JPH0123070B2 - - Google Patents

Info

Publication number
JPH0123070B2
JPH0123070B2 JP56173697A JP17369781A JPH0123070B2 JP H0123070 B2 JPH0123070 B2 JP H0123070B2 JP 56173697 A JP56173697 A JP 56173697A JP 17369781 A JP17369781 A JP 17369781A JP H0123070 B2 JPH0123070 B2 JP H0123070B2
Authority
JP
Japan
Prior art keywords
flip
package
flop
switching
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56173697A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5876773A (ja
Inventor
Taiichi Miho
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Small Business Corp
Original Assignee
Small Business Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Small Business Corp filed Critical Small Business Corp
Priority to JP56173697A priority Critical patent/JPS5876773A/ja
Publication of JPS5876773A publication Critical patent/JPS5876773A/ja
Publication of JPH0123070B2 publication Critical patent/JPH0123070B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/67Testing the correctness of wire connections in electric apparatus or circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP56173697A 1981-10-31 1981-10-31 布線試験機のアドレス制御方式 Granted JPS5876773A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56173697A JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56173697A JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Publications (2)

Publication Number Publication Date
JPS5876773A JPS5876773A (ja) 1983-05-09
JPH0123070B2 true JPH0123070B2 (enrdf_load_stackoverflow) 1989-04-28

Family

ID=15965433

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56173697A Granted JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Country Status (1)

Country Link
JP (1) JPS5876773A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6042662A (ja) * 1983-08-17 1985-03-06 Ibiden Co Ltd プリント配線板の検査方法とその検査装置
JPS61117473A (ja) * 1984-11-13 1986-06-04 Ibiden Co Ltd プリント配線板の検査方法とその検査装置

Also Published As

Publication number Publication date
JPS5876773A (ja) 1983-05-09

Similar Documents

Publication Publication Date Title
EP0758771B1 (en) An electronic circuit or board tester and a method of testing an electronic device
JPS6232511B2 (enrdf_load_stackoverflow)
JPH0123070B2 (enrdf_load_stackoverflow)
KR100492231B1 (ko) 자동시험장치(ate)테스터의아날로그채널에서의펄스발생
KR100544223B1 (ko) 반도체 디바이스 시험 장치
JP3401713B2 (ja) 集積回路試験装置
JPH08293734A (ja) 波形発生装置
JP2006030166A (ja) Icテスタ
JP2921291B2 (ja) パターン信号発生器に同期したac測定電圧印加回路
JP2598580Y2 (ja) Ic試験装置
JP2000149593A (ja) Ic試験装置
JP3006076B2 (ja) Ic試験装置
JPH07104386B2 (ja) 論理回路試験装置
US6957373B2 (en) Address generator for generating addresses for testing a circuit
JP3119388B2 (ja) Ic試験装置
JP2605858B2 (ja) 半導体集積回路装置のモニタダイナミックバーンインテスト装置
JPH07209389A (ja) 高速パターン発生器
JP2962552B2 (ja) Ic試験装置
JP2864880B2 (ja) 半導体メモリic試験装置
JPH0429991B2 (enrdf_load_stackoverflow)
JPH11125660A (ja) 半導体試験装置用タイミング発生器
JP2002131394A (ja) 半導体試験装置のテスト波形生成装置
JPH0599985A (ja) 半導体試験装置のテストパターン発生装置
JPH1152029A (ja) タイミング発生装置
JP2003098234A (ja) 半導体試験装置