JPH0222540B2 - - Google Patents
Info
- Publication number
- JPH0222540B2 JPH0222540B2 JP55135869A JP13586980A JPH0222540B2 JP H0222540 B2 JPH0222540 B2 JP H0222540B2 JP 55135869 A JP55135869 A JP 55135869A JP 13586980 A JP13586980 A JP 13586980A JP H0222540 B2 JPH0222540 B2 JP H0222540B2
- Authority
- JP
- Japan
- Prior art keywords
- melting point
- low melting
- pellet
- point glass
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 43
- 239000011521 glass Substances 0.000 claims abstract description 29
- 238000002844 melting Methods 0.000 claims abstract description 29
- 230000008018 melting Effects 0.000 claims abstract description 24
- 239000008188 pellet Substances 0.000 claims abstract description 23
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 10
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 239000000758 substrate Substances 0.000 abstract description 9
- 239000000919 ceramic Substances 0.000 abstract description 7
- 239000000463 material Substances 0.000 abstract description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 5
- 229910052710 silicon Inorganic materials 0.000 abstract description 5
- 239000010703 silicon Substances 0.000 abstract description 5
- 230000008646 thermal stress Effects 0.000 abstract description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 2
- 239000004411 aluminium Substances 0.000 abstract 1
- 230000001747 exhibiting effect Effects 0.000 abstract 1
- 230000003014 reinforcing effect Effects 0.000 abstract 1
- 238000007789 sealing Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010970 precious metal Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/27—Manufacturing methods
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Engineering & Computer Science (AREA)
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- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Die Bonding (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Joining Of Glass To Other Materials (AREA)
Description
【発明の詳細な説明】
本発明は低融点ガラスを用いた半導体素子の搭
載方法に関するものである。
載方法に関するものである。
低融点ガラスを用いた半導体素子の搭載方法
は、一般にガラス封止型半導体装置に使用されて
いる。前記ガラス封止型半導体装置を始めとし
て、一般に低融点ガラスを用いた半導体素子の搭
載方法では半導体素子を直接低融点ガラスに接続
せしめているが、半導体素子とベースアセンブリ
との熱膨脹係数差が大きい場合、あるいは前記熱
膨脹係数差がかなり小さくても半導体素子が大き
い場合には環境温度から受ける熱応力が極めて大
きくなるためペレツトが破壊されることが知られ
ている。
は、一般にガラス封止型半導体装置に使用されて
いる。前記ガラス封止型半導体装置を始めとし
て、一般に低融点ガラスを用いた半導体素子の搭
載方法では半導体素子を直接低融点ガラスに接続
せしめているが、半導体素子とベースアセンブリ
との熱膨脹係数差が大きい場合、あるいは前記熱
膨脹係数差がかなり小さくても半導体素子が大き
い場合には環境温度から受ける熱応力が極めて大
きくなるためペレツトが破壊されることが知られ
ている。
ところが、従来は、ペレツトがどのようなメカ
ニズムにより破壊に至るかということが判明して
いなかつた。そのため、従来は、低融点ガラスを
用いた半導体素子の搭載技術は製造原価を低減で
きる一大長所が一般に認められながら、半導体素
子の大きさ、あるいはベースアセンブリの材料が
