JP7619943B2 - 撮像装置 - Google Patents
撮像装置 Download PDFInfo
- Publication number
- JP7619943B2 JP7619943B2 JP2021527782A JP2021527782A JP7619943B2 JP 7619943 B2 JP7619943 B2 JP 7619943B2 JP 2021527782 A JP2021527782 A JP 2021527782A JP 2021527782 A JP2021527782 A JP 2021527782A JP 7619943 B2 JP7619943 B2 JP 7619943B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- wiring
- pixel
- imaging device
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/79—Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/018—Manufacture or treatment of image sensors covered by group H10F39/12 of hybrid image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/182—Colour image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/809—Constructional details of image sensors of hybrid image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/813—Electronic components shared by multiple pixels, e.g. one amplifier shared by two pixels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
- H10W20/423—Shielding layers
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019119099 | 2019-06-26 | ||
| JP2019119099 | 2019-06-26 | ||
| PCT/JP2020/025285 WO2020262629A1 (ja) | 2019-06-26 | 2020-06-26 | 撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2020262629A1 JPWO2020262629A1 (https=) | 2020-12-30 |
| JP7619943B2 true JP7619943B2 (ja) | 2025-01-22 |
Family
ID=74061756
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021527782A Active JP7619943B2 (ja) | 2019-06-26 | 2020-06-26 | 撮像装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US11901391B2 (https=) |
| EP (1) | EP3993011A4 (https=) |
| JP (1) | JP7619943B2 (https=) |
| KR (2) | KR102805550B1 (https=) |
| CN (2) | CN119451260A (https=) |
| TW (2) | TWI861140B (https=) |
| WO (1) | WO2020262629A1 (https=) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI861140B (zh) | 2019-06-26 | 2024-11-11 | 日商索尼半導體解決方案公司 | 攝像裝置 |
| JP7427646B2 (ja) * | 2021-12-07 | 2024-02-05 | キヤノン株式会社 | 光電変換装置、光電変換システム、移動体 |
| WO2023248925A1 (ja) * | 2022-06-24 | 2023-12-28 | ソニーセミコンダクタソリューションズ株式会社 | 撮像素子及び電子機器 |
| WO2024042862A1 (ja) * | 2022-08-25 | 2024-02-29 | ソニーセミコンダクタソリューションズ株式会社 | 撮像装置 |
| WO2024095743A1 (ja) * | 2022-11-01 | 2024-05-10 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置およびその製造方法、並びに電子機器 |
| JP2024171089A (ja) * | 2023-05-29 | 2024-12-11 | キヤノン株式会社 | 光電変換装置、光電変換システム、および移動体 |
| US20240402006A1 (en) * | 2023-06-02 | 2024-12-05 | International Business Machines Corporation | Flexible ultraviolet sensor |
| WO2024252866A1 (ja) * | 2023-06-06 | 2024-12-12 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置 |
| WO2024253074A1 (ja) * | 2023-06-09 | 2024-12-12 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置および電子機器 |
| JP2025167910A (ja) * | 2024-04-26 | 2025-11-07 | キヤノン株式会社 | 光電変換装置および機器 |
| WO2025263397A1 (ja) * | 2024-06-20 | 2025-12-26 | ソニーセミコンダクタソリューションズ株式会社 | 光検出素子及び電子機器 |
| WO2026074912A1 (ja) * | 2024-10-01 | 2026-04-09 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置および電子機器 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006019455A (ja) | 2004-06-30 | 2006-01-19 | Nec Electronics Corp | 半導体装置およびその製造方法 |
| JP2007294652A (ja) | 2006-04-25 | 2007-11-08 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置及びその製造方法 |
| JP2013008952A (ja) | 2011-05-20 | 2013-01-10 | Societe Francaise De Detecteurs Infrarouges Sofradir | 低フラックス及び低ノイズの検出回路 |
| WO2015016140A1 (ja) | 2013-08-02 | 2015-02-05 | ソニー株式会社 | 撮像素子、電子機器、および撮像素子の製造方法 |
| JP2016181884A (ja) | 2015-03-25 | 2016-10-13 | 住友電気工業株式会社 | 電子回路 |
