ
JP2001352070A (ja) 2000-04-07 2001-12-21 Denso Corp 半導体装置およびその製造方法
JP2019125621A (ja) * 2018-01-12 2019-07-25 トヨタ自動車株式会社 半導体装置

Also Published As

Publication number Publication date
JPS59132671A (ja) 1984-07-30

Similar Documents

Publication Publication Date Title
US6246092B1 (en) High breakdown voltage MOS semiconductor apparatus
US4686551A (en) MOS transistor
US3512058A (en) High voltage transient protection for an insulated gate field effect transistor
JP2692350B2 (ja) Mos型半導体素子
JPH051626B2 (en, 2012)
KR19990022793A (ko) 반도체 칩 연결 영역을 갖는 고전압 래터럴 금속 산화물 반도체전계 효과 트랜지스터 세마이콘덕터-온-인슐레이터 디바이스
JPH0715006A (ja) 集積化構体保護装置
US20020153564A1 (en) Semiconductor device
JPS62176168A (ja) 縦型mosトランジスタ
JPH0376592B2 (en, 2012)
US4520382A (en) Semiconductor integrated circuit with inversion preventing electrode
US11677033B2 (en) Passive element on a semiconductor base body
JP2000114266A (ja) 高耐圧ダイオードとその製造方法
JP4431761B2 (ja) Mos型半導体装置
JP3412393B2 (ja) 半導体装置
JP2854900B2 (ja) 半導体装置
JPS62217664A (ja) 半導体装置
JPH04363068A (ja) 半導体装置
JPH0328836B2 (en, 2012)
JP2973583B2 (ja) 半導体装置
JP2785792B2 (ja) 電力用半導体素子
JPH0475668B2 (en, 2012)
JP3074064B2 (ja) 横型mos電界効果トランジスタ
JPH0997844A (ja) 半導体集積回路装置
JP2907504B2 (ja) 半導体装置