限定された範囲内でしか使用されていなかつた。
ニズムにより破壊に至るかということが判明して
いなかつた。そのため、従来は、低融点ガラスを
用いた半導体素子の搭載技術は製造原価を低減で
きる一大長所が一般に認められながら、半導体素
子の大きさ、あるいはベースアセンブリの材料が
限定された範囲内でしか使用されていなかつた。
そこで、本発明者等が鋭意研究を重ねた結果、
前記した半導体素子すなわちペレツトが破壊する
現象は半導体素子の構成材料であるシリコン
(Si)が低融点ガラスとの濡れ性が悪く、且つ接
合強度が弱いため熱応力が加えられると容易に低
融点ガラスとの間で接合部の剥離が生じ、上記剥
離部の境界部にSi基板を破壊せしめるような応力
集中が生ずるために起きるものであることが判明
した。
前記した半導体素子すなわちペレツトが破壊する
現象は半導体素子の構成材料であるシリコン
(Si)が低融点ガラスとの濡れ性が悪く、且つ接
合強度が弱いため熱応力が加えられると容易に低
融点ガラスとの間で接合部の剥離が生じ、上記剥
離部の境界部にSi基板を破壊せしめるような応力
集中が生ずるために起きるものであることが判明
した。
本発明はこのような知見に基づいて従来技術の
欠点を解消するためになされたもので、前述の如
く、半導体素子とベースアセンブリとの熱膨脹係
数差が大きい場合あるいは半導体素子が大きい場
合でも半導体素子を破壊せずに接続搭載せしむる
ことを目的とするものである。
欠点を解消するためになされたもので、前述の如
く、半導体素子とベースアセンブリとの熱膨脹係
数差が大きい場合あるいは半導体素子が大きい場
合でも半導体素子を破壊せずに接続搭載せしむる
ことを目的とするものである。
本発明の要旨は、半導体ペレツトを低融点ガラ
スを用いてパツケージの半導体ペレツト取付面上
に固着した半導体装置の製造方法において、前記
ペレツトの裏面上に前記低融点ガラスとの接続を
強固とすることの可能な金属膜を形成し、前記金
属膜を前記ペレツト取付面上に前記低融点ガラス
を用いて固着することを特徴とする半導体装置の
製造方法にある。
スを用いてパツケージの半導体ペレツト取付面上
に固着した半導体装置の製造方法において、前記
ペレツトの裏面上に前記低融点ガラスとの接続を
強固とすることの可能な金属膜を形成し、前記金
属膜を前記ペレツト取付面上に前記低融点ガラス
を用いて固着することを特徴とする半導体装置の
製造方法にある。
以下、本発明を図面に示す実施例にしたがつて
さらに説明する。
さらに説明する。
第1図は本発明により半導体素子をパツケージ
のペレツト取付面に搭載する前の状態を示す概略
断面図、第2図は搭載後の状態を示す概略断面図
である。図示した実施例において、1はセラミツ
クパツケージの一部であるセラミツク基板、2は
セラミツク基板1のキヤビテイ部に形成された半
導体素子接続用の低融点ガラス膜、3は封止用低
融点ガラス膜である。後者の低融点ガラス膜3は
上記キヤビテイ部の半導体素子接続用の低融点ガ
ラス膜2と同一材質でもよく、また異なる材質の
ものを用いてもよい。前記セラミツク基板1、低
融点ガラス2と3は総称的にベースアセンブリと
呼ぶことができる。
のペレツト取付面に搭載する前の状態を示す概略
断面図、第2図は搭載後の状態を示す概略断面図
である。図示した実施例において、1はセラミツ
クパツケージの一部であるセラミツク基板、2は
セラミツク基板1のキヤビテイ部に形成された半
導体素子接続用の低融点ガラス膜、3は封止用低
融点ガラス膜である。後者の低融点ガラス膜3は
上記キヤビテイ部の半導体素子接続用の低融点ガ
ラス膜2と同一材質でもよく、また異なる材質の
ものを用いてもよい。前記セラミツク基板1、低
融点ガラス2と3は総称的にベースアセンブリと
呼ぶことができる。
また、符号4はキヤビテイ部の低融点ガラス膜
2に接続搭載されるべき半導体素子すなわちペレ
ツト、5は半導体素子4の裏面に設けられたAl
蒸着膜(加工膜)である。なお、このAl蒸着膜
5のAlは蒸着のみによらず、スパツター等他の
方法で形成されてもよい。
2に接続搭載されるべき半導体素子すなわちペレ
ツト、5は半導体素子4の裏面に設けられたAl
蒸着膜(加工膜)である。なお、このAl蒸着膜
5のAlは蒸着のみによらず、スパツター等他の
方法で形成されてもよい。
次に、本発明の方法により半導体素子をパツケ
ージに搭載する手順について説明する。
ージに搭載する手順について説明する。
まず、セラミツク基板1、低融点ガラス膜2と
3からなるベースアセンブリを低融点ガラスの作
業温度にまで加熱して低融点ガラスを軟化せし
め、裏面にAl蒸着膜5を設けた半導体素子4を
その中央部のペレツト取付面上に位置させ、低融
点ガラス2とAl蒸着膜5とが互いに濡れ合つて
接着され、互いに強固に接合されるように所定の
時間だけ適当な温度で加熱した後、冷却を行うこ
とにより、半導体素子4のペレツト取付面への搭
載接着が完了する。
3からなるベースアセンブリを低融点ガラスの作
業温度にまで加熱して低融点ガラスを軟化せし
め、裏面にAl蒸着膜5を設けた半導体素子4を
その中央部のペレツト取付面上に位置させ、低融
点ガラス2とAl蒸着膜5とが互いに濡れ合つて
接着され、互いに強固に接合されるように所定の
時間だけ適当な温度で加熱した後、冷却を行うこ
とにより、半導体素子4のペレツト取付面への搭
載接着が完了する。
本実施例においては、Al蒸着膜5がペレツト
取付部の低融点ガラス膜2と強固に接合されるの
で、半導体素子4が破壊されてしまうような熱応
力は半導体装置が使用されるべき如何なる環境条
件下に於ても生ずることはなく良好な半導体素子
4の搭載が完成される。半導体装置の製造におい
て、Alは広く一般的に用いられていることから、
蒸着膜の形成を容易に行うことができる。また低
融点ガラスとの接続を強固にするために半導体素
子裏面に設ける膜の種類としてはAlに限定され
ず、Cr、TiまたはCuからなる金属膜又はCr、Ti
またはCuを主成分とする加工被膜でもよい。