| WO2018075099A1 (en) | 2016-10-19 | 2018-04-26 | Raytheon Company | Coaxial connector feed-through for multi-level interconnected semiconductor wafers |
| JP2018125396A (ja) | 2017-01-31 | 2018-08-09 | 東芝メモリ株式会社 | 半導体装置およびその製造方法 |
| JP2018148567A (ja) | 2018-04-26 | 2018-09-20 | ソニー株式会社 | 半導体装置、固体撮像装置、およびカメラシステム |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5258416B2 (ja) * | 2008-06-27 | 2013-08-07 | パナソニック株式会社 | 固体撮像装置 |
| US7965329B2 (en) * | 2008-09-09 | 2011-06-21 | Omnivision Technologies, Inc. | High gain read circuit for 3D integrated pixel |
| JP4835710B2 (ja) * | 2009-03-17 | 2011-12-14 | ソニー株式会社 | 固体撮像装置、固体撮像装置の製造方法、固体撮像装置の駆動方法、及び電子機器 |
| JP5985136B2 (ja) | 2009-03-19 | 2016-09-06 | ソニー株式会社 | 半導体装置とその製造方法、及び電子機器 |
| JP5489705B2 (ja) * | 2009-12-26 | 2014-05-14 | キヤノン株式会社 | 固体撮像装置および撮像システム |
| JP5601001B2 (ja) * | 2010-03-31 | 2014-10-08 | ソニー株式会社 | 固体撮像素子および駆動方法、並びに電子機器 |
| US20110241185A1 (en) * | 2010-04-05 | 2011-10-06 | International Business Machines Corporation | Signal shielding through-substrate vias for 3d integration |
| US9252171B2 (en) * | 2010-09-06 | 2016-02-02 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device |
| JP2012248953A (ja) * | 2011-05-25 | 2012-12-13 | Olympus Corp | 固体撮像装置、撮像装置、および信号読み出し方法 |
| JP6172608B2 (ja) * | 2012-05-30 | 2017-08-02 | パナソニックIpマネジメント株式会社 | 固体撮像装置、その駆動方法及び撮影装置 |
| JP2015012240A (ja) * | 2013-07-01 | 2015-01-19 | ソニー株式会社 | 撮像素子および電子機器 |
| JP6171997B2 (ja) * | 2014-03-14 | 2017-08-02 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びに電子機器 |
| US9349767B2 (en) * | 2014-04-16 | 2016-05-24 | Semiconductor Components Industries, Llc | Image sensors with through-oxide via structures |
| JP6215246B2 (ja) * | 2014-05-16 | 2017-10-18 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子および固体撮像素子の製造方法、並びに電子機器 |
| US10264199B2 (en) * | 2014-07-15 | 2019-04-16 | Brillnics Inc. | Solid-state imaging device, method for producing solid-state imaging device, and electronic apparatus using photoelectric conversion elements |
| JP6493411B2 (ja) * | 2014-11-05 | 2019-04-03 | ソニー株式会社 | 撮像装置 |
| US9774801B2 (en) * | 2014-12-05 | 2017-09-26 | Qualcomm Incorporated | Solid state image sensor with enhanced charge capacity and dynamic range |
| CN105934826B (zh) * | 2014-12-18 | 2021-07-20 | 索尼公司 | 固态图像传感器、成像装置和电子设备 |
| JP6856974B2 (ja) * | 2015-03-31 | 2021-04-14 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子および電子機器 |
| US10341592B2 (en) * | 2015-06-09 | 2019-07-02 | Sony Semiconductor Solutions Corporation | Imaging element, driving method, and electronic device |
| WO2017057277A1 (ja) * | 2015-09-30 | 2017-04-06 | 株式会社ニコン | 撮像素子および撮像装置 |
| US11778862B2 (en) * | 2016-09-07 | 2023-10-03 | Sony Semiconductor Solutions Corporation | Display device and electronic device including capacitors connected to anode electrode of light emitting unit |
| US10062722B2 (en) * | 2016-10-04 | 2018-08-28 | Omnivision Technologies, Inc. | Stacked image sensor with shield bumps between interconnects |
| JP6746476B2 (ja) * | 2016-11-24 | 2020-08-26 | キヤノン株式会社 | 撮像装置、撮像システム、および、移動体 |
| JP7121468B2 (ja) * | 2017-02-24 | 2022-08-18 | ブリルニクス シンガポール プライベート リミテッド | 固体撮像装置、固体撮像装置の製造方法、および電子機器 |
| CN108987420B (zh) * | 2017-06-05 | 2023-12-12 | 松下知识产权经营株式会社 | 摄像装置 |
| JP6976744B2 (ja) * | 2017-06-29 | 2021-12-08 | キヤノン株式会社 | 撮像装置、撮像システム、および、移動体 |
| TWI861140B (zh) | 2019-06-26 | 2024-11-11 | 日商索尼半導體解決方案公司 | 攝像裝置 |
-
2020
- 2020-06-24 TW TW109121742A patent/TWI861140B/zh active
