JPS5876773A - 布線試験機のアドレス制御方式 - Google Patents
布線試験機のアドレス制御方式Info
- Publication number
- JPS5876773A JPS5876773A JP56173697A JP17369781A JPS5876773A JP S5876773 A JPS5876773 A JP S5876773A JP 56173697 A JP56173697 A JP 56173697A JP 17369781 A JP17369781 A JP 17369781A JP S5876773 A JPS5876773 A JP S5876773A
- Authority
- JP
- Japan
- Prior art keywords
- test
- flip
- package
- flop
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56173697A JPS5876773A (ja) | 1981-10-31 | 1981-10-31 | 布線試験機のアドレス制御方式 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56173697A JPS5876773A (ja) | 1981-10-31 | 1981-10-31 | 布線試験機のアドレス制御方式 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5876773A true JPS5876773A (ja) | 1983-05-09 |
JPH0123070B2 JPH0123070B2 (enrdf_load_stackoverflow) | 1989-04-28 |
Family
ID=15965433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56173697A Granted JPS5876773A (ja) | 1981-10-31 | 1981-10-31 | 布線試験機のアドレス制御方式 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5876773A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6042662A (ja) * | 1983-08-17 | 1985-03-06 | Ibiden Co Ltd | プリント配線板の検査方法とその検査装置 |
JPS61117473A (ja) * | 1984-11-13 | 1986-06-04 | Ibiden Co Ltd | プリント配線板の検査方法とその検査装置 |
-
1981
- 1981-10-31 JP JP56173697A patent/JPS5876773A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6042662A (ja) * | 1983-08-17 | 1985-03-06 | Ibiden Co Ltd | プリント配線板の検査方法とその検査装置 |
JPS61117473A (ja) * | 1984-11-13 | 1986-06-04 | Ibiden Co Ltd | プリント配線板の検査方法とその検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0123070B2 (enrdf_load_stackoverflow) | 1989-04-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4879717A (en) | Testable carriers for integrated circuits | |
US4656632A (en) | System for automatic testing of circuits and systems | |
JPS62503188A (ja) | 構成可能なゲ−トアレイ用オンチツプテストシステム | |
JPH03256297A (ja) | 線形フイードバツクシフトレジスタをクロスチエツク格子構造を伴なつて直列シフトレジスタとして動作させる方法および装置 | |
JPS6232511B2 (enrdf_load_stackoverflow) | ||
GB2070779A (en) | Apparatus for testing digital electronic circuits | |
US4222514A (en) | Digital tester | |
KR900019188A (ko) | 시험 방법, 시험회로 및 시험회로를 갖는 반도체 집적회로 | |
US5166937A (en) | Arrangement for testing digital circuit devices having tri-state outputs | |
JPS5876773A (ja) | 布線試験機のアドレス制御方式 | |
EP0661551A2 (en) | Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing | |
US5918198A (en) | Generating pulses in analog channel of ATE tester | |
US5811977A (en) | Device for electrically testing an electrical connection member | |
JP3555953B2 (ja) | プリング抵抗を備える接続部をテストする装置 | |
US5155733A (en) | Arrangement for testing digital circuit devices having bidirectional outputs | |
JPS60239836A (ja) | 論理回路の故障診断方式 | |
JPS6088370A (ja) | 論理回路 | |
US5426649A (en) | Test interface for a digital circuit | |
JPH08293734A (ja) | 波形発生装置 | |
US11340294B2 (en) | Boundary test circuit, memory and boundary test method | |
JP3586609B2 (ja) | 複数のスロットを持つボードの検査方式 | |
SU1432528A2 (ru) | Устройство дл контрол функционировани логических блоков | |
JP2864880B2 (ja) | 半導体メモリic試験装置 | |
JPS61262856A (ja) | 試験回路 | |
JPH0455774A (ja) | 同期型ff間のオーバディレイテスト方式 |