取付部の低融点ガラス膜2と強固に接合されるの
で、半導体素子4が破壊されてしまうような熱応
力は半導体装置が使用されるべき如何なる環境条
件下に於ても生ずることはなく良好な半導体素子
4の搭載が完成される。半導体装置の製造におい
て、Alは広く一般的に用いられていることから、
蒸着膜の形成を容易に行うことができる。また低
融点ガラスとの接続を強固にするために半導体素
子裏面に設ける膜の種類としてはAlに限定され
ず、Cr、TiまたはCuからなる金属膜又はCr、Ti
またはCuを主成分とする加工被膜でもよい。
以上説明したように、本発明によれば、半導体
素子を破壊することなく、確実かつ強固に搭載す
ることができ、またペレツト付けのために高価な
金等の貴金属を用いる必要がないので、コストを
著しく低減できる。
素子を破壊することなく、確実かつ強固に搭載す
ることができ、またペレツト付けのために高価な
金等の貴金属を用いる必要がないので、コストを
著しく低減できる。
第1図は本発明の一実施例を示す半導体素子の
搭載前の半導体装置の一部の略断面図、第2図は
搭載後の状態を示す略断面図である。 1……セラミツク基板、2……低融点ガラス
膜、3……封止用の低融点ガラス膜、4……半導
体素子(ペレツト)、5……Al蒸着膜。
搭載前の半導体装置の一部の略断面図、第2図は
搭載後の状態を示す略断面図である。 1……セラミツク基板、2……低融点ガラス
膜、3……封止用の低融点ガラス膜、4……半導
体素子(ペレツト)、5……Al蒸着膜。
Claims (1)
- 【特許請求の範囲】 1 半導体ペレツトを低融点ガラスを用いてパツ
ケージの半導体ペレツト取付面上に固着した半導
体装置の製造方法において、前記ペレツトの裏面
上に前記低融点ガラスとの接続を強固とすること
の可能な金属膜を形成し、前記金属膜を前記ペレ
ツト取付面上に前記低融点ガラスを用いて固着す
ることを特徴とする半導体装置の製造方法。 2 前記金属膜はAl、Cr、TiまたはCuからなる
金属膜又はCr、TiまたはCuを主成分とする加工
被膜であることを特徴とする特許請求の範囲第1
項記載の半導体装置の製造方法。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55135869A JPS5762539A (en) | 1980-10-01 | 1980-10-01 | Mounting method for semiconductor element |
GB8129017A GB2084399B (en) | 1980-10-01 | 1981-09-25 | Mounting a semiconductor device |
DE3138718A DE3138718C2 (de) | 1980-10-01 | 1981-09-29 | Halbleiterbauelement und Verfahren zu dessen Herstellung |
US06/306,863 US4437228A (en) | 1980-10-01 | 1981-09-29 | Method of mounting a silicon pellet on a ceramic substrate |
IT68266/81A IT1144882B (it) | 1980-10-01 | 1981-09-30 | Dispositivo a semiconduttore e procedimento per la sua fabbricazione |
FR8118497A FR2491259B1 (fr) | 1980-10-01 | 1981-09-30 | Dispositif a semi-conducteurs et son procede de fabrication |
US06/563,617 US4554573A (en) | 1980-10-01 | 1983-12-20 | Glass-sealed ceramic package type semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55135869A JPS5762539A (en) | 1980-10-01 | 1980-10-01 | Mounting method for semiconductor element |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5762539A JPS5762539A (en) | 1982-04-15 |
JPH0222540B2 true JPH0222540B2 (ja) | 1990-05-18 |
Family
ID=15161666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55135869A Granted JPS5762539A (en) | 1980-10-01 | 1980-10-01 | Mounting method for semiconductor element |
Country Status (6)
Country | Link |
---|---|
US (2) | US4437228A (ja) |
JP (1) | JPS5762539A (ja) |
DE (1) | DE3138718C2 (ja) |
FR (1) | FR2491259B1 (ja) |
GB (1) | GB2084399B (ja) |
IT (1) | IT1144882B (ja) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59117242A (ja) * | 1982-12-24 | 1984-07-06 | Hitachi Hokkai Semiconductor Kk | 半導体装置 |
GB2134704A (en) * | 1983-01-24 | 1984-08-15 | Larontrol Ltd | Semiconductor mounting arrangements |