- 2020-06-24 TW TW113137694A patent/TWI900270B/zh active
- 2020-06-26 KR KR1020217038792A patent/KR102805550B1/ko active Active
- 2020-06-26 WO PCT/JP2020/025285 patent/WO2020262629A1/ja not_active Ceased
- 2020-06-26 KR KR1020257012662A patent/KR20250059540A/ko active Pending
- 2020-06-26 EP EP20830501.1A patent/EP3993011A4/en active Pending
- 2020-06-26 CN CN202411500850.8A patent/CN119451260A/zh active Pending
- 2020-06-26 US US17/620,258 patent/US11901391B2/en active Active
- 2020-06-26 CN CN202080034711.4A patent/CN113841242B/zh active Active
- 2020-06-26 JP JP2021527782A patent/JP7619943B2/ja active Active
-
2023
- 2023-12-28 US US18/398,746 patent/US12183760B2/en active Active
-
2024
- 2024-11-13 US US18/946,518 patent/US20250072151A1/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006019455A (ja) | 2004-06-30 | 2006-01-19 | Nec Electronics Corp | 半導体装置およびその製造方法 |
| JP2007294652A (ja) | 2006-04-25 | 2007-11-08 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置及びその製造方法 |
| JP2013008952A (ja) | 2011-05-20 | 2013-01-10 | Societe Francaise De Detecteurs Infrarouges Sofradir | 低フラックス及び低ノイズの検出回路 |
| WO2015016140A1 (ja) | 2013-08-02 | 2015-02-05 | ソニー株式会社 | 撮像素子、電子機器、および撮像素子の製造方法 |
| JP2016181884A (ja) | 2015-03-25 | 2016-10-13 | 住友電気工業株式会社 | 電子回路 |
| WO2018075099A1 (en) | 2016-10-19 | 2018-04-26 | Raytheon Company | Coaxial connector feed-through for multi-level interconnected semiconductor wafers |
| JP2018125396A (ja) | 2017-01-31 | 2018-08-09 | 東芝メモリ株式会社 | 半導体装置およびその製造方法 |
| JP2018148567A (ja) | 2018-04-26 | 2018-09-20 | ソニー株式会社 | 半導体装置、固体撮像装置、およびカメラシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| US12183760B2 (en) | 2024-12-31 |
| CN113841242B (zh) | 2025-06-13 |
| EP3993011A1 (en) | 2022-05-04 |
| US20220367555A1 (en) | 2022-11-17 |
| US20240204028A1 (en) | 2024-06-20 |
| KR102805550B1 (ko) | 2025-05-13 |
| TWI900270B (zh) | 2025-10-01 |
| WO2020262629A1 (ja) | 2020-12-30 |
| CN113841242A (zh) | 2021-12-24 |
| KR20250059540A (ko) | 2025-05-02 |
| EP3993011A4 (en) | 2022-11-23 |
| TW202510027A (zh) | 2025-03-01 |
| TW202109616A (zh) | 2021-03-01 |
| JPWO2020262629A1 (https=) | 2020-12-30 |
| TWI861140B (zh) | 2024-11-11 |
| US11901391B2 (en) | 2024-02-13 |
| US20250072151A1 (en) | 2025-02-27 |
| CN119451260A (zh) | 2025-02-14 |
| KR20220023760A (ko) | 2022-03-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7619943B2 (ja) | 撮像装置 | |
| JP7592013B2 (ja) | 撮像装置 | |
| JP7637742B2 (ja) | 固体撮像素子 | |
| JP7624389B2 (ja) | 撮像装置 | |
| JP7566738B2 (ja) | 固体撮像装置及び電子機器 | |
| WO2020262582A1 (ja) | 半導体装置及びその製造方法 | |
| JP7568620B2 (ja) | 固体撮像装置 | |
| KR20220023764A (ko) | 촬상 장치 | |
| JP7600108B2 (ja) | 半導体装置および撮像装置 | |
| WO2020262323A1 (ja) | 撮像装置 | |
| WO2022138467A1 (ja) | 固体撮像装置 | |
| CN118648110A (zh) | 比较器、光检测元件和电子设备 | |
| WO2024176641A1 (ja) | 固体撮像装置及び電子機器 | |
| WO2024090081A1 (ja) | 増幅回路、コンパレータおよび固体撮像装置 | |
| WO2024214517A1 (ja) | 光検出装置及び電子機器 | |
| WO2023223743A1 (ja) | 光検出素子 | |
| WO2024203423A1 (ja) | 光検出装置及び電子機器 | |
| WO2024185529A1 (ja) | 光検出装置及び電子機器 | |
| WO2023243440A1 (ja) | 比較器、光検出素子および電子機器 | |
| WO2023136174A1 (ja) | 固体撮像装置および電子機器 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230523 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240723 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240919 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20241210 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20250109 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7619943 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |