JPH033941B2 - - Google Patents

Info

Publication number
JPH033941B2
JPH033941B2 JP58016904A JP1690483A JPH033941B2 JP H033941 B2 JPH033941 B2 JP H033941B2 JP 58016904 A JP58016904 A JP 58016904A JP 1690483 A JP1690483 A JP 1690483A JP H033941 B2 JPH033941 B2 JP H033941B2
Authority
JP
Japan
Prior art keywords
wire
circuit
inspection
inspected
contour
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58016904A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59150433A (ja
Inventor
Hiroyuki Tsukahara
Masahito Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58016904A priority Critical patent/JPS59150433A/ja
Publication of JPS59150433A publication Critical patent/JPS59150433A/ja
Publication of JPH033941B2 publication Critical patent/JPH033941B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10W72/50—
    • H10W72/07531—
    • H10W72/536—
    • H10W72/5363—
    • H10W72/5449—
    • H10W90/756—

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58016904A 1983-02-05 1983-02-05 ワイヤ検査装置 Granted JPS59150433A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58016904A JPS59150433A (ja) 1983-02-05 1983-02-05 ワイヤ検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58016904A JPS59150433A (ja) 1983-02-05 1983-02-05 ワイヤ検査装置

Publications (2)

Publication Number Publication Date
JPS59150433A JPS59150433A (ja) 1984-08-28
JPH033941B2 true JPH033941B2 (index.php) 1991-01-21

Family

ID=11929124

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58016904A Granted JPS59150433A (ja) 1983-02-05 1983-02-05 ワイヤ検査装置

Country Status (1)

Country Link
JP (1) JPS59150433A (index.php)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017092187A (ja) * 2015-11-06 2017-05-25 キヤノンマシナリー株式会社 ボンディングワイヤの検出装置及びボンディングワイヤの検出方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH061163B2 (ja) * 1984-08-31 1994-01-05 富士通株式会社 物体形状検出装置及び形状検査方法
JP2689505B2 (ja) * 1988-08-03 1997-12-10 日本電気株式会社 ボンディングワイヤの形状検査装置
JPH07111998B2 (ja) * 1989-08-18 1995-11-29 株式会社東芝 ワイヤボンディング検査装置
US5298989A (en) * 1990-03-12 1994-03-29 Fujitsu Limited Method of and apparatus for multi-image inspection of bonding wire
CN105849881A (zh) * 2013-12-11 2016-08-10 飞兆半导体公司 集成的引线接合器和具有缺陷剔除的三维测量系统

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017092187A (ja) * 2015-11-06 2017-05-25 キヤノンマシナリー株式会社 ボンディングワイヤの検出装置及びボンディングワイヤの検出方法

Also Published As

Publication number Publication date
JPS59150433A (ja) 1984-08-28

Similar Documents

Publication Publication Date Title
KR100283834B1 (ko) 반도체칩의 본딩방법 및 그 장치
KR930005496B1 (ko) 와이어본딩 검사장치
JPH03191600A (ja) 検査方法、並びに検査プログラムデータの自動作成機能を有する検査装置
KR960001824B1 (ko) 와이어 본딩 검사 장치
US20070187470A1 (en) Wire bonding apparatus, record medium storing bonding control program, and bonding method
JPH0666370B2 (ja) 半導体デバイス用外観検査装置
JPH033941B2 (index.php)
JPS63126242A (ja) 外観検査方法および装置
JP3225067B2 (ja) リード測定方法
WO2005064354A1 (ja) 回路パターン検査装置及び回路パターン検査方法
JPH0429007A (ja) 光学検査装置
JPH02253110A (ja) 線状物体の形状検査装置
JP3029723B2 (ja) 半田付け工程でのリード浮きの検出方法
KR100231274B1 (ko) 패턴 인식 장치 및 이를 이용한 그라운드 본딩 위치 인식 방법
JP2682581B2 (ja) ボンディングワイヤの形状検査方法
JPH05335388A (ja) 半導体装置のリード平坦度検査方法
JPH0576185B2 (index.php)
JPH0372203A (ja) 半田付け部の外観検査方法
JPH04315905A (ja) 物体検査装置
JPH047448B2 (index.php)
JPH05335390A (ja) ボンディングワイヤ検査装置
JP2545570B2 (ja) 画像処理による接続線の傾斜検査方法
JP3171949B2 (ja) ワイヤボンディング検査方法
JPS63144531A (ja) 半導体装置の撮像検査装置
JPH0524667B2 (index.php)