US4688075A (en) * | 1983-07-22 | 1987-08-18 | Fairchild Semiconductor Corporation | Integrated circuit having a pre-attached conductive mounting media and method of making the same |
DE3335184A1 (de) * | 1983-09-28 | 1985-04-04 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum herstellen von halbleiterbausteinen |
US4729010A (en) * | 1985-08-05 | 1988-03-01 | Hitachi, Ltd. | Integrated circuit package with low-thermal expansion lead pieces |
JP2502511B2 (ja) * | 1986-02-06 | 1996-05-29 | 日立マクセル株式会社 | 半導体装置の製造方法 |
US4866505A (en) * | 1986-03-19 | 1989-09-12 | Analog Devices, Inc. | Aluminum-backed wafer and chip |
JPH0711461B2 (ja) * | 1986-06-13 | 1995-02-08 | 株式会社日本自動車部品総合研究所 | 圧力検出器 |
US5043535A (en) * | 1989-03-10 | 1991-08-27 | Olin Corporation | Hermetic cerglass and cermet electronic packages |
US5200241A (en) * | 1989-05-18 | 1993-04-06 | General Electric Company | Metal-ceramic structure with intermediate high temperature reaction barrier layer |
US5041396A (en) * | 1989-07-18 | 1991-08-20 | Vlsi Technology, Inc. | Reusable package for holding a semiconductor chip and method for reusing the package |
EP0409257A3 (en) * | 1989-07-21 | 1991-04-03 | Kabushiki Kaisha Toshiba | Low-melting point glass sealed semiconductor device and method of manufacturing the same |
EP0409004A3 (en) * | 1989-07-21 | 1991-04-03 | Kabushiki Kaisha Toshiba | Low-melting point glass sealed semiconductor device and method of manufacturing the same |
US5237206A (en) * | 1989-07-21 | 1993-08-17 | Kabushiki Kaisha Toshiba | Low-melting point glass sealed semiconductor device and method of manufacturing the same |
US5311399A (en) * | 1992-06-24 | 1994-05-10 | The Carborundum Company | High power ceramic microelectronic package |
KR100332967B1 (ko) * | 2000-05-10 | 2002-04-19 | 윤종용 | 디지털 마이크로-미러 디바이스 패키지의 제조 방법 |
US6661102B1 (en) * | 2002-01-18 | 2003-12-09 | Advance Micro Devices, Inc. | Semiconductor packaging apparatus for controlling die attach fillet height to reduce die shear stress |
TWI251910B (en) * | 2004-06-29 | 2006-03-21 | Phoenix Prec Technology Corp | Semiconductor device buried in a carrier and a method for fabricating the same |
US20110128237A1 (en) * | 2009-12-02 | 2011-06-02 | Rothkopf Fletcher R | Thinned-Portion Substrates |
TWI446495B (zh) * | 2011-01-19 | 2014-07-21 | Subtron Technology Co Ltd | 封裝載板及其製作方法 |
DE102012206362B4 (de) | 2012-04-18 | 2021-02-25 | Rohde & Schwarz GmbH & Co. Kommanditgesellschaft | Schaltungsanordnung zur thermisch leitfähigen Chipmontage und Herstellungsverfahren |
DE102016116499B4 (de) * | 2016-09-02 | 2022-06-15 | Infineon Technologies Ag | Verfahren zum Bilden von Halbleiterbauelementen und Halbleiterbauelemente |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4916227A (ja) * | 1972-06-05 | 1974-02-13 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3256465A (en) * | 1962-06-08 | 1966-06-14 | Signetics Corp | Semiconductor device assembly with true metallurgical bonds |
GB1037534A (en) * | 1963-03-14 | 1966-07-27 | Ultra Electronics Ltd | A method of bonding metal or silicon to glass |
US3405224A (en) * | 1966-04-20 | 1968-10-08 | Nippon Electric Co | Sealed enclosure for electronic device |
US3526814A (en) * | 1968-04-03 | 1970-09-01 | Itt | Heat sink arrangement for a semiconductor device |
US3828425A (en) | 1970-10-16 | 1974-08-13 | Texas Instruments Inc | Method for making semiconductor packaged devices and assemblies |
US3793064A (en) * | 1971-11-15 | 1974-02-19 | Du Pont | Product and process for cavity metallization of semiconductor packages |
US4032350A (en) * | 1973-03-12 | 1977-06-28 | Owens-Illinois, Inc. | Printing paste vehicle, gold dispensing paste and method of using the paste in the manufacture of microelectronic circuitry components |
US4262165A (en) | 1976-03-26 | 1981-04-14 | Hitachi, Ltd. | Packaging structure for semiconductor IC chip |
US4376287A (en) * | 1980-10-29 | 1983-03-08 | Rca Corporation | Microwave power circuit with an active device mounted on a heat dissipating substrate |
US4401767A (en) * | 1981-08-03 | 1983-08-30 | Johnson Matthey Inc. | Silver-filled glass |
JPS5842260A (ja) * | 1981-09-07 | 1983-03-11 | Mitsubishi Electric Corp | 半導体装置 |
-
1980
- 1980-10-01 JP JP55135869A patent/JPS5762539A/ja active Granted
-
1981
- 1981-09-25 GB GB8129017A patent/GB2084399B/en not_active Expired
- 1981-09-29 US US06/306,863 patent/US4437228A/en not_active Expired - Lifetime
- 1981-09-29 DE DE3138718A patent/DE3138718C2/de not_active Expired
- 1981-09-30 FR FR8118497A patent/FR2491259B1/fr not_active Expired
- 1981-09-30 IT IT68266/81A patent/IT1144882B/it active
-
1983
- 1983-12-20 US US06/563,617 patent/US4554573A/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4916227A (ja) * | 1972-06-05 | 1974-02-13 |
Also Published As
Publication number | Publication date |
---|---|
DE3138718A1 (de) | 1982-04-22 |
US4437228A (en) | 1984-03-20 |
FR2491259B1 (fr) | 1986-07-04 |
DE3138718C2 (de) | 1985-06-27 |
FR2491259A1 (fr) | 1982-04-02 |
GB2084399A (en) | 1982-04-07 |
GB2084399B (en) | 1984-09-19 |
IT1144882B (it) | 1986-10-29 |
JPS5762539A (en) | 1982-04-15 |
US4554573A (en) | 1985-11-19 |
IT8168266A0 (it) | 1981-09-30 